JPS6321888B2 - - Google Patents
Info
- Publication number
- JPS6321888B2 JPS6321888B2 JP12964780A JP12964780A JPS6321888B2 JP S6321888 B2 JPS6321888 B2 JP S6321888B2 JP 12964780 A JP12964780 A JP 12964780A JP 12964780 A JP12964780 A JP 12964780A JP S6321888 B2 JPS6321888 B2 JP S6321888B2
- Authority
- JP
- Japan
- Prior art keywords
- pattern
- direction wiring
- active matrix
- mask
- row
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000011159 matrix material Substances 0.000 claims description 10
- 238000000034 method Methods 0.000 description 5
- 230000002950 deficient Effects 0.000 description 4
- 230000007547 defect Effects 0.000 description 3
- 238000012937 correction Methods 0.000 description 2
- 238000007689 inspection Methods 0.000 description 2
- 230000003252 repetitive effect Effects 0.000 description 2
- 238000001514 detection method Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70283—Mask effects on the imaging process
- G03F7/70291—Addressable masks, e.g. spatial light modulators [SLMs], digital micro-mirror devices [DMDs] or liquid crystal display [LCD] patterning devices
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/38—Masks having auxiliary features, e.g. special coatings or marks for alignment or testing; Preparation thereof
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12964780A JPS5754318A (en) | 1980-09-18 | 1980-09-18 | Active matrix mask |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12964780A JPS5754318A (en) | 1980-09-18 | 1980-09-18 | Active matrix mask |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5754318A JPS5754318A (en) | 1982-03-31 |
| JPS6321888B2 true JPS6321888B2 (enrdf_load_stackoverflow) | 1988-05-10 |
Family
ID=15014682
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP12964780A Granted JPS5754318A (en) | 1980-09-18 | 1980-09-18 | Active matrix mask |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5754318A (enrdf_load_stackoverflow) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01222980A (ja) * | 1988-03-02 | 1989-09-06 | Fujitsu Ltd | サーマルプリンタ及びそれに用いる2ply感熱紙 |
| JP5102989B2 (ja) * | 2006-08-08 | 2012-12-19 | ルネサスエレクトロニクス株式会社 | 半導体装置の製造方法 |
| CN107329365B (zh) * | 2017-05-31 | 2018-10-12 | 泰州市西陵纺机工具厂 | 一种掩模板图案的测量方法 |
-
1980
- 1980-09-18 JP JP12964780A patent/JPS5754318A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5754318A (en) | 1982-03-31 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| KR20020010585A (ko) | 반도체 장치의 제조 방법 및 그것을 사용하여 제조된반도체 장치 | |
| CN102623368A (zh) | 一种晶圆缺陷检测方法 | |
| DE112004000395T5 (de) | Halbleiterwafer mit nichtrechteckig geformten Chips | |
| JPS6233739B2 (enrdf_load_stackoverflow) | ||
| JPS6321888B2 (enrdf_load_stackoverflow) | ||
| JP2009264865A (ja) | フラットパネルディスプレイの欠陥検査装置およびその方法 | |
| JP4972278B2 (ja) | レチクル及び半導体装置の製造方法 | |
| CN204102865U (zh) | 一种对准测量结构 | |
| JP2829211B2 (ja) | 合せずれ測定方法 | |
| CN114720483A (zh) | 一种无需标准样片的光学检测方法及其应用 | |
| JP2633228B2 (ja) | 半導体装置のエッチング精度検査方法 | |
| CN106325004A (zh) | Ldi曝光机能量均匀性检测方法 | |
| CN119381296B (zh) | 一种晶圆定位map定位标记方法 | |
| JP2913747B2 (ja) | ウェーハ検査装置 | |
| US4765743A (en) | Method of inspecting a master member | |
| JP2564440B2 (ja) | ウエハ内位置表示を付したチップの製造方法 | |
| JPS6184029A (ja) | 半導体検査装置 | |
| JPH04587B2 (enrdf_load_stackoverflow) | ||
| JPH10339943A (ja) | 半導体装置の製造方法 | |
| JP2002043197A (ja) | 薄膜積層素子及びその製造方法 | |
| JPH05136034A (ja) | 電子ビーム露光におけるドリフト量測定方法 | |
| CN112108776A (zh) | 一种用于led灯珠不良品标记的高精度激光打标方法 | |
| JPS6132550A (ja) | 半導体集積回路素子 | |
| JP2001274067A (ja) | 半導体装置の製造方法 | |
| JPH02125256A (ja) | フォトマスク |