JPS63152243U - - Google Patents
Info
- Publication number
- JPS63152243U JPS63152243U JP4374987U JP4374987U JPS63152243U JP S63152243 U JPS63152243 U JP S63152243U JP 4374987 U JP4374987 U JP 4374987U JP 4374987 U JP4374987 U JP 4374987U JP S63152243 U JPS63152243 U JP S63152243U
- Authority
- JP
- Japan
- Prior art keywords
- wiring pattern
- protrusion
- probe card
- insulating substrate
- flexible insulating
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims description 8
- 239000004065 semiconductor Substances 0.000 claims description 5
- 239000000758 substrate Substances 0.000 claims description 3
- 238000003384 imaging method Methods 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4374987U JPS63152243U (forum.php) | 1987-03-25 | 1987-03-25 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4374987U JPS63152243U (forum.php) | 1987-03-25 | 1987-03-25 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS63152243U true JPS63152243U (forum.php) | 1988-10-06 |
Family
ID=30860905
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP4374987U Pending JPS63152243U (forum.php) | 1987-03-25 | 1987-03-25 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS63152243U (forum.php) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2000200812A (ja) * | 1990-02-16 | 2000-07-18 | Glenn J Leedy | 高密度探触点を使用した集積回路の製作および試験方法 |
-
1987
- 1987-03-25 JP JP4374987U patent/JPS63152243U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2000200812A (ja) * | 1990-02-16 | 2000-07-18 | Glenn J Leedy | 高密度探触点を使用した集積回路の製作および試験方法 |