JPS63148864U - - Google Patents
Info
- Publication number
- JPS63148864U JPS63148864U JP4008787U JP4008787U JPS63148864U JP S63148864 U JPS63148864 U JP S63148864U JP 4008787 U JP4008787 U JP 4008787U JP 4008787 U JP4008787 U JP 4008787U JP S63148864 U JPS63148864 U JP S63148864U
- Authority
- JP
- Japan
- Prior art keywords
- probe
- imaging means
- aligning
- position correction
- diagram showing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000003384 imaging method Methods 0.000 claims description 7
- 239000000523 sample Substances 0.000 claims description 5
- 238000010586 diagram Methods 0.000 description 10
Landscapes
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4008787U JPS63148864U (US08080257-20111220-C00005.png) | 1987-03-20 | 1987-03-20 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4008787U JPS63148864U (US08080257-20111220-C00005.png) | 1987-03-20 | 1987-03-20 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS63148864U true JPS63148864U (US08080257-20111220-C00005.png) | 1988-09-30 |
Family
ID=30853857
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP4008787U Pending JPS63148864U (US08080257-20111220-C00005.png) | 1987-03-20 | 1987-03-20 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS63148864U (US08080257-20111220-C00005.png) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2006085570A1 (ja) * | 2005-02-14 | 2006-08-17 | Exedy Corporation | 自動超音波検査装置、その検査方法及びその検査方法を用いた製造方法 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57200857A (en) * | 1981-06-05 | 1982-12-09 | Olympus Optical Co Ltd | Automatic focus adjusting method for ultrasonic microscope |
JPS6148360B2 (US08080257-20111220-C00005.png) * | 1977-07-01 | 1986-10-23 | Nippon Electric Co |
-
1987
- 1987-03-20 JP JP4008787U patent/JPS63148864U/ja active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6148360B2 (US08080257-20111220-C00005.png) * | 1977-07-01 | 1986-10-23 | Nippon Electric Co | |
JPS57200857A (en) * | 1981-06-05 | 1982-12-09 | Olympus Optical Co Ltd | Automatic focus adjusting method for ultrasonic microscope |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2006085570A1 (ja) * | 2005-02-14 | 2006-08-17 | Exedy Corporation | 自動超音波検査装置、その検査方法及びその検査方法を用いた製造方法 |
US7798002B2 (en) | 2005-02-14 | 2010-09-21 | Exedy Corporation | Automatic ultrasonic examination device, automatic ultrasonic examination method and production method using the examination method |