JPS6314459B2 - - Google Patents
Info
- Publication number
- JPS6314459B2 JPS6314459B2 JP53140379A JP14037978A JPS6314459B2 JP S6314459 B2 JPS6314459 B2 JP S6314459B2 JP 53140379 A JP53140379 A JP 53140379A JP 14037978 A JP14037978 A JP 14037978A JP S6314459 B2 JPS6314459 B2 JP S6314459B2
- Authority
- JP
- Japan
- Prior art keywords
- ion
- mass spectrometer
- photon
- electron
- spectrometer according
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 150000002500 ions Chemical class 0.000 claims description 142
- 238000006243 chemical reaction Methods 0.000 claims description 37
- 238000000926 separation method Methods 0.000 claims description 16
- 238000005259 measurement Methods 0.000 claims description 8
- 239000012528 membrane Substances 0.000 claims description 8
- 239000004033 plastic Substances 0.000 claims description 7
- 229920003023 plastic Polymers 0.000 claims description 7
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 6
- 229910052782 aluminium Inorganic materials 0.000 claims description 6
- 238000001228 spectrum Methods 0.000 claims description 5
- 229920003002 synthetic resin Polymers 0.000 claims description 5
- 239000000057 synthetic resin Substances 0.000 claims description 5
- 238000012800 visualization Methods 0.000 claims description 4
- 229910000952 Be alloy Inorganic materials 0.000 claims description 2
- VVQNEPGJFQJSBK-UHFFFAOYSA-N Methyl methacrylate Chemical compound COC(=O)C(C)=C VVQNEPGJFQJSBK-UHFFFAOYSA-N 0.000 claims description 2
- 229920000642 polymer Polymers 0.000 claims description 2
- 238000003860 storage Methods 0.000 claims description 2
- 238000004458 analytical method Methods 0.000 description 21
- 238000010884 ion-beam technique Methods 0.000 description 10
- 239000013307 optical fiber Substances 0.000 description 6
- 238000001514 detection method Methods 0.000 description 5
- 230000005684 electric field Effects 0.000 description 5
- 238000001819 mass spectrum Methods 0.000 description 4
- 230000006698 induction Effects 0.000 description 3
- 230000003287 optical effect Effects 0.000 description 3
- 230000002123 temporal effect Effects 0.000 description 3
- 239000012491 analyte Substances 0.000 description 2
- 238000003384 imaging method Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000003595 spectral effect Effects 0.000 description 2
- 230000001960 triggered effect Effects 0.000 description 2
- 101100167360 Drosophila melanogaster chb gene Proteins 0.000 description 1
- 229920005372 Plexiglas® Polymers 0.000 description 1
- 238000011088 calibration curve Methods 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 238000010668 complexation reaction Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000010304 firing Methods 0.000 description 1
- 230000005596 ionic collisions Effects 0.000 description 1
- 238000004020 luminiscence type Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000004949 mass spectrometry Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 239000004926 polymethyl methacrylate Substances 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 238000010183 spectrum analysis Methods 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
- 238000002366 time-of-flight method Methods 0.000 description 1
- 238000011144 upstream manufacturing Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/28—Static spectrometers
- H01J49/30—Static spectrometers using magnetic analysers, e.g. Dempster spectrometer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/28—Measuring radiation intensity with secondary-emission detectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/025—Detectors specially adapted to particle spectrometers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/40—Time-of-flight spectrometers
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Electron Tubes For Measurement (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR7734271A FR2408910A1 (fr) | 1977-11-15 | 1977-11-15 | Spectrographe de masse |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS54112697A JPS54112697A (en) | 1979-09-03 |
| JPS6314459B2 true JPS6314459B2 (US20110009641A1-20110113-C00256.png) | 1988-03-31 |
Family
ID=9197608
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14037978A Granted JPS54112697A (en) | 1977-11-15 | 1978-11-14 | Mass analyzer |
Country Status (5)
Families Citing this family (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0002153A1 (fr) * | 1977-11-15 | 1979-05-30 | COMMISSARIAT A L'ENERGIE ATOMIQUE Etablissement de Caractère Scientifique Technique et Industriel | Détecteur panoramique d'ions |
| US4472631A (en) * | 1982-06-04 | 1984-09-18 | Research Corporation | Combination of time resolution and mass dispersive techniques in mass spectrometry |
| US4597947A (en) * | 1983-06-30 | 1986-07-01 | The United States Of America As Represented By The Secretary Of The Army | Mass transfer and material separation microchannel plate apparatus |
| US4597873A (en) * | 1983-06-30 | 1986-07-01 | The United States Of America As Represented By The Secretary Of The Army | Process of mass transfer and material separation using a microchannel plate |
| DE4316805C2 (de) * | 1993-05-19 | 1997-03-06 | Bruker Franzen Analytik Gmbh | Nachweis schwerer Ionen in einem Flugzeitmassenspektrometer |
| US7009187B2 (en) * | 2002-08-08 | 2006-03-07 | Fei Company | Particle detector suitable for detecting ions and electrons |
| US7157697B2 (en) * | 2002-12-12 | 2007-01-02 | Micromass Uk Limited | Ion detector |
| US6906318B2 (en) * | 2003-02-13 | 2005-06-14 | Micromass Uk Limited | Ion detector |
| EP1630851B1 (en) * | 2004-05-17 | 2013-07-10 | Burle Technologies, Inc. | A detector for a co-axial bipolar time-of-flight mass spectrometer |
| JP4718982B2 (ja) * | 2005-12-07 | 2011-07-06 | 財団法人光科学技術研究振興財団 | イオン分析装置 |
| US20080173807A1 (en) * | 2006-04-11 | 2008-07-24 | Oh-Kyu Yoon | Fragmentation modulation mass spectrometry |
| EP2006881A3 (en) | 2007-06-18 | 2010-01-06 | FEI Company | In-chamber electron detector |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4210239Y1 (US20110009641A1-20110113-C00256.png) * | 1965-07-13 | 1967-06-05 | ||
| JPS472073U (US20110009641A1-20110113-C00256.png) * | 1971-01-26 | 1972-08-23 | ||
| JPS4842230U (US20110009641A1-20110113-C00256.png) * | 1971-09-22 | 1973-05-30 | ||
| JPS5110797A (ja) * | 1974-07-09 | 1976-01-28 | Canon Kk | Ekishohyojisochi |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2765408A (en) * | 1952-09-08 | 1956-10-02 | Bendix Aviat Corp | Mass spectrometer |
| US2798162A (en) * | 1953-12-23 | 1957-07-02 | Philips Corp | Mass spectrometer |
| FR1523030A (fr) * | 1967-05-17 | 1968-04-02 | Ass Elect Ind | Ensemble collecteur d'ions pour spectromètre de masse à étincelles |
| US3538328A (en) * | 1968-03-04 | 1970-11-03 | Varian Associates | Scintillation-type ion detector employing a secondary emitter target surrounding the ion path |
| US3676674A (en) * | 1970-07-16 | 1972-07-11 | Nasa | Apparatus for ionization analysis |
| US3916187A (en) * | 1971-10-14 | 1975-10-28 | Nasa | Cosmic dust analyzer |
| GB1412849A (en) * | 1973-04-12 | 1975-11-05 | Ass Elect Ind | Mass spectrographs and ion collector systems therefor |
| US3953732A (en) * | 1973-09-28 | 1976-04-27 | The University Of Rochester | Dynamic mass spectrometer |
| US3955084A (en) * | 1974-09-09 | 1976-05-04 | California Institute Of Technology | Electro-optical detector for use in a wide mass range mass spectrometer |
| FR2446060B2 (fr) * | 1977-08-30 | 1986-01-03 | Calvet Pierre | Perfectionnements aux machines a vendanger |
-
1977
- 1977-11-15 FR FR7734271A patent/FR2408910A1/fr active Granted
-
1978
- 1978-11-13 DE DE7878400174T patent/DE2862113D1/de not_active Expired
- 1978-11-13 EP EP78400174A patent/EP0002152B1/fr not_active Expired
- 1978-11-14 JP JP14037978A patent/JPS54112697A/ja active Granted
-
1980
- 1980-08-13 US US06/177,775 patent/US4322629A/en not_active Expired - Lifetime
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4210239Y1 (US20110009641A1-20110113-C00256.png) * | 1965-07-13 | 1967-06-05 | ||
| JPS472073U (US20110009641A1-20110113-C00256.png) * | 1971-01-26 | 1972-08-23 | ||
| JPS4842230U (US20110009641A1-20110113-C00256.png) * | 1971-09-22 | 1973-05-30 | ||
| JPS5110797A (ja) * | 1974-07-09 | 1976-01-28 | Canon Kk | Ekishohyojisochi |
Also Published As
| Publication number | Publication date |
|---|---|
| EP0002152A1 (fr) | 1979-05-30 |
| US4322629A (en) | 1982-03-30 |
| EP0002152B1 (fr) | 1982-12-01 |
| JPS54112697A (en) | 1979-09-03 |
| FR2408910B1 (US20110009641A1-20110113-C00256.png) | 1980-11-28 |
| DE2862113D1 (en) | 1983-01-05 |
| FR2408910A1 (fr) | 1979-06-08 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US6940066B2 (en) | Time of flight mass spectrometer and multiple detector therefor | |
| Koppenaal et al. | MS detectors | |
| Lee et al. | Coincidence ion imaging with a fast frame camera | |
| Galanti et al. | A high resolution, high sensitivity channel plate image intensifier for use in particle spectrographs | |
| WO2006130149A2 (en) | Mass spectrometer and methods of increasing dispersion between ion beams | |
| JPS6314459B2 (US20110009641A1-20110113-C00256.png) | ||
| US20230170205A1 (en) | Apparatus and method for high-performance charged particle detection | |
| Giffin et al. | An electro—optical detector for focal plane mass spectrometers | |
| US4398090A (en) | Panoramic ion detector | |
| CN102507517A (zh) | 一种光子计数全谱直读荧光光谱仪 | |
| US5026988A (en) | Method and apparatus for time of flight medium energy particle scattering | |
| US3946227A (en) | Mass spectrographs and ion collector systems therefor | |
| CN102507464A (zh) | 一种光子计数全谱直读吸收光谱仪 | |
| JPH0510946A (ja) | 細胞解析装置 | |
| US4320295A (en) | Panoramic ion detector | |
| US9640378B2 (en) | Time-of-flight mass spectrometer | |
| JP2764505B2 (ja) | 電子分光方法とこれを用いた電子分光装置 | |
| JP2875370B2 (ja) | 荷電粒子測定装置および光強度波形測定装置 | |
| US3435207A (en) | Apparatus for measuring velocity of low energy electrons | |
| JP2000231901A (ja) | 画像解析法による質量分析計又はそれを使用した質量分析方法 | |
| US20040021069A1 (en) | Spectroscopic analyser for surface analysis, and method therefor | |
| JPS6245423Y2 (US20110009641A1-20110113-C00256.png) | ||
| Ceasar et al. | A multichannel electro‐optical detector for rapid acquisition of X‐ray photoelectron spectroscopy data | |
| JPS6245424Y2 (US20110009641A1-20110113-C00256.png) | ||
| JPS6240148A (ja) | イオン検出器 |
