JPS6312522B2 - - Google Patents

Info

Publication number
JPS6312522B2
JPS6312522B2 JP57041832A JP4183282A JPS6312522B2 JP S6312522 B2 JPS6312522 B2 JP S6312522B2 JP 57041832 A JP57041832 A JP 57041832A JP 4183282 A JP4183282 A JP 4183282A JP S6312522 B2 JPS6312522 B2 JP S6312522B2
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP57041832A
Other versions
JPS57191502A (en
Inventor
Deebitsudo Gurobuman Uooren
Arubaato Neruson Junia Deebitsudo
Maikeru Waaromonto Jon
Original Assignee
Intaanashonaru Bijinesu Mashiinzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to US06/265,140 priority Critical patent/US4405238A/en
Application filed by Intaanashonaru Bijinesu Mashiinzu Corp filed Critical Intaanashonaru Bijinesu Mashiinzu Corp
Publication of JPS57191502A publication Critical patent/JPS57191502A/ja
Publication of JPS6312522B2 publication Critical patent/JPS6312522B2/ja
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F9/00Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
    • G03F9/70Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
    • G03F9/7073Alignment marks and their environment
    • G03F9/7076Mark details, e.g. phase grating mark, temporary mark
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
    • G02B5/00Optical elements other than lenses
    • G02B5/18Diffraction gratings
    • G02B5/1876Diffractive Fresnel lenses; Zone plates; Kinoforms
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F9/00Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
    • G03F9/70Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
    • G03F9/7049Technique, e.g. interferometric
JP57041832A 1981-05-20 1982-03-18 Expired JPS6312522B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US06/265,140 US4405238A (en) 1981-05-20 1981-05-20 Alignment method and apparatus for x-ray or optical lithography

Publications (2)

Publication Number Publication Date
JPS57191502A JPS57191502A (en) 1982-11-25
JPS6312522B2 true JPS6312522B2 (ja) 1988-03-19

Family

ID=23009187

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57041832A Expired JPS6312522B2 (ja) 1981-05-20 1982-03-18

Country Status (4)

Country Link
US (1) US4405238A (ja)
EP (1) EP0065115B1 (ja)
JP (1) JPS6312522B2 (ja)
DE (1) DE3265191D1 (ja)

Families Citing this family (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4765714A (en) * 1984-04-03 1988-08-23 Horner Joseph L Binary phase-only optical correlation system
JPH0726803B2 (ja) * 1984-11-26 1995-03-29 株式会社ニコン 位置検出方法及び装置
DE3704313A1 (de) * 1986-11-20 1988-06-01 Krupp Gmbh Beruehrungsloses optisches verfahren zur bestimmung von gegenstaenden
US4815854A (en) * 1987-01-19 1989-03-28 Nec Corporation Method of alignment between mask and semiconductor wafer
US4791482A (en) * 1987-02-06 1988-12-13 Westinghouse Electric Corp. Object locating system
JPH01285803A (en) * 1988-05-13 1989-11-16 Fujitsu Ltd Fresnel zone plate and aligning method using same
JPH07119574B2 (ja) * 1988-09-12 1995-12-20 富士通株式会社 二次元位置検出方法
JP2666859B2 (ja) * 1988-11-25 1997-10-22 日本電気株式会社 目合せ用バーニヤパターンを備えた半導体装置
US5229617A (en) * 1989-07-28 1993-07-20 Canon Kabushiki Kaisha Position detecting method having reflectively scattered light prevented from impinging on a detector
JP2925168B2 (ja) * 1989-07-28 1999-07-28 キヤノン株式会社 位置検出装置及び方法
JP3008633B2 (ja) * 1991-01-11 2000-02-14 キヤノン株式会社 位置検出装置
JP2592369B2 (ja) * 1991-08-22 1997-03-19 富士通株式会社 多層配線回路基板の製造方法及び誘電体ミラーマスクの製造方法
US5504596A (en) * 1992-12-21 1996-04-02 Nikon Corporation Exposure method and apparatus using holographic techniques
US5825482A (en) * 1995-09-29 1998-10-20 Kla-Tencor Corporation Surface inspection system with misregistration error correction and adaptive illumination
US5864394A (en) * 1994-06-20 1999-01-26 Kla-Tencor Corporation Surface inspection system
US5576831A (en) * 1994-06-20 1996-11-19 Tencor Instruments Wafer alignment sensor
US20040057044A1 (en) * 1994-12-08 2004-03-25 Mehrdad Nikoonahad Scanning system for inspecting anamolies on surfaces
US5883710A (en) 1994-12-08 1999-03-16 Kla-Tencor Corporation Scanning system for inspecting anomalies on surfaces
DE19609399C2 (de) * 1996-03-01 2002-05-29 Infineon Technologies Ag Method for determining crystal orientation in a wafer
JP4306800B2 (ja) * 1996-06-04 2009-08-05 ケーエルエー−テンカー テクノロジィース コーポレイション 表面検査用光学走査システム
US5973316A (en) * 1997-07-08 1999-10-26 Nec Research Institute, Inc. Sub-wavelength aperture arrays with enhanced light transmission
US6040936A (en) * 1998-10-08 2000-03-21 Nec Research Institute, Inc. Optical transmission control apparatus utilizing metal films perforated with subwavelength-diameter holes
US6236033B1 (en) 1998-12-09 2001-05-22 Nec Research Institute, Inc. Enhanced optical transmission apparatus utilizing metal films having apertures and periodic surface topography
US6285020B1 (en) 1999-11-05 2001-09-04 Nec Research Institute, Inc. Enhanced optical transmission apparatus with improved inter-surface coupling
US6441298B1 (en) 2000-08-15 2002-08-27 Nec Research Institute, Inc Surface-plasmon enhanced photovoltaic device
CA2319898C (en) 2000-09-18 2006-05-16 Institut National D'optique Position encoding optical device and method
US6649901B2 (en) 2002-03-14 2003-11-18 Nec Laboratories America, Inc. Enhanced optical transmission apparatus with improved aperture geometry
US8225664B1 (en) * 2007-10-17 2012-07-24 Lsp Technologies Lamb waves for laser bond inspection
CN101694531B (zh) * 2009-10-15 2011-01-05 电子科技大学 过剩光载流子菲涅耳波带片

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4842764A (ja) * 1971-09-29 1973-06-21

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3545854A (en) * 1966-06-17 1970-12-08 Gen Electric Semiconductor mask making
US4037969A (en) * 1976-04-02 1977-07-26 Bell Telephone Laboratories, Incorporated Zone plate alignment marks
FR2436967A1 (fr) * 1978-09-19 1980-04-18 Thomson Csf Procede d'alignement optique de motifs dans deux plans rapproches et dispositif d'alignement mettant en oeuvre un tel procede
US4360586A (en) * 1979-05-29 1982-11-23 Massachusetts Institute Of Technology Spatial period division exposing
US4326805A (en) * 1980-04-11 1982-04-27 Bell Telephone Laboratories, Incorporated Method and apparatus for aligning mask and wafer members

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4842764A (ja) * 1971-09-29 1973-06-21

Also Published As

Publication number Publication date
US4405238A (en) 1983-09-20
JPS57191502A (en) 1982-11-25
EP0065115B1 (en) 1985-08-07
EP0065115A1 (en) 1982-11-24
DE3265191D1 (en) 1985-09-12

Similar Documents

Publication Publication Date Title
DE3249561C2 (ja)
JPH0422794B2 (ja)
JPH0237202B2 (ja)
JPS6237407B2 (ja)
JPS6058469B2 (ja)
JPS6228983B2 (ja)
IN157351B (ja)
JPH0478625B2 (ja)
DE3108891C2 (ja)
FR2512270B1 (ja)
GR78227B (ja)
DE3211984C2 (ja)
JPH0312226B2 (ja)
JPH0219906B2 (ja)
JPH0445887B2 (ja)
DE3113651C2 (ja)
JPH0232714B2 (ja)
JPS6320305B2 (ja)
FR2503036B1 (ja)
DE3314319C2 (ja)
FR2515730B1 (ja)
JPH0343273B2 (ja)
JPS6161467B2 (ja)
JPS5933809B2 (ja)
FR2509040B3 (ja)