JPS63123115A - Coordinate position detecting method - Google Patents
Coordinate position detecting methodInfo
- Publication number
- JPS63123115A JPS63123115A JP61268509A JP26850986A JPS63123115A JP S63123115 A JPS63123115 A JP S63123115A JP 61268509 A JP61268509 A JP 61268509A JP 26850986 A JP26850986 A JP 26850986A JP S63123115 A JPS63123115 A JP S63123115A
- Authority
- JP
- Japan
- Prior art keywords
- voltage
- auxiliary
- electrodes
- point
- auxiliary electrodes
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000000034 method Methods 0.000 title description 7
- 238000001514 detection method Methods 0.000 claims abstract description 13
- 238000003825 pressing Methods 0.000 claims description 38
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 abstract description 2
- 239000004020 conductor Substances 0.000 abstract description 2
- 229910052709 silver Inorganic materials 0.000 abstract description 2
- 239000004332 silver Substances 0.000 abstract description 2
- 230000000994 depressogenic effect Effects 0.000 abstract 2
- 238000010586 diagram Methods 0.000 description 8
- 238000005259 measurement Methods 0.000 description 5
- 238000004364 calculation method Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 229920006267 polyester film Polymers 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- 230000032683 aging Effects 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 229910003437 indium oxide Inorganic materials 0.000 description 1
- PJXISJQVUVHSOJ-UHFFFAOYSA-N indium(iii) oxide Chemical compound [O-2].[O-2].[O-2].[In+3].[In+3] PJXISJQVUVHSOJ-UHFFFAOYSA-N 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000007935 neutral effect Effects 0.000 description 1
- 235000014347 soups Nutrition 0.000 description 1
- 125000006850 spacer group Chemical group 0.000 description 1
- 235000012976 tarts Nutrition 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野ゴ
本発明は、座標入力装置の座標位置検出方法に関するも
のである。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a coordinate position detection method for a coordinate input device.
互いに近接対向する抵抗シートの抵抗膜を押圧すること
により入力が行われる座標入力装置が、従来から提案さ
れている。2. Description of the Related Art Coordinate input devices have been proposed in which input is performed by pressing resistive films of resistive sheets that face each other in close proximity.
例えば、入力座標を電圧で検出する前記せる座標入力装
置の従来基本例を第9図及び第10図に示すと、1は下
部の抵抗シート、2は上部の抵抗シートで、下部抵抗シ
ート1はポリエステルフィルム等の絶縁基板3の上面に
蒸着法等で酸化インジウムなどの薄い抵抗膜4を被着し
、更に抵抗膜4の両端部にY方向に平行な集電電極5a
、5bを被着形成したものである。また、上部の抵抗シ
ート2はポリエステルフィルム等の可撓性絶縁基板6の
下面に前記同様な抵抗膜7及び抵抗膜7の両端部にY方
向と直交するX方向の集電電極8a。For example, FIGS. 9 and 10 show basic examples of conventional coordinate input devices that detect input coordinates using voltage. 1 is a lower resistance sheet, 2 is an upper resistance sheet, and the lower resistance sheet 1 is A thin resistive film 4 made of indium oxide or the like is deposited on the top surface of an insulating substrate 3 made of polyester film or the like by vapor deposition or the like, and current collecting electrodes 5a are arranged at both ends of the resistive film 4 parallel to the Y direction.
, 5b are deposited. Further, the upper resistive sheet 2 has a resistive film 7 similar to that described above on the lower surface of a flexible insulating substrate 6 such as a polyester film, and current collecting electrodes 8a extending in the X direction orthogonal to the Y direction at both ends of the resistive film 7.
8bを被着形成したものである。この各抵抗シート1.
2は各々の抵抗膜4.7を対向させ、両者間に枠状や点
状等の絶縁スペーサ9を介在させて平行に近接配置され
る。そして、各抵抗シート1゜2の一方の集電電極5a
、8aはスイッチング回路10を介して直流電源11に
接続され、他の各集電電極5b、8bは別のスイッチン
グ回路12を介してアースされる。この各スイッチング
回路10.12は例えばコンピュータ制御されて直流定
電圧を各抵抗シートl、2の各集電電極5a。8b is deposited and formed. Each of these resistance sheets 1.
2 are arranged close to each other in parallel, with the respective resistive films 4.7 facing each other, with an insulating spacer 9 in the form of a frame or dots being interposed between them. Then, one current collecting electrode 5a of each resistor sheet 1.2
, 8a are connected to a DC power supply 11 via a switching circuit 10, and each of the other current collecting electrodes 5b, 8b is grounded via another switching circuit 12. Each switching circuit 10.12 is controlled by a computer, for example, to apply a constant DC voltage to each current collecting electrode 5a of each resistor sheet 1, 2.
5b及び8a、8bに交互に印加する。5b and 8a, 8b alternately.
いま下部の抵抗シート1に直流電圧を印加し、上部の抵
抗シート2をオープン状態にして、上部の抵抗シート2
上から任意の点pをスタイラスや指等で加圧し、各抵抗
シート1.2の抵抗膜4゜7の点pの箇所を点接触させ
る。すると下部の抵抗シート1の抵抗M4にはX方向に
電位匂配が生じて、第9図に示すように抵抗膜4上の点
pに分圧された電圧eXが生じ、この電圧eXは上部抵
抗シート2の集電電極8aから検出される。ここで点p
の座標を(x、y)、下部抵抗シート1の両集電電極5
a、5b間の距離をし、集電電極間電圧をEとすると、
抵抗膜4の単位面積当たりの抵抗値が均一である条件下
で次式が成り立つ。Now apply a DC voltage to the lower resistor sheet 1, open the upper resistor sheet 2, and open the upper resistor sheet 2.
Pressure is applied to an arbitrary point p from above with a stylus, a finger, etc., and the resistive film 4°7 of each resistive sheet 1.2 is brought into point contact with the point p. Then, a potential distribution occurs in the resistor M4 of the lower resistor sheet 1 in the X direction, and a divided voltage eX is generated at a point p on the resistor film 4 as shown in FIG. It is detected from the current collecting electrode 8a of the resistance sheet 2. Here point p
With the coordinates of (x, y), both current collecting electrodes 5 of the lower resistive sheet 1
If the distance between a and 5b is taken and the voltage between the current collecting electrodes is E, then
The following formula holds under the condition that the resistance value per unit area of the resistive film 4 is uniform.
E L
従って、eXを求めることによって点pのX座標が求ま
る。またX座標検出後、直流電圧を上部抵抗シート2に
切換え接続し、下部抵抗シート1をオープン状態にする
と、上記同様の検出原理で点pのX座標が下部抵抗シー
ト1の集電電極5aの電圧e、の検出によって求まる。E L Therefore, by finding eX, the X coordinate of point p can be found. Further, after detecting the X coordinate, if the DC voltage is switched and connected to the upper resistor sheet 2 and the lower resistor sheet 1 is opened, the X coordinate of point p will be set to the current collecting electrode 5a of the lower resistor sheet 1 using the same detection principle as described above. It is determined by detecting the voltage e.
入力座標を正確に検出するためには、(1)式から明ら
かなように各抵抗膜4.7の膜厚を全面にわたって一定
にして、単位面積当たりの抵抗値を均一にすることが必
要である。In order to accurately detect the input coordinates, as is clear from equation (1), it is necessary to make the thickness of each resistive film 4.7 constant over the entire surface and to make the resistance value per unit area uniform. be.
しかし乍ら、各抵抗膜4.7を簿膜に形成することは現
実問題として難しく、どうしても膜厚に若干のバラツキ
が生じる。また抵抗膜4.7には製造工程途上や使用中
に傷が付いて部分的に不連続箇所が生じることがある。However, as a practical matter, it is difficult to form each of the resistive films 4.7 to be a regular film, and some variation in film thickness inevitably occurs. Further, the resistive film 4.7 may be damaged during the manufacturing process or during use, resulting in partial discontinuities.
さらに膜厚がバラツキまた抵抗膜に傷が付いたりしてい
ると、装置の使用温度条件によって抵抗膜の温度変形状
態の部分的な差が大きくなって、第9図の集電電極5a
。Furthermore, if the film thickness is uneven or the resistive film is scratched, local differences in the temperature deformation state of the resistive film will increase depending on the operating temperature conditions of the device.
.
5bに平行になるべき抵抗膜4上の等電位線が歪んでし
まう。The equipotential lines on the resistive film 4, which should be parallel to the resistive film 5b, are distorted.
このように抵抗膜の膜厚差、傷の存在さらには装置の使
用温度条件等で、例えば抵抗膜4上の等電位線が歪むと
、第9図のY軸に平行な同一線上でil1式の電圧eX
が異なることになり、同一のX座標が得られるべきなの
に、その値が異なることになり不都合である。For example, if the equipotential lines on the resistive film 4 are distorted due to differences in the film thickness of the resistive film, the presence of scratches, or the operating temperature conditions of the device, the il1 equation on the same line parallel to the Y axis in FIG. voltage eX
are different, and although the same X coordinate should be obtained, the values are different, which is inconvenient.
本発明は前述せる座標位置検出方法の現状に鑑みてなさ
れたものであり、その目的は抵抗膜の膜厚差、傷の存在
或いは使用温度差等を補償し、部分的測定誤差が極めて
少なくまた迅速に高精度の座標位置の検出を行える座標
位置検出方法を提供することにある。The present invention was made in view of the current status of the coordinate position detection method described above, and its purpose is to compensate for differences in film thickness of resistive films, the presence of scratches, differences in operating temperature, etc., and to minimize local measurement errors. An object of the present invention is to provide a coordinate position detection method that can quickly and accurately detect coordinate positions.
前記せる目的を達成するため、この発明では抵抗膜を有
する二枚の抵抗シートと、これらの抵抗シートのそれぞ
れの抵抗膜の両端に平行に延長形成される集電電極とを
有し、前記抵抗シートのそれぞれの抵抗膜が対向し且つ
それぞれの電極が直交するように配置され、前記抵抗膜
が押圧されて入力が行われる座標入力装置の前記押圧点
の座標位置を検出する座標位置検出方法において、前記
抵抗膜に前記集電電極に平行に複数の補助電極を設け、
前記押圧点を挾む前記補助電極のいずれか一方を特定し
、該特定された補助電極の電圧と前記押圧点の電圧とか
ら前記押圧点位置を演算して、前記押圧点の座標位置を
検出するようにした。In order to achieve the above object, the present invention includes two resistor sheets each having a resistor film, and current collecting electrodes extending parallel to both ends of each resistor film of these resistor sheets. In a coordinate position detection method for detecting the coordinate position of the pressing point of a coordinate input device in which each resistive film of a sheet is arranged so that each resistive film faces each other and each electrode is perpendicular to each other, and input is performed by pressing the resistive film. , a plurality of auxiliary electrodes are provided on the resistive film in parallel to the current collecting electrode,
Identifying one of the auxiliary electrodes that sandwich the pressing point, calculating the pressing point position from the voltage of the specified auxiliary electrode and the voltage of the pressing point, and detecting the coordinate position of the pressing point. I decided to do so.
本発明によると、補助電極によって抵抗膜の集電電極間
には等電位線が形成され、補助電極間における補助電極
に平行な方向の各押圧点では、抵抗膜厚、傷あるいは使
用温度差等による電圧値の変動が大幅に補償されており
、且つ補助電極間の比較的短い抵抗路による電圧測定値
と補助電極の電圧値とで演算が行われるので、迅速に高
精度の座標位置検出を行うことが出来る。According to the present invention, equipotential lines are formed between the current collecting electrodes of the resistive film by the auxiliary electrodes, and at each pressing point between the auxiliary electrodes in the direction parallel to the auxiliary electrodes, there are Since fluctuations in the voltage value caused by It can be done.
以下本発明の実施例を、第1図乃至第8図を用いて詳細
に説明する。Embodiments of the present invention will be described in detail below with reference to FIGS. 1 to 8.
本発明の詳細な説明に使用する第1図は、本発明の実施
例に使用する座標入力装置の構成を示す一部切開平面図
、第2図は第1図のn−n断面図、第3図は本発明の実
施例の回路図、第4図は本発明の実施例における押圧点
を挾む補助電極区間の特定時のフローチャート、第5図
は本発明の実施例における座標位置検出時のフローチャ
ート、第6図は本発明の実施例におけるオフセット測定
時の回路図、第7図は本発明の実施例における押圧点を
挾む補助電極の電圧測定時の回路図、第8図は本発明の
実施例における押圧点電圧測定時の回路図である。FIG. 1 used for detailed explanation of the present invention is a partially cutaway plan view showing the configuration of a coordinate input device used in an embodiment of the present invention, and FIG. Fig. 3 is a circuit diagram of an embodiment of the present invention, Fig. 4 is a flowchart when identifying an auxiliary electrode section sandwiching a pressing point in an embodiment of the present invention, and Fig. 5 is a flowchart when detecting coordinate positions in an embodiment of the present invention. FIG. 6 is a circuit diagram when measuring offset in the embodiment of the present invention, FIG. 7 is a circuit diagram when measuring the voltage of the auxiliary electrodes sandwiching the pressing point in the embodiment of the present invention, and FIG. 8 is the circuit diagram when measuring the offset in the embodiment of the present invention. It is a circuit diagram at the time of press point voltage measurement in the Example of this invention.
本発明の実施例に使用する座標入力装置は、第1図及び
第2図に示すように各抵抗シート1,2の抵抗膜4.7
上に各々の集電電極5a、5b。As shown in FIGS. 1 and 2, the coordinate input device used in the embodiment of the present invention includes resistive films 4 and 7 of each resistive sheet 1 and 2.
On top are respective current collecting electrodes 5a, 5b.
8a、8bと平行な複数本の直線状の補助電極13゜1
4が等間隔に例えば銀ベーストなどの良導電体で形成さ
れている。Multiple linear auxiliary electrodes 13°1 parallel to 8a and 8b
4 are formed of a good conductor such as silver base at equal intervals.
このように複数本の補助電極13.14が形成されてい
るので、これらの補助電極により抵抗膜4.7上に等電
位線が形成され、補助電極間の狭い区間では、抵抗膜厚
差、傷の存在などによる等電位線の歪みが、両側の補助
電極で補償されて極めて小さなものとなっている。Since a plurality of auxiliary electrodes 13.14 are formed in this way, equipotential lines are formed on the resistive film 4.7 by these auxiliary electrodes, and in narrow sections between the auxiliary electrodes, differences in resistive film thickness, Distortions in the equipotential lines due to the presence of scratches are compensated for by the auxiliary electrodes on both sides, making them extremely small.
本発明の実施例においては、座標位置検出に際して最初
に押圧点を挾む補助電極のいずれか一方が特定される。In the embodiment of the present invention, when detecting the coordinate position, one of the auxiliary electrodes sandwiching the pressing point is first specified.
このために、第5図のフローチャートの第1段階で押圧
検出が行われる。実施例に使用する回路では第3図に示
すように抵抗膜4上に形成される各補助電極13−1.
13−2・・・・・・13−7にスイッチSl、S2・
・・・・・S7の一端が0N−OFF可能に接続され、
各スイッチの他端が端子T2に接続されている。また、
スイッチwi、W2・旧・・W8の一端が各補助電極1
3−1.13−2・・・・・・13−8に0N−OFF
可能に接続され、各スイッチの他端が端子T1に接続さ
れている。さらに、スイッチSOの一端が、抵抗Rdの
一端に0N−OFF可能に接続され、抵抗R,の他端は
集電電極8bに接続されている。補助電極14−1・・
・・・・14−8に対してもスイッチS′O・・・・・
・S’7が、全く同様に接続されている。For this purpose, pressure detection is performed in the first step of the flowchart shown in FIG. In the circuit used in the example, each auxiliary electrode 13-1. is formed on the resistive film 4 as shown in FIG.
13-2...13-7 has switches Sl, S2.
...One end of S7 is connected in a 0N-OFF manner,
The other end of each switch is connected to terminal T2. Also,
One end of switch wi, W2/old...W8 is connected to each auxiliary electrode 1
3-1.13-2...13-8 0N-OFF
and the other end of each switch is connected to terminal T1. Further, one end of the switch SO is connected to one end of the resistor Rd in an ON-OFF manner, and the other end of the resistor R is connected to the current collecting electrode 8b. Auxiliary electrode 14-1...
...Switch S'O also for 14-8...
- S'7 is connected in exactly the same way.
スイッチW’l〜W’8の他端とスイッチS°0〜S’
7の他端が、差動増幅器21の入力端子tII+txt
にそれぞれ接続され、入力端子tIIIt!!はそれぞ
れ端子Tz、TIに接続されている。また、差動増幅器
21の出力端子はAD変換器22の入力端子に接続され
ている。The other ends of switches W'l to W'8 and switches S°0 to S'
7 is the input terminal tII+txt of the differential amplifier 21
are connected to the input terminals tIIIt!, respectively. ! are connected to terminals Tz and TI, respectively. Further, the output terminal of the differential amplifier 21 is connected to the input terminal of the AD converter 22.
押圧検出に際しては、スイッチ10は集電電極5a側に
切換えられ、スイッチ12は中立位置に切換えられ、ス
イッチSO及びS′0がONとされる。When detecting a press, the switch 10 is switched to the current collecting electrode 5a side, the switch 12 is switched to the neutral position, and the switches SO and S'0 are turned on.
いま、第3図のp点で押圧が行われ、p点で抵抗膜4及
び7が接触したものとする。前述のようなスイッチの切
換状態では、差動増幅器21の端子t2gはアースされ
、直流電源11の電圧Eがスイッチ5a、抵抗膜4、p
点、抵抗膜7、スイッチSO1端子T2及び端子tl+
を介して差動増幅器21の端子tl+に印加される。こ
のため、AD変換器22からは、押圧の存在を検知する
検知信号が得られるので、第5図のフローチャートの第
2段階での押圧が行われてM a k e L/たか否
かの判定が行われる。Now, it is assumed that pressing is performed at point p in FIG. 3, and the resistive films 4 and 7 come into contact at point p. In the switching state of the switch as described above, the terminal t2g of the differential amplifier 21 is grounded, and the voltage E of the DC power supply 11 is applied to the switch 5a, the resistive film 4, and the terminal t2g of the differential amplifier 21.
point, resistive film 7, switch SO1 terminal T2 and terminal tl+
is applied to the terminal tl+ of the differential amplifier 21 via the terminal tl+. Therefore, since a detection signal that detects the presence of pressure is obtained from the AD converter 22, it is determined whether or not the pressure has been applied in the second stage of the flowchart in FIG. will be held.
次いで第5図のフローチャートの第3段階に進んで、押
圧点を挾む補助電極区間の検出が行われる。この補助電
極区間の検出は、第4図に示すフローチャートに従って
行われる。Next, the process proceeds to the third step of the flowchart of FIG. 5, in which the auxiliary electrode section sandwiching the pressing point is detected. Detection of this auxiliary electrode section is performed according to the flowchart shown in FIG.
この場合第3図において、スイッチ10は集電電極5a
側に切換えられ、スイッチSOがONとされ、スイッチ
SlOは○FFとされ、スイッチ12は集電電極5b側
に切換えられる。このようなスイッチの切換状態では、
集電電極5bに対する押圧点pの電圧が、抵抗膜7、ス
イッチSO1端子T2を介して差動増幅器21の端子t
l+に印加される。In this case, in FIG. 3, the switch 10 is the current collector electrode 5a.
The switch SO is turned on, the switch SlO is turned FF, and the switch 12 is turned to the collector electrode 5b side. In this switch state,
The voltage at the pressing point p with respect to the current collecting electrode 5b is applied to the terminal t of the differential amplifier 21 via the resistive film 7 and the switch SO1 terminal T2.
applied to l+.
この状態で端子T、に接続されているスイッチWI、W
z・・・・・・W8が順次ON状態にされる。先ずスイ
ッチWIがONになると、集電電極5bに対する補助電
極13−1の電圧が、端子T11を介して差動増幅器2
1の端子tz’xに印加される。差動増幅器21では押
圧点pの電圧と補助電極13−1の電圧とが比較される
。ここまでの過程が第4図のフローチャートの第1段階
及び第2段階で行われる。In this state, the switches WI, W connected to terminals T,
z...W8 is sequentially turned on. First, when the switch WI is turned ON, the voltage of the auxiliary electrode 13-1 with respect to the current collecting electrode 5b is applied to the differential amplifier 2 via the terminal T11.
It is applied to the terminal tz'x of 1. In the differential amplifier 21, the voltage at the pressing point p and the voltage at the auxiliary electrode 13-1 are compared. The processes up to this point are performed in the first and second stages of the flowchart in FIG.
第4図のフローチャートの第3段階で、押圧点pの電圧
と端子t、における補助電極13−1の電圧とが所定以
上の差があるか否かが比較される。In the third step of the flowchart of FIG. 4, it is compared whether the voltage at the pressing point p and the voltage at the auxiliary electrode 13-1 at the terminal t are greater than a predetermined difference.
この場合の判定基準は、例えば両者の差が直流電源11
の電圧Eの1/8以下であるように設定される。この場
合、補助電極13−1の電圧と押圧点pの電圧との差は
1/8E以上であるので、第4図のフローチャートの第
4段階に進み、スイッチWIがOFFとされ、スイッチ
W2がONとされる。The criterion in this case is, for example, that the difference between the two is
The voltage is set to be 1/8 or less of the voltage E of . In this case, since the difference between the voltage of the auxiliary electrode 13-1 and the voltage of the pressing point p is 1/8E or more, the process proceeds to the fourth step of the flowchart in FIG. 4, the switch WI is turned OFF, and the switch W2 is turned OFF. It is turned ON.
このスイッチの切換によって補助電極13−2の電圧が
、端子t2から差動増幅器21の端子t。By switching this switch, the voltage of the auxiliary electrode 13-2 is changed from the terminal t2 to the terminal t of the differential amplifier 21.
に与えられて、補助電極13−2の電圧と押圧点pの電
圧とが比較される。The voltage of the auxiliary electrode 13-2 and the voltage of the pressing point p are compared.
この場合も両者の電圧値が1/8E以上あるので、スイ
ッチW2がOFFされてスイッチW3がONとされる。In this case as well, since both voltage values are 1/8E or more, the switch W2 is turned off and the switch W3 is turned on.
この状態で補助電極13−3の電圧と押圧点pの電圧が
比較され、両者の差が1/8E以下なので、第4図のフ
ローチャートの第5段階、第7段階と進んで、補助電極
13〜3が押圧点pを挾む電極であることが判定され、
第5図のフローチャートの第3段階が完了する。In this state, the voltage of the auxiliary electrode 13-3 and the voltage of the pressing point p are compared, and since the difference between the two is less than 1/8E, the process proceeds to the 5th and 7th steps of the flowchart in FIG. ~3 is determined to be the electrode sandwiching the pressing point p,
The third stage of the flowchart of FIG. 5 is completed.
なお、補助電極の選択が押圧点pを越えて選択された場
合には、第4図のフローチャートの第5段階、第6段階
と進んで補助電極の選択方向が変えられる。Note that if the auxiliary electrode is selected beyond the pressing point p, the process proceeds to the fifth and sixth stages of the flowchart of FIG. 4, and the direction of selection of the auxiliary electrode is changed.
次いで第5図のフローチャートの第4段階に進んで、測
定系のオフセットの測定が行われる。Next, the process proceeds to the fourth step of the flowchart of FIG. 5, where the offset of the measurement system is measured.
すなわち、スイッチS4とスイッチW3がONとされ、
押圧点pを挾む補助電極13−3が、第6図に示すよう
に測定系の入力端子に接続され、オフセ゛ント電圧e″
が測定される。That is, switch S4 and switch W3 are turned on,
Auxiliary electrodes 13-3 sandwiching the pressing point p are connected to the input terminal of the measurement system as shown in FIG. 6, and the offset voltage e''
is measured.
次いで、第5図のフローチャートの第5段階に進んで、
押圧点pを挾む補助電極13−3及び13一4間の電圧
が測定される。Next, proceed to step 5 of the flowchart in FIG.
The voltage between the auxiliary electrodes 13-3 and 13-4 sandwiching the pressing point p is measured.
このために、第3図において、スイッチ10が集電電極
5a側に、スイッチ12が集電電極5b側に切換えられ
、スイッチS4とスイッチW3がONとされ、第7図に
示すように補助電極13−3及び13−4間電圧が測定
される。For this purpose, in FIG. 3, the switch 10 is switched to the current collecting electrode 5a side, the switch 12 is switched to the current collecting electrode 5b side, the switch S4 and the switch W3 are turned on, and the auxiliary electrode is turned on as shown in FIG. The voltage between 13-3 and 13-4 is measured.
さらに、第5図のフローチャートの第6段階に進んで、
押圧点pの電圧の測定が行われる。このために第3図に
おいて、スイッチ10が集電電極5a側に、スイッチ1
2が集電電極5b側に切換えられ、スイッチSOがON
にスイッチSIOがONに設定され、第8図に示すよう
に押圧点pの電圧e゛が検出される。Furthermore, proceeding to step 6 of the flowchart in Figure 5,
The voltage at the pressing point p is measured. For this reason, in FIG. 3, the switch 10 is placed on the collector electrode 5a side, and the switch 1
2 is switched to the current collecting electrode 5b side, and the switch SO is turned on.
Then, the switch SIO is set to ON, and the voltage e' at the pressing point p is detected as shown in FIG.
次に第5図のフローチャートの第7段階に進んで、補助
電極13−3及び13−4間距離をK、集電電極5bと
補助電極13−3間距離をkとして、次式によって集電
電極5bと押圧点p間距離、即ち押圧点pのX座標lx
が演算される。Next, proceeding to step 7 of the flowchart in FIG. 5, the current is collected using the following formula, where K is the distance between the auxiliary electrodes 13-3 and 13-4, and k is the distance between the current collecting electrode 5b and the auxiliary electrode 13-3. The distance between the electrode 5b and the pressing point p, that is, the X coordinate lx of the pressing point p
is calculated.
以上は、押圧点pのX座標位置の検出について説明した
が、押圧点pのX座標位置の検出についても、抵抗膜7
と補助電極I4を使用して全く同様に行うことが出来る
。The above describes the detection of the X-coordinate position of the pressing point p, but the detection of the X-coordinate position of the pressing point p is also
This can be done in exactly the same way using the auxiliary electrode I4.
押圧点は複数の補助電極間に挾まれた狭い領域に存在し
、両側の補助電極はそれぞれ等電位線を設定しているの
で、押圧点位置が補助電極に平行に移動しても、抵抗膜
の厚みの変動や傷の発生による押圧点電圧の変動が極め
て小さくなっている。The pressure point exists in a narrow area sandwiched between multiple auxiliary electrodes, and the auxiliary electrodes on both sides have respective equipotential lines, so even if the pressure point moves parallel to the auxiliary electrodes, the resistance film Fluctuations in pressure point voltage due to variations in thickness or occurrence of scratches are extremely small.
従って、測定座標方向と直角方向での押圧点位置の変化
による測定座標値の変動がない。また、変動成分を含む
可能性のある抵抗路を短く取り、この短い抵抗路間で測
定される比較的小さな電圧値と、補助電極間で測定され
る抵抗変動要素を含まない電圧値との比演算に基づく比
例演算で求められる座標位置の検出値は、極めて高精度
のものが得られる。Therefore, there is no fluctuation in the measured coordinate value due to a change in the pressing point position in the direction perpendicular to the measured coordinate direction. In addition, the resistance path that may include a fluctuation component is shortened, and the ratio of the relatively small voltage value measured across this short resistance path to the voltage value that does not include the resistance fluctuation component measured between the auxiliary electrodes is calculated. The detected value of the coordinate position obtained by the proportional calculation based on the calculation can be obtained with extremely high accuracy.
補助電極の電圧は、集電電極間にこれらの補助電極を等
間隔で形成しておくと、集電電極間に印加される電圧値
から、それぞれの電圧が得られる。When these auxiliary electrodes are formed at equal intervals between the current collecting electrodes, the voltages of the auxiliary electrodes can be obtained from the voltage values applied between the current collecting electrodes.
しかし、装置の使用雰囲気や抵抗膜の経年変化などで補
助電極の電圧は僅かに変動するおそれがあるので、座標
位置の検出に際しては、実施例のように最新の電圧値を
測定して演算を行うことが望ましい。また、実施例では
押圧点を挾む一方の補助電極13−3を特定して座標位
置の検出を行ったが、他方の補助電極13−4を特定し
て座標位置の検出を行うことも出来る。However, the voltage of the auxiliary electrode may fluctuate slightly due to the atmosphere in which the device is used or the aging of the resistive film, so when detecting the coordinate position, the latest voltage value is measured and calculated as in the example. It is desirable to do so. Further, in the embodiment, the coordinate position was detected by specifying one auxiliary electrode 13-3 that sandwiched the pressing point, but it is also possible to specify the other auxiliary electrode 13-4 and detect the coordinate position. .
以上詳細に説明したように、この発明によると、押圧点
に近い補助電極を基準にして当該押圧点の座標値を測定
することができるため、測定誤差が少ない極めて高精度
な座標入力装置を提供することができる。As described in detail above, according to the present invention, it is possible to measure the coordinate values of a pressed point using the auxiliary electrode near the pressed point as a reference, thereby providing an extremely high-precision coordinate input device with little measurement error. can do.
第1図は本発明の実施例に使用する座標入力装置の構成
を示す一部切開平面図、第2図は第1図のIT−II線
断面図、第3図は本発明の実施例の回路図、第4図は本
発明の実施例における押圧点を挾む補助電極区間の特定
時のフローチャート、第5図は本発明の実施例における
座標位置検出時のフローチャート、第6図は本発明の実
施例におけるオフセット測定時の回路図、第7図は本発
明の実施例における押圧点を挾む補助電極の電圧測定時
の回路図、第8図は本発明の実施例における押圧点電圧
測定時の回路図、第9図は従来使用されている座標入力
装置の構成を示す一部切開平面図、第10図は第9図の
I−I線断面図である。
1.2・・・抵抗シート、4,7・・・抵抗膜、5a。
5b、8a、8b・・・集電電極、13.14−・・補
助電極、21・・・差動増幅器、22・・・A/D変換
器。
第1図
’4b
糖
第2図 52
va 4 J 13 5b
第3図
升
汁
」
第4図
5tart
第5図
第6図
第7図
第9図
3x
it [−
第1O図FIG. 1 is a partially cutaway plan view showing the configuration of a coordinate input device used in an embodiment of the present invention, FIG. 2 is a sectional view taken along the IT-II line in FIG. 1, and FIG. A circuit diagram, FIG. 4 is a flowchart for specifying the auxiliary electrode section sandwiching the pressing point in the embodiment of the present invention, FIG. 5 is a flowchart for detecting the coordinate position in the embodiment of the present invention, and FIG. 6 is the flowchart for detecting the coordinate position in the embodiment of the present invention. 7 is a circuit diagram when measuring the voltage of the auxiliary electrodes sandwiching the pressure point in the embodiment of the present invention. FIG. 8 is a circuit diagram when measuring the voltage at the pressure point in the embodiment of the present invention. FIG. 9 is a partially cutaway plan view showing the configuration of a conventional coordinate input device, and FIG. 10 is a sectional view taken along the line I--I in FIG. 9. 1.2... Resistance sheet, 4, 7... Resistance film, 5a. 5b, 8a, 8b... Current collecting electrode, 13.14-... Auxiliary electrode, 21... Differential amplifier, 22... A/D converter. Fig. 1 '4b Sugar Fig. 2 52 va 4 J 13 5b Fig. 3 Soup'' Fig. 4 5 tart Fig. 5 Fig. 6 Fig. 7 Fig. 9 Fig. 3x it [- Fig. 1O
Claims (1)
トのそれぞれの抵抗膜の両端に平行に延長形成される集
電電極とを有し、前記抵抗シートのそれぞれの抵抗膜が
対向し且つそれぞれの電極が直交するように配置され、
前記抵抗膜が押圧されて入力が行われる座標入力装置の
前記押圧点の座標位置を検出する座標位置検出方法にお
いて、前記抵抗膜に前記集電電極に平行に複数の補助電
極を設け、前記押圧点を挾む前記補助電極のいずれか一
方を特定し、該特定された補助電極の電圧と前記押圧点
の電圧とから前記押圧点位置を演算して、前記押圧点の
座標位置を検出するようにしたことを特徴とする座標位
置検出方法。It has two resistive sheets each having a resistive film, and current collecting electrodes extending in parallel to both ends of each resistive film of these resistive sheets, and the resistive films of each of the resistive sheets face each other and each The electrodes are arranged orthogonally,
In the coordinate position detection method of detecting the coordinate position of the pressing point of a coordinate input device in which input is performed by pressing the resistive film, a plurality of auxiliary electrodes are provided on the resistive film in parallel to the current collecting electrode, and the pressing One of the auxiliary electrodes sandwiching the point is specified, and the pressing point position is calculated from the voltage of the specified auxiliary electrode and the voltage of the pressing point, and the coordinate position of the pressing point is detected. A coordinate position detection method characterized by:
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61268509A JPS63123115A (en) | 1986-11-13 | 1986-11-13 | Coordinate position detecting method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61268509A JPS63123115A (en) | 1986-11-13 | 1986-11-13 | Coordinate position detecting method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS63123115A true JPS63123115A (en) | 1988-05-26 |
Family
ID=17459493
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP61268509A Pending JPS63123115A (en) | 1986-11-13 | 1986-11-13 | Coordinate position detecting method |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS63123115A (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH02260021A (en) * | 1989-03-31 | 1990-10-22 | Omron Tateisi Electron Co | Coordinate input device |
| JPH02260023A (en) * | 1989-03-31 | 1990-10-22 | Omron Tateisi Electron Co | Coordinate input device |
| JPH02260022A (en) * | 1989-03-31 | 1990-10-22 | Omron Tateisi Electron Co | Coordinate input device |
| JPH06348390A (en) * | 1993-06-01 | 1994-12-22 | Nitsuko Corp | Input coordinate detecting device |
| JP2011034560A (en) * | 2009-07-31 | 2011-02-17 | Chi Mei Electronics Corp | Touch device and its control method |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62295132A (en) * | 1986-06-14 | 1987-12-22 | Omron Tateisi Electronics Co | coordinate input device |
-
1986
- 1986-11-13 JP JP61268509A patent/JPS63123115A/en active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62295132A (en) * | 1986-06-14 | 1987-12-22 | Omron Tateisi Electronics Co | coordinate input device |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH02260021A (en) * | 1989-03-31 | 1990-10-22 | Omron Tateisi Electron Co | Coordinate input device |
| JPH02260023A (en) * | 1989-03-31 | 1990-10-22 | Omron Tateisi Electron Co | Coordinate input device |
| JPH02260022A (en) * | 1989-03-31 | 1990-10-22 | Omron Tateisi Electron Co | Coordinate input device |
| JPH06348390A (en) * | 1993-06-01 | 1994-12-22 | Nitsuko Corp | Input coordinate detecting device |
| JP2011034560A (en) * | 2009-07-31 | 2011-02-17 | Chi Mei Electronics Corp | Touch device and its control method |
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