JPS63101289A - Test run device for elevator - Google Patents

Abstract

(57) [Abstract] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to an elevator testing device, and particularly to a device suitable for elevators that uses a microcomputer (hereinafter abbreviated as microcomputer) in the elevator signal control section.

[Conventional technology] Due to recent advances in semiconductor integration technology, the degree of integration has increased from MSI to
Following LSI, microcontrollers have recently become widespread. This microcontroller is small and low-priced.

Due to its high functionality and low power consumption, it has been incorporated into various industrial products.

The microcontroller is MPU (Micro Process).
er Unit).

ROM (Read Only Memory),
RAM (Random Access Memory)
y I/O (Input/Oputput) boats, etc., but as the prices of these products become lower, so-called one-chip M
PU has also been commercialized.

Such a microcomputer is also suitable for elevator control.

In other words, conventional elevator control is mainly based on relays, which can number in the hundreds, which increases the size of the control device, complicates the relay sequence, and limits the ability to improve functionality.

Most of these problems, such as lack of expandability, can be solved by applying microcontrollers to elevator control equipment, and if we look only at the signal control section using microcontrollers, reliability can be improved. can be improved.

However, in the elevator, inside the car and inside the hoistway.

A large number of electrical devices such as various mechanical switches and drive devices, protective equipment, etc. are scattered in the landing area 2 machine room. Therefore, even if the signal control section of the elevator control device is made into a microcomputer, the overall failure rate will not be drastically reduced.

Therefore, it is necessary to monitor the control status in the same way as in elevators configured with conventional relays.

In addition, when the elevator is delivered, and as necessary thereafter, it is also necessary to conduct a test run for adjustment, inspection, maintenance, etc.

[Problem that the invention seeks to solve]

In conventional relay circuits, elevators can be monitored by checking whether each relay is on or off. On the other hand, when configured using a microcomputer, it is impossible to check how the sequence is operating at all.However, this point can be addressed by displaying the microcomputer control data on the CRT display. is considered.

Regarding the above test operation, in conventional relay circuits, maintenance personnel or the like manually turn on the relay, or continuously turn on the relay with a clip.

Test driving is underway. However, in elevators that use microcomputers, there are only a few locations that can be tested using conventional methods, making it impossible to perform sufficient adjustment, inspection, or maintenance. For this reason, some kind of testing device is desired. Furthermore, the conventional testing method described above has the following drawbacks, and it would be extremely beneficial if these points could be improved at the same time.

(1) Ensuring safety 2. As mentioned above, conventional test runs are performed by continuously closing or blocking relays with clips, so if you forget to put them back at the end of the test run, an abnormal condition will occur under normal service conditions. There is a possibility that it will become.

(2) Improving test accuracy: Conventionally, test operations were only possible within the range where relays could be opened and closed manually, making it difficult to test the entire control system.

(3) Simplification of test operation: Unskilled and unskilled maintenance personnel are required, and test operation requires a long time. This is even more noticeable in group control elevators in which a plurality of elevators are installed side by side.

SUMMARY OF THE INVENTION An object of the present invention is to provide an elevator test operation device that allows easy test operation of an elevator using a microcomputer as a signal control section.

[Means for solving problems]

A feature of the present invention for achieving the above object is that an elevator control device using a microcomputer is provided with a means for performing a test run by changing the timer time limit, and a timer is further provided for starting the test run control means. A means is provided for generating a test run signal including a time limit change command.

[Effect]

As a result, an elevator using a microcomputer, which cannot currently be sufficiently tested, can be easily and quickly test-run by a maintenance worker or the like simply by operating the test-run signal generating means.

〔Example〕

An embodiment of the present invention will be described in detail below with reference to the drawings.

In the following explanation, an example will be described in which the elevators of No. 1 and No. 2 are managed as a group.

FIG. 1 is a block diagram for explaining the overall configuration of an embodiment according to the present invention.

The elevator control system 1 of the No. 1 machine consists of a control circuit 15 having several relays used for safety and configuring sequences such as elevator driving, etc., and buttons 11 for car calls, etc.
Switches 12 for operation selection, etc., limit switches 13 for confirming elevator safety. It is composed of an indicator 14 such as a car call response lamp.

The signal control device 2 of the elevator of No. 1 has an input/output interface circuit 21 with the elevator control system 1, a microcomputer 22 that performs signal control, and a microcomputer 22 to process the elevator sequence program PGM2 preferentially at regular intervals. an interrupt pulse generation circuit 24 that generates an interrupt;
It is comprised of an interface circuit 23 for transmitting and receiving data for performing a test operation according to the present invention and the contents of an elevator control data table to a signal line DLL, and an interface circuit 25 for transmitting and receiving data to and from the first group management control device 7.

The test device 3 includes an interface circuit 31 for transmitting and receiving data with the elevator signal control device 2, a microcomputer 32,
A CRT that is transmitted from the elevator signal control device 2, etc. and displays conventional data and information necessary for operating the test device.
(Cathode Ray Tube) device or other display device, a video control circuit 33 that outputs display signals to the display device 34, a control console such as a keyboard, a signal input device 36 such as a cassette tape, and a signal input device 36 and a microcomputer. Input/output interface circuit 3 with 32
5 and a modem (MODE) that communicates with the remote maintenance device 4.
M) 38, a modem 38, and an input/output interface circuit 37 for the microcomputer 32.

The No. 2 elevator control system 2 and the No. 2 elevator signal control device 5 have the same configuration as the No. 2 device, and have 5 signals 1DL.
1, it is connected to the test device 3. Group management control device 7
The No. 1 elevator signal control device 2 does not have anything equivalent to the input/output interface circuit 21 in terms of hardware;
The configuration is the same except that interface circuits such as the elevator signal control device 5 for the elevators of the elevators and the elevators for the elevators when there are many elevators are added.

However, although the signal processing program by the microcomputer described later is completely different, it is easy for those skilled in the art to understand that the present invention, which will be explained later, can be applied to the group management control device 7. A detailed explanation will be omitted.

Further, the elevator control systems 1 and 6 and the elevator signal control devices 2 and 5, which constitute the entire elevator control device, are not limited to such configurations. A configuration may be adopted in which the control processing is performed by the devices 2 and 5.

Further, although the signal line DLI and the signal lines DL3 and DL4 can be used in common, an example is given here in which separate signal lines are used in order to briefly explain the content of the present invention. In addition, a microcomputer 32 was used in the test equipment 3 with the aim of expanding maintenance functions.

It is also possible to have a simple configuration in which the signal input device 36 and the interface circuit 23 are directly connected. That is, the test device 3 generates a test signal, and is not limited to its specific configuration.

Next, the general operation of the present invention will be explained using FIG. The elevator signal control device 2 receives control input signals from buttons 11, such as a hall call button at a landing, a destination floor button (abbreviated as a car call button) in a car, and a door open/close button on a driving panel in the car.
The input/output interface circuit 21 inputs data to the microcomputer 22 . The microcomputer 22 starts a program that controls the elevator signal using pulses from the interrupt pulse generation circuit 24 at a cycle earlier than the time required for practical use, controls the elevator so that the above-mentioned calls can be serviced efficiently and safely, and controls the input/output. The interface 21 drives and controls relays, devices, and the number of lamps in the elevator control system 1.

This is sufficient if the elevator control device and the entire elevator drive mechanism are always normal, and the signal input/output interface circuit 23 and the like according to the present invention are unnecessary. However, as mentioned above, elevators may experience problems of various sizes several times a year.

For this reason, there are supervisors who constantly monitor the condition of elevators,
Monitoring panels that display information necessary for monitoring and issue alarms are still required as before.

The test equipment @ 3 in FIG. 1 also has the function of this monitoring panel, and transmits the elevator control information from the microcomputer 22 to the interface circuit 23, the signal line DLL, and the interface circuit 3.
1 and then input to the microcomputer 32. Therefore, the test device 3 can diagnose the failure of the plow elevator based on the information inputted from the microcomputer 22, and when the condition is normal, the service status can be notified to the supervisor, and when the trouble occurs, the contents and countermeasures can be notified by the CRT 34.

Furthermore, recently, in order to improve maintenance services, there has been a demand for a centralized monitoring system at maintenance centers.

In such a case, the modem 38 can control communication with the remote maintenance device 4 installed at the maintenance center of the maintenance company. Furthermore, if it is necessary to send and receive information only when a failure is diagnosed by the microcomputer 32 or when a request for confirmation is received from the maintenance center, a telephone line network control unit (abbreviated as NCU) is installed in the modem 38. By adding this, information can be transmitted using general subscriber telephone lines, which have low maintenance costs.

A necessary function when using a microcomputer in an elevator control device is a test function.

Highly efficient and reliable test equipment is desired not only for test runs and adjustment operations after elevator installation is complete, but also for service function checks and group management operation checks during periodic inspections.

For example, you can always register the car calls for both ends of the floor, check the elevator position indicator on each floor for breakage, or perform a sequence check when the car is full by setting the car weight arbitrarily.
It is necessary to check the traffic volume detection function required for group control elevators.

Such test data may be input from the signal input device 36. When testing automatically, by inputting information using a cassette tape or the like, maintenance personnel can concentrate on checking the CRT, resulting in even higher efficiency. Furthermore, if the microcomputer 32 has sufficient capacity, pass/fail judgment and failure diagnosis can be made using correct operation mode information from the cassette tape.

In order to perform the test functions necessary for these monitoring and maintenance, in this embodiment, the elevator signal control device 2
The test equipment includes an input/output interface circuit 23 that connects the microcomputer 22 that forms the center of the test device 3 and a program that controls this input/output.

According to the embodiment shown in FIG. 1 described above, there is no need to provide an individual output circuit for display corresponding to a specific signal that requires displaying a sequence state. In addition, it is equipped with a specific input circuit for a specific control input signal necessary for test operation of the elevator, and a signal from a specific test control signal generator (for example, a button) and a corresponding control input signal line of the elevator control system 1 are provided. There is no need to provide means for serial insertion, switching, or parallel connection.

As a result, the same effect as in the embodiment of FIG. 1 can be obtained.

(1) The code signal interface circuit 23, which can be used for input/output for various purposes, allows the signal line D to be connected by a small number of signals.
Since the test equipment can be connected to the test equipment using LL, the test equipment is not limited to mounting the elevator signal control equipment 2 in the same cubicle, and the signal line DLL can be used as one cable to connect the test equipment 3. It can be made into a removable and easily portable device. Furthermore, if the noise margin is improved by increasing the drive voltage level of the code signal interface circuit 23, the test device 2 can be installed several hundred meters away. Therefore, since it can be moved to any location in the machine room, used in the building manager's room, inside the car, or on the car, it has the effect of finding faults and shortening recovery time, and the test equipment can be shared by many elevators. It has an effect that can be used as

(2) The test device can be simply a ten-key keyboard, or it can be equipped with a microcomputer 32 and a modem 3.
8, it becomes easy to add sophisticated monitoring and testing functions to the elevator control device as necessary.

These can be dealt with by adding or changing some programs of the test equipment@3 and the microcomputer 22. Therefore, improvements after delivery have become extremely easy.

An embodiment of the present invention and its effects have been generally described above, and a first embodiment of the present invention will now be described with reference to FIGS. 2 to 19.

FIG. 2 is a circuit diagram of one embodiment of the test device, showing the relationship with the code signal interface circuit 23. FIG.

The microcomputer 32 includes a microprocessor (abbreviated as MPU) 32o, a random access memory (abbreviated as RAM) 321, and a read-only memory (abbreviated as RO'M) 322. The MPU 320 has an address bus AB.

There is a data bus DB and a control bus CB, and these buses receive signals sent from the elevator signal control device 2, etc., and a keyboard 3, which is a type of signal input device.
A RAM 321 that stores key human input signals from the test device 6 and a ROM 322 that stores programs designed to perform various functions of the test device 3 are connected. Furthermore, these buses are equipped with a preferential interface adapter (abbreviated as PIA) that interfaces with the outside world.
311, 312, a video control circuit 33 that outputs a display signal to the CRT 34; An asynchronous communication interface adapter (abbreviated as ACIA) 37 that interfaces with the modem 38 is connected.

The microcomputer 22 also has the same circuit configuration as the microcomputer 32, and interfaces code signals. PIA23
are connected to the above three types of buses controlled by the microcomputer 22.

Next, an outline of the operation of the microcomputer 22 of the first machine will be explained with reference to FIGS. 3 to 5.

Figure 3 shows a program P that starts processing as soon as the power is turned on.
In the GMI flowchart, the initialization program M100 initializes the internal registers of the PIA used for the input/output interface circuit 21 and the code signal interface circuit 23, and initializes the RAM (generally clears all areas to 11011). The stack pointer is also set at the same time.

In the next step M110, it is determined based on the signal of the bus assignment signal line BCI shown in FIG. do. If so, the program advances to program M2O0, where control is performed to input test data to the microcomputer 22 based on commands input from the keyboard 36. Next, the program proceeds to program M300, where a monitor data transmission program to be transmitted from the No. 1 elevator signal control device 2 to the test device 3 is processed. These two programs control the bus use permission signal BC of the first car if the group management control unit 4 is allowed to use the bus.
I is u O'', and in this case, the determination result in step M100 is NO, and the program waits in step M110. If permission is given to use the bus, these two programs perform loop processing (details will be described later). ) Figure 4 will be explained in particular detail from now on.It is illustrated using the microcomputer 22 of the first machine as an example, and it has RAM and ROM.
FIG. 2 is a conceptual diagram of an address map showing the allocation status of .

There is an area a''k as an address area, where a belongs to an address with a small address value, and k belongs to an address with a large address value.

Address area a is a work memory area used for multiple purposes necessary for MPU 320 calculations. The address area b is an area for storing control input data input from the elevator control system 1. Address area C is an internal data memory area and is created by a program stored in k area.

Address area d is an area for storing control output data to be output to the elevator control system 1, and is created by a program stored in area k.

This at by C, d area is also the address area of the first RAM 1 constituting the microcomputer 22.

Next, the address area e is a test data memory area that stores signals transmitted from the test device 3. Address area f is a test flag area that stores setting data and test flag signals created by the test data receiving program stored in area i.

The e and f areas are the second R area constituting the microcomputer 22.
It is also the address area of AM2.

Next, address area g is the register area of the PIA for the input/output interface shown in FIG. 1, and address area g is the PIA for the code signal interface circuit 23 with the test equipment.
This is the register area.

The address area ly j+k is a program area, i is a program area for receiving and processing test data, and j is a program for transmitting data required by the test device 3 among the information stored in RAM l. Area k is the machine control program area. The area 2 is also an area of the first ROM 1 constituting the microcomputer 22, and the areas i and j are also areas of the second ROM z.

As mentioned above, within one microcontroller, memory,
Duplicate allocation of input/output interface circuits to the same address space is not allowed.

Here, in an elevator control device in which the test device 3 is not always required, the RAM 2 code signal interface circuit 23 and ROMz can be omitted, so these circuits can be mounted separately from other circuits. Additional operations can only be performed during trial run or maintenance. As a result, it is sufficient to prepare one set of circuits for each of a plurality of test and maintenance circuits, resulting in an inexpensive test system.

FIG. 5 shows the machine control program PGM activated by the interrupt pulse CLz from the interrupt pulse generation circuit 24 shown in FIG.
z general flowchart (hereinafter abbreviated as GFC) is shown.

When an interrupt signal enters the MPU of the microcomputer 22 from the outside,
First, step MI related to the test equipment described in FIG.
The processing of IO and programs M2O0° and M2O3 is temporarily interrupted, various registers are saved, and then the processing of the program shown in FIG. 5 is performed.

First, the processing of the timer control program of program M400 is executed, and it is determined in the sequence program PGM21 whether the programmed predetermined time limit has expired based on the time limit elapsed count of the timer that is requested to count and the size of the count value of the timer, and the timer is output. Performs timer control such as setting flags. When all timer processing is completed, the program advances to program M440, where a program for inputting control input signals from the elevator control system 1 is processed.

Next, the newly input control input data and the RAM
Processing is performed by a sequence program PGM21 that uses internal data stored in RAM z and RAM z as input data. Controls typical functions of the sequence program PGM21. Although seven task programs are shown in FIG. 5, consisting of program amount 4f0 to program M650, in general, much more programs than these are incorporated. The present invention relates to the machine control program shown in FIG. 5, but for the sake of brevity, a description of these general functions will be omitted.
A description of programs directly related to the present invention will be given later when explaining FIGS. 17 to 19.

As a result of processing these sequence programs PGMI,
That is, the data stored in the control output data memory area e is transferred to the elevator control system 1 by the program M690.
For example, by outputting the signal to the controller, a car response light is turned on or a door opening/closing control command is issued.

When the above-mentioned processing is completed, all the processing of the interrupt program is completed, and the process returns to the processing of the program related to the test device that performs the re-handling processing shown in FIG. 3.

Next, we will explain the operation summary of the microcomputer 32 of the test equipment 3 in the sixth section.
This will be explained with reference to the drawings and FIG.

Figure 6 shows the program PGM starting at the same time as the power is turned on.
Initialize program M with 70 flowcharts
710 is PIA311 shown in FIG. 2 and PIA31
2, and a PIA which is an embodiment of the interface circuit 35.
, the initial settings of the internal registers of ACIA37, and the RA
M321 and the initial setting of the internal memory of the video control circuit 33 (generally, all areas of the RAM 321 are cleared to ON). Next, the programs M720 and M730 are processed in a loop. Program M720 performs input/output control of the signal input device 36 for inputting commands necessary for test operation, and program M730 performs output control of data to be displayed on the CRT.

FIG. 7 shows the elevator control block (2.4. in FIG. 2).
The program PGM80 is activated by the interrupt signal RC from 5), and controls the use permission signal of the common data bus DCB, transmission of test data, reception of control data, failure detection and its automatic recording and notification. .

Prior to the detailed explanation of FIG. 7, the control method of the common bus DCB and the overall operation of FIG. 2 to which the present invention is specifically applied will be explained with reference to the time chart of FIG. 8.

Interrupt processing program PGM2 that controls the operation of Unit 1 when the bus use permission signal BCI of Unit 1 is It I II.
Immediately after completion of the program, programs M2O0 and M2O3 (symbol 0) are executed, which transmit and receive encoded signals necessary for testing and maintenance, process test data, and control test operation.

At the same time as this processing is completed, the bus use permission signal BCI becomes "0", and the program PGM 1 of the first machine loops through step M110.

Since the program PGM'2 is activated at regular intervals by the fall of the interrupt pulse CL2 at times t1 and t2, the operation of the elevator is smoothly controlled by the microcomputer 22 having the necessary response speed.

As shown in FIG. 8, the bus permission signals BCI to BC3 are cyclically controlled without ever wrapping, so that other control device blocks are equally controlled.

As shown in FIG. 8, the test device 3 is a program that performs interface processing with an input device such as a keyboard and creation of display data on a CRT by connecting time periods in which the interrupt processing program PGM80 is not activated. Loop processing M720 and M730.

Returning to the explanation of FIG. 7 again. In step M805, when the one-time program PGM80 is activated by the interrupt signal RC, the transmission/reception control signal RC is masked for the purpose of being used not as an interrupt signal but as a data establishment signal until it is completed.

In step M810, as shown in FIG. 10, it is determined that the first transmitted block signal and the integer 2 indicating the control device block signal outputting the bus use permission signal match. If NO because there is a mismatch, record the Q at that time and the received block number, and jump to program M850 since the next block may be normal.

If YES, the test data transmission program M820 and the control data reception program M840 perform processing using a handshake method with the microcomputer of the permitted block. When this is completed, the bus use permission signal is temporarily turned OFF in step M849, thereby preventing the test device from proceeding uselessly with the processing corresponding to the program PGMI in each block while executing the failure-related programs M890 to M894. Next, program M89 checks the rationality and safety of the signal received by program M840.
The result of processing 0 is determined in step 892, and if it is determined to be a failure, an alarm or notification is sent to the remote maintenance equipment installed in the building manager's office or a maintenance company in another building via the ACIA 37 and modem 38. It performs control such as sending information and storing it.

Now that the processing of block ρ has been completed, program M8
At step 50, Q is cyclically controlled, and program M870 outputs it. At step M880, the interrupt is released, and the test device completes preparations for transitioning to processing of the next block.

As a countermeasure when a certain block is in a completely stopped state, program M740 is added to FIG. 6, and the program is improved so that if no interrupt pulse RC is input for a certain period of time or more, the program proceeds to the next block.

Next, the test data reception program M that forms the center of the present invention
An example of 2O0 will be described in detail with reference to FIG.

First, in step M2O2, a code for making the test device confirm that it is a transmission request for its own block number and test data is transmitted to the test device as the first transmission/reception data, and the interrupt program PGM8 of FIG.
0 is activated to the communication control signal RC.Next, initial settings for receiving and processing the five data shown in FIG. 10 from the test device 3 are performed in step M2O.
Do it in 4.

Next, a loop of steps M2O6 and M2O7 waits until RTB, which serves as a 1-byte data transmission completion signal from the test device 3, reaches 141 I+.

It is confirmed whether the block number of the first transmission/reception data ELNO of the data bus DTB to which this data is input matches the own block number, and if they match, the steps M210 and M218 for monitoring the signal RTB are looped again.

The second received data T is transferred from the test device 3 to the data bus DTB.
When STCD is sent, the determination of this loop is at step M
210 becomes YES, and the second received data is stored in area e in FIG. 4 in step M212. Next step M2
At step 14, the counter C is incremented by +1. Incidentally, since the counter C was set to the numerical value O in step M2O4, the counter C becomes the numerical value 1. The third one received one after another. When storing the fourth and fifth received data to their respective addresses in step M212, the value of counter C is used, so it has the role of increasing the value to 1.2.3.

In step M216, since reception is complete in this embodiment when the fifth received data is received, it is determined whether the value of the counter C has reached 4, and the process proceeds to step M220.

Here, the test code TSTCD already stored in the test data memory area e is checked, the start address of the program corresponding to this is selected, and in the next step M222, a jump is made to the test program at the selected start address, Run this.

Note that steps M2O7 and M218 are performed by the test device 3.
This is to detect when the test operation is stopped or when test data is not being sent from the l~ syllable of software or hardware related to test data transmission. be.

It is also assumed that upon completion of the test, the test device 3 is disconnected from the elevator signal control device 2 using a detachable connector 26, such as a socket and a connector. As a result, test data is not received, so step M
2O7 or M218 determines that overtime has occurred, and step A224 is activated to clear all test data flags created in the past. Here, the bus use permission signal of the separated block is configured to be "1", and the determination at step M110 in FIG. 3 is YE.
It is designed to be S.

Further, due to a trouble in the test device 3, if test data is not transmitted within a predetermined time interval, it will be determined that the test is overtime, and if there is a malfunction, the determination will be No in step M2O3, and the program in step M224 will be started.

When step M224 is executed, all test functions can be stopped, so functionally the failed test device is automatically disconnected.

The effect of the embodiment related to FIG. 9 is that the mutual influence between the reliability of the test device and the reliability of the elevator signal control device can be extremely reduced.

Further, it is possible to prevent troubles such as forgetting an instruction to cancel a test operation through an input operation of the test device.

An example of the test code TSTCD and its test function is shown in FIG. 10 and Table 1 below.

Table 1 Here, a specific example of the test program M270 from test code 02's timer advance control test program M230 to test code 10's car weight setting control will be described with reference to FIGS. 11 to 15. Other test operation control programs can be created in the same way, but detailed explanations will be omitted.

Note that the types of information indicated by the test data included in the third to fifth received data shown in FIG. 10 differ depending on the test code. Further, if the number of service floors exceeds 24 floors, a large amount of test data will be required, and in this case, the judgment value 4 in step M216 in FIG. 9 may be increased.

In addition, the data length of the signal can be made variable according to the test code TSTCD, and a part of the test code can be made independent.
It is easy to control by adding a code that indicates the data length before and after the test code.

In such a case, the number 4 in step M216 becomes a variable,
Although FIG. 9 requires a slight change in the flow, it is easy for a person skilled in the art to do so.

Now, one embodiment of timer early test control will be described in detail with reference to FIGS. 11, 16, and 17.

The program M230 in FIG. 11 is the second received data TS.
The 10th step M232 shows the test program M230 for early control of the timer, which is started and executed in step M222 of FIG. 9 when the TCD value is 02.
By determining the numerical value of the first test data TSTDTI shown in the figure and determining whether it is 01 or not, it is determined whether the test command is a test command to start timer advance control or a test command to terminate timer advance control.

In the former case (TSTDT1=01), the answer is YES, and the timer early test flag FTI is set in step M234.
Set M to "1".

In the latter case, the answer is NO, and the timer early test flag FTIM is cleared to 110'' in step M236.

Also, as explained earlier, when the program in step M224 in FIG. 9 is executed, the test flag FTIM is set to "0".
” will be cleared.

In this way, the test flag FTIM controlled by the test data reception program M20.0 is used to determine whether or not to control the timer control program M400 to advance the timer.Explanation of the timer control program M400 shown in FIG. For the purpose of making it easier, we will provide an overview of timer control in general.

The timer control program M400 is activated every cycle of the interrupt pulse CL2, as shown in FIG. For example, if this cycle is 10 m5, the timer control program that forms part of the program PG2 is started every 10 m5, so the MPU of the microcomputer 22 is 8 bi
t machine, 1 byte (8 bits) as the internal data register for the sequence timer counter.
shall be used. The maximum delay time for this special benefit is 2'X10mX10m5=256X10.56
Seconds. This makes it difficult to create timers that require long time limits, such as automatic door closing time, M-G automatic stop time, door opening extension time, rope stretch compensation termination time, 1-clock timer, and traffic sample timer. I can't.

In addition, there are timers for which it is desired to advance the timer based on instructions from the test device 3 (including all of the seven cases described above), and cases for which it is not desirable to advance the timer for safety reasons, such as the time limit for switching from M-G to Y-. There are cases where testing efficiency does not improve even if the timer is set earlier, such as a timer of less than 1 second.

Based on the above-mentioned two circumstances, in this embodiment, reference pulse registers PTMA and PTMB for two types of timers each having 1 byte are provided, and in the program M418 shown in FIG. 17, the count of each sequence timer is based on these standards. Select any pulse from among the pulses and count UPL, it only when this pulse is “1”
When the value is "O", processing is performed to hold the count value.

However, only the reference pulse register PTMB is configured so that the pulse interval can be shortened to 1/32 by the instruction of the timer early test flag. Therefore, a sequence timer that requires a faster timer uses the pulse in register PTMB as a reference pulse.

For example, in a 60-second sequence timer A that requires an early timer, the 0th bit of register PTMB is 0.
After counting 94 reference pulses of 64 m5 (described later), the program is configured so that the output of this sequence timer A is set to "1".

If the 60-second timer is set to early operation using the timer early test function, it will operate in approximately 2 seconds, resulting in the effect of speeding up sequence checking.

Figure 16 shows program M for creating reference pulse PTMA.
401 is explained.

First, the internal data of the counter CTMA is stored in step M40.
2 allows A CCA (accumulator A
) A.

Load and then take the complement. That is, the process rACC^←CTMAJ shown in FIG. 16 is performed.

In step M404, the counter CTMA is counted up by one. That is, rCTMA←CTMAt
Perform IJ processing.

Next, in step M406, ACC^ and counter CT
The result of the logical product of MA for each bit is sent to the reference pulse register PTMA.

That is, the process ``rPTMA4-CTMA-ACC^'' is performed.

Register CTMB by program M407 is also basically created by the above operations.

This can be summarized as follows. Both programs set “1” from II OII in each bit of the counter.
The bit of the reference pulse register that is the same as the bit that changed to
t becomes "1" only for a period of 10 m5 when the program M400 is started next.

The difference between program M407 and program M401 is that step M41'0 and step M412 are added, and other steps M408, M414. M
The method of processing 416ρ is the same as that of program M401.

In step M410, it is determined whether or not the aforementioned test flag FTIM has become '1' due to the timer advance command.

If it is 0'', the result is No, and the 4th bit reference pulse PTMA4 of the reference pulse register PTMA is determined from step M412.If it is 1'', step M
The process advances to step M414 and the counter CTMB is incremented by 1. If it is "0", the value of the counter CTMB is held and in step M416, all bits of the register PTMB become "O".

In other words, the pulse interval of the 0th bit reference pulse PTMBo of the reference pulse register PTMB is 640 m.
5 (2X2”X10m5).

This is because the program M 401 is started every 10 m5 and a reference pulse is created by detecting the rising edge, so the pulse interval of the reference pulse PTM A o is 20 m5 (2
x 10m5). Therefore, the reference pulse P TMA4
This is because the area is 320m5 (2 x 2nd x 10m5).

On the other hand, the test flag FTIM =
II I 11, the determination in step M410 is YE.
S, the reference pulse register PTMA program M
As with 401, the counter CTMB counts up every time.
Therefore, the reference pulse P T M B .

The pulse interval of 640 m5 was shortened to 20 m5.

Therefore, among the sequence timers controlled in step M418, those using the reference pulse register register PTMB as the reference pulse can operate earlier than the timer time limit 1732, thereby improving the sequence check efficiency during maintenance.

Next, an embodiment of the test program M240 for car call set control will be described with reference to FIG.

When the value of the second received data TSTCD is 04, the test program M240 shown in FIG. 12 is activated. Next, in step M242, interrupt masking is performed to prevent this program from being interrupted by the interrupt pulse CL2. (The reason will be explained later) Next, in step M244, the test data TSTDTI and TSTDT2 are stored in the car call button input data table. The next step constitutes a part of the machine control program PGM2 shown in FIG.

The subroutine of the car call registration program M500 (details will be described later) is used as is, started up, and executed.

As a result, new registration (set) of some or all car calls can be performed using the test data signal sent from the test device.

In step M246, the interrupt mask is canceled and control is performed so that program PGM2 can be activated.

In this embodiment, the test data for car call setting is stored at the address where the control input data from the car button is stored, and a part of the original car control program PGM2 is used for test processing.

For this reason, if an interrupt occurs during this test process and program PGM2 is started, the program M44
Since the test data will be corrupted by 0, it is necessary to block interrupt processing for a short period of time to prevent this.

Next, an embodiment of car call registration cancellation test control will be described in detail with reference to FIGS. 13 and 19.

The test program M250 in FIG. 13 is started in step M222 in FIG. 9 when the value of the second received data is 06.

When the test flag FCRGCR for clearing all car calls is set to "1" in step M252 and the subroutine M500 is activated in the next step, if the test flag FOROCR is "I II", all car calls are cleared.

In the next step M254, the test flag FCRGCR is returned to "011" so that when the subroutine is subsequently executed by the program PGM2, the all-cancel test control will not be performed.

FIG. 19 is a flowchart illustrating in detail the subroutine call registration tt=program M500.

In the first step M502, it is determined whether the value of the service mode 5MN0, which is internal data created by the service method selection control program M470, is 8 or more.

Table 2 shows an example of the relationship between the value of the test mode number 5MN0 and the service method.

Table 2 As you can see, the car call registration using the destination floor button in the car and the service of that call are in test mode number 5M.
N0 is limited to 8 or more.

Step M502 utilizes this to execute the determination of the presence or absence of the car call service at a high processing speed.

If it is less than 8 and the determination is No, step M510
Proceed to , close a part of the output data table area, and clear the call registration output data to It O11.

Also, if it is 8 or more, it becomes YES and the next step M50
4, the test program M230 in FIG.
” is “1”. Generally, it is 1101j and N
The determination is O and the process advances to step M506. In this step, in the next step M508, it is determined whether control is to be performed to determine the presence or absence of the control input data CAGCRB for the call/cancel button, whether or not it is attached to the in-car turntable.

In the embodiment shown in FIG. 19, the above-mentioned call cancellation button is enabled only during manual operation by a driver with service mode number 8 and dedicated operation such as when carrying luggage by a specific user with service mode number 9. shall be. In this case, the answer is YES, and step M508 is processed. If the cancel button has not been pressed, the answer is NO, and a program for setting a car call and resetting the car call upon service termination is activated in step M520.

Next, the continuous registration test control will be explained with reference to FIGS. 14 and 17.

FIG. 14 shows a test program M260 that performs continuous registration control, and is started in step M222 of FIG. 9 when the value of the second received data is 08. Step M
262, the first test 1-data TS which is the third received data
Depending on whether the value of TDTI is 01 or not, proceed to step M264 where the continuous set flag FCAGC3 is set to "1'" or step M where it is reset to "0".
We are deciding whether to proceed to 268.

If the first test data TSTDTI is 01, the process advances to step M264, and then to step M266, where the second test data TSTDT2 and the third test data TST
DT3 is stored in the memory area of car call test data DCAGC.

Next, using FIG. 18, we will explain how these test data and test flags lead to continuous registration.

Figure 18 shows PGM2 of the machine control program shown in Figure 5.
This shows a part of the control input signal input program M440 included in the control input signal input program M440.

Step M442 stores the control input signal from the call button in area CAGCB.

In step M444, the call continuous set flag FCA
It is determined whether GCS is '1', and if it is '1', the logical sum of the car call test data DCAGC and the car call button input data CAGCB stored in step M442 is calculated and stored in the CAGCB table.

In other words, once the test flag FCAGC3 becomes 1", no matter how many times the machine control program PG2 is started,
It is set to "1" by the set test data DCAGC, and consecutive calls are registered.

To end the continuous registration test control, input this command from the keyboard 36, and the microcomputer 32 inputs this command with 08 as the test code number and 02 as the next first test data TSTDTI, for example (if it is other than 01). Anything is OK.).

Next, car weight setting test control is performed according to FIGS. 15 and 18. The test program M270 in FIG. 15 executes step M222 in FIG. 9 when the value of the second received data is 10.
It is started with .

In step M272, the car weight setting flag FCATG is determined depending on whether the value of the first test data TSTDTI is 01 or not.
Do you proceed to step M274 where the WS is set to 111” (t
It is determined whether to proceed to step M278 for resetting to OII.

If it is true, step M276 is activated following step M274, and the second test data TSTDT2 is stored in the car weight setting test data DCAGlil.

Partially set car weight setting test data DCAGW
The value of the flag FCAGS will not change until it is canceled or other test data with a different set value is input.

The car weight setting flag and test data controlled as described above are shown in step M451 and step M453 in FIG.
Use with.

When the setting flag FCAGWS is 01, step M4
51 becomes YES, and the test data DCAGW is transferred to the control input data area CAGW.

On the other hand, when the keyboard of the test equipment is operated to reset the flag FCAGW to "OIt", step M45
1 becomes No, and the process proceeds to step M452, where the signal indicating the weight from the elevator car weight detection device is sent to the control input data area CAGW.

The car weight input data CAGW controlled in this way is
Full occupancy and overload detection control program M shown in Figure 5
605. That is, input data CAG
If the value of W is large, it is determined that the hall is full, and the hall is called out.
Performs controls such as turning on the full-occupancy light. Furthermore, if the value is large, overload detection is performed, and controls such as sounding the BZ on the car and preventing door closing are performed.

In addition, the call control program M650 is registered with the value of car weight input signal data CAGW (approximately proportional to the number of passengers). It is determined that there has been a registration, and controls such as warnings and cancellations are performed.

In this way, when performing control processing based on car weight and inspecting the elevator control system, the car weight can be freely set from the keyboard of the test equipment without having to load and unload a 1,000 kg weight dozens of times. Increased efficiency.

Step M471 in FIG. 18 is a specific example where operation from the test device is prohibited for safety reasons.

Although one embodiment has been described in detail above, the present invention is not limited to this, and modifications can be easily made as follows.

In the embodiment shown in FIG. 1, the signal transmission/reception line DL3. Although the signal transmission/reception line DLL that sends and receives test data to and from DL4 is separate, the signal line DLL
By performing management control of the signal line DLI such as bus distribution control, the transmission and reception signals of signals DL3 and DL4 are distributed to the line line DLL.
It can be sent and received.

Furthermore, two types of test equipment 3 are provided, one for monitoring and one for inspection, and are normally used as the monitoring terminal and as a connection device between the elevator signal control device and the remote maintenance device. Control of long-distance signal line DL2 using general subscriber telephone line, etc., encoding to reduce data transmission/reception signals, control of encoding, temporary storage of failure judgment and status signals, and transmission to remote maintenance equipment. Performs transmission start control, etc.

Therefore, in some cases, devices, circuits, and control means related to CRTs and signal input devices are not required, and the monitoring and maintenance device can be made inexpensive and compact. It can also be used as a test command check device for inspection during trial operation, maintenance, or in the event of a failure, and can be made into a device that does not require a modem-related device.

〔Effect of the invention〕

As described above in detail with reference to the embodiments, according to the present invention, an elevator using a microcomputer, which cannot be sufficiently tested at present, can be tested very easily. Therefore, it is possible to perform high-accuracy tests in a short time without the need for experienced test personnel.
Inspection and maintenance work becomes significantly easier.

[Brief explanation of the drawing]

The figures are an embodiment of the present invention and an explanatory diagram of its operation, in which FIG. 1 is a block diagram showing the overall configuration, FIG. 2 is a circuit diagram of an embodiment of a test device, and FIG. 3 is a program of an embodiment. Fourth
The figure shows the memory map of the machine control section, Figure 5 shows the machine control program, Figures 6 and 7 show the test equipment control program, Figure 8 is a time chart explaining the operation, and Figures 9 to 15 show the test. An example program for data reception, 1st
FIG. 6 is an explanatory diagram of the operation of a program for creating a timer reference pulse register, and FIGS. 17 to 19 are detailed diagrams of the machine control program. 1.6...Elevator control system, 2,5...Elevator signal control device, 3...Test device, 4...Remote maintenance device, 7...Group management control device.

Claims (1)

[Scope of Claims] 1. In an elevator in which a microcomputer is used in the signal control unit of an elevator in service between multiple floors to control the operation of the elevator, there is provided a means for controlling test operation by changing a timer period; 1. A test operation device for an elevator, comprising: means for generating a test operation signal including a timer time limit change command for activating a test operation control means. 2. The test operation device for an elevator according to claim 1, wherein the timer time limit changing means is a means for shortening a door opening/closing time limit and an operation pattern switching time limit.