JPS6282306A - Method and device for detecting breadthwise position of metallic ingot - Google Patents
Method and device for detecting breadthwise position of metallic ingotInfo
- Publication number
- JPS6282306A JPS6282306A JP22325985A JP22325985A JPS6282306A JP S6282306 A JPS6282306 A JP S6282306A JP 22325985 A JP22325985 A JP 22325985A JP 22325985 A JP22325985 A JP 22325985A JP S6282306 A JPS6282306 A JP S6282306A
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- video signal
- voltage
- comparator
- voltage difference
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Abstract
Description
【発明の詳細な説明】
[産業上の利用分野]
本発明は、高温の金属塊の幅方向位置を検出する際に検
出演算視野中を水や水蒸気等の外乱が遮った場合でも、
良好な精度で金属塊の幅端位置を検出し得るようにした
、金属塊の幅方向位置検出方法及びその装置に関するも
のである。[Detailed Description of the Invention] [Industrial Application Field] The present invention is capable of detecting the widthwise position of a high-temperature metal lump even when disturbances such as water or water vapor block the detection calculation field of view.
The present invention relates to a method and apparatus for detecting the widthwise position of a metal lump, which enables the width end position of the metal lump to be detected with good accuracy.
[従来の技術]
圧延又は連続加工では、製品歩留りを向上するうえで精
密な板幅管理が望まれる。特に熱間圧延の場合は、圧延
n−’c水平圧下すると圧延材に幅広がりが生じるが、
これを放置したまま圧延を繰返すと、製品板幅が設定値
よりも極めて大きいものとなり、後工程のサイドトリミ
ング等で切捨てる部分が増大し、歩留りの低下を招来す
る。[Prior Art] In rolling or continuous processing, precise sheet width control is desired in order to improve product yield. Particularly in the case of hot rolling, when rolling n-'c horizontal reduction occurs, the width of the rolled material widens;
If rolling is repeated with this condition left as is, the width of the product sheet will be much larger than the set value, and the portion to be cut off during side trimming or the like in the subsequent process will increase, leading to a decrease in yield.
一方、ジングルスタンドにおけるリバース圧延、連続ス
タンドにおける先後端部通過時等の無張力圧延において
は、蛇行が生じ易いため、圧延材の蛇行聞を検出して、
左右のロールギャップの調整を行う必要がある。ところ
が、従来の圧延荷重差に基づいて蛇行を検出して制御す
る方式では、圧延材の端折れによる端部2枚噛みゃ先後
端の不規則形状部の圧延時に発生する圧延荷重差等を蛇
行税象と判断し、圧下レベル調整を狂わし、かえっで圧
延作業を中断させる、等の致命的な欠陥があった。On the other hand, meandering tends to occur during reverse rolling in a jingle stand and in tensionless rolling when passing the leading and trailing ends in a continuous stand.
It is necessary to adjust the left and right roll gaps. However, with the conventional method of detecting and controlling meandering based on the rolling load difference, the difference in rolling load that occurs during rolling of irregularly shaped parts at the leading and trailing ends of the rolled material due to the bending of the two ends is detected and controlled. There were fatal flaws such as a tax error, which disrupted the rolling reduction level adjustment and even caused the rolling operation to be interrupted.
そこで、最近では、熱間圧延材、連鋳材等の加熱fL属
塊の板幅或いは蛇行等を高精度で制御することが望まれ
、その基になる板幅或いは蛇行等の検出手段として光学
的幅方向位置検出器が開発されている。この装置uは第
4図に示す原理に基づいている。Therefore, in recent years, it has become desirable to control the plate width or meandering of heated fL metal ingots such as hot-rolled materials and continuous cast materials with high precision. A target width direction position detector has been developed. This device u is based on the principle shown in FIG.
すなわち、圧延材1の下方から投光器2により圧延材1
を投光し、上方、つまり圧延材1の表面方向部位に設け
た受光器3によって圧延材1に遮蔽されない部分の受光
ωを測定し、板幅を検出するものである。受光器3には
、光電索子(フォトダイオード)を利用したもの、テレ
ビカメラ式撮像管を利用したもの等があるが、以下、充
電素子を利用したものについて説明する。テレビカメラ
°式躍像管を用いた場合も原理的には変らない。光電素
子4は投光器2と平行に、複数個、直線状に配列され(
個数単位として一般に「ビット」を用いる)、レンズ5
を通して集光した象の受光値に比例した電気信号6を発
する。この受光はを所定の変換器により一部レベルでス
レッシュホールドすることにより、電気信号をオン、オ
フ2種類の同明信号1に変換する。1ビット当りの集光
距離はレンズ5の集光角度2α(又は集光範囲L)及び
被測定物としての圧延材1とレンズ5との間の距l!!
!iHによって定まるので、全光電素子数をNビットと
すると、板幅Wは次式で求めることかできる。That is, the rolled material 1 is illuminated by the floodlight 2 from below the rolled material 1.
The light receiver 3 provided above, that is, in the surface direction of the rolled material 1, measures the received light ω in a portion not shielded by the rolled material 1, thereby detecting the sheet width. The light receiver 3 includes one that uses a photodiode, one that uses a television camera type image pickup tube, etc., but one that uses a charging element will be described below. The principle remains the same even when a television camera angle tube is used. A plurality of photoelectric elements 4 are arranged in a straight line parallel to the projector 2 (
"bit" is generally used as a unit of quantity), lens 5
It emits an electrical signal 6 proportional to the received light value of the elephant focused through the lens. This received light is thresholded at a partial level by a predetermined converter, thereby converting the electrical signal into two types of Domei signals 1: on and off. The focusing distance per bit is determined by the focusing angle 2α (or focusing range L) of the lens 5 and the distance l! between the rolled material 1 as the object to be measured and the lens 5! !
! Since it is determined by iH, if the total number of photoelectric elements is N bits, the plate width W can be determined by the following equation.
w−L、x (N−(Nl +N2 ) )/N=2H
CanαX (N (Nl +N2 > )/N
−□□C:)而して、このような板幅検出手段を圧延材
等の蛇行検出に適用することも考えられ、既に一部では
実施されているが、特に熱間圧延では圧延材自体が80
0℃前後の高温であるため、第4図に示す投光器2を廃
して圧延材自体の光を検知する方式が有効である。この
場合の原理を第5図により説明すると、圧延材1の左右
両側、すなわち、ワークサイドとドライブサイドの夫夫
に受光器8,9を設け、該受光器8,9により圧延材1
の光を検知するようにする。検知時には、受光素子10
.11の各ビットごとに集光が行われ、各ビットごとに
集光された光の強さに比例づ−る電圧が発生する。例え
ば、受光格子10 F検出された電圧と受光素子10の
各ビットどの関係を図示すると第6図に示すようになり
、電圧差が発生し始めた位置が圧延材1のワークサイド
側端部として検知される。なお、第6図を映像信号と称
する。第6図において、tsは夫々の受光素子10.1
1の全ビットの走査に要する走査同門、■は圧延材幅端
光格差を表わす゛電圧である。w-L, x (N-(Nl +N2))/N=2H
CanαX (N (Nl +N2 > )/N
-□□C:) Therefore, it is possible to apply such a strip width detection means to detect meandering of rolled materials, etc., and this has already been done in some cases. is 80
Since the temperature is around 0° C., it is effective to eliminate the floodlight 2 shown in FIG. 4 and detect the light from the rolled material itself. The principle in this case will be explained with reference to FIG.
to detect light. At the time of detection, the light receiving element 10
.. Light is focused for each of the 11 bits, and a voltage proportional to the intensity of the focused light is generated for each bit. For example, the relationship between the voltage detected by the light-receiving grating 10F and each bit of the light-receiving element 10 is shown in FIG. Detected. Note that FIG. 6 is referred to as a video signal. In FIG. 6, ts represents each light receiving element 10.1
The scanning voltage required to scan all bits of 1 is the voltage representing the optical difference at the width edge of the rolled material.
ところで、一般的には圧延材の種類によって温度が貸な
るため、第5図に示す受光器8.9へ入る先触に温度に
よる差が生じる。すなわち、温度の高い圧延材で走査口
)間tsを大きくすると、受光素子10.11への入光
時間が長くなり、圧延材から発せられるローラーテーブ
ル等に反射した弱い光も多量に受光素子10.11に受
光される結果、第7図のイに示すように、電圧Vが圧延
材1から離れた位置で急激に立上り、幅端部の検出精度
が悪化−する。文通に走査時間tsが短かすぎると、受
光素子10.11の各ビットへの入光時間が短くなり、
光が十分に受光素子10゜11に受光されない結果、第
7図の口に示すように電圧Vのレベルが低下し、板幅端
部検出の信号がJ、t Illとなるスレッシュホール
ド電圧vしに達せず、検出が不可能となる虞れがある。By the way, since the temperature generally varies depending on the type of rolled material, a temperature difference occurs in the amount of light entering the light receiver 8.9 shown in FIG. 5. In other words, when the distance ts between scanning ports is increased in a rolled material having a high temperature, the time for light to enter the light receiving element 10. As a result, as shown in FIG. 7A, the voltage V suddenly rises at a position away from the rolled material 1, and the detection accuracy at the width end portion deteriorates. If the scanning time ts is too short for correspondence, the time for light to enter each bit of the light receiving element 10.11 will be shortened.
As a result of insufficient light being received by the light-receiving elements 10 and 11, the level of the voltage V decreases as shown at the bottom of FIG. There is a risk that detection will not be possible.
従って、走査時間tsを自動的にコントロールし、受光
素子1oytiに受光される光量を常に一定に保持し、
電圧Vを第7図の八に示すように調節することが必要と
なる。Therefore, the scanning time ts is automatically controlled, and the amount of light received by the light receiving element 1oyti is always kept constant.
It is necessary to adjust the voltage V as shown in 8 of FIG.
そこで、本願発明者は、例えば特願昭59−77214
号明1iJに示すように、加熱された金属塊の発する光
を受光する受光素子群とレンズとより構成された検出器
により金属塊幅端位置を検出する際に、受光素子を金属
塊の中央側より幅端方向へ走査し、該走査により得られ
た映像信号中、予め設定されたレベルの電圧を発生する
受光素子近傍の受光素子が受けている光量から走査周期
を決定し、前記検出演算受光素子を金属塊の中央側より
幅り向へ、決定された走査周期により走査を行ない、予
め設定されたレベルの電圧を発生する受光素子の番地を
求めて金属塊の幅方向位置を正確に検出する方法及びそ
の装置について提案を行った。Therefore, the inventor of the present application, for example, in Japanese Patent Application No. 59-77214
As shown in No. 1iJ, when detecting the width end position of a metal lump using a detector composed of a light receiving element group and a lens that receive light emitted from a heated metal lump, the light receiving element is placed at the center of the metal lump. The scanning period is determined from the amount of light received by a light-receiving element near the light-receiving element that generates a voltage at a preset level in the video signal obtained by the scanning, and the detection calculation is performed. The light-receiving element is scanned from the center side of the metal mass in the width direction at a determined scanning period, and the address of the light-receiving element that generates a voltage at a preset level is determined to accurately locate the widthwise position of the metal mass. We proposed a detection method and device.
[発明が解決しようとする問題点]
しかしながら、]二述の金属塊の幅方向位置検出方法及
びその装置にあっては、検出演算視野中を水蒸気、水、
酸化スケール等の外乱により遮られると、正確に金属塊
の幅端位置を検出することができないという問題がある
。[Problems to be Solved by the Invention] However, in the method and device for detecting the position in the width direction of a metal lump described above, water vapor, water,
There is a problem in that if it is blocked by disturbances such as oxide scale, it is not possible to accurately detect the width end position of the metal lump.
本発明は、上記実情に鑑み、金属塊の幅端位置を外乱の
影響を受けずに正確に検出し得るようにづることを目的
としCなしたちのである。In view of the above-mentioned circumstances, the present invention has been made with the object of making it possible to accurately detect the width end position of a metal lump without being affected by disturbance.
「問題点を解決ザるための手段」
本発明は、加熱された金属塊の発する光を受光する受光
素子群とレンズとから成る検出器により金属塊の幅端位
置を検出する際に、受光素子を金属塊の幅方向へ走査し
て得られた1ビットごとの映像信号の電圧差を演算する
と共に、1ビットごとの映g!信号を予め定められたス
レッシュホールド電圧と比較し、その差に符号変化が起
こった時点の番地を記憶しておき、現時点の映像信号の
電圧差と一時点前の映像信号の電圧差とを比較演免して
数時点内でその時点の映ぐ9信号の電圧差の差と一時点
前の映像信号の電圧差の差の正負の符号に変化が生じた
場合には、前記記憶していた受光素子の番地を棄却し、
前記その時点の映像信号の電圧差の差と一時点前の映像
信号の電圧差の差の正負の符号に変化が生じない場合に
は映像信号電圧が予め定められたスレッシュホールド電
圧よりも低くなった時点の前記記憶していた受光素子の
番地を金属塊の幅端位置と認定する構成を廂えている。"Means for Solving the Problems" The present invention provides a method for detecting the width end position of a metal lump using a detector consisting of a group of light receiving elements and a lens that receives light emitted from a heated metal lump. The voltage difference of the video signal for each bit obtained by scanning the element in the width direction of the metal block is calculated, and the video g! Compare the signal with a predetermined threshold voltage, memorize the address at the time when the sign change occurs in the difference, and compare the voltage difference between the current video signal and the voltage difference between the video signals one point before. If there is a change in the positive or negative sign of the difference between the voltage differences of the 9 signals displayed at that point and the voltage difference of the video signal one point before within several points after the performance, the above-mentioned memorized Discard the address of the light receiving element,
If there is no change in the positive or negative sign of the difference between the voltage difference between the video signals at that point in time and the voltage difference between the video signals at a point before, the video signal voltage becomes lower than a predetermined threshold voltage. The address of the light-receiving element stored at the time when the address of the light-receiving element is recognized as the width end position of the metal lump is provided.
[作 用]
従って、本発明では受光素子は金属l卑の幅方向へ走査
されて1ビットごとの映像信号の電圧とスレッシュホー
ルド電圧との比較演紳が行なわれ、且つ、1ビットごと
の映像信号の電圧差が演算され、現時点の映像信号の電
圧差の差と一時点前の映像信号の電圧差の10の符号に
変化が生じた場合には、その時点の番地は金属塊の幅端
位置とはされず、前記電圧差の正負の符号に変化が生じ
ない場合には、その時点の映像信号の電圧が予め設定さ
れたスレッシュホールド電圧よりも低くなった番地が金
属塊の幅端位置とされる。[Function] Therefore, in the present invention, the light-receiving element is scanned in the width direction of the metal base, and the voltage of the video signal for each bit is compared with the threshold voltage. When the signal voltage difference is calculated and the sign of 10 changes between the current video signal voltage difference and the video signal voltage difference one point before, the address at that point is at the width end of the metal block. If the sign of the voltage difference does not change, the address where the voltage of the video signal at that point is lower than the preset threshold voltage is the width end position of the metal block. It is said that
[実 施 例]
以下、本発明の実施例を添付図面を参照しつつ説明する
。[Example] Hereinafter, an example of the present invention will be described with reference to the accompanying drawings.
先ず、本発明の原理を第2図及び第3図により説明する
と、第2図に示す映像信号は水蒸気、水、酸化スケール
等の外乱の影響を受けていないもの、第3図に示す映像
信号は外乱の影ワを受けているものであり、何れも例え
ばフォトダイオードを使用した充電素子を圧延材1の幅
方向に所定の走査周期で走査し、lIられたものである
。なお、走査の仕方、走査周期の調節の仕方は特願昭5
8−238540号明細λ、特願昭59−77214号
明細占等に間示しであるの?1″説明は省略する。First, the principle of the present invention will be explained with reference to FIGS. 2 and 3. The video signal shown in FIG. 2 is not affected by disturbances such as water vapor, water, and oxide scale, and the video signal shown in FIG. are affected by external disturbances, and all of them are obtained by scanning a charging element using, for example, a photodiode in the width direction of the rolled material 1 at a predetermined scanning period. The method of scanning and how to adjust the scanning period is described in the patent application filed in 1973.
Is it indicated in the specification λ of No. 8-238540 and the specification of Japanese Patent Application No. 59-77214? 1'' Explanation will be omitted.
今、第2図において、映像信号を圧延材1の中央から幅
方向へ走査するとして、予め設定されたスレッシュホー
ルド電圧VLと各番地の電圧を順次比較してゆき、VL
より小さくなった電圧VEを与える受光素子の番地NE
を板幅端と判定する。Now, in FIG. 2, assuming that the video signal is scanned from the center of the rolled material 1 in the width direction, the preset threshold voltage VL and the voltage at each address are sequentially compared, and VL
Address NE of the light receiving element that provides the smaller voltage VE
is determined to be the board width end.
ところで、第3図に示すように、例えば圧延材1にスケ
ール12が載ってその部分から受光素子へ入光する光量
が減少した場合、対応する受光素子の映像信号の電圧が
降下する。この状態で、圧延材1の幅端位置を第2図で
説明した方法で求めると、スケール12の載った部分を
幅端位置として求めてしまうので、検出に大きなエラー
が生じることになる。By the way, as shown in FIG. 3, for example, when a scale 12 is placed on the rolled material 1 and the amount of light entering the light receiving element from that part decreases, the voltage of the video signal of the corresponding light receiving element drops. In this state, if the width end position of the rolled material 1 is determined by the method explained in FIG. 2, the width end position will be determined as the part on which the scale 12 is placed, resulting in a large error in detection.
本発明では、これを防止するために、各番地とその1番
地手前の映像信号の電圧差、すなわちAV1+□=i
VLヤ、を順次求めてゆき、得られた”i+1の各時
点ごとの符号変化を調べ、符号変化が生じた場合、その
時点で得られている映像信号中のスレッシュホールドよ
り小さい電圧を与える番地を棄却する。すなわち、第3
図において、i=に+1の時点で
AVk+、−Vk−■に+、〉0
を求め、又Vk+、〈Vしてあるので、番地Nk+□を
幅端位置と判断する。しかし、次のi =に+2時点目
r t、t、 ” k+2− vk+1 ’に+2
<Oとなり、符号が正から負へ変化する。第3図を児
ても分るように、このような符号変化は幅端位置では決
して起こらない。In the present invention, in order to prevent this, the voltage difference between the video signal at each address and the one before it, that is, AV1+□=i
Sequentially find VLya, check the sign change at each point in time of the obtained "i+1", and if a sign change occurs, set the address that gives a voltage smaller than the threshold in the video signal obtained at that point. , i.e., the third
In the figure, when i = +1, AVk+, -Vk-■ +, >0 are obtained, and since Vk+ and <V are set, address Nk+□ is determined to be the width end position. However, at the next i= +2nd time point r t, t, ``k+2- vk+1'' +2
<O, and the sign changes from positive to negative. As can be seen from FIG. 3, such a sign change never occurs at the width end position.
従って、この符号変化を検出してそれが生じた場合には
、それまでに得でいるVk+1〈VLである番地Nk+
□を棄却する。こうすることによって、スケール等の外
乱の影響を受けずに精度良く受光素子上の圧延材部端位
置に相当する番地を求めることができる。第2図、第3
図では、走査方向を圧延材1の中央から幅端方向へ走査
する場合を示しているが、逆に幅端から中央方向へ走査
する場合も同様に適用できる。この場合には、先の電圧
差の符号変化は負から正となると共に、スレッシュホー
ルド電圧VLよりも始めて大きくなった時点の番地が幅
端位置である。従って、どちらの方向から走査するにし
ても、映像信号とスレッシュホールド電圧とを比較し、
これに符号変化が生じた時点の映像信号の番地を求めれ
ば良い。Therefore, when this sign change is detected and occurs, the address Nk+ which is Vk+1<VL which has been obtained up to that point
□ is rejected. By doing so, it is possible to accurately determine the address corresponding to the end position of the rolled material on the light receiving element without being affected by disturbances such as scale. Figures 2 and 3
Although the figure shows a case in which the scanning direction is scanned from the center of the rolled material 1 toward the width end, the same applies to the case where the scanning direction is scanned from the width end toward the center. In this case, the sign of the voltage difference changes from negative to positive, and the address at which the voltage difference first becomes larger than the threshold voltage VL is the width end position. Therefore, no matter which direction you scan, the video signal and threshold voltage are compared,
It is sufficient to find the address of the video signal at the time when the sign change occurs.
次に第1図を参照しつつ中央側から幅端方向へ走査する
場合について本発明の具体例につき説明する。Next, with reference to FIG. 1, a specific example of the present invention will be described regarding scanning from the center side to the width end direction.
図中Aは上述の既出願明細書に開示したよう検出演算光
電素子を圧延材幅方向へ走査させることにより得られた
映像信号、13はクロックパルスCの1パルスごとに現
在走査中の番地の受光素子で得られた映像信号の電圧V
1+、とシフトレジスタ14から送られて来た1番地手
前の受光素子で得られた映像信号の電圧Vi とを比
較潰砕する比較器、15は比較器13から送られて来た
電圧差A Viや□−vi+1 ’i とシフトレ
ジスタ16から送られて来た一時点前の゛+−11差A
Vi =vi −Vi−1とヲ比較演Ll ’I 比
較器、17t、i比較器15の演鈴結渠の符号を判別す
る符号判別回路、18は映像Ci号への電圧■ヤ、とス
レッシュホールド電LL V Lとを比較する比較器、
19は比較器18で比較されたスレッシュホールド電圧
VLより小さい電圧を与える映像信号の番地を記憶し且
つ符号判別回路17からのクリアパルスCEが入力され
ると記憶している番地を東7J]する記憶回路、20は
クロックパルスCの数をカウントしその故を番地として
記憶回路19に送るカウンタである。In the figure, A is a video signal obtained by scanning the detection calculation photoelectric element in the width direction of the rolled material as disclosed in the above-mentioned specification, and 13 is the image signal of the address currently being scanned for each pulse of the clock pulse C. Voltage V of the video signal obtained by the light receiving element
A comparator 15 compares and crushes the voltage Vi of the video signal obtained at the light receiving element in front of address 1 sent from the shift register 14, and the voltage difference A sent from the comparator 13. Vi or □-vi+1 'i and the ゛+-11 difference A sent from the shift register 16 at the previous point.
Vi = vi -Vi-1 and wo comparison Ll 'I comparator, 17t, i sign discrimination circuit for determining the sign of the output signal of comparator 15, 18 is voltage to video Ci, and threshold. A comparator that compares the hold voltage LL V L,
19 stores the address of the video signal that gives a voltage smaller than the threshold voltage VL compared by the comparator 18, and when the clear pulse CE from the code discrimination circuit 17 is input, the stored address is changed to East 7J]. A memory circuit 20 is a counter that counts the number of clock pulses C and sends it to the memory circuit 19 as an address.
圧延H幅端位置の検出に際しては、圧延材の映像信号△
の電圧V、+、及びシフトレジスタ14に記憶されてい
た1番地手前の映像信号の電圧■ がり[1ツクパルス
Cの1パルスごとに比較器13に送られ、両者の差がA
V、= V、 −V、、1+1 1
として比較部口され、電圧差AV が比較器131+
1
から比較器15及びシフトレジスタ16へ出力される。When detecting the rolled H width end position, the video signal △ of the rolled material is
The voltages V and + of the video signal stored in the shift register 14 before the first address are sent to the comparator 13 every pulse C, and the difference between the two is A.
V, = V, -V,, 1+1 1 and the voltage difference AV is input to the comparator 131+
1 to the comparator 15 and shift register 16.
又シフトレジスタ14ではクロックパルスCの1パルス
ごとに映像信号への値が更改される。Further, in the shift register 14, the value of the video signal is updated every pulse of the clock pulse C.
比較器13から出力された電圧差AVi+1は比較器1
3において、シフトレジスタ16に記憶されてイタ一時
点前の電圧差av、 と、av、−7111v、、に
より比較演篩され、その信号は符号判別回路17に出力
され、該符号判別器17で比較器15からの出力の正負
が判別される。The voltage difference AVi+1 output from comparator 13 is
3, the signal is stored in the shift register 16 and compared and sieved by the voltage difference av, av, -7111v, before the iter point, and the signal is output to the sign discriminator 17. It is determined whether the output from the comparator 15 is positive or negative.
一方、映像信号への電圧V、+、はスレッシュホールド
電圧VLと比較器18で時々刻々と比較されて記憶回路
19へ送られているが、Nk 番地でVL >V ど
なるので、このとぎNk番地の値に+L
は記憶回路19へ残る。而して、このままではNk番地
を圧延材幅端部と誤認してしまうことになるが、比較器
15の出力が負になった場合は先の符号判別1回路17
よりクリアパルスCEが記憶回路19へ送られて来、番
地Nkが棄却される。斯かる操作によって圧延材1の真
の幅端位置を表わす受光素子の番地NEが記憶回路19
に残る。On the other hand, the voltage V,+ to the video signal is constantly compared with the threshold voltage VL by the comparator 18 and sent to the storage circuit 19, but since VL > V at the Nk address, at this point the Nk address The value +L remains in the storage circuit 19. If this continues, the Nk address will be mistakenly recognized as the width end of the rolled material, but if the output of the comparator 15 becomes negative, the sign determination circuit 17
A clear pulse CE is then sent to the memory circuit 19, and the address Nk is rejected. Through this operation, the address NE of the light receiving element representing the true width end position of the rolled material 1 is stored in the memory circuit 19.
remains in
又シフトレジスタ16では、クロックパルスCの1パル
スごとに電圧差の値が更改される。Further, in the shift register 16, the value of the voltage difference is updated every pulse of the clock pulse C.
上述のようにして、検出演算視野中が部分的に水蒸気や
水等に遮られたり、圧延材に水や酸化スケール等が残っ
′Cし正確に圧延材の幅端部が求められる。As described above, even if the detection calculation field of view is partially blocked by steam, water, etc., or if water, oxidized scale, etc. remain on the rolled material, the width end portion of the rolled material can be accurately determined.
なJ3、本発明の実施例においては、圧延材幅端部の位
置を検出する場合について説明したが、圧延材に限らず
高温の金属塊ならいかなる金属に対しても適用可能なこ
と、本発明装置はコンピユータにより構成することもで
きるし、或いは電子回路等のハードウェアで構成するこ
ともできること、その他、本発明の要旨を逸脱しない範
囲内で種々変更を加え得ること、等は勿論である。J3. In the embodiments of the present invention, the case of detecting the position of the width end of a rolled material has been described, but the present invention is applicable not only to rolled materials but also to any metal as long as it is a high-temperature metal lump. It goes without saying that the device can be configured by a computer or by hardware such as an electronic circuit, and that various other changes can be made without departing from the gist of the present invention.
[発明の効果〕
本発明の金属塊の幅方向位置検出方法及びその装置によ
れば、水蒸気、水、酸化スケール等、加熱金属塊の端部
位置を光学式検出器で測定する際に避けることのできな
い外乱の影響を除去し、精度の高い測定が可能となると
いう優れた効果を奏し得る。[Effects of the Invention] According to the method and device for detecting the position in the width direction of a metal lump of the present invention, water vapor, water, oxide scale, etc. can be avoided when measuring the end position of a heated metal lump with an optical detector. This has the excellent effect of eliminating the influence of disturbances that cannot be measured, making it possible to perform highly accurate measurements.
第1図は本発明の金属塊の幅方向位置検出方法及びその
装置を具体化した例の説明図、第2図及び第3図は本発
明の金属塊の幅方向位置検出方法及びその装置の原理の
説明図、第4図は金属塊等の材料の幅方向位置を検出す
る原理の説明図、第5図は加熱された金属塊の幅方向位
置を検出する原理の説明図、第6図は第5図で示ず幅方
向位置検出の場合に幅端部に生じる光m差を表わす信号
と走査時間との関係を示すグラフ、第7図は加熱された
金属塊の幅端部を検出す−る場合に走査時間の変更によ
る出力信号の変化を示す説明図である。
図中13は比較器、14はシフトレジスタ、15は比較
器、16はシフトレジスタ、17は符号判別回路、18
は比較器、19は記憶回路、20はカウンタを示す。
区
\!
愕
区 区
Ln ■
悸 に
(*\FIG. 1 is an explanatory diagram of an example embodying the method and device for detecting the position in the width direction of a metal lump according to the present invention, and FIGS. An explanatory diagram of the principle, Fig. 4 is an explanatory diagram of the principle of detecting the widthwise position of a material such as a metal lump, Fig. 5 is an explanatory diagram of the principle of detecting the widthwise position of a heated metal lump, Fig. 6 is not shown in Fig. 5, but is a graph showing the relationship between the scanning time and the signal representing the light m difference generated at the width edge in the case of width direction position detection, and Fig. 7 is a graph showing the relationship between the scanning time and the signal representing the light m difference generated at the width edge in the case of width direction position detection. FIG. 3 is an explanatory diagram showing changes in output signals due to changes in scanning time when scanning. In the figure, 13 is a comparator, 14 is a shift register, 15 is a comparator, 16 is a shift register, 17 is a sign discrimination circuit, 18
is a comparator, 19 is a storage circuit, and 20 is a counter. Ward\! Shocking Ward Ward Ln ■ Palpation ni (*\
Claims (1)
とレンズとから成る検出器により金属塊の幅端位置を検
出する際に、受光素子を金属塊の幅方向へ走査して得ら
れた1ビットごとの映像信号電圧と予め定められたスレ
ッシュホールド電圧とを比較し、これに符号変化が生じ
た時点での映像信号の番地を記憶すると共に、1ビット
ごとに現時点の映像信号と1時点前の映像信号との電圧
差を演算し、その電圧差に符号変化が生じた場合は前記
記憶されていた番地を棄却することを特徴とする金属塊
の幅方向位置検出装置。 2)加熱された金属塊の発する光を受光する受光素子群
とレンズとから成り金属塊を幅方向へ走査し得るように
した検出器と、検出された所定番地の映像信号と一番地
前の映像信号の電圧差を比較演算する比較器と、該比較
器から送られて来た現時点の映像信号の電圧差と一時点
前の映像信号の電圧差を比較演算する比較器と、現時点
の映像信号の電圧差と一時点前の映像信号の電圧差の正
負の符号を判別し符号が変化した場合には、クリアパル
スを出す符号判別回路と、前記各時点の映像信号の電圧
と予め設定されたスレッシュホールド電圧との差を比較
演算する比較器と、該比較器の出力に符号変化が起つた
ときにはその時点の受光素子の番地を記憶し前記符号判
別回路からクリアパルスが送られて来た場合には前記記
憶している受光素子の番地を棄却する記憶回路を設けた
ことを特徴とする金属塊の幅方向位置検出装置。[Claims] 1) When detecting the width end position of a metal lump using a detector consisting of a light receiving element group and a lens that receive light emitted from a heated metal lump, the light receiving element is moved in the width direction of the metal lump. The video signal voltage for each bit obtained by scanning is compared with a predetermined threshold voltage, and the address of the video signal at the time when a sign change occurs is memorized. A position in the width direction of a metal block, characterized in that the voltage difference between the current video signal and the video signal one time before is calculated, and if a sign change occurs in the voltage difference, the stored address is discarded. Detection device. 2) A detector consisting of a light-receiving element group and a lens that receives the light emitted by the heated metal lump and is capable of scanning the metal lump in the width direction, and a detector that detects the video signal of the detected predetermined location and the nearest location. A comparator that compares and calculates the voltage difference between video signals, a comparator that compares and calculates the voltage difference between the current video signal sent from the comparator, and the voltage difference between the video signal at a point before, and the current video signal. A sign discrimination circuit that determines the positive or negative sign of the voltage difference between the signal and the voltage difference of the video signal at one point before and outputs a clear pulse when the sign changes; A comparator that compares and calculates the difference between the output of the comparator and a threshold voltage, and when a sign change occurs in the output of the comparator, the address of the light receiving element at that time is memorized and a clear pulse is sent from the sign discrimination circuit. A device for detecting a position in the width direction of a metal lump, further comprising a memory circuit for discarding the stored address of the light-receiving element.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP22325985A JPS6282306A (en) | 1985-10-07 | 1985-10-07 | Method and device for detecting breadthwise position of metallic ingot |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP22325985A JPS6282306A (en) | 1985-10-07 | 1985-10-07 | Method and device for detecting breadthwise position of metallic ingot |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6282306A true JPS6282306A (en) | 1987-04-15 |
JPH0467888B2 JPH0467888B2 (en) | 1992-10-29 |
Family
ID=16795297
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP22325985A Granted JPS6282306A (en) | 1985-10-07 | 1985-10-07 | Method and device for detecting breadthwise position of metallic ingot |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6282306A (en) |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5335569A (en) * | 1976-09-14 | 1978-04-03 | Asahi Glass Co Ltd | Method of measuring outer diameter of transparent substance |
JPS57146103A (en) * | 1981-03-05 | 1982-09-09 | Fujitsu Ltd | Measuring system for size |
-
1985
- 1985-10-07 JP JP22325985A patent/JPS6282306A/en active Granted
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5335569A (en) * | 1976-09-14 | 1978-04-03 | Asahi Glass Co Ltd | Method of measuring outer diameter of transparent substance |
JPS57146103A (en) * | 1981-03-05 | 1982-09-09 | Fujitsu Ltd | Measuring system for size |
Also Published As
Publication number | Publication date |
---|---|
JPH0467888B2 (en) | 1992-10-29 |
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