JPS628006A - Optical apparatus for measuring outer shape - Google Patents

Optical apparatus for measuring outer shape

Info

Publication number
JPS628006A
JPS628006A JP14734985A JP14734985A JPS628006A JP S628006 A JPS628006 A JP S628006A JP 14734985 A JP14734985 A JP 14734985A JP 14734985 A JP14734985 A JP 14734985A JP S628006 A JPS628006 A JP S628006A
Authority
JP
Grant status
Application
Patent type
Prior art keywords
light
measured
shielding
sensor
matter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP14734985A
Other versions
JPH0776684B2 (en )
Inventor
Toshihiro Mori
Original Assignee
Hokuyo Automatic Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date

Links

Abstract

PURPOSE: To correct a measuring error with high accuracy, by arranging a light shielding body, wherein a measured value varies under the same condition as matter to be measured, in front of an image sensor.
CONSTITUTION: A light shielding body 11 projects the shade of light the same to the edge of matter 9 to be detected to an image sensor 8 by the edge thereof. When pulse light is emitted from a light emitting source 3, parallel light containing the shades of the matter 9 to be detected and the light shielding body 11 is incident to the image sensor 8. When a clock pulse is applied immediately after, output of a wavelength A is obtained from the sensor 8. Then, values (m), (n) measured by the falling and rising of the rectangular wave B generated at the edge of the light shielding body 11 on the basis of reference time. are preliminarily stored and, on the basis of the differences between theses values (m), (n) and the measured values m', n' of the rectangular wave generated at the edge of the light shielding block 11 when the matter 9 to be detected is actually measured, either one of magnitudes (d), (u) of the measured values of falling and rising is calculated as a correction value. By this method, the temp. drift of the sensor 8 is corrected.
COPYRIGHT: (C)1987,JPO&Japio
JP14734985A 1985-07-03 1985-07-03 Optical profile measuring apparatus Expired - Lifetime JPH0776684B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14734985A JPH0776684B2 (en) 1985-07-03 1985-07-03 Optical profile measuring apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14734985A JPH0776684B2 (en) 1985-07-03 1985-07-03 Optical profile measuring apparatus

Publications (2)

Publication Number Publication Date
JPS628006A true true JPS628006A (en) 1987-01-16
JPH0776684B2 JPH0776684B2 (en) 1995-08-16

Family

ID=15428171

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14734985A Expired - Lifetime JPH0776684B2 (en) 1985-07-03 1985-07-03 Optical profile measuring apparatus

Country Status (1)

Country Link
JP (1) JPH0776684B2 (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02189912A (en) * 1989-01-18 1990-07-25 Elna Co Ltd Manufacture of aluminum foil for electrolytic capacitor
USRE38025E1 (en) * 1991-02-22 2003-03-11 Cyberoptics Corporation High precision component alignment sensor system
US7746481B2 (en) 2007-03-20 2010-06-29 Cyberoptics Corporation Method for measuring center of rotation of a nozzle of a pick and place machine using a collimated laser beam
US8068664B2 (en) 2007-06-05 2011-11-29 Cyberoptics Corporation Component sensor for pick and place machine using improved shadow imaging
CN103542813A (en) * 2013-07-05 2014-01-29 中国计量学院 Laser diameter measuring instrument based on boundary differential and environmental light self-calibration
CN104121861A (en) * 2014-08-05 2014-10-29 中国计量学院 Environmental light self-adaptive laser diameter measuring device based on optical flat scanning

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53119079A (en) * 1977-03-26 1978-10-18 Tatsu Akutsu Measuring method of diameter of running filamentous articles
JPS58162804A (en) * 1982-03-23 1983-09-27 Mitsutoyo Mfg Co Ltd Optical measuring device

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53119079A (en) * 1977-03-26 1978-10-18 Tatsu Akutsu Measuring method of diameter of running filamentous articles
JPS58162804A (en) * 1982-03-23 1983-09-27 Mitsutoyo Mfg Co Ltd Optical measuring device

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02189912A (en) * 1989-01-18 1990-07-25 Elna Co Ltd Manufacture of aluminum foil for electrolytic capacitor
USRE38025E1 (en) * 1991-02-22 2003-03-11 Cyberoptics Corporation High precision component alignment sensor system
US7746481B2 (en) 2007-03-20 2010-06-29 Cyberoptics Corporation Method for measuring center of rotation of a nozzle of a pick and place machine using a collimated laser beam
US8068664B2 (en) 2007-06-05 2011-11-29 Cyberoptics Corporation Component sensor for pick and place machine using improved shadow imaging
CN103542813A (en) * 2013-07-05 2014-01-29 中国计量学院 Laser diameter measuring instrument based on boundary differential and environmental light self-calibration
CN104121861A (en) * 2014-08-05 2014-10-29 中国计量学院 Environmental light self-adaptive laser diameter measuring device based on optical flat scanning

Also Published As

Publication number Publication date Type
JP2071715C (en) grant
JPH0776684B2 (en) 1995-08-16 grant

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