JPS6267849A - Manufacture of thick film hybrid ic - Google Patents

Manufacture of thick film hybrid ic

Info

Publication number
JPS6267849A
JPS6267849A JP60206462A JP20646285A JPS6267849A JP S6267849 A JPS6267849 A JP S6267849A JP 60206462 A JP60206462 A JP 60206462A JP 20646285 A JP20646285 A JP 20646285A JP S6267849 A JPS6267849 A JP S6267849A
Authority
JP
Japan
Prior art keywords
conductor
thick film
substrate
laser beam
silicon carbide
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP60206462A
Other languages
Japanese (ja)
Inventor
Sumio Hayashida
林田 純夫
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP60206462A priority Critical patent/JPS6267849A/en
Publication of JPS6267849A publication Critical patent/JPS6267849A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/0286Programmable, customizable or modifiable circuits
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/09Use of materials for the conductive, e.g. metallic pattern
    • H05K1/092Dispersed materials, e.g. conductive pastes or inks
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/16Printed circuits incorporating printed electric components, e.g. printed resistor, capacitor, inductor

Landscapes

  • Parts Printed On Printed Circuit Boards (AREA)
  • Apparatuses And Processes For Manufacturing Resistors (AREA)

Abstract

PURPOSE:To improve a yield by a single means and to contrive the improvement of productivity by a method wherein a laser beam is directed to an arbitrary art of the surface of an electrically insulative silicon carbide ceramic substrate and the substrate is changed into a good conductor by breaking its insulation quality. CONSTITUTION:A thick film conductor 2, glass films 3 and thick film resistors 4 are formed on an electrically insulative silicon carbide ceramic substrate 1 (SiC substrate). The thick film conductor 2 is previously provided with a conductor isolation part 5 with a printed mask, and after the thick film resistors 4 are trimmed in elements in a state that the conductor 2 is turned into a closed loop by cutting part of it, a laser beam is irradiated on the SiC substrate surface at the microscopic cut part of the conductor including the conductor isolation part 5 to selectively heat at high temperatures of 1,000 deg.C or more and the substrate is changed into a good conductor by breaking its insulation quality to form an electrical circuit network. Moreover, in irradiation with the laser beam on the SiC substrate surface at the conductor isolation part 5, if such reducing gas as hydrogen gas is locally supplied, the resistance of the irradiation part can be further lessened.

Description

【発明の詳細な説明】 〔発明の利用分野〕 本発明は厚膜混成IC,特に大電力半導体素子を搭載し
た厚膜混成ICにおいて、その厚膜抵抗体の素子トリミ
ングに好適な製造方法に関するものである。
[Detailed Description of the Invention] [Field of Application of the Invention] The present invention relates to a manufacturing method suitable for element trimming of a thick film resistor in a thick film hybrid IC, particularly a thick film hybrid IC mounted with a high power semiconductor element. It is.

〔発明の背景〕[Background of the invention]

従来技術による厚膜混成ICの一例を第2図について説
明するに、電気絶縁性炭化硅素セラミック基板(SiC
基板)1上に、厚膜導体2、ガラス膜3および厚膜抵抗
体4を公知例(特開昭59−126665号公報)に示
す技術により遂次形成する。この際、厚膜導体2と厚膜
抵抗体4からなる閉ループ回路を切断するために、導体
分離部5が設けられている。前記公知例には、SLC基
板を用いることにより放熱効果が良好であるため、半導
体素子を直接SiC基板上に厚膜導体を介して接続可能
であることが記載されている。
An example of a conventional thick film hybrid IC is described with reference to FIG.
A thick film conductor 2, a glass film 3, and a thick film resistor 4 are sequentially formed on a substrate 1 by a technique shown in a known example (Japanese Patent Application Laid-Open No. 126665/1984). At this time, a conductor separation section 5 is provided in order to disconnect the closed loop circuit consisting of the thick film conductor 2 and the thick film resistor 4. The above-mentioned known example describes that since the use of an SLC substrate has a good heat dissipation effect, it is possible to directly connect a semiconductor element to a SiC substrate via a thick film conductor.

次に上記各厚膜抵抗体4を所望の精度に素子トリミング
する。なお、図中の6はトリミング跡を示す。ついで、
搭載部品、例えば半導体素子、個別部品(図示せず)を
接続した後、導体分離fa5を半田又はジャンパー#7
で接続して電気的回路網を形成させていた。このため、
導体分離部5を凄続させる特別の工程を必要とするから
、製造工程が複雑となる恐れがあった。
Next, each thick film resistor 4 is trimmed to a desired precision. Note that 6 in the figure indicates a trimming trace. Then,
After connecting mounted components, such as semiconductor elements and individual components (not shown), connect conductor separation fa5 with solder or jumper #7.
They were connected to form an electrical network. For this reason,
Since a special process is required to connect the conductor separation part 5, the manufacturing process may become complicated.

〔発明の目的〕[Purpose of the invention]

本発明は上記のような先行技術の問題点を解消し、簡便
な手段により歩留りQ)良好で、かつ生産性の向上をは
かることができる厚膜混成ICの製造方法を提供するこ
とを目的とするものである。
An object of the present invention is to solve the problems of the prior art as described above, and to provide a method for manufacturing thick film hybrid ICs that can achieve a good yield (Q) and improve productivity using simple means. It is something to do.

〔発明の概要〕[Summary of the invention]

本発明は上記目的を達成するために、電気絶縁性炭化硅
素セラミック基板上に形成した厚膜導体に、半導体素子
および個別搭l!部品等を接続すると共に、前記基板上
に形成したカラス膜上に厚膜抵抗体を形成してなる厚膜
混成ICにおいて、該厚膜抵抗体を所望精度に素子トリ
ミングした後、前記炭化硅素スラミツク基板の任意表面
なレーザ光線を介して溶融させることにより、炭化硅素
の絶縁性を破壊して電気的に導通させることを%徴とす
る。
In order to achieve the above object, the present invention includes a thick film conductor formed on an electrically insulating silicon carbide ceramic substrate, a semiconductor element and an individual mounting plate. In a thick film hybrid IC in which parts and the like are connected and a thick film resistor is formed on a glass film formed on the substrate, the thick film resistor is trimmed to a desired precision, and then the silicon carbide slamic is By melting any surface of the substrate via a laser beam, the insulating properties of silicon carbide are destroyed and the silicon carbide becomes electrically conductive.

〔発明の実施例〕[Embodiments of the invention]

以下、本発明の一実施例を図面について説明する。 An embodiment of the present invention will be described below with reference to the drawings.

第1図において、電気絶縁性炭化硅素セラミック基板1
 (SiC基板)上に前記の従来技術(巣2図)と同様
に厚膜導体2、ガラス膜3および厚膜抵抗体4を形成す
る。前記SiC基板1は近年、開発されたもので、10
00℃以上の高温で加熱すると、その電気絶縁性が破壊
されて良導電体となる性質を有する。
In FIG. 1, an electrically insulating silicon carbide ceramic substrate 1
A thick film conductor 2, a glass film 3, and a thick film resistor 4 are formed on a (SiC substrate) in the same manner as in the prior art (see Fig. 2). The SiC substrate 1 has been developed in recent years.
When heated at a high temperature of 00°C or higher, its electrical insulation properties are destroyed and it becomes a good conductor.

そこで、印刷マスクによりあらかじめ厚膜導体2に導体
分離部5を設け、該導体2の一部を切断して開ループと
した状態で厚膜抵抗体4を素子トリミングし°た後、咄
記導体分離部5を含む導体の微細な切断部分のSiC基
板表面にレーザ光線を照射することにより、選択的に1
000℃以上の高温で加熱し、電気的絶縁性を破壊して
良導電体となし電気回路網を形成させる。
Therefore, a conductor separation part 5 is provided in advance on the thick film conductor 2 using a printing mask, and after cutting a part of the conductor 2 to form an open loop, the thick film resistor 4 is trimmed. Selectively 1
It is heated at a high temperature of 000°C or higher to break down its electrical insulation and become a good conductor, forming an electrical circuit network.

特にn膜抵抗体4の素子トリミングなレーザ光線で行う
場合には、トリミング作業と同時に連続して作業が可能
であるため、従来技術の切断部を半田、ジャンパー勝勢
で電気的に接続すると言5製造工程の煩雑を解消するこ
とができる。なお、図中の8はレーザ光線を照射したと
きのレーザ跡を示す。
In particular, when trimming the element of the n-film resistor 4 using a laser beam, it is possible to perform the trimming operation simultaneously and continuously. Complications in the manufacturing process can be eliminated. Note that 8 in the figure indicates a laser trace when a laser beam is irradiated.

上記導体分離部5のSiC基、f表面にレーザ光線を照
射する場合、局所的に水累ガス等の還元性ガスを供給す
れば、該照射部の抵抗をさらに小さくすることが可能で
ある利点がある。
When the SiC group, f surface of the conductor separation section 5 is irradiated with a laser beam, the resistance of the irradiation section can be further reduced by locally supplying a reducing gas such as aqueous gas. There is.

〔発明の効果〕〔Effect of the invention〕

以上説明したように、本発明によれば、電気P縁性炭化
硅素セラミック基板の任意表面にレーザ光線を照射し、
その絶縁性を破壊して良導電体とすることにより、従来
のようにネテ別な接続工程を必要とせず、簡便な手段に
より歩留りを良好にし、かつ生産性の向上をはかること
ができろ。
As explained above, according to the present invention, a laser beam is irradiated onto any surface of an electric P-edge silicon carbide ceramic substrate,
By destroying the insulation and making it a good conductor, it is possible to improve the yield and productivity by simple means without requiring a separate connection process as in the past.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の厚膜混成ICQ復遣方法の一実施例を
示す平面図、第2図(工従米の厚)漠混成ICの製造方
法の一例を示す平面図である。
FIG. 1 is a plan view showing an embodiment of the thick-film hybrid ICQ return method of the present invention, and FIG. 2 is a plan view showing an example of the manufacturing method for a thick-film hybrid IC (thickness of the thickness of the film).

Claims (1)

【特許請求の範囲】[Claims]  電気絶縁性炭化硅素セラミック基板上に形成した厚膜
導体に、半導体素子および個別搭載部品等を接続すると
共に、前記基板上に形成したガラス膜上に厚膜抵抗体を
形成してなる厚膜混成ICにおいて、該厚膜抵抗体を所
望精度に素子トリミングした後、前記炭化硅素セラミッ
ク基板の任意表面をレーザ光線を介して溶融させること
により、炭化硅素の絶縁性を破壊して電気的に導通させ
ることを特徴とする厚膜混成ICの製造方法。
A thick film hybrid structure in which semiconductor elements, individual mounted components, etc. are connected to a thick film conductor formed on an electrically insulating silicon carbide ceramic substrate, and a thick film resistor is formed on a glass film formed on the substrate. In an IC, after trimming the thick film resistor to a desired precision, any surface of the silicon carbide ceramic substrate is melted using a laser beam, thereby breaking the insulation properties of the silicon carbide and making it electrically conductive. A method for manufacturing a thick film hybrid IC, characterized in that:
JP60206462A 1985-09-20 1985-09-20 Manufacture of thick film hybrid ic Pending JPS6267849A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60206462A JPS6267849A (en) 1985-09-20 1985-09-20 Manufacture of thick film hybrid ic

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60206462A JPS6267849A (en) 1985-09-20 1985-09-20 Manufacture of thick film hybrid ic

Publications (1)

Publication Number Publication Date
JPS6267849A true JPS6267849A (en) 1987-03-27

Family

ID=16523777

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60206462A Pending JPS6267849A (en) 1985-09-20 1985-09-20 Manufacture of thick film hybrid ic

Country Status (1)

Country Link
JP (1) JPS6267849A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63314783A (en) * 1987-06-17 1988-12-22 World:Kk Terminal table

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63314783A (en) * 1987-06-17 1988-12-22 World:Kk Terminal table
JPH0426189B2 (en) * 1987-06-17 1992-05-06 Waarudo Kk

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