JPS6255690B2 - - Google Patents

Info

Publication number
JPS6255690B2
JPS6255690B2 JP55016360A JP1636080A JPS6255690B2 JP S6255690 B2 JPS6255690 B2 JP S6255690B2 JP 55016360 A JP55016360 A JP 55016360A JP 1636080 A JP1636080 A JP 1636080A JP S6255690 B2 JPS6255690 B2 JP S6255690B2
Authority
JP
Japan
Prior art keywords
alignment
die
chip
pattern
step size
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP55016360A
Other languages
English (en)
Japanese (ja)
Other versions
JPS56114320A (en
Inventor
Nobuhiro Endo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
CHO ERU ESU AI GIJUTSU KENKYU KUMIAI
Original Assignee
CHO ERU ESU AI GIJUTSU KENKYU KUMIAI
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by CHO ERU ESU AI GIJUTSU KENKYU KUMIAI filed Critical CHO ERU ESU AI GIJUTSU KENKYU KUMIAI
Priority to JP1636080A priority Critical patent/JPS56114320A/ja
Publication of JPS56114320A publication Critical patent/JPS56114320A/ja
Publication of JPS6255690B2 publication Critical patent/JPS6255690B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F9/00Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
    • G03F9/70Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
    • G03F9/7088Alignment mark detection, e.g. TTR, TTL, off-axis detection, array detector, video detection

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Projection-Type Copiers In General (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
JP1636080A 1980-02-13 1980-02-13 Aligning method Granted JPS56114320A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1636080A JPS56114320A (en) 1980-02-13 1980-02-13 Aligning method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1636080A JPS56114320A (en) 1980-02-13 1980-02-13 Aligning method

Publications (2)

Publication Number Publication Date
JPS56114320A JPS56114320A (en) 1981-09-08
JPS6255690B2 true JPS6255690B2 (enrdf_load_stackoverflow) 1987-11-20

Family

ID=11914165

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1636080A Granted JPS56114320A (en) 1980-02-13 1980-02-13 Aligning method

Country Status (1)

Country Link
JP (1) JPS56114320A (enrdf_load_stackoverflow)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2610815B2 (ja) * 1985-09-19 1997-05-14 株式会社ニコン 露光方法

Also Published As

Publication number Publication date
JPS56114320A (en) 1981-09-08

Similar Documents

Publication Publication Date Title
US4568189A (en) Apparatus and method for aligning a mask and wafer in the fabrication of integrated circuits
US6563568B2 (en) Multiple image reticle for forming layers
KR100233417B1 (ko) 마이크로렌즈 형성방법
JPH0450730B2 (enrdf_load_stackoverflow)
US7556893B2 (en) Self-compensating mark design for stepper alignment
JPS6255690B2 (enrdf_load_stackoverflow)
JP2756862B2 (ja) 露光装置
JP2647835B2 (ja) ウェハーの露光方法
CN112666806A (zh) 一种光刻机对准标记制作方法
JP2000292905A (ja) パタンデータの作成方法および固体素子の製造方法
JP4591919B2 (ja) 液晶パネル用対向基板の製造方法
JPS63275115A (ja) 半導体装置のパタ−ン形成方法
JPS5839015A (ja) 半導体装置の製造方法
JPH0222532B2 (enrdf_load_stackoverflow)
JPH10125589A (ja) 走査型露光装置及びそれを用いたデバイス製造方法
JPS6258139B2 (enrdf_load_stackoverflow)
JPS60245224A (ja) 半導体装置製造用マスク合せ方法
JPH03179350A (ja) 縮小投影露光装置およびそれを用いた半導体装置の製造方法
JPS63181318A (ja) パタ−ン形成方法
JPS588132B2 (ja) 集積回路製造方法
JPS6345091B2 (enrdf_load_stackoverflow)
JPH01117322A (ja) 縮小投影露光装置
JP2780265B2 (ja) パターン形成方法
JPS5975627A (ja) 半導体装置の製造方法
JPS6146025A (ja) 投影露光方法