JPS6253561U - - Google Patents
Info
- Publication number
- JPS6253561U JPS6253561U JP14553885U JP14553885U JPS6253561U JP S6253561 U JPS6253561 U JP S6253561U JP 14553885 U JP14553885 U JP 14553885U JP 14553885 U JP14553885 U JP 14553885U JP S6253561 U JPS6253561 U JP S6253561U
- Authority
- JP
- Japan
- Prior art keywords
- electrode
- ion
- quadrupole
- axis
- stage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000006243 chemical reaction Methods 0.000 claims 1
- 238000001514 detection method Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 2
Landscapes
- Electron Tubes For Measurement (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14553885U JPH0316206Y2 (en:Method) | 1985-09-24 | 1985-09-24 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14553885U JPH0316206Y2 (en:Method) | 1985-09-24 | 1985-09-24 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6253561U true JPS6253561U (en:Method) | 1987-04-02 |
| JPH0316206Y2 JPH0316206Y2 (en:Method) | 1991-04-08 |
Family
ID=31057172
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14553885U Expired JPH0316206Y2 (en:Method) | 1985-09-24 | 1985-09-24 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0316206Y2 (en:Method) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2015128032A (ja) * | 2013-12-27 | 2015-07-09 | アジレント・テクノロジーズ・インクＡｇｉｌｅｎｔ Ｔｅｃｈｎｏｌｏｇｉｅｓ， Ｉｎｃ． | プラズマ質量分析装置用イオン光学システム |
| JP2017107817A (ja) * | 2015-12-11 | 2017-06-15 | 株式会社堀場エステック | 四重極型質量分析計及び残留ガス分析方法 |
| WO2019003365A1 (ja) * | 2017-06-29 | 2019-01-03 | 株式会社島津製作所 | 四重極型質量分析装置 |
-
1985
- 1985-09-24 JP JP14553885U patent/JPH0316206Y2/ja not_active Expired
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2015128032A (ja) * | 2013-12-27 | 2015-07-09 | アジレント・テクノロジーズ・インクＡｇｉｌｅｎｔ Ｔｅｃｈｎｏｌｏｇｉｅｓ， Ｉｎｃ． | プラズマ質量分析装置用イオン光学システム |
| JP2017107817A (ja) * | 2015-12-11 | 2017-06-15 | 株式会社堀場エステック | 四重極型質量分析計及び残留ガス分析方法 |
| WO2019003365A1 (ja) * | 2017-06-29 | 2019-01-03 | 株式会社島津製作所 | 四重極型質量分析装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0316206Y2 (en:Method) | 1991-04-08 |