JPS6249239U - - Google Patents

Info

Publication number
JPS6249239U
JPS6249239U JP14098185U JP14098185U JPS6249239U JP S6249239 U JPS6249239 U JP S6249239U JP 14098185 U JP14098185 U JP 14098185U JP 14098185 U JP14098185 U JP 14098185U JP S6249239 U JPS6249239 U JP S6249239U
Authority
JP
Japan
Prior art keywords
probe card
needle
semiconductor chip
partially
utility
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14098185U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP14098185U priority Critical patent/JPS6249239U/ja
Publication of JPS6249239U publication Critical patent/JPS6249239U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP14098185U 1985-09-13 1985-09-13 Pending JPS6249239U (US06559137-20030506-C00071.png)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14098185U JPS6249239U (US06559137-20030506-C00071.png) 1985-09-13 1985-09-13

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14098185U JPS6249239U (US06559137-20030506-C00071.png) 1985-09-13 1985-09-13

Publications (1)

Publication Number Publication Date
JPS6249239U true JPS6249239U (US06559137-20030506-C00071.png) 1987-03-26

Family

ID=31048342

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14098185U Pending JPS6249239U (US06559137-20030506-C00071.png) 1985-09-13 1985-09-13

Country Status (1)

Country Link
JP (1) JPS6249239U (US06559137-20030506-C00071.png)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010156569A (ja) * 2008-12-26 2010-07-15 National Institute Of Advanced Industrial Science & Technology 積層lsiチップのシステム検査のための方法および装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010156569A (ja) * 2008-12-26 2010-07-15 National Institute Of Advanced Industrial Science & Technology 積層lsiチップのシステム検査のための方法および装置

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