JPS62215857A - Apparatus for inspecting printed circuit board - Google Patents

Apparatus for inspecting printed circuit board

Info

Publication number
JPS62215857A
JPS62215857A JP61059696A JP5969686A JPS62215857A JP S62215857 A JPS62215857 A JP S62215857A JP 61059696 A JP61059696 A JP 61059696A JP 5969686 A JP5969686 A JP 5969686A JP S62215857 A JPS62215857 A JP S62215857A
Authority
JP
Japan
Prior art keywords
board
parts
printed circuit
inferior
inspection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP61059696A
Other languages
English (en)
Other versions
JPH081421B2 (ja
Inventor
Tamio Miyake
Original Assignee
Omron Tateisi Electronics Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Omron Tateisi Electronics Co filed Critical Omron Tateisi Electronics Co
Priority to JP61059696A priority Critical patent/JPH081421B2/ja
Publication of JPS62215857A publication Critical patent/JPS62215857A/ja
Publication of JPH081421B2 publication Critical patent/JPH081421B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

JP61059696A 1986-03-18 1986-03-18 基板検査装置 Expired - Fee Related JPH081421B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61059696A JPH081421B2 (ja) 1986-03-18 1986-03-18 基板検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61059696A JPH081421B2 (ja) 1986-03-18 1986-03-18 基板検査装置

Publications (2)

Publication Number Publication Date
JPS62215857A true JPS62215857A (en) 1987-09-22
JPH081421B2 JPH081421B2 (ja) 1996-01-10

Family

ID=13120627

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61059696A Expired - Fee Related JPH081421B2 (ja) 1986-03-18 1986-03-18 基板検査装置

Country Status (1)

Country Link
JP (1) JPH081421B2 (ja)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62116600U (ja) * 1986-01-14 1987-07-24

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62116600U (ja) * 1986-01-14 1987-07-24

Also Published As

Publication number Publication date
JPH081421B2 (ja) 1996-01-10

Similar Documents

Publication Publication Date Title
JPS61293657A (en) Method for inspecting soldering appearance
EP0126492A3 (en) Circuit board inspection apparatus and method
JPH03167456A (en) Automatic high speed optical inspection apparatus
JPH03195042A (en) Apparatus and method for inspecting ic lead
EP0871027A3 (en) Inspection of print circuit board assembly
JPS6242039A (en) Surface inspecting device
JPH03295408A (en) Method and instrument for inspecting uneven surface
JPS62215857A (en) Apparatus for inspecting printed circuit board
JPH04166711A (en) Surface-state observing apparatus
JPH04166709A (en) Surface-state observing apparatus
JPH04166710A (en) Surface-state observing apparatus
JPS62215855A (en) Apparatus for inspecting printed circuit board
JPS63274851A (en) Method for inspecting seamed part of can
JPS62201335A (en) Speckle inspecting method for periodic pattern
JPH01100409A (en) Apparatus for inspecting positional shift of chip component
JPS58223328A (en) Inspecting device for defect of mask
JPS6168676A (en) Test method of packaged printed board part
JPS6423191A (en) Inspection device for presence and absence of electronic component on printed board
JPS62261050A (en) Printed circuit board inspecting device
JPS62261049A (en) Printed circuit board inspecting device
JPS6361104A (en) Apparatus for inspecting positional shift
JPS62251608A (en) Inspecting method for packaging state of printed circuit board parts
JPS59202633A (en) Pattern inspecting device
JPS62265512A (en) Inspecting method for shadow mask
JPS63106508A (en) Method and apparatus for inspecting mounting state

Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees