JPS62185151A - Foreign matter detection in dielectric body by microwave - Google Patents
Foreign matter detection in dielectric body by microwaveInfo
- Publication number
- JPS62185151A JPS62185151A JP61027578A JP2757886A JPS62185151A JP S62185151 A JPS62185151 A JP S62185151A JP 61027578 A JP61027578 A JP 61027578A JP 2757886 A JP2757886 A JP 2757886A JP S62185151 A JPS62185151 A JP S62185151A
- Authority
- JP
- Japan
- Prior art keywords
- dielectric
- foreign matter
- line
- sample
- transmission line
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000001514 detection method Methods 0.000 title abstract description 6
- 230000005540 biological transmission Effects 0.000 claims abstract description 17
- 238000000034 method Methods 0.000 claims description 8
- 239000002184 metal Substances 0.000 abstract description 10
- 239000003989 dielectric material Substances 0.000 description 5
- 239000003365 glass fiber Substances 0.000 description 4
- 239000000126 substance Substances 0.000 description 3
- 230000008878 coupling Effects 0.000 description 2
- 238000010168 coupling process Methods 0.000 description 2
- 238000005859 coupling reaction Methods 0.000 description 2
- 239000013078 crystal Substances 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000003780 insertion Methods 0.000 description 2
- 230000037431 insertion Effects 0.000 description 2
- 229910001111 Fine metal Inorganic materials 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 239000004744 fabric Substances 0.000 description 1
- 239000000835 fiber Substances 0.000 description 1
- 239000011888 foil Substances 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 230000010355 oscillation Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000001902 propagating effect Effects 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
Abstract
Description
【発明の詳細な説明】
イ1発明の目的
〔産業上の利用分野〕
近年、コンピュータの発展に伴い電気部品(LSI−超
LSI等)の小型化が進み、プリントノ、(板肉に侵入
した微細な金属片がyσ絡゛捗故の基になるケースが発
生している。一方晶電力で使用する絶七府でも その内
部の金属その価の微細か異物が・1覧故原因となってい
る。[Detailed Description of the Invention] A1. Purpose of the Invention [Field of Industrial Application] In recent years, with the development of computers, electrical components (LSI-ultra LSI, etc.) have become smaller. There have been cases where fine metal pieces are the cause of yσ entanglement failures.On the other hand, in the case of Zetsushichifu used in crystal power, fine or foreign matter of the same value of metal inside the crystals has become the cause of failures. There is.
本発明は、誘電体繊維又は?A電体布又は誘電体板内に
含まれる異物を検出することを目的とする。The present invention provides dielectric fibers or ? A: The purpose is to detect foreign substances contained in electric cloth or dielectric plates.
同種の目的には公開特許公報昭59−214748号「
繊維状ガラス中の導電性物質の検出方法」及び開閉13
0−87844号「ガラス繊維または、ガラス繊維加重
製品中の導電性物質検出方法および装置」の発明が公開
されているが、これ等は高電圧を印加した時とか大電力
を印加した時に異物の所で起る放電現象を検知する方法
である。一方マイクロ波を用いたものに公開特許公報昭
80−20138号「ガラス繊維の欠陥を検出する方法
」が知られているが、伝送ラインに導波管を用いその中
にテストする試料を挿入するものである。For similar purposes, published patent publication No. 59-214748 “
“Method for detecting conductive substances in fibrous glass” and opening/closing 13
No. 0-87844, ``Method and device for detecting conductive substances in glass fibers or glass fiber-loaded products,'' has been disclosed. This is a method of detecting discharge phenomena that occur at certain locations. On the other hand, there is a known method using microwaves, ``Method for detecting defects in glass fibers'' published in Japanese Patent Publication No. 80-20138, which uses a waveguide in the transmission line and inserts the sample to be tested into it. It is something.
従って前者の従来方法では高電圧・大電力を使用するた
め安全性に問題があり、装置も大型となる。また後者は
試料を導波管中に挿入するために大型の試料では取扱い
が不便である。Therefore, the former conventional method uses a high voltage and a large amount of power, which poses a safety problem, and the device becomes large. Furthermore, in the latter method, the sample is inserted into a waveguide, making it inconvenient to handle large samples.
本発明は、上記の諸問題を解消した誘電体内の異物検出
方法を提供することを目的とする。SUMMARY OF THE INVENTION An object of the present invention is to provide a method for detecting foreign matter in a dielectric body that solves the above-mentioned problems.
口、発明の構成
〔問題点を解決するための手段〕
本発明は、連続波または周波数掃引を行ったマイクロ波
信号を、スロットライン又はこれと同等の伝送ラインに
伝播させ、被測定誘電体を、これと電磁気的に結合させ
、該誘電体をL記伝送ラインと交差方向に移動させて、
IE常な誘電体と異物を含有する同種の誘電体の相対的
な電磁気的変化を読取り異物の存在を検出することを特
徴とするマイクロ波による誘電体内の異物検出方法であ
る。Summary: Structure of the Invention [Means for Solving the Problems] The present invention propagates a continuous wave or frequency swept microwave signal through a slot line or an equivalent transmission line, and transmits a dielectric material to be measured. , electromagnetically coupled with this, and moving the dielectric in a direction crossing the transmission line L,
IE is a method for detecting foreign matter in a dielectric material using microwaves, which is characterized by detecting the presence of foreign matter by reading relative electromagnetic changes between a normal dielectric material and a dielectric material of the same type containing foreign matter.
なお上記の相対的な電磁気的変化とは、インピーダンス
、もしくは挿入損失の相対的変化或は反射波の検出、通
過電力の変化等である。Note that the above-mentioned relative electromagnetic change is a relative change in impedance or insertion loss, detection of reflected waves, change in passing power, or the like.
スロットライン又はこれと同等の伝送ラインにマイクロ
波信号を伝播させ、試料をその伝送ラインと交差して移
動させて電磁気的に結合させることにより、正常な試料
の時の状態と異物が入っていた時の状態との電磁気的な
変化を生ずるから、その差を1反射波や挿入損失または
インピーダンスの変化として検出し、信号出力をコンピ
ュータ処理することにより容易に異物の存在を検知する
ことが出来る。By propagating a microwave signal through a slot line or equivalent transmission line, and moving the sample across the transmission line and electromagnetically coupling it, the condition of a normal sample and that of a foreign object can be determined. Since an electromagnetic change occurs from the current state, the presence of a foreign object can be easily detected by detecting the difference as a reflected wave, insertion loss, or change in impedance, and processing the signal output with a computer.
マイクロ波の伝送ラインはスロットライン又は同等の伝
送ラインを用いるので、マイクロ波との結合部分の微細
なインピーダンス変化が検出され高分解部の検出が可能
である。Since a slot line or an equivalent transmission line is used as the microwave transmission line, minute impedance changes at the coupling portion with the microwave can be detected and high resolution portions can be detected.
マイクロ波発振信号源は単一周波数でも可能であるが、
掃引周波数を用いることにより一つの異物からの各周波
数に応じた信号を得ることが出来る。これは検出のため
の分解能をあげる効果を発揮する。Although microwave oscillation signal sources can be of a single frequency,
By using the sweep frequency, it is possible to obtain signals corresponding to each frequency from one foreign object. This has the effect of increasing the resolution for detection.
第1図〜第3図は誘電体基板lの」二に金属板(又金属
箔帯体)2.および22を適当な間隔をもって配置しそ
の隙間3でスロットラインを形成した例で、その伝送ラ
インの一方の端から高周波電力を電源Gから供給し、ラ
インの他端には無反射終端を接続して、反射波を検出す
るか、或は電力検出器を置いて、通過電力の変化を検出
し、その検出信号をコンピュータ処理する。Figures 1 to 3 show a dielectric substrate l with a metal plate (or metal foil strip) 2. and 22 are arranged at appropriate intervals and a slot line is formed in the gap 3. High frequency power is supplied from the power supply G from one end of the transmission line, and a non-reflection termination is connected to the other end of the line. Then, the reflected wave is detected, or a power detector is installed to detect a change in the passing power, and the detected signal is processed by a computer.
第2図はそのライン3と交差して平板(布状)の試料T
1を金属板面に沿って移動させる状態、第3図は繊維状
の試料T2を示す、誘電体Tに含有する異物fは長さ・
大きさ・送り方向に対する向き等はアットランダムであ
るので、スロット3と試料送り方向とのなす角0を変化
させることにより、検出が容易になった。送り機構はバ
ッジ式でもベルトコンベア方式でも可能である。Figure 2 shows a flat (cloth-like) sample T that intersects line 3.
1 is moved along the metal plate surface, and FIG. 3 shows a fibrous sample T2. The foreign matter f contained in the dielectric T is
Since the size, direction with respect to the feeding direction, etc. are at random, detection is facilitated by changing the angle 0 between the slot 3 and the sample feeding direction. The feeding mechanism can be either a badge type or a belt conveyor type.
実験によれば、周波数10 GHzのマイクロ波を用い
厚さ数■の布状の誘電体に含まれた直径10g・長さ5
1程度の繊維状の金属片fの検出がiif能であった。According to an experiment, using microwaves with a frequency of 10 GHz, a material with a diameter of 10 g and a length of 5
It was possible to detect approximately 1 fibrous metal piece f.
また直径10ル・長さ2ffiII+程度の異物fでも
検出が可能であった。It was also possible to detect a foreign object f with a diameter of about 10 l and a length of about 2ffiII+.
第4図はスロットラインと回等の伝送ラインの数例を示
す、同図 (A)の接地板4は有無画形式がある。同図
(B)はコプレーナ・ウェーブガイド、(C)はHガ
イドである。FIG. 4 shows several examples of transmission lines such as slot lines and transmission lines. The ground plate 4 shown in FIG. In the same figure, (B) is a coplanar waveguide, and (C) is an H guide.
ハ、発明の効果
本発明は−F述のように、誘電体板に金属帯状体を装置
しただけの簡単な伝送ラインに試料を近接移動させるも
のであるから、装置が小型で持ち運びも容易であり、試
料の交換も容易で操作性に優れている。また高電圧大電
力を用いないから安全で、装置も小型化されるものであ
る。C. Effects of the Invention As mentioned in -F, the present invention moves a sample close to a simple transmission line consisting of a metal strip attached to a dielectric plate, so the device is small and easy to carry. It is easy to exchange samples and has excellent operability. Furthermore, since high voltage and large power are not used, it is safe and the device can be made smaller.
第1図は、本発明の伝送ラインとしてのスロワI・ライ
ンを説明する横断面図、第2図は平板状試ネ′]、第3
図はta維状状試料異物検出要領の説明図、第4図 (
A) (B) (C)は他の伝送ラインの横断面図。
G・・・マイクロ波信号電源、l・・・誘電体、2、・
22・・・金属板、3・・・スロットライン、4・・・
接地板、TI・・・モ板状試料、T2・・・繊維状試料
。FIG. 1 is a cross-sectional view illustrating a thrower I line as a transmission line of the present invention, FIG. 2 is a flat test tube, and FIG.
The figure is an explanatory diagram of the procedure for detecting foreign matter in a ta fibrous sample, and Figure 4 (
A) (B) (C) are cross-sectional views of other transmission lines. G...Microwave signal power supply, l...Dielectric material, 2,...
22...Metal plate, 3...Slot line, 4...
Ground plate, TI... plate-like sample, T2... fibrous sample.
Claims (1)
を、スロットライン又はこれと同等の伝送ラインに伝播
させ、被測定誘電体を、これと電磁気的に結合させ、該
誘電体を上記伝送ラインと交差方向に移動させて、正常
な誘電体と異物を含有する同種の誘電体の相対的な電磁
気的変化を読取り異物の存在を検出することを特徴とす
るマイクロ波による誘電体内の異物検出方法。(1) Propagate a continuous wave or frequency swept microwave signal to a slot line or equivalent transmission line, electromagnetically couple the dielectric to be measured, and connect the dielectric to the transmission line. A method for detecting foreign matter in a dielectric using microwaves, which is characterized in that the presence of a foreign matter is detected by reading the relative electromagnetic change between a normal dielectric and a dielectric of the same type containing a foreign matter by moving the dielectric in a direction crossing the dielectric. .
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP61027578A JP2584727B2 (en) | 1986-02-10 | 1986-02-10 | Detecting device for foreign matter in dielectric by microwave |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP61027578A JP2584727B2 (en) | 1986-02-10 | 1986-02-10 | Detecting device for foreign matter in dielectric by microwave |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS62185151A true JPS62185151A (en) | 1987-08-13 |
JP2584727B2 JP2584727B2 (en) | 1997-02-26 |
Family
ID=12224859
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP61027578A Expired - Fee Related JP2584727B2 (en) | 1986-02-10 | 1986-02-10 | Detecting device for foreign matter in dielectric by microwave |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2584727B2 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5376889A (en) * | 1991-10-10 | 1994-12-27 | Hughes Aircraft Company | System and method for detecting and locating flaws on or beneath a surface |
JP2021124309A (en) * | 2020-02-03 | 2021-08-30 | 株式会社豊田中央研究所 | Cavity resonator for foreign body detection, and foreign body detection device and method |
-
1986
- 1986-02-10 JP JP61027578A patent/JP2584727B2/en not_active Expired - Fee Related
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5376889A (en) * | 1991-10-10 | 1994-12-27 | Hughes Aircraft Company | System and method for detecting and locating flaws on or beneath a surface |
JP2021124309A (en) * | 2020-02-03 | 2021-08-30 | 株式会社豊田中央研究所 | Cavity resonator for foreign body detection, and foreign body detection device and method |
Also Published As
Publication number | Publication date |
---|---|
JP2584727B2 (en) | 1997-02-26 |
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Legal Events
Date | Code | Title | Description |
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R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
LAPS | Cancellation because of no payment of annual fees |