JPS62106170U - - Google Patents
Info
- Publication number
- JPS62106170U JPS62106170U JP1985197978U JP19797885U JPS62106170U JP S62106170 U JPS62106170 U JP S62106170U JP 1985197978 U JP1985197978 U JP 1985197978U JP 19797885 U JP19797885 U JP 19797885U JP S62106170 U JPS62106170 U JP S62106170U
- Authority
- JP
- Japan
- Prior art keywords
- chip
- shaped electronic
- check bars
- electronic component
- electronic components
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000007689 inspection Methods 0.000 claims description 3
- 230000002950 deficient Effects 0.000 claims 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1985197978U JPS62106170U (US06174465-20010116-C00003.png) | 1985-12-23 | 1985-12-23 | |
US07/294,973 US4891583A (en) | 1985-12-23 | 1988-12-30 | Inspection mechanism for chip type circuit element |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1985197978U JPS62106170U (US06174465-20010116-C00003.png) | 1985-12-23 | 1985-12-23 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS62106170U true JPS62106170U (US06174465-20010116-C00003.png) | 1987-07-07 |
Family
ID=16383480
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1985197978U Pending JPS62106170U (US06174465-20010116-C00003.png) | 1985-12-23 | 1985-12-23 |
Country Status (2)
Country | Link |
---|---|
US (1) | US4891583A (US06174465-20010116-C00003.png) |
JP (1) | JPS62106170U (US06174465-20010116-C00003.png) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5265328A (en) * | 1992-12-11 | 1993-11-30 | Stratos Product Development Group, Inc. | Circuit module extraction tool and method |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4991775A (US06174465-20010116-C00003.png) * | 1972-12-26 | 1974-09-02 | ||
JPS58184559A (ja) * | 1982-04-21 | 1983-10-28 | Toshiba Corp | 半導体測定用保持装置 |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4152644A (en) * | 1978-06-02 | 1979-05-01 | Burroughs Corporation | Fixture for testing integrated circuits |
US4686468A (en) * | 1984-12-10 | 1987-08-11 | Aseco Corporation | Contact set for test apparatus for testing integrated circuit package |
-
1985
- 1985-12-23 JP JP1985197978U patent/JPS62106170U/ja active Pending
-
1988
- 1988-12-30 US US07/294,973 patent/US4891583A/en not_active Expired - Fee Related
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4991775A (US06174465-20010116-C00003.png) * | 1972-12-26 | 1974-09-02 | ||
JPS58184559A (ja) * | 1982-04-21 | 1983-10-28 | Toshiba Corp | 半導体測定用保持装置 |
Also Published As
Publication number | Publication date |
---|---|
US4891583A (en) | 1990-01-02 |