JPS6150356A - Adjustment for impedance of impedance parts - Google Patents
Adjustment for impedance of impedance partsInfo
- Publication number
- JPS6150356A JPS6150356A JP59172585A JP17258584A JPS6150356A JP S6150356 A JPS6150356 A JP S6150356A JP 59172585 A JP59172585 A JP 59172585A JP 17258584 A JP17258584 A JP 17258584A JP S6150356 A JPS6150356 A JP S6150356A
- Authority
- JP
- Japan
- Prior art keywords
- trimming
- parts
- impedance
- component
- laser
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01C—RESISTORS
- H01C17/00—Apparatus or processes specially adapted for manufacturing resistors
- H01C17/22—Apparatus or processes specially adapted for manufacturing resistors adapted for trimming
- H01C17/24—Apparatus or processes specially adapted for manufacturing resistors adapted for trimming by removing or adding resistive material
- H01C17/242—Apparatus or processes specially adapted for manufacturing resistors adapted for trimming by removing or adding resistive material by laser
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
- H10D86/80—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple passive components, e.g. resistors, capacitors or inductors
- H10D86/85—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple passive components, e.g. resistors, capacitors or inductors characterised by only passive components
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/18—Printed circuits structurally associated with non-printed electric components
- H05K1/181—Printed circuits structurally associated with non-printed electric components associated with surface mounted components
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/22—Secondary treatment of printed circuits
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Plasma & Fusion (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Apparatuses And Processes For Manufacturing Resistors (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は、プリント基板に装着され導電膜及び絶縁板を
含むインピーダンス部品のインピーダンス値を調整する
方法に関するものである。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a method for adjusting the impedance value of an impedance component mounted on a printed circuit board and including a conductive film and an insulating plate.
従来、プリント基板に装着された抵抗体の抵抗値を調整
できるようにするため、半固定抵抗器が使用されていた
。しかし、リード形半固定抵抗器は高密度実装に適さず
、チップ形半固定抵抗器は、ディラグ半田付は時のフラ
ックスが接点の接触不良を起こし、リード形より高価の
割に信頼性に欠けていた。そこで、かかる従来の半固定
抵抗器に代え、絶縁板にカーボン抵抗膜を被着した部品
を使用し、これをレーザー光線によ、9)リミング又は
カットして抵抗値を調整する方法が考えられた。Conventionally, semi-fixed resistors have been used to adjust the resistance value of resistors mounted on printed circuit boards. However, lead-type semi-fixed resistors are not suitable for high-density mounting, and chip-type semi-fixed resistors are more expensive and less reliable than lead-type resistors because the flux during delag soldering causes contact failure. was. Therefore, instead of such conventional semi-fixed resistors, a method was devised in which a component in which a carbon resistive film is coated on an insulating plate is used, and the resistance value is adjusted by rimming or cutting it using a laser beam. .
第5図は従来のチップ抵抗部品を用いた場合のレーザー
・トリミング結果を示すもので、同図Aは平面図、同図
Bは同図Aのx−xHve沿う断面図である。これらの
図において、(11はチップ部品を全体として示し、(
11)はチップ部品の電極、 (12)はカーがン抵抗
膜、(13)はセラミック等の絶縁板、(2)はチップ
部品ランド及び・リーン、(3)はチップ部品の下を通
るノ9ターン、(4)はトリミングφカツト部、(5)
はプリント基板を示す。特K、第1図Aの(41)は、
トリミング・カット部(4)のスタート付近で下のパタ
ーン(3)がレーザm−ビームによって切られた部分を
示す。このように、実装後のレーザー・トリミングにお
いてはどうしてもトリミング・スタート点でレーザー−
ビームが下のパターン(3)をも切ってしまうという問
題があった。″これを防ぐため罠考えられる第1の方法
は、下の・母ターン(3)の幅を部分的に太くすること
である。FIG. 5 shows the results of laser trimming when a conventional chip resistor component is used. FIG. 5A is a plan view, and FIG. 5B is a cross-sectional view along x-xHve of FIG. In these figures, (11 indicates the chip component as a whole, (
11) is the electrode of the chip component, (12) is the Kergan resistive film, (13) is the insulating plate such as ceramic, (2) is the land and lean of the chip component, and (3) is the hole passing under the chip component. 9 turns, (4) is the trimming φ cut part, (5)
indicates a printed circuit board. Special K, (41) in Figure 1A is
Near the start of the trimming cut (4), the lower pattern (3) shows the section cut by the laser m-beam. In this way, in laser trimming after mounting, it is inevitable that the laser
There was a problem that the beam also cut the pattern (3) below. ``The first method that can be considered to prevent this is to partially increase the width of the lower mother turn (3).
これを第5図Aに点線で示す。次に考えられるのは、第
6図に示すように下のパターン(31を横にすらす方法
である。また、第7図に示すように、下の)やターン(
3)を2つのパターン(31)と(32)とに分割する
方法も考えられる。しかしながら、これらの方法は、い
ずれも・ぞターンの力を変えるものであるから、ieタ
ーンの設計が面倒になる。This is shown by the dotted line in FIG. 5A. The next possibility is to lay the lower pattern (31 horizontally) as shown in Figure 6. Also, as shown in Figure 7, the lower pattern (31) or the turn (
A method of dividing 3) into two patterns (31) and (32) can also be considered. However, since all of these methods change the force of the ie-turn, the design of the ie-turn becomes complicated.
したがって、本発明は、ノ千ターンはそのままとしノぞ
ターンに傷が付かないようにレーザm−トリミングして
、プリント基板に実装された抵抗部品の1 抵
抗値を調整する方法を提供することを主な目的とする。Therefore, the present invention provides a method for adjusting the resistance value of a resistor component mounted on a printed circuit board by leaving the 1,000 turns as they are and performing laser m-trimming so as not to damage the 1,000 turns. Main purpose.
しかし、本発明は、後述のように抵抗部品のほかに他の
インピーダンス部品にも適用しうるも2のである。However, the present invention can also be applied to other impedance components in addition to resistive components, as will be described later.
本発明は、後記の実施例を参照していえは、上記カーボ
ンのような抵抗膜のうちトリミング・スタート点を含む
一部分を除去してその下のセラミック部を露出させた抵
抗部品を用い、その露出部分にトリミング−スタート点
を設定してレーザー・トリミングを行ない、その抵抗部
品を含む回路が所定の特性(例えば電流)値を示す時点
でトリミングを終了するようにしたものである。The present invention uses a resistor component in which a portion of the resistive film such as carbon, including the trimming start point, is removed to expose the ceramic portion underneath. Laser trimming is performed by setting a trimming start point in the exposed portion, and the trimming is completed when the circuit including the resistor component exhibits a predetermined characteristic (for example, current) value.
露出したセラミック部のトリミング・スタート位置より
レーザー・トリミングを開始し、抵抗体の抵抗値を直接
又は間接に測定しながら、所定値に達した時点でトリミ
ングを停止する。したがって、抵抗部品の下を通るパタ
ーンに傷を付けることなく、実装抵抗部品の抵抗値を調
整することができる。Laser trimming is started from the trimming start position of the exposed ceramic portion, and while the resistance value of the resistor is measured directly or indirectly, trimming is stopped when a predetermined value is reached. Therefore, the resistance value of the mounted resistor component can be adjusted without damaging the pattern passing under the resistor component.
以下図面を参照しながら本発明インピーダンス部品のイ
ンピーダンス調整方法の一実施例につき説明する。An embodiment of the method for adjusting the impedance of an impedance component according to the present invention will be described below with reference to the drawings.
第1図は、本発明により抵抗体の抵抗値が調整されたチ
ップ部品を示す平面図である。この図において、チップ
部品(1)のカーボン抵抗膜(12)は部品電極(11
)と直角方向の両端部分がほぼ全体にわたシ除去されて
いて、セラミック部(13)が露出している。このセラ
ミック部(13)内の所定位置にトリミンク・スタート
点(6)が設定され、この点よりレーザー・トリミング
が開始されたトリミング・カット部が示されている。こ
のようなトリミングを行なうための装置としては、°穐
々のものが考えられる。FIG. 1 is a plan view showing a chip component in which the resistance value of a resistor is adjusted according to the present invention. In this figure, the carbon resistance film (12) of the chip component (1) is connected to the component electrode (11).
) and both end portions in the direction perpendicular to it have been almost completely removed to expose the ceramic portion (13). A trimming start point (6) is set at a predetermined position within this ceramic portion (13), and a trimming cut portion from which laser trimming is started from this point is shown. As a device for performing such trimming, various devices can be considered.
第2図は、本発明方法に使用される装置の一例を示す概
略図である。この図において、00)はレーザー光源、
(111はプリント基板(5)を載置した移動可能な台
、a’aVi例えばモータの如き移動手段、131はチ
ップ部品(1)を含む回路の特性を示す測定器、o4)
はビデオ・カメラ、(+51は移動制御回路である。FIG. 2 is a schematic diagram showing an example of an apparatus used in the method of the present invention. In this figure, 00) is a laser light source,
(111 is a movable table on which the printed circuit board (5) is placed, a'aVi is a moving means such as a motor, 131 is a measuring device that shows the characteristics of the circuit including the chip component (1), o4)
is a video camera, and (+51 is a movement control circuit).
いま、ビデオ・カメラIと移動制御回路O9がない場合
を考える。まず、レーザー光源(101に内蔵した補助
光源より可視光線を発射させプリント基板上のレーザー
光線投射点と同じ点にスポットが生じるようにし、スポ
ットと〕やターンを見ながら移動手段0zを介して台α
DをX及びY方向に移動させて、このスポラ)Kチップ
部品(1)の上記のセラミック部(la) K設定した
トリミング・スター)A(61を合わせる。見易くする
ため、トリミング・スタート点(6)Kは適当なマーク
を付けておくのがよい。Now, consider a case where the video camera I and the movement control circuit O9 are not provided. First, emit visible light from the auxiliary light source built into the laser light source (101) so that a spot is generated at the same point as the laser beam projection point on the printed circuit board.
Move D in the X and Y directions to align the above ceramic part (la) of the spora) K chip component (1) K set trimming star) A (61. To make it easier to see, mark the trimming start point ( 6) It is best to mark K appropriately.
この後、トリミングを開始させ、測定器(131が所定
値を示すまでレーザー光源0α又は台0υを動かしてト
リミングを行ない、所定値を示した時点でレーザー光源
001又は金的)を停止させトリミングを終了する。上
記のような移動手段0zにより台01)をX及びY方向
に移動させることは公知技術より容易に考えられるので
、詳細な説明は省略する。この方法は人間の眼を使用し
てレーザー投射点とトリミング・スタート点を合わせた
が、これをビデオ・カメラ0ルと移動制御回路a9で行
なうこともできる。After that, start trimming and perform trimming by moving the laser light source 0α or platform 0υ until the measuring device (131 shows a predetermined value), and then stop the laser light source 001 or gold metal when it shows the predetermined value and start trimming. finish. Since it is easier to move the table 01) in the X and Y directions using the moving means 0z as described above than in known techniques, a detailed explanation will be omitted. Although this method uses the human eye to align the laser projection point and the trimming start point, this can also be done with a video camera and a movement control circuit a9.
すなわち、例えば、レーザー光線のプリント基板上への
投射点がカメラ撮像面の中央になるようにカメラ0沿を
固定し、予め記憶させた所定のトリミング・スタート点
を示すビデオ信号を移動制御回路+151内の比較器の
一方の入力に供給し、この信号とカメラ0滲より得られ
るビデオ信号とを比較して得られるスタート点に対する
X及びY方向の差信号により移動手段07Jを制御する
ようにする。That is, for example, the camera 0 is fixed so that the projection point of the laser beam onto the printed circuit board is at the center of the camera imaging surface, and a video signal indicating a predetermined trimming start point stored in advance is sent to the movement control circuit +151. The moving means 07J is controlled by the difference signal in the X and Y directions with respect to the starting point obtained by comparing this signal with the video signal obtained from the camera 0.
第3図は、本発明に用いうるチップ部品の他の例を示す
平面図である。本例は、トリミングの方向又はマウント
の方向が一定の部品に使用しうるものである。第4図は
、本発明に用いうるチップ部品の更に他の例を示す平面
図である。本例は、セラミック部(13)の露出面積を
小さくしてトリミング・スタート点を示すマークとなる
ようにしたものである。こうすると、カメラ041によ
りこのセラミック部をトリミング・スタート点として認
識することができる。また、本例は、第1図の例と1
同様に、トリミングの方向又はマウントの方
向に関係なく使用しうるものである。FIG. 3 is a plan view showing another example of a chip component that can be used in the present invention. This example can be used for parts whose trimming direction or mounting direction is constant. FIG. 4 is a plan view showing still another example of a chip component that can be used in the present invention. In this example, the exposed area of the ceramic portion (13) is reduced to serve as a mark indicating the trimming start point. This allows the camera 041 to recognize this ceramic portion as a trimming start point. In addition, this example is similar to the example in Figure 1.
Similarly, it can be used regardless of the trimming or mounting orientation.
以上、カーボン抵抗膜を有するチップ部品を例にとって
説明したが、本発明は、導’L、膜と絶縁板を含む部品
であれは、コンデンサやインダクタのようなインピーダ
ンス部品にも適用しうるものである。すなわち、導電膜
を極板として、絶縁板を誘電体としてもつコンデンサに
おいては、少なくとも一方の極板をトリミングすること
により容量を調整することができるので、予め片面の導
taの一部を除去し露出した絶縁板の一部にトリミング
・スタート点を設定すればよい。また、インダクタにお
いては、抵抗の場合と全く同様に考えることができる。The above explanation has been given using a chip component having a carbon resistive film as an example, but the present invention can also be applied to impedance components such as capacitors and inductors as long as the component includes a conductive L, film and an insulating plate. be. In other words, in a capacitor that has a conductive film as a plate and an insulating plate as a dielectric, the capacitance can be adjusted by trimming at least one plate. It is sufficient to set a trimming start point on a part of the exposed insulation board. Furthermore, inductors can be considered in exactly the same way as resistors.
よって、本発FJIJにおいて、導電膜は抵抗部品の場
合に抵抗膜を指し、コンデンサ部品の場合は極板を指す
ことになる。Therefore, in the present FJIJ, the conductive film refers to the resistive film in the case of a resistive component, and refers to the electrode plate in the case of a capacitor component.
本発明によれば、プリント基板に実装されたインピーダ
ンス部品のインピーダンス値を調整するに際し、その部
品の下を通るパターンを傷付けたシ切ったりしないでレ
ーザー−トリミングすることができる。したがって、抵
抗部品の場合は、従来の半固定抵抗部品の代わ)Kチッ
プ部品を使用することが容易となシ、高密度実装及び低
コスト化が可能になると共に信頼性が向上する。他のイ
ンピーダンス部品の場合も同様である。According to the present invention, when adjusting the impedance value of an impedance component mounted on a printed circuit board, laser trimming can be performed without damaging or cutting a pattern passing under the component. Therefore, in the case of resistance components, it is easy to use K-chip components (in place of conventional semi-fixed resistance components), which enables high-density packaging and cost reduction, and improves reliability. The same applies to other impedance components.
第1図は本発明により抵抗値が調整されたチップ抵抗部
品を示す平面図、第2図は本発明に使用される装置の一
例を示す概略図、第3図は本発明に用いるチップ部品の
他の例を示す平面図、第4図は本発明に用いるチップ部
品の更に他の例を示す平面図、第5図は従来のチップ部
品を用いた場合のレーザー・トリミング結果を示す図、
第6図はチップ部品の下のパターンを傷付けない方法の
一例を示す平面図、第7図は同じく下の・やターンを傷
付けない方法の他の例を示す平面図である。
(])・・・抵抗(インピーダンス)部品、(12)・
・・抵抗(導電)膜、(13)・・・絶縁板、(6)・
・・トリミング・スタート点。FIG. 1 is a plan view showing a chip resistance component whose resistance value has been adjusted according to the present invention, FIG. 2 is a schematic diagram showing an example of a device used in the present invention, and FIG. FIG. 4 is a plan view showing another example of the chip component used in the present invention; FIG. 5 is a diagram showing the laser trimming result when conventional chip components are used;
FIG. 6 is a plan view showing an example of a method of not damaging the pattern below the chip component, and FIG. 7 is a plan view showing another example of a method of preventing damage to the bottom pattern. (])...Resistance (impedance) parts, (12)
...Resistive (conductive) film, (13)...Insulating plate, (6)...
...Trimming start point.
Claims (1)
一部をレーザー光線でトリミングすることによりインピ
ーダンス値を調整するインピーダンス部品のインピーダ
ンス調整方法において、上記導電膜のうち予め定めたト
リミング・スタート点を含む一部分を除去して上記絶縁
板の一部分を露出した部品を用い、このトリミング・ス
タート点からトリミングを開始し、上記インピーダンス
部品が所定のインピーダンス値を示す時点においてトリ
ミングを停止することを特徴とするインピーダンス部品
のインピーダンス調整方法。In an impedance adjustment method for an impedance component, in which the impedance value is adjusted by trimming a part of the conductive film of the impedance component including a conductive film and an insulating plate with a laser beam, a portion of the conductive film that includes a predetermined trimming start point. An impedance component characterized in that using a component in which a part of the insulating plate is exposed by removing the component, trimming is started from this trimming start point, and trimming is stopped when the impedance component shows a predetermined impedance value. impedance adjustment method.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59172585A JPH067580B2 (en) | 1984-08-20 | 1984-08-20 | Impedance adjustment method for impedance parts |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59172585A JPH067580B2 (en) | 1984-08-20 | 1984-08-20 | Impedance adjustment method for impedance parts |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6150356A true JPS6150356A (en) | 1986-03-12 |
| JPH067580B2 JPH067580B2 (en) | 1994-01-26 |
Family
ID=15944564
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP59172585A Expired - Lifetime JPH067580B2 (en) | 1984-08-20 | 1984-08-20 | Impedance adjustment method for impedance parts |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH067580B2 (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0353503A (en) * | 1989-07-20 | 1991-03-07 | Riide Electron:Kk | Illumination light moving type laser trimming device |
| JP2006046991A (en) * | 2004-08-02 | 2006-02-16 | Micronics Japan Co Ltd | Calibration substrate trimming apparatus and trimming method |
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|---|---|---|---|---|
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| JPS58131999A (en) * | 1982-01-30 | 1983-08-06 | Osaka Chem Lab | Antitumor agent |
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1984
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|---|---|---|---|---|
| JPS5517306U (en) * | 1978-07-19 | 1980-02-04 | ||
| JPS5619613A (en) * | 1979-07-25 | 1981-02-24 | Mitsubishi Electric Corp | Manufacture of inductance element |
| JPS5650552A (en) * | 1979-10-02 | 1981-05-07 | Nec Corp | Manufacture of hybrid integrated circuit device |
| JPS56158900A (en) * | 1980-05-10 | 1981-12-07 | Tanaka Denshi Kogyo Kk | Method for working tip of needle of stainless steel needle by electrolytic polishing |
| JPS5863704U (en) * | 1981-10-23 | 1983-04-28 | 三菱電機株式会社 | chip resistor |
| JPS58131529A (en) * | 1982-01-29 | 1983-08-05 | Mitsubishi Electric Corp | Thrust load detection device for rotating shaft |
| JPS58131999A (en) * | 1982-01-30 | 1983-08-06 | Osaka Chem Lab | Antitumor agent |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0353503A (en) * | 1989-07-20 | 1991-03-07 | Riide Electron:Kk | Illumination light moving type laser trimming device |
| JP2006046991A (en) * | 2004-08-02 | 2006-02-16 | Micronics Japan Co Ltd | Calibration substrate trimming apparatus and trimming method |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH067580B2 (en) | 1994-01-26 |
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