JPS6141846B2 - - Google Patents
Info
- Publication number
- JPS6141846B2 JPS6141846B2 JP3816779A JP3816779A JPS6141846B2 JP S6141846 B2 JPS6141846 B2 JP S6141846B2 JP 3816779 A JP3816779 A JP 3816779A JP 3816779 A JP3816779 A JP 3816779A JP S6141846 B2 JPS6141846 B2 JP S6141846B2
- Authority
- JP
- Japan
- Prior art keywords
- boron
- substrate
- mol
- aluminum
- chromium
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 229910052796 boron Inorganic materials 0.000 claims description 51
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 claims description 50
- 239000000758 substrate Substances 0.000 claims description 23
- 238000000034 method Methods 0.000 claims description 17
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 claims description 16
- 229910052804 chromium Inorganic materials 0.000 claims description 16
- 239000011651 chromium Substances 0.000 claims description 16
- 239000000463 material Substances 0.000 claims description 16
- 229910052782 aluminium Inorganic materials 0.000 claims description 15
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 15
- 238000005229 chemical vapour deposition Methods 0.000 claims description 13
- 239000010953 base metal Substances 0.000 claims description 5
- 238000004519 manufacturing process Methods 0.000 claims description 5
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 13
- 239000010410 layer Substances 0.000 description 7
- 229910052715 tantalum Inorganic materials 0.000 description 7
- 239000001257 hydrogen Substances 0.000 description 5
- 229910052739 hydrogen Inorganic materials 0.000 description 5
- 229910052751 metal Inorganic materials 0.000 description 5
- 239000002184 metal Substances 0.000 description 5
- 238000004544 sputter deposition Methods 0.000 description 5
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 4
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 4
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 4
- 238000005452 bending Methods 0.000 description 4
- 238000000576 coating method Methods 0.000 description 4
- 239000013078 crystal Substances 0.000 description 4
- 230000000694 effects Effects 0.000 description 4
- 238000010438 heat treatment Methods 0.000 description 4
- 229910052750 molybdenum Inorganic materials 0.000 description 4
- 239000011733 molybdenum Substances 0.000 description 4
- 239000000126 substance Substances 0.000 description 4
- 239000010936 titanium Substances 0.000 description 4
- 229910052719 titanium Inorganic materials 0.000 description 4
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 4
- 229910052721 tungsten Inorganic materials 0.000 description 4
- 239000010937 tungsten Substances 0.000 description 4
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 3
- 229910052794 bromium Inorganic materials 0.000 description 3
- 239000011248 coating agent Substances 0.000 description 3
- 239000002131 composite material Substances 0.000 description 3
- 229910052758 niobium Inorganic materials 0.000 description 3
- 239000010955 niobium Substances 0.000 description 3
- GUCVJGMIXFAOAE-UHFFFAOYSA-N niobium atom Chemical compound [Nb] GUCVJGMIXFAOAE-UHFFFAOYSA-N 0.000 description 3
- 239000000047 product Substances 0.000 description 3
- WKBOTKDWSSQWDR-UHFFFAOYSA-N Bromine atom Chemical compound [Br] WKBOTKDWSSQWDR-UHFFFAOYSA-N 0.000 description 2
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 2
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 description 2
- 239000012814 acoustic material Substances 0.000 description 2
- GDTBXPJZTBHREO-UHFFFAOYSA-N bromine Substances BrBr GDTBXPJZTBHREO-UHFFFAOYSA-N 0.000 description 2
- 229910052801 chlorine Inorganic materials 0.000 description 2
- 239000000460 chlorine Substances 0.000 description 2
- 150000001875 compounds Chemical class 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 2
- 238000009713 electroplating Methods 0.000 description 2
- 230000002829 reductive effect Effects 0.000 description 2
- ZAMOUSCENKQFHK-UHFFFAOYSA-N Chlorine atom Chemical compound [Cl] ZAMOUSCENKQFHK-UHFFFAOYSA-N 0.000 description 1
- QQHSIRTYSFLSRM-UHFFFAOYSA-N alumanylidynechromium Chemical compound [Al].[Cr] QQHSIRTYSFLSRM-UHFFFAOYSA-N 0.000 description 1
- 150000001638 boron Chemical class 0.000 description 1
- -1 boron halide Chemical class 0.000 description 1
- 238000005266 casting Methods 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 239000011247 coating layer Substances 0.000 description 1
- RKTYLMNFRDHKIL-UHFFFAOYSA-N copper;5,10,15,20-tetraphenylporphyrin-22,24-diide Chemical compound [Cu+2].C1=CC(C(=C2C=CC([N-]2)=C(C=2C=CC=CC=2)C=2C=CC(N=2)=C(C=2C=CC=CC=2)C2=CC=C3[N-]2)C=2C=CC=CC=2)=NC1=C3C1=CC=CC=C1 RKTYLMNFRDHKIL-UHFFFAOYSA-N 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- 238000000354 decomposition reaction Methods 0.000 description 1
- 238000005238 degreasing Methods 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 229910003460 diamond Inorganic materials 0.000 description 1
- 239000010432 diamond Substances 0.000 description 1
- 238000004090 dissolution Methods 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- 229910052736 halogen Inorganic materials 0.000 description 1
- 150000002367 halogens Chemical group 0.000 description 1
- 150000002431 hydrogen Chemical class 0.000 description 1
- PNDPGZBMCMUPRI-UHFFFAOYSA-N iodine Chemical compound II PNDPGZBMCMUPRI-UHFFFAOYSA-N 0.000 description 1
- 229910052740 iodine Inorganic materials 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000010297 mechanical methods and process Methods 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 239000000843 powder Substances 0.000 description 1
- 239000002244 precipitate Substances 0.000 description 1
- 238000001556 precipitation Methods 0.000 description 1
- 239000002994 raw material Substances 0.000 description 1
- 238000005096 rolling process Methods 0.000 description 1
- 238000011282 treatment Methods 0.000 description 1
- FAQYAMRNWDIXMY-UHFFFAOYSA-N trichloroborane Chemical compound ClB(Cl)Cl FAQYAMRNWDIXMY-UHFFFAOYSA-N 0.000 description 1
- 238000007738 vacuum evaporation Methods 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/01—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes on temporary substrates, e.g. substrates subsequently removed by etching
Landscapes
- Chemical & Material Sciences (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Chemical Vapour Deposition (AREA)
- Diaphragms For Electromechanical Transducers (AREA)
Description
本発明は、硼素構造材の製造方法にかかり、特
に硼素構造材を構成する硼素の膜質や機械的性質
の向上と、硼素構造材の製造保留りおよび生産性
の向上を図ることを目的とするものである。
硼素は、ダイヤモンドに次ぐ硬度をもち、その
耐摩耗性も非常に大きいものであるため、切削工
具や摺動機械部品、軸受けなどに適した材料であ
る。また、比弾性率(弾性率/密度)が、現在知
られている物質中では、最大という優れた特徴を
もつている。この性質は音波の伝幡速度が既存の
物質中で最大であることを意味し、音響材料とし
て特に有用である。
硼素応用製品を、鋳造や圧延といつた方法によ
つて、緻密な塊や薄肉、薄肉パイプ等の状態で得
ることは困難なことである。このため、種々の硼
素応用製品の製作にあたつては、ほとんどの場
合、硼素以外の材料からなる基体上に、蒸着法
や、スパツタリング法、化学蒸着法(以下CVD
法という)などによつて、硼素以外の材料からな
る基体上に硼素皮膜を形成した複合体として用い
られている。
このような従来の方法で作られた複合構造材料
は、硼素の硬さやその優れた耐摩耗性を利用する
製品の場合には、大きな支障を生じるようなこと
がない。ところが、比弾性率の大きさを利用しよ
うとする、スピーカの振動板やカートリツジのカ
ンチレバーなどの音響材料などでは、きわめて重
大な支障となる。すなわち、複合体の密度や弾性
率は基体の性質に大きく左右され、硼素本来の性
質がそれによつて大きく減殺されるからである。
一方、硼素を化学的あるいは物理的な処理により
基体から分離させる試みは数多くあるが、蒸着さ
れた硼素皮膜と基体との間に熱膨脹率の違いなど
によつて歪が生じ、そのため、硼素皮膜にクラツ
クなどが生じて、十分な機械的強度のある硼素皮
膜を歩留りよく得ることがむずかしかつた。
発明者らは、かかる従来の方法にあつた欠点を
除去するためには、タンタルやニオブ、モリブデ
ン、タングステン、チタンなどの金属を基体と
し、その表面にアルミニウムを1.0モル%〜35.0
モル%含むクロムを所望の厚さに付着させ、この
上に化学蒸着することが有効であることを見出し
た。
以下、本発明の方法について具体的に説明す
る。硼素をCVD法により基体上に形成するに
は、たとえば反応器内に置かれた基体を赤外線加
熱や高周波加熱、通電といつた方法で加熱し、次
式に示すような還元分解反応により硼素を析出さ
せる。
2BX3+3H2→2B+6HX
(ただし、Xは、Cl、Br、Iなどのハロゲン元素
である。)
CVD法に使用することのできる原料ガスとし
ては、ハロゲン化硼素BX3のほかに、硼素の水素
化合物などもある。
また、この硼素析出反応においては、加熱温度
や、反応器への原料がこの流入量などにより、
種々の結晶形が得られる。各種の結晶形のうち
で、緻密で、機械的性質に優れた硼素皮膜を得る
ためには、β−ロンボヘドラル、テトラゴナル、
あるいは非晶質の硼素が望ましい。
次に化学的あるいは機械的な方法により、基体
を溶解除去あるいは剥離さしたりし、主な硼素単
体からなるパイプや板を得る。化学的方法として
は、主に弗酸を主とする液を使用することが考え
られる。また、特に効果的な液としては、無水ア
ルコールに、臭素、塩素、沃素、または、これら
2種以上の化合物や混合物を溶解させたもの。
基体を構成するための金属としては、硼素の
CVDが高温度下(9000℃以上)で行なわれるた
め、また、通電や高周波加熱が容易であることを
考えあわせると、タンタル、ニオブ、モリブデ
ン、チタン、タングステンなどが望ましい。これ
ら材料のうちでも、CVDが水素気流中で行われ
るため、水素脆化の程度の小さいタンタルとモリ
ブデン、タングステンがより望ましい。また、沈
積した硼素皮膜と基体との熱歪を小さくするため
には、熱膨脹係数が硼素に近いタンタルや、チタ
ンがより望ましい。
本発明の方法の主要な要点は、上記金属上にア
ルミニウムを1.0モル%〜35.0モル%含むクロム
を電気メツキ法やCVD法、スパツタ法、真空蒸
着法により付着させ、それを所望の厚さの層で被
覆して、基体とすることにある。しかる後、硼素
を基体上に析出させ、さらに、基体を選択的に溶
解して除去したり機械的に除去したりして、硼素
からなる構造物を得るわけである。従来、金属基
体のみや金属基体上にクロムのみを被覆した基体
を用いたとき、選択溶解や機械的な剥離を行なう
過程で、硼素皮膜が破壊し、また得られた硼素構
造物の機械的性質があまりよくない場合があつ
た。本発明の方法により、これらの点において、
大巾な改善がなされた。特に硼素が非晶質の場合
大巾に改善された。これにより、たとえば基体を
線状としたときにはパイプ状の硼素構造材が、ま
たそれを板状としたときには薄板状の硼素構造材
がそれぞれ得られる。
本発明において、クロムに含まれるアルミニウ
ムの量を1.0モル%〜35.0モル%に限定したの
は、1.0モル%よりそれが少ないときには、基体
を溶解除去して得られるパイプの収率があまりよ
くない。また、それが35モル%よりも多くなると
硼素のCVD時に基体変形してしまい、硼素の強
度が低下してしまうためである。アルミニウムを
含むクロムの板などを、そのまま基体として用い
た場合、CVD時において高い温度になると、基
体そのものが変形を起すために、硼素のCVD終
了時に硼素皮膜に割れが生じた。したがつて、本
発明の効果を発揮させるためには、アルミニウム
を1.0モル%〜35.0モル%含むクロム層の厚みに
は、おのずから望ましい厚さがある。この望まし
い厚さは、基体金属の厚みにも左右される。基体
金属として、たとえば太さ200〜300μmの線状の
タンタルを使用した場合には、アルミニウムを含
むクロム層の厚さは、10μm以下であつた。すな
わち、それが厚すぎると、硼素皮膜に割れが生じ
やすくなる。ただ、0.05μm程度とあまり薄くな
ると、本発明による改善効果が明瞭には認められ
ない。この場合のもつとも望ましい被覆層の厚さ
は、0.1〜2.0μmであつた。
本発明による効果は、基体の金属としてタンタ
ルを使用したときにもつとも大きい。これは、熱
膨脹係数が硼素のそれに近いこと、および、水素
ぜい化の程度が比較的小さいことといつた理由に
よるものではないかと考えられる。
アルミニウムを含むクロム層は、電気メツキ
法、スパツタ法、あるいはCVD法により基体上
に被覆形成することができる。どのような被覆方
法をとろうとも、その結果はほぼ同じであつた。
さらに詳しくは、実質例で説明する。
直径250μm、長さ800mmのタンタル線を準備し
た、タンタル線を脱脂、洗浄したのち、それにア
ルミニウムを1.0モル%含むクロムをスパツタ法
で付着させ、約1.0μmの層を形成した。次に、
アルミニウム1.0モル%を含むクロム層で被覆さ
れたタンタル線を通電により発熱させて1000℃の
温度に保持し、これに三塩化硼素(BCl3)1容
量部と水素(H2)3容量部との混合ガスを毎分
1の割合で2.5分間流した。これにより約50μ
mの厚さの硼素層が形成された。
このようにして作つた試料を5mmの長さにレー
ザー光を照射するなどして切断し、切断された試
料を市販の無水メタノール200mlに臭素50gを溶
解させた液に浸漬して、タンタルおよびクロムや
アルミニウム等の硼化物を溶解させた。このとき
硼素は溶解しない。得られたパイプの寸法は、内
径250μm、外径350μm、長さ5mmであつた。X
線回折で調べた結果、その結晶形は、主に非晶質
(アモルフアス)であつた。
このパイプの抗折強度を測定した。測定は、梁
の長さ4mmとし、両端を支持梁の形で、荷重Wを
加えて、パイプが破壊したときの荷重より求める
という方法で実施した。
次に、長さ800mmのサンプルから5mmに切断し
た試料が基本を溶解除去する過程で15%の数だけ
破壊した。すなわち、その収率は85%であつた。
得られたパイプの平均の抗折強度は515gであつ
た。この結果を下表の試料1としてまとめて示
す。
上記実施例と同様にして、下表に示す試料2〜
13を作り、それらについても調べた。アルミニウ
ムを含むクロムによるタンタル線の被覆方法とし
ては、アルミニウム−クロムの圧粉パウダーをタ
ーゲツトとし直流スパツタ法により被覆するとい
う方法を使用した。試料2〜13もすべて硼素が50
μmの膜厚になるようにCVDの時間を調整し
た。
比較のため、クロムのみをタンタル線に被複し
たとき(試料12)、あるいは、タンタル線のみ
(試料13)のときも50μmそれぞれ硼素を付着さ
せた。そのときの硼素沈積温度、収率、平均抗折
強度、結晶系についても下表にまとめて示す。
The present invention relates to a method for manufacturing a boron structural material, and in particular aims to improve the film quality and mechanical properties of boron constituting the boron structural material, and to reduce production pending and improve productivity of the boron structural material. It is something. Boron has a hardness second only to diamond, and has extremely high wear resistance, making it a suitable material for cutting tools, sliding machine parts, bearings, etc. Additionally, it has the excellent characteristic of having the highest specific elastic modulus (elastic modulus/density) among currently known materials. This property means that the propagation speed of sound waves is the highest among existing materials, making it particularly useful as an acoustic material. It is difficult to obtain boron-applied products in the form of dense blocks, thin walls, thin-walled pipes, etc. by methods such as casting or rolling. For this reason, when manufacturing various boron-applied products, in most cases vapor deposition, sputtering, or chemical vapor deposition (CVD) is used on substrates made of materials other than boron.
It is used as a composite in which a boron film is formed on a substrate made of a material other than boron, using a method such as a method called a boron method. Composite structural materials made by such conventional methods do not cause any major problems in products that utilize the hardness of boron and its excellent wear resistance. However, this poses a very serious problem in acoustic materials such as speaker diaphragms and cartridge cantilevers that utilize the large specific modulus of elasticity. In other words, the density and elastic modulus of the composite are greatly influenced by the properties of the substrate, and the inherent properties of boron are thereby greatly reduced.
On the other hand, there have been many attempts to separate boron from the substrate through chemical or physical treatments, but distortion occurs due to differences in coefficient of thermal expansion between the deposited boron film and the substrate, and as a result, the boron film is Cracks and the like occur, making it difficult to obtain a boron film with sufficient mechanical strength at a high yield. In order to eliminate the drawbacks of such conventional methods, the inventors believe that a metal such as tantalum, niobium, molybdenum, tungsten, or titanium is used as a base material, and 1.0 mol% to 35.0 mol% of aluminum is added to the surface of the base metal.
It has been found that it is effective to deposit chromium containing a mole percent of chromium to a desired thickness and then chemical vapor deposit it thereon. The method of the present invention will be specifically explained below. To form boron on a substrate using the CVD method, for example, the substrate placed in a reactor is heated using methods such as infrared heating, high-frequency heating, or energization, and boron is removed by a reductive decomposition reaction as shown in the following equation. Let it precipitate. 2BX 3 +3H 2 →2B+6HX (However, X is a halogen element such as Cl, Br, I, etc.) In addition to boron halide BX 3 , boron hydrogen There are also compounds. In addition, in this boron precipitation reaction, depending on the heating temperature and the amount of raw material flowing into the reactor,
Various crystal forms are obtained. Among various crystal forms, β-rombohedral, tetragonal,
Alternatively, amorphous boron is preferable. Next, the substrate is dissolved or removed by chemical or mechanical methods to obtain pipes or plates made mainly of simple boron. As a chemical method, it is conceivable to use a solution mainly containing hydrofluoric acid. A particularly effective solution is one in which bromine, chlorine, iodine, or a compound or mixture of two or more of these is dissolved in absolute alcohol. Boron is the metal used to form the base.
Tantalum, niobium, molybdenum, titanium, tungsten, etc. are desirable because CVD is carried out at high temperatures (over 9000°C) and because they are easy to conduct electricity and high-frequency heating. Among these materials, tantalum, molybdenum, and tungsten, which are less susceptible to hydrogen embrittlement, are more desirable because CVD is performed in a hydrogen stream. Further, in order to reduce the thermal strain between the deposited boron film and the substrate, tantalum or titanium, which has a coefficient of thermal expansion close to that of boron, is more desirable. The main point of the method of the present invention is to deposit chromium containing 1.0 mol% to 35.0 mol% aluminum on the metal by electroplating, CVD, sputtering, or vacuum evaporation, and deposit it to a desired thickness. The purpose is to coat it with a layer and use it as a substrate. Thereafter, boron is deposited on the substrate, and then the substrate is selectively dissolved and removed or mechanically removed to obtain a structure made of boron. Conventionally, when using only a metal substrate or a substrate in which only chromium was coated on a metal substrate, the boron film was destroyed during the selective dissolution or mechanical peeling process, and the mechanical properties of the resulting boron structure deteriorated. There were cases where things were not very good. With the method of the present invention, in these respects,
Significant improvements have been made. In particular, when boron was amorphous, the improvement was significant. As a result, for example, when the base body is made into a linear shape, a pipe-shaped boron structural material is obtained, and when it is made into a plate-like shape, a thin plate-like boron structural material is obtained. In the present invention, the amount of aluminum contained in chromium is limited to 1.0 mol% to 35.0 mol% because if it is less than 1.0 mol%, the yield of the pipe obtained by dissolving and removing the base is not very good. . Moreover, if it exceeds 35 mol%, the substrate will be deformed during CVD of boron, and the strength of boron will decrease. When a chromium plate containing aluminum is used as a substrate, the substrate itself deforms when exposed to high temperatures during CVD, resulting in cracks in the boron film when CVD of boron is completed. Therefore, in order to exhibit the effects of the present invention, the thickness of the chromium layer containing 1.0 mol % to 35.0 mol % of aluminum naturally has a desirable thickness. This desired thickness also depends on the thickness of the base metal. For example, when linear tantalum having a thickness of 200 to 300 μm was used as the base metal, the thickness of the chromium layer containing aluminum was 10 μm or less. That is, if it is too thick, cracks will easily occur in the boron film. However, if the thickness is too thin, about 0.05 μm, the improvement effect of the present invention cannot be clearly recognized. The most desirable thickness of the coating layer in this case was 0.1 to 2.0 μm. The effects of the present invention are even greater when tantalum is used as the base metal. This is thought to be due to the fact that the coefficient of thermal expansion is close to that of boron and the degree of hydrogen embrittlement is relatively small. The chromium layer containing aluminum can be formed on the substrate by electroplating, sputtering, or CVD. Regardless of the coating method used, the results were almost the same. More details will be explained using a practical example. A tantalum wire with a diameter of 250 μm and a length of 800 mm was prepared. After degreasing and cleaning the tantalum wire, chromium containing 1.0 mol % of aluminum was deposited on it by a sputtering method to form a layer of about 1.0 μm. next,
A tantalum wire coated with a chromium layer containing 1.0 mol% aluminum is heated by passing an electric current through it and maintained at a temperature of 1000°C, and 1 part by volume of boron trichloride (BCl 3 ) and 3 parts by volume of hydrogen (H 2 ) are added to this. The mixed gas was flowed at a rate of 1/min for 2.5 minutes. This results in approximately 50μ
A boron layer of m thickness was formed. The sample thus prepared was cut into a length of 5 mm by irradiating a laser beam, etc., and the cut sample was immersed in a solution containing 50 g of bromine dissolved in 200 ml of commercially available anhydrous methanol. Borides such as aluminum and aluminum were dissolved. At this time, boron does not dissolve. The dimensions of the obtained pipe were an inner diameter of 250 μm, an outer diameter of 350 μm, and a length of 5 mm. X
As a result of examination by line diffraction, the crystal form was mainly amorphous. The bending strength of this pipe was measured. The measurement was carried out by using a beam with a length of 4 mm, with both ends serving as support beams, applying a load W, and determining the load when the pipe breaks. Next, 15% of the samples cut into 5 mm pieces from the 800 mm long sample were broken during the process of dissolving and removing the base. That is, the yield was 85%.
The average bending strength of the resulting pipe was 515 g. The results are summarized as Sample 1 in the table below. Samples 2 to 2 shown in the table below were prepared in the same manner as in the above example.
I created 13 and researched them as well. As a method for coating the tantalum wire with chromium containing aluminum, a method was used in which aluminum-chromium compacted powder was used as a target and the coating was performed by a direct current sputtering method. Samples 2 to 13 also all contain 50 boron.
The CVD time was adjusted to obtain a film thickness of μm. For comparison, boron was deposited to a thickness of 50 μm when only chromium was applied to the tantalum wire (sample 12) or when only tantalum wire was applied (sample 13). The boron deposition temperature, yield, average bending strength, and crystal system at that time are also summarized in the table below.
【表】【table】
【表】
上表の結果から明らかなように、本発明の方法
によれば、硼素パイプの収率がよく、その平均抗
折強度も大きい。特に非晶質硼素に対しては、収
率強度がクロム被覆単独よりアルミニウムを含有
する方がよくなつている。上記実施例では硼素パ
イプを示したが、板状の硼素でも同様の結果が得
られた。また、基体がタンタル以外にもモリブデ
ン、ニオブ、チタン、タングステンでも同様の結
果が得られた。そして、クロムにアルミニウムの
ほかに他の元素を加えて、その効果をさらに高め
ることも可能である。[Table] As is clear from the results in the above table, according to the method of the present invention, the yield of boron pipes is high and the average bending strength thereof is also high. Particularly for amorphous boron, the yield strength is better with aluminum than with chromium coating alone. In the above example, a boron pipe was shown, but similar results were obtained with a plate of boron. Similar results were also obtained when the substrate was molybdenum, niobium, titanium, or tungsten in addition to tantalum. It is also possible to further enhance the effect by adding other elements besides aluminum to chromium.
Claims (1)
モル%含むクロムの層を形成してなる基体上に、
化学蒸着法により硼素層を形成してから、前記基
体を選択的に除去して、硼素構造材を得ることを
特徴とする硼素構造材の製造方法。 2 基体上に、β−ロンボヘドラル、または非晶
質を主な結晶形とする硼素層を化学蒸着法で形成
することを特徴とする特許請求の範囲第1項に記
載の硼素構造材の製造方法。[Claims] 1. 1.0 mol% to 35.0 mol% of aluminum in base metal
On a substrate formed by forming a layer of chromium containing mol%,
A method for producing a boron structural material, comprising forming a boron layer by a chemical vapor deposition method and then selectively removing the substrate to obtain a boron structural material. 2. A method for producing a boron structural material according to claim 1, characterized in that a boron layer whose main crystalline form is β-rombohedral or amorphous is formed on a substrate by a chemical vapor deposition method. .
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3816779A JPS55130817A (en) | 1979-03-29 | 1979-03-29 | Producing boron structural material |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3816779A JPS55130817A (en) | 1979-03-29 | 1979-03-29 | Producing boron structural material |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS55130817A JPS55130817A (en) | 1980-10-11 |
JPS6141846B2 true JPS6141846B2 (en) | 1986-09-18 |
Family
ID=12517834
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP3816779A Granted JPS55130817A (en) | 1979-03-29 | 1979-03-29 | Producing boron structural material |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS55130817A (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8216654B2 (en) | 2003-02-19 | 2012-07-10 | Ulvac, Inc. | Components for a film-forming device and method for cleaning the same |
SG11202003305UA (en) * | 2017-10-17 | 2020-05-28 | Tokuyama Corp | Boron structure and boron powder |
-
1979
- 1979-03-29 JP JP3816779A patent/JPS55130817A/en active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS55130817A (en) | 1980-10-11 |
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