JPS61296779A - Formation of back electrode of light emitting diode - Google Patents

Formation of back electrode of light emitting diode

Info

Publication number
JPS61296779A
JPS61296779A JP60138704A JP13870485A JPS61296779A JP S61296779 A JPS61296779 A JP S61296779A JP 60138704 A JP60138704 A JP 60138704A JP 13870485 A JP13870485 A JP 13870485A JP S61296779 A JPS61296779 A JP S61296779A
Authority
JP
Japan
Prior art keywords
electrode
stripe
emitting diode
metal mask
light emitting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP60138704A
Other languages
Japanese (ja)
Inventor
Nobuyuki Shiose
伸行 塩瀬
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP60138704A priority Critical patent/JPS61296779A/en
Publication of JPS61296779A publication Critical patent/JPS61296779A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To obtain excellent yield of production of the title electrode by a method wherein, on the stripe-like electrode formed by vapor-deposition, another stripe-like electrode is formed again placing an angle for the stripe of the electrode using a metal mask for formation of the stripe-like electrode, and a reticulate electrode is formed without using a photoetching method. CONSTITUTION:A metal mask, whereon stripe-formed holes of 50mum wide and 3cm long are formed in line at the pitch of 100mum, is manufactured and the prescribed electrode material mainly composed of gold is vapor-deposited on a GaAs infrared ray light-emitting diode epitaxial wafer. Then, either of said wafer and metal mask is rotated at an angle of 90 deg., and the same vapor- deposition method is performed again. Subsequently, a sintering is conducted on the above-mentioned material at the prescribed temperature for the prescribed period of time, and it in formed into the indivisually cut pellets of 400mumX400mum, and the manufacture of light-emitting diode pellet is completed. As a result, the pellet having the total electrode area percentage for the pellet back side of 75% can be formed without using a photoetching method.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 発光ダイオードは長寿命、低消費電力、高速、であると
いう長所を有する為近年各方面において使用されるよう
になり各種ディスプレイ、及び家電製品等のリモートコ
ントロール装置の発光源としても幅広く用いられている
。本発明は上記発光ダイオードの構造に関し51%に裏
面電極の形成方法に関する。
[Detailed Description of the Invention] [Industrial Field of Application] Light emitting diodes have the advantages of long life, low power consumption, and high speed, so they have been used in various fields in recent years, and have been used in various displays, home appliances, etc. It is also widely used as a light source for remote control devices. The present invention relates to the structure of the light emitting diode, and 51% relates to a method for forming a back electrode.

〔従来の技術〕[Conventional technology]

発光ダイオードは一般的にGaP、GaAs等の基板1
上に同種の層又はGaAsx−xPx、GaAlt−x
Asx等の3元系化合物半導体層2をエピタキシャル成
長させPN接合を形成したウェハースに所定の電極を表
面4及び裏面に形成した後、所定寸法のペレットに分離
して構成される。(第2図)またグイボンディングする
側の裏面電極3は、PN接合にて発生した光の裏面での
吸収を低減するため裏面電極面積を小さくする工夫がな
され、一般的には50〜100BTrLφの円形の微小
なドツト電極を複数個蒸着する方法が採用されてきた。
Light emitting diodes generally have a substrate 1 made of GaP, GaAs, etc.
Homogeneous layer or GaAsx-xPx, GaAlt-x on top
After forming predetermined electrodes on the front surface 4 and the back surface of a wafer in which a ternary compound semiconductor layer 2 such as Asx is epitaxially grown to form a PN junction, the wafer is separated into pellets of predetermined dimensions. (Figure 2) In addition, the back electrode 3 on the side to be bonded is designed to reduce the area of the back electrode in order to reduce the absorption of light generated by the PN junction on the back surface, and generally has a diameter of 50 to 100 BTrLφ. A method has been adopted in which a plurality of circular minute dot electrodes are deposited.

(第3図(a)) 〔発明が解決しようとする問題点〕 上述した円形の微小電極の形成は、モリブデン等を素材
とする金属薄板をエツチングにより必要とする電極形状
の穴を多数設けた蒸着用メタルマスクによりウェハース
の裏面へ密着カバーして、そこへ直接所定の電極材料を
蒸着することlこより行なうのが一般的である。ところ
が、メタルマスク蒸着法は円形電極の径の大型化及び電
極の数を増して総電極面積を増加させたい場合に、メタ
ルマスク製造に関する点で限界が生じることとなる。
(Fig. 3 (a)) [Problem to be solved by the invention] The formation of the circular microelectrode described above involves etching a thin metal plate made of molybdenum or the like to provide a large number of holes in the required electrode shape. Generally, the back surface of the wafer is tightly covered with a metal mask for vapor deposition, and a predetermined electrode material is directly vapor-deposited thereon. However, the metal mask vapor deposition method has limitations in terms of metal mask manufacturing when it is desired to increase the total electrode area by increasing the diameter of the circular electrode and the number of electrodes.

つまりメタルマスクのエツチング精度上及びマスク自身
の機械的強度上通常使用される25〜30μmの板厚に
関して隣接する穴の最近接間隔が50μmに制限される
からである。さらに、ドツト電極は、マウント材(主に
銀ペースト)との接触に於いて1べ1ノツトのすべての
裏面ドツト電極がマウント材と均一に接触しない可能性
を有する欠点があり、発光ダイオードに於いても特にリ
モートコントロール用発信源として大電流領域(100
nA以上)での使用が多いGaAs系赤外発光ダイオー
ドでは前記の裏面電f&総面債が小さいことと併わせ°
C、マウント材との間で電流集中を引き起こし、接触抵
抗が直列に付加されることがあり、大゛1流での順方向
電圧の増大をまねいていた。ゆえに乾電池を電源として
1吏用する定電圧駆動の発光ダイオードでは、裏面電極
を小さくすることにより出力を増加させたにもかかわら
ず、大電流での順方向電圧増大による通電電流減少の効
果が大きくなり、全体としては出力の線形性の悪化を引
き起こしていた。そこで電極面積と出力のバランスを考
慮して最適値を求める必要があった。
That is, in view of the etching accuracy of the metal mask and the mechanical strength of the mask itself, the closest distance between adjacent holes is limited to 50 .mu.m for a plate thickness of 25 to 30 .mu.m which is normally used. In addition, dot electrodes have the disadvantage that all the back dot electrodes on each node may not come into uniform contact with the mounting material (mainly silver paste), which is a problem in light emitting diodes. However, it is especially suitable for use as a remote control source in the large current range (100
GaAs-based infrared light emitting diodes, which are often used in
C. Current concentration may occur with the mounting material, and contact resistance may be added in series, leading to a large increase in forward voltage in one current. Therefore, in a constant-voltage light emitting diode that uses a dry battery as a power source, although the output has been increased by making the back electrode smaller, the effect of reducing the conducting current due to the increase in forward voltage at large currents is large. This caused deterioration of the linearity of the output as a whole. Therefore, it was necessary to find the optimal value by considering the balance between electrode area and output.

そこで、以上の電極門構の増加で困難であること及びマ
ウント材との接触が悪いことの2点の不具合を改善する
為に第3図(b)に示した網状電極が採用されている。
Therefore, in order to improve the two problems of difficulty due to the increase in the number of electrode gate structures and poor contact with the mounting material, the mesh electrode shown in FIG. 3(b) has been adopted.

この製法は裏面電極側にもフォトエツチング法により、
任意の面積の電極を部分的に除去することにより形成さ
れている。ところが、網状電極は、フォトエツチング法
により形成される為、メタルマスク法に比較して、工程
が追加される上に、フォトレジスト塗布によるウニ/1
−スの破損及び金を主体とする裏面電極のエツチングに
ムラが生じて歩留りを低下させることは避けられない欠
点として残されている。
This manufacturing method also uses photoetching on the back electrode side.
It is formed by partially removing an electrode of an arbitrary area. However, since the mesh electrode is formed by a photoetching method, it requires an additional process compared to the metal mask method, and also requires additional steps due to photoresist coating.
- Breakage of the substrate and uneven etching of the back electrode, which is mainly made of gold, which lowers the yield rate, remain unavoidable drawbacks.

〔問題点を解決するための手段〕[Means for solving problems]

本発明は、発光ダイオードの裏面電極に2いて、従来の
欠点を取り除(為、網目状電極を形成する場合、ストラ
イプ状電極形成用メタルマスクを使用し、ストライプ状
電極を蒸着形成した上に、該電極のストライプに対し角
度をつけて再度ストライプ状電極を蒸着形成して、フォ
トエツチング法を使用せずに網目状電極を形成するもの
である。
The present invention eliminates the drawbacks of the conventional method by forming a back electrode of a light emitting diode (in order to form a mesh electrode, a metal mask for forming a stripe electrode is used, and the stripe electrode is formed by vapor deposition on top of the electrode). In this method, striped electrodes are formed again by vapor deposition at an angle to the stripes of the electrodes, thereby forming a mesh electrode without using a photo-etching method.

〔実施例〕〔Example〕

次に本発明について実施例に即して説明する。 Next, the present invention will be explained based on examples.

前述したように、メタルマスク法に使用するマスクは材
質は主にモリブデンで板厚は25〜30μ扉が一般的で
あり、その場合穴と穴との最近接距離を50μm以下に
することは困難である。そこで本実施例では幅50μ7
FIX長さ3cIrLのストライプ状の穴を100μm
 ピッチで並んだメタルマスクを製作してGaps系赤
外発光ダイオードエピタキシャルウェハースへ金を主体
とする所定の電極材料を蒸着する。さらに次に該ウェハ
ース、又はメタルマスクのどちらかを90’回転させ、
再度同一の蒸着を施す。その後、所定の温度と時間でシ
ンターを行ない、400μmX400μmの個切りペレ
ット状にして本発明による発光ダイオードペレットは完
成する。
As mentioned above, the mask used in the metal mask method is mainly made of molybdenum and has a plate thickness of 25 to 30 μm. In this case, it is difficult to reduce the closest distance between the holes to 50 μm or less. It is. Therefore, in this embodiment, the width is 50μ7.
FIX length 3cIrL striped hole 100μm
A metal mask arranged at pitches is manufactured and a predetermined electrode material mainly composed of gold is vapor-deposited onto a Gaps-based infrared light emitting diode epitaxial wafer. Further, either the wafer or the metal mask is rotated 90',
The same vapor deposition is performed again. Thereafter, sintering is performed at a predetermined temperature and time to form individual pellets of 400 μm×400 μm, thereby completing the light emitting diode pellets according to the present invention.

以上により、ペレット裏面に対する総電極面積の比率が
75%のものが、フォトエツチング法を使用せずに形成
されることとなる。
As a result, an electrode having a ratio of the total electrode area to the back surface of the pellet of 75% can be formed without using the photoetching method.

〔発明の効果〕〔Effect of the invention〕

以上説明したように裏面′成極として、ストライプ状電
極を2回蒸着し、その各々が互いに交差するようにすれ
ば、フォトエツチング法によらずとも網状電極が形成可
能となり、2回蒸着という工程にもかかわらず、第2の
蒸着はメタルマスク又はウェハースを90°程度回転す
るという作業のみを行なえばよく、歩留りも良好であり
、従来のドツト電極と同程度の歩留りを維持できる。さ
らにドツト電極に2いては複数の微小電極にて構成され
ている為、一部の電極に2いてはマウント材との接触が
悪いこともあり、そのことが直接発光ダイオードの順方
向電圧に影響することになるが、本網目状電極に2いて
は、マウント材の銀ペーストとの接触が悪い部分が存在
しても電極全体がつながりをもっている為裏面電極全体
での接触が行なわれ、発光ダイオードの通電時に電流集
中が起こらず、発光出力の線形性が損われないことは言
うまでもない。また、本実施例では幅50μmのストラ
イブを100μ雇 ピッチで設けたが、幅、ピッチを各
ストライプの最近接距離が50μmという制限以内で、
幅、ピッチを変更することlこより、1ペレツトの裏面
面積に対する電極面積の比率を任意に変更することも可
能である。
As explained above, for backside polarization, by depositing striped electrodes twice so that they intersect with each other, it is possible to form a net-like electrode without using the photoetching method, which is a process called double deposition. Nevertheless, the second vapor deposition only requires rotating the metal mask or wafer by about 90 degrees, and the yield is good, and the yield can be maintained at the same level as that of conventional dot electrodes. Furthermore, since the dot electrodes are composed of multiple microelectrodes, some of the electrodes may have poor contact with the mounting material, which directly affects the forward voltage of the light emitting diode. However, with this mesh electrode 2, even if there are parts that have poor contact with the silver paste of the mounting material, the entire electrode is connected, so contact is made with the entire back electrode, and the light emitting diode Needless to say, no current concentration occurs when the current is applied, and the linearity of the light emission output is not impaired. In addition, in this example, stripes with a width of 50 μm were provided at a pitch of 100 μm, but the width and pitch could be adjusted within the limit that the closest distance between each stripe was 50 μm.
By changing the width and pitch, it is also possible to arbitrarily change the ratio of the electrode area to the back surface area of one pellet.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明による発光ダイオードのダイボンディン
グ側裏面電極の上面図を示し、第2図は発光ダイオード
の最も一般的な構造を示す断面図、第3図は従来技術に
よる裏面電標の上面図を示し、(a)はメタルマスク法
により形成された円形ドツト電極、(b)はフォトエツ
チング法により形成される網状電極を示す。 察 /I!I (cL)(6−) 茅 3 図
FIG. 1 shows a top view of the back electrode on the die bonding side of a light emitting diode according to the present invention, FIG. 2 is a sectional view showing the most general structure of a light emitting diode, and FIG. 3 is a top view of a back electrode according to the prior art. The figures show (a) a circular dot electrode formed by a metal mask method, and (b) a mesh electrode formed by a photoetching method. Sensei /I! I (cL) (6-) Kaya 3 Figure

Claims (1)

【特許請求の範囲】[Claims] 発光ダイオードの裏面電極において、特に網目状電極形
成方法においてストライプ状電極を蒸着形成した上に、
該電極に対して交差するように角度を設け再度ストライ
プ状電極を蒸着形成し網目状電極とすることを特徴とす
る裏面電極形成方法。
In the back electrode of a light emitting diode, in particular, a striped electrode is formed by vapor deposition in a mesh electrode formation method, and then
A method for forming a back electrode, which comprises forming a stripe-like electrode again by vapor deposition at an angle so as to intersect with the electrode to form a mesh-like electrode.
JP60138704A 1985-06-25 1985-06-25 Formation of back electrode of light emitting diode Pending JPS61296779A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60138704A JPS61296779A (en) 1985-06-25 1985-06-25 Formation of back electrode of light emitting diode

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60138704A JPS61296779A (en) 1985-06-25 1985-06-25 Formation of back electrode of light emitting diode

Publications (1)

Publication Number Publication Date
JPS61296779A true JPS61296779A (en) 1986-12-27

Family

ID=15228173

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60138704A Pending JPS61296779A (en) 1985-06-25 1985-06-25 Formation of back electrode of light emitting diode

Country Status (1)

Country Link
JP (1) JPS61296779A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5309001A (en) * 1991-11-25 1994-05-03 Sharp Kabushiki Kaisha Light-emitting diode having a surface electrode of a tree-like form
JP2005019653A (en) * 2003-06-25 2005-01-20 Matsushita Electric Works Ltd Semiconductor light emitting element and light emitting device
CN105322068A (en) * 2015-11-17 2016-02-10 天津三安光电有限公司 Light emitting diode chip and manufacturing method therefor

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5309001A (en) * 1991-11-25 1994-05-03 Sharp Kabushiki Kaisha Light-emitting diode having a surface electrode of a tree-like form
JP2005019653A (en) * 2003-06-25 2005-01-20 Matsushita Electric Works Ltd Semiconductor light emitting element and light emitting device
CN105322068A (en) * 2015-11-17 2016-02-10 天津三安光电有限公司 Light emitting diode chip and manufacturing method therefor

Similar Documents

Publication Publication Date Title
US4126812A (en) Spherical light emitting diode element and character display with integral reflector
US4624045A (en) Method of making thin film device
US4080245A (en) Process for manufacturing a gallium phosphide electroluminescent device
JPH03225725A (en) Micro-vacuum tube and manufacture thereof
US8362495B2 (en) Rod-shaped semiconductor device
US4182025A (en) Manufacture of electroluminescent display devices
JPS61296779A (en) Formation of back electrode of light emitting diode
JP3602929B2 (en) Group III nitride semiconductor light emitting device
JPS61296780A (en) Formation of back electrode of light-emitting diode
CN112350146B (en) VCSEL array electrode structure and preparation method
US5275968A (en) Method of producing a semiconductor light emitting device disposed in an insulating substrate
US5100833A (en) Method of producing a semiconductor light emitting device disposed in an insulating substrate
US5194399A (en) Method of producing a semiconductor light emitting device disposed in an insulating substrate
KR100801922B1 (en) Production method for light emitting element
KR910006707B1 (en) Light emitted diode and its method of manufacturing
JPS61263289A (en) Light emitting diode
JPH06310752A (en) Silicon carbide light emitting diode
JPH03190287A (en) Light-emitting diode array
JPH0349406Y2 (en)
JPH0442918Y2 (en)
JPS6134275B2 (en)
JPS62252180A (en) Semiconductor element
JPH06169104A (en) Emiconductor light-emitting device and manufacture thereof
JPS62139365A (en) Multi-step type semiconductor light emitting device
JPH0212985A (en) Semiconductor device and manufacture thereof