JPS612911B2 - - Google Patents

Info

Publication number
JPS612911B2
JPS612911B2 JP56206377A JP20637781A JPS612911B2 JP S612911 B2 JPS612911 B2 JP S612911B2 JP 56206377 A JP56206377 A JP 56206377A JP 20637781 A JP20637781 A JP 20637781A JP S612911 B2 JPS612911 B2 JP S612911B2
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP56206377A
Other versions
JPS58106464A (ja
Inventor
Koji Nakagome
Tetsuo Aoki
Takayuki Nakajima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ADOBANTESUTO KK
Original Assignee
ADOBANTESUTO KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ADOBANTESUTO KK filed Critical ADOBANTESUTO KK
Priority to JP56206377A priority Critical patent/JPS58106464A/ja
Priority to US06/450,791 priority patent/US4495621A/en
Priority to EP82111879A priority patent/EP0082535B1/en
Priority to DE8282111879T priority patent/DE3270184D1/de
Publication of JPS58106464A publication Critical patent/JPS58106464A/ja
Publication of JPS612911B2 publication Critical patent/JPS612911B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/02Measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time or duration
    • G01R29/027Indicating that a pulse characteristic is either above or below a predetermined value or within or beyond a predetermined range of values
    • G01R29/0273Indicating that a pulse characteristic is either above or below a predetermined value or within or beyond a predetermined range of values the pulse characteristic being duration, i.e. width (indicating that frequency of pulses is above or below a certain limit)
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00Arrangements for displaying electric variables or waveforms
    • G01R13/20Cathode-ray oscilloscopes
    • G01R13/22Circuits therefor
    • G01R13/30Circuits for inserting reference markers, e.g. for timing, for calibrating, for frequency marking
JP56206377A 1981-12-21 1981-12-21 グリツチ検出測定器 Granted JPS58106464A (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP56206377A JPS58106464A (ja) 1981-12-21 1981-12-21 グリツチ検出測定器
US06/450,791 US4495621A (en) 1981-12-21 1982-12-17 Glitch detecting and measuring apparatus
EP82111879A EP0082535B1 (en) 1981-12-21 1982-12-21 Unwanted signal detecting and measuring apparatus
DE8282111879T DE3270184D1 (en) 1981-12-21 1982-12-21 Unwanted signal detecting and measuring apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56206377A JPS58106464A (ja) 1981-12-21 1981-12-21 グリツチ検出測定器

Publications (2)

Publication Number Publication Date
JPS58106464A JPS58106464A (ja) 1983-06-24
JPS612911B2 true JPS612911B2 (ja) 1986-01-28

Family

ID=16522319

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56206377A Granted JPS58106464A (ja) 1981-12-21 1981-12-21 グリツチ検出測定器

Country Status (4)

Country Link
US (1) US4495621A (ja)
EP (1) EP0082535B1 (ja)
JP (1) JPS58106464A (ja)
DE (1) DE3270184D1 (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01145412U (ja) * 1988-03-30 1989-10-05

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4631683A (en) * 1984-08-29 1986-12-23 General Electric Company Acoustic detection of contact between cutting tool and workpiece
US4857760A (en) * 1988-02-10 1989-08-15 Tektronix, Inc. Bipolar glitch detector circuit
US4965800A (en) * 1988-10-11 1990-10-23 Farnbach William A Digital signal fault detector
US5214784A (en) * 1988-11-28 1993-05-25 Tektronix, Inc. Sequence of events detector for serial digital data which selectively outputs match signal in the series which defines detected sequence
US4979177A (en) * 1989-10-26 1990-12-18 Tektronix, Inc. Enhanced counter/timer resolution in a logic analyzer
US5023892A (en) * 1990-04-06 1991-06-11 Printer Systems Corporation System for detecting and correcting signal distortion
US5489865A (en) * 1992-02-28 1996-02-06 Media Vision, Inc. Circuit for filtering asynchronous metastability of cross-coupled logic gates
US5422891A (en) * 1993-07-23 1995-06-06 Rutgers University Robust delay fault built-in self-testing method and apparatus
DE4336390A1 (de) * 1993-10-26 1995-04-27 Bosch Gmbh Robert Elektronische Zählerschaltung zur zeitlichen Vermessung eines digitalen Signals
US5526286A (en) * 1994-02-16 1996-06-11 Tektronix, Inc. Oversampled logic analyzer
US5544175A (en) * 1994-03-15 1996-08-06 Hewlett-Packard Company Method and apparatus for the capturing and characterization of high-speed digital information
US5629947A (en) * 1996-01-11 1997-05-13 Hewlett-Packard Company Method and apparatus for detecting positive and negative runt pulses simultaneously
IL121521A (en) 1997-08-11 2003-04-10 Nds Ltd Television signal glitch detector
US6377065B1 (en) 2000-04-13 2002-04-23 Advantest Corp. Glitch detection for semiconductor test system
GB2362473B (en) * 2000-05-18 2002-08-21 3Com Corp On-chip detector of clock glitches
US6587800B1 (en) * 2000-06-30 2003-07-01 Intel Corporation Reference timer for frequency measurement in a microprocessor
AU2002324688A1 (en) * 2001-08-10 2003-02-24 Shakti Systems, Inc. Logic state transition sensor circuit
US7081762B2 (en) * 2003-07-31 2006-07-25 Lsi Logic Corporation Method and apparatus for measuring high speed glitch energy in an integrated circuit
US7039540B1 (en) * 2004-10-15 2006-05-02 International Business Machines Corporation Apparatus, system, and method for testing an analog to digital converter
US7180301B1 (en) * 2005-11-30 2007-02-20 The Untied States Of America As Represented By The Secretary Of The Army Power monitor-glitch trap system
US7941775B2 (en) 2008-03-07 2011-05-10 International Business Machines Corporation Arbitrary waveform propagation through a logic gate using timing analysis results
US9437237B1 (en) 2015-02-20 2016-09-06 Western Digital Technologies, Inc. Method to detect power loss through data storage device spindle speed
CN113740345B (zh) * 2021-08-27 2024-03-22 电子科技大学(深圳)高等研究院 一种高速采样速率下的毛刺检测方法及系统

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3449716A (en) * 1963-05-09 1969-06-10 Sangamo Electric Co Digital self-optimizing terminal
US3334298A (en) * 1963-12-26 1967-08-01 Monrad-Krohn Lars Waveform detector using amplitude comparison of time-space samples of the waveform
US3386079A (en) * 1964-10-01 1968-05-28 Martin Marietta Corp Error reducing device
US3502991A (en) * 1967-06-19 1970-03-24 Bell Telephone Labor Inc Signal generator with asynchronous start
US3909724A (en) * 1973-06-26 1975-09-30 Addressograph Multigraph Start bit detector and data strober for asynchronous receiver
US4006454A (en) * 1975-05-07 1977-02-01 Motorola, Inc. Analog to digital converter for asynchronous detector
US4107651A (en) * 1976-11-08 1978-08-15 Hewlett-Packard Company Glitch detector
US4293949A (en) * 1979-10-30 1981-10-06 The United States Of America As Represented By The Secretary Of The Navy Clock invariant synchronization for random binary sequences
US4353032A (en) * 1980-06-02 1982-10-05 Tektronix, Inc. Glitch detector

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01145412U (ja) * 1988-03-30 1989-10-05

Also Published As

Publication number Publication date
JPS58106464A (ja) 1983-06-24
EP0082535B1 (en) 1986-03-26
EP0082535A1 (en) 1983-06-29
DE3270184D1 (en) 1986-04-30
US4495621A (en) 1985-01-22

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