JPS61263039A - 質量分析計 - Google Patents

質量分析計

Info

Publication number
JPS61263039A
JPS61263039A JP60105478A JP10547885A JPS61263039A JP S61263039 A JPS61263039 A JP S61263039A JP 60105478 A JP60105478 A JP 60105478A JP 10547885 A JP10547885 A JP 10547885A JP S61263039 A JPS61263039 A JP S61263039A
Authority
JP
Japan
Prior art keywords
filament
sample
magnet
repeller
ionization chamber
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP60105478A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0475622B2 (enrdf_load_stackoverflow
Inventor
Ryuichi Shimizu
志水　隆一
Sumio Kumashiro
熊代　州三夫
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP60105478A priority Critical patent/JPS61263039A/ja
Publication of JPS61263039A publication Critical patent/JPS61263039A/ja
Publication of JPH0475622B2 publication Critical patent/JPH0475622B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP60105478A 1985-05-16 1985-05-16 質量分析計 Granted JPS61263039A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60105478A JPS61263039A (ja) 1985-05-16 1985-05-16 質量分析計

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60105478A JPS61263039A (ja) 1985-05-16 1985-05-16 質量分析計

Publications (2)

Publication Number Publication Date
JPS61263039A true JPS61263039A (ja) 1986-11-21
JPH0475622B2 JPH0475622B2 (enrdf_load_stackoverflow) 1992-12-01

Family

ID=14408695

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60105478A Granted JPS61263039A (ja) 1985-05-16 1985-05-16 質量分析計

Country Status (1)

Country Link
JP (1) JPS61263039A (enrdf_load_stackoverflow)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01272043A (ja) * 1988-04-22 1989-10-31 Hitachi Ltd スパッタ中性粒子のイオン化方法およびその装置
JP2006521006A (ja) * 2003-03-03 2006-09-14 ブリガム・ヤング・ユニバーシティ 直交加速飛行時間型質量分析のための新規な電子イオン化源
EP3232464B1 (en) * 2016-04-14 2023-04-05 Bruker Scientific LLC Magnetically assisted electron impact ion source for mass spectrometry

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01272043A (ja) * 1988-04-22 1989-10-31 Hitachi Ltd スパッタ中性粒子のイオン化方法およびその装置
JP2006521006A (ja) * 2003-03-03 2006-09-14 ブリガム・ヤング・ユニバーシティ 直交加速飛行時間型質量分析のための新規な電子イオン化源
EP3232464B1 (en) * 2016-04-14 2023-04-05 Bruker Scientific LLC Magnetically assisted electron impact ion source for mass spectrometry

Also Published As

Publication number Publication date
JPH0475622B2 (enrdf_load_stackoverflow) 1992-12-01

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Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees