JPS61234307A - Optical measuring apparatus - Google Patents
Optical measuring apparatusInfo
- Publication number
- JPS61234307A JPS61234307A JP7576885A JP7576885A JPS61234307A JP S61234307 A JPS61234307 A JP S61234307A JP 7576885 A JP7576885 A JP 7576885A JP 7576885 A JP7576885 A JP 7576885A JP S61234307 A JPS61234307 A JP S61234307A
- Authority
- JP
- Japan
- Prior art keywords
- cylindrical lens
- optical axis
- mirror
- lens
- scanning
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000003287 optical Effects 0.000 title abstract 5
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical means
Abstract
PURPOSE:To prevent deviation of a scanning surface of parallel scanning beams from the optical axis, by installing in the respective specified positions the No.1 cylindrical lens between on ftheta lens and a specimen to be measured and the No.2 cylindrical lens between a beam generator and a polygonal rotary mirror. CONSTITUTION:An incident beam 12 issued from a laser tube 10, after reflected through a right angle, by a stationary mirror 14A, passes through the No.2 cylindrical lens 48 and here, after shrinkage of its beam diameter in the direction in which major axis 48A of this cylindrical lens 48 and the optical axis intersect, the beam is reflected by a stationary mirror 14B and irradiated into a reflecting surface of a polygonal rotary mirror 16. When the reflecting surface of the mirror 16 happens to be tilted, as the focal length of the No.1 cylindrical lens 46 is mode equal to a distance f1 up to a scanning position relative to the specimen to be measured, the parallel beams incident to the lens 46 pass through the focus F, even if their distance from the central optical axis 18A is significant. Accordingly, the scanning surface of the beam can be kept undeviated from the optical axis.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7576885A JPS61234307A (en) | 1985-04-10 | 1985-04-10 | Optical measuring apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7576885A JPS61234307A (en) | 1985-04-10 | 1985-04-10 | Optical measuring apparatus |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS61234307A true JPS61234307A (en) | 1986-10-18 |
Family
ID=13585714
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP7576885A Pending JPS61234307A (en) | 1985-04-10 | 1985-04-10 | Optical measuring apparatus |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS61234307A (en) |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58134618A (en) * | 1982-02-05 | 1983-08-10 | Ricoh Co Ltd | Scanning optical system having inclination compensating function provided with semiconductor laser |
-
1985
- 1985-04-10 JP JP7576885A patent/JPS61234307A/en active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58134618A (en) * | 1982-02-05 | 1983-08-10 | Ricoh Co Ltd | Scanning optical system having inclination compensating function provided with semiconductor laser |
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