JPS61224327A - Cleaning apparatus - Google Patents

Cleaning apparatus

Info

Publication number
JPS61224327A
JPS61224327A JP60063624A JP6362485A JPS61224327A JP S61224327 A JPS61224327 A JP S61224327A JP 60063624 A JP60063624 A JP 60063624A JP 6362485 A JP6362485 A JP 6362485A JP S61224327 A JPS61224327 A JP S61224327A
Authority
JP
Japan
Prior art keywords
unit
cleaning device
cleaned
dust
type cleaning
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP60063624A
Other languages
Japanese (ja)
Inventor
Ryuichi Funada
舟田 隆一
Isamu Akiba
勇 秋葉
Seiji Fujikura
誠司 藤倉
Tomoyoshi Ogoshi
大越 智義
Akio Onose
小野瀬 章夫
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP60063624A priority Critical patent/JPS61224327A/en
Publication of JPS61224327A publication Critical patent/JPS61224327A/en
Pending legal-status Critical Current

Links

Classifications

    • H10P52/00

Landscapes

  • Cleaning By Liquid Or Steam (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Cleaning Or Drying Semiconductors (AREA)

Abstract

PURPOSE:To prevent any microorganism from breeding by a method wherein a cleaning apparatus is composed of a wet type cleaning unit mainly removing inorganic dirt and dust and a dry type cleaning unit mainly removing organic dirt and dust while the cleanser piping system of wet type cleaning unit is provided with a channel flowing a bit of cleanser even during the stoppage of apparatus. CONSTITUTION:A cleaning apparatus is composed of a loader unit 2, a wet type cleaning unit 3, a dry type cleaning unit 4, an inspection unit 5 and an unloader unit 6 successively connected with one another while an element 7 to be cleaned which is mounted on a carrying rotary table 12 is passed through these cleaning units. At this time, fresh air A is fed to the units 6, 5, 3, 2 in the direction reverse to the shifting direction of element 7 to be blown from upper part to lower part simultaneously bypassing the unit 4. Besides, the other fresh air B is fed to the unit 4 to decompose and remove any dirt and dust sticking to the element 7, changing into carbon dioxide and steam to be exhausted out of the unit 4. Moreover, the wet type cleaning unit 3 is provided with a channel flowing a bit of cleanser even during the stoppage of apparatus to prevent any microorganism from breeding while avoiding any repollusion.

Description

【発明の詳細な説明】 〔発明の利用分野〕 本発明は洗浄装置に係り、特に半導体部品などの表面に
付着した有機物と無機物とが混在した塵埃を除去するの
に好適な洗浄装置に関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Application of the Invention] The present invention relates to a cleaning device, and more particularly to a cleaning device suitable for removing dust containing a mixture of organic and inorganic substances adhering to the surfaces of semiconductor components and the like.

〔発明の背景〕[Background of the invention]

半導体部品などの表面に付着した塵埃を除去する従来の
洗浄装置としては、特公昭5g−15939号により開
示されているように被洗浄物に付着したホトレジスト(
塵埃)をオゾンにより除去する乾式洗浄装置が公知であ
る。
Conventional cleaning equipment for removing dust adhering to the surfaces of semiconductor components and the like is disclosed in Japanese Patent Publication No. Sho 5g-15939.
A dry cleaning device that removes dust using ozone is known.

しかし、この洗浄装置は、塵埃が有機物と無機物とが混
在する場合には無機物を除去する効果がほとんどなく、
シかも無機物の背面に入り込んだ有機物の除去が十分に
行なえないという欠点があった。
However, this cleaning device has little effect on removing inorganic substances when the dust is a mixture of organic and inorganic substances.
However, there was a drawback in that the organic matter that had gotten into the back of the inorganic matter could not be removed sufficiently.

一方、洗浄槽内の水中に被洗浄物を浸し、この洗浄槽に
超音波振動子を取付け、この振動子を振動させることに
よって水を振動させ、これによって被洗浄物表面の塵埃
を遊離して除去する湿式超音波洗浄装置も公知である。
On the other hand, the object to be cleaned is immersed in water in a cleaning tank, an ultrasonic vibrator is attached to this cleaning tank, and the vibrator is vibrated to vibrate the water, thereby releasing dust on the surface of the object to be cleaned. Wet-type ultrasonic cleaning devices for removal are also known.

しかし、この湿式超音波洗浄装置では、被洗浄物表面の
大きな塵埃。
However, with this wet ultrasonic cleaning device, large amounts of dust can be removed from the surface of the object to be cleaned.

主として無機物の塵埃しか除去できないものであった。Mainly, only inorganic dust could be removed.

上記のような問題を解決するために湿式洗浄装置と乾式
洗浄装置とを搬送手段を介して一体に構成して、前記湿
式洗浄装置でまず無機物の塵埃を除去したのちに前記乾
式洗浄装置で有機物の塵埃を除去するようにした提案が
なされているが、この種の洗浄装置では湿式洗浄の段階
で装置が停止したときに洗浄液の液流も停止するため、
液吐出口付近や液貯蔵槽及びフィルタハウジング内で微
生物が発生するという問題があった。
In order to solve the above-mentioned problems, a wet cleaning device and a dry cleaning device are integrated through a conveying means, and the wet cleaning device first removes inorganic dust, and then the dry cleaning device removes organic matter. A proposal has been made to remove dust from the wet cleaning system, but when the equipment stops during the wet cleaning stage, the flow of the cleaning solution also stops.
There was a problem in that microorganisms were generated near the liquid discharge port, in the liquid storage tank, and in the filter housing.

〔発明の目的〕[Purpose of the invention]

本発明は上述した点に鑑みてなされたもので、その目的
とするところは、被洗浄物表面に付着する有機物と無機
物とが混在する塵埃でも十分に除去でき、常に洗浄な洗
浄液を供給できる洗浄装置を提供することにある。
The present invention has been made in view of the above-mentioned points, and its purpose is to provide a cleaning solution that can sufficiently remove even dust containing a mixture of organic and inorganic substances that adheres to the surface of the object to be cleaned, and that can always supply a clean cleaning solution. The goal is to provide equipment.

〔発明の概要〕[Summary of the invention]

本発明は被洗浄物に付着した塵埃のうち、主として無機
物の塵埃を除去するための湿式洗浄装置と、主として有
機物の塵埃を除去するための乾式洗浄装置とを結合して
なる洗浄装置の、湿式洗浄装置内に設けられた洗浄液配
管系に、前記洗浄装置停止時に微量な洗浄液が通過する
流路を設けることにより、所期の目的を達成するように
なしたものである。
The present invention provides a wet-type cleaning device that combines a wet-type cleaning device for removing mainly inorganic dust from among the dust attached to an object to be cleaned and a dry-type cleaning device for mainly removing organic dust. The intended purpose is achieved by providing a cleaning fluid piping system provided in the cleaning device with a flow path through which a small amount of cleaning fluid passes when the cleaning device is stopped.

〔発明の実施例〕[Embodiments of the invention]

以下、本発明に係る洗浄装置の一実施例を図面を参照し
て説明する。
An embodiment of the cleaning device according to the present invention will be described below with reference to the drawings.

第1図〜第8図に本発明の一実施例を示す。洗浄装置1
は第1図に示すようにローダ2.湿式洗浄袋[3、湿式
洗浄装置4、検査装置5、アンローダ6を順に結合して
1つの装置としたものである。被洗浄物7は第1図矢印
の順に搬送手段にて移動する。第1図のように清浄空気
Aは被洗浄物7の移動方向と逆方向に流れるようになっ
ている。
An embodiment of the present invention is shown in FIGS. 1 to 8. Cleaning device 1
As shown in FIG. A wet cleaning bag [3, a wet cleaning device 4, an inspection device 5, and an unloader 6 are combined in order to form one device. The object to be cleaned 7 is moved by the conveying means in the order of the arrows in FIG. As shown in FIG. 1, the clean air A is designed to flow in the opposite direction to the moving direction of the object 7 to be cleaned.

清浄空気Aは各装置6,5,3.2における被洗浄物7
の上方から下方へ順次・分岐して各装置6゜5.3.2
から発生する塵埃が被洗浄物7に付着しないように配慮
されている。又清浄空気Aは洗浄装置1内を送られる際
に徐々に汚染されるが被洗浄物7の移動方向とは逆方向
に流れることにより、被洗浄物7が取出される側がきれ
いな状態であり、順方向に流す場合に比較して被洗浄物
7の洗浄を大幅に良好にできる。この清浄空気Aは。
Clean air A is used to clean the object 7 in each device 6, 5, 3.2.
Sequentially/branching from the top to the bottom of each device 6゜5.3.2
Care is taken to prevent dust generated from the cleaning from adhering to the object 7 to be cleaned. In addition, the clean air A becomes gradually contaminated as it is sent through the cleaning device 1, but because it flows in the opposite direction to the moving direction of the object 7 to be cleaned, the side from which the object 7 to be cleaned is taken out is in a clean state. The object 7 to be cleaned can be cleaned much better than when flowing in the forward direction. This clean air A.

乾式洗浄装置4をバイパスするようになっている乾式洗
浄装置4には、別の清浄空気Bを送り込むようになって
おり、被洗浄物7に付着した塵埃が分解除去され、炭酸
ガスと水蒸気に変化しそれを直ちに装W4外へ排出し、
次工程へ塵埃が送られないようになっている。清浄空気
Bの代りに酸素ガスを送り込んでも良く、酸素ガスを送
り込めば装置4にてオゾンの発生を助ける作用をする。
Another clean air B is sent into the dry cleaning device 4 which bypasses the dry cleaning device 4, and the dust adhering to the object 7 to be cleaned is decomposed and removed and converted into carbon dioxide gas and water vapor. change and immediately discharge it to the outside of the packaging W4,
This prevents dust from being sent to the next process. Oxygen gas may be sent instead of clean air B, and if oxygen gas is sent, the device 4 will help generate ozone.

被洗浄物7は例えば第2図に示すようにステンレス製の
搬送トレイ8上に加工片7aを載せた状態で洗浄装置1
内に送り込まれる。搬送トレイ8は真空引穴8aと液抜
穴8bと被洗浄物位置決め用ピン8cを有している。被
洗浄物7は内外周2列に等間隔で配置される。第2図は
、加工片7aを2行分だけ取付けた状態を示し、他は省
略しであるが実際には全周にわたって取付けである。加
工片7aを載置した搬送トレイ8は、第3図に示すよう
にラック9に多段に積載されてローダ2の昇降テープ2
aを介して搬送コンベア2bに順次載置され搬送コンベ
ア2bで搬送回転テーブル10との受渡し位置へ移送さ
れる。搬送回転テーブル10はトレイ8を受は取り、回
転モータ11にて180°回転し湿式洗浄装置3へ送り
込む。
For example, as shown in FIG. 2, the object 7 to be cleaned is transferred to the cleaning apparatus 1 with the work piece 7a placed on a stainless steel conveyor tray 8.
sent inside. The conveyance tray 8 has a vacuum hole 8a, a liquid drain hole 8b, and a pin 8c for positioning the object to be cleaned. The objects 7 to be cleaned are arranged in two rows on the inner and outer peripheries at equal intervals. FIG. 2 shows a state in which only two rows of workpieces 7a are attached, and although the others are omitted, they are actually attached over the entire circumference. The transport tray 8 on which the workpieces 7a are placed is stacked on a rack 9 in multiple stages as shown in FIG.
a, and are sequentially placed on the conveyor 2b, and transported by the conveyor 2b to a delivery position with the conveyance rotary table 10. The conveying rotary table 10 picks up the tray 8, rotates it 180 degrees by a rotary motor 11, and sends it to the wet cleaning device 3.

この搬送回転テーブル10は回転モータ11の回転角度
を制御してやることにより360a内のどの角度にでも
設定することができるため、搬送方向を自由に定めるこ
とが可能である。したがって各装置2,3,4,5,6
をユニット構造にしてやることで設置場所に応じた単一
洗浄装置を構成することが可能である1本実施例は一直
線状に構成された場合であり、この他、U字形、L字形
など自由なレイアウトが選べる。
This conveyance rotary table 10 can be set at any angle within 360a by controlling the rotation angle of the rotary motor 11, so that the conveyance direction can be freely determined. Therefore, each device 2, 3, 4, 5, 6
By making it into a unit structure, it is possible to configure a single cleaning device according to the installation location.1 This example is a case where it is configured in a straight line, but other shapes such as U-shape, L-shape, etc. You can choose the layout.

第4図の湿式洗浄装置3は中央のテーブル3aを有して
おり、このテーブル3a上に載置された被洗浄物7は、
液体を使用し、ブラシスクラバ3b、リンスノズル3c
、ジェットスクラバ3dで被洗浄物7の表面上の無機物
の塵埃を剥離除去したのち、N2 ガスをブローノズル
3eより被洗浄物7に噴射することにより被洗浄物7を
乾燥する。テーブル3aには搬送用トレイ8の真空引穴
8aに合致する図示せぬ真空引穴が設けられておりこの
真空引穴を介して真空を引いて加工片7aをトレイ8と
一体にテーブル3aに固定させている。ここで被洗浄物
7が半導体ウェハのように小形の場合には、テーブル3
a上に真空吸着用の加工溝を別途に形成する。
The wet cleaning apparatus 3 shown in FIG. 4 has a central table 3a, and the object 7 placed on the table 3a is
Using liquid, brush scrubber 3b, rinse nozzle 3c
After the inorganic dust on the surface of the object 7 to be cleaned is peeled off and removed by the jet scrubber 3d, the object 7 to be cleaned is dried by injecting N2 gas onto the object 7 from the blow nozzle 3e. The table 3a is provided with a vacuum hole (not shown) that matches the vacuum hole 8a of the transfer tray 8, and by drawing a vacuum through this vacuum hole, the work piece 7a is transferred to the table 3a together with the tray 8. It is fixed. If the object 7 to be cleaned is small like a semiconductor wafer, the table 3
A groove for vacuum suction is separately formed on a.

前記湿式洗浄装置l!3による洗浄が終了すると、真空
引きを止めて被洗浄物7を次の搬送回転テーブル12に
載置し乾式洗浄装置4へ移送する。この搬送回転テーブ
ル12によって送られてきた被洗浄物7は、第5図に示
すように回転アーム13の先端に載置され、この回転ア
ーム13が回転して被洗浄物7は先ず前室4aに送られ
る。この前室4aの入口と出口にはシャッタ4b、4c
が設けられており被洗浄物7が通過する時のみ開く。
The wet cleaning device l! 3, the vacuum is stopped and the object 7 to be cleaned is placed on the next transport rotary table 12 and transferred to the dry cleaning device 4. The object to be cleaned 7 sent by the transport rotary table 12 is placed on the tip of a rotary arm 13 as shown in FIG. sent to. Shutters 4b and 4c are provided at the entrance and exit of this front chamber 4a.
is provided and opens only when the object to be cleaned 7 passes through.

この前室4aは水室4dにて発生したオゾンおよび酸素
ラジカルが湿式洗浄装置3へ流出しないようにす、るた
めである0回転アーム13は、さらに回転し被洗浄物7
を水室4d内へ送り込む0水室4d内には紫外線ランプ
4eと赤外線ランプ4fがあり、赤外線ランプ4fで被
洗浄物7表面の有機物塵埃を加熱しながら紫外線ランプ
4eの照射する紫外線で発生するオゾンで有機物塵埃を
化学的に除去する。この時に無機物の塵埃は前工程で除
去されているので有機物の塵埃を効率よく確実に除去す
ることができる。有機物の除去が完了すると、被洗浄物
7は回転アーム14によってシャッタ4gを経て後室4
hに移送され、水室4dより後室4hに流れ出たオゾン
、酸素ラジカルを除去したのち、シャッタ41を経て搬
送回転テーブル15へ載置される。被洗浄物7は、搬送
回転テーブル15により検査装置5へ載置される。検査
装置5は、第6図に示すように顕微鏡5a、モニタカメ
ラ5b、モニタ50などから成っており、検査結果をモ
ニタ5cに表示する。検査終了後、第7図に示すように
、搬送回転テーブル16で搬送コンベア6aに載置しラ
ック17内に順次積重ねる。
The purpose of this front chamber 4a is to prevent ozone and oxygen radicals generated in the water chamber 4d from flowing out to the wet cleaning device 3.The zero-rotation arm 13 further rotates and
There are an ultraviolet lamp 4e and an infrared lamp 4f in the water chamber 4d, and while the infrared lamp 4f heats organic dust on the surface of the object 7 to be cleaned, the ultraviolet rays irradiated by the ultraviolet lamp 4e generate heat. Chemically remove organic dust using ozone. At this time, since inorganic dust has been removed in the previous step, organic dust can be efficiently and reliably removed. When the removal of organic matter is completed, the object 7 to be cleaned is sent to the rear chamber 4 through the shutter 4g by the rotary arm 14.
After removing ozone and oxygen radicals flowing out from the water chamber 4d to the rear chamber 4h, the sample is placed on the conveyance rotary table 15 via the shutter 41. The object to be cleaned 7 is placed on the inspection device 5 by the transport rotary table 15 . As shown in FIG. 6, the inspection device 5 includes a microscope 5a, a monitor camera 5b, a monitor 50, etc., and displays the inspection results on the monitor 5c. After the inspection is completed, as shown in FIG. 7, the sheets are placed on the conveyor 6a by the conveyance rotary table 16 and stacked one after another in the rack 17.

このように各装置をユニット化し搬送用回転テーブル1
0,12,15,16で結合することにより自由な構成
でなおかつ設置場所に応じたレイアウトが可能となる。
In this way, each device is made into a unit, and the transport rotary table 1
By combining 0, 12, 15, and 16, it is possible to have a free configuration and a layout according to the installation location.

一方、湿式洗浄装置の液配管系及び純水製造ユニットの
一例を第81!Iに示す。純水製造ユニットとしでは、
原水は入口19から入り、ポンプ20aを通り、圧力調
整バルブ26にて調圧され電磁弁27a、精密ニードル
バルブ28a、若しくは28bを通り、プレフィルタ2
9a、活性炭フィルタ29b、29aにて濾過され、イ
オン交換樹脂カートリッジ30にて脱イオン化され微細
な最終フィルタ29dにて純水化し好ましくはフッ素樹
脂のごとき材質の貯水槽32に一時貯蔵される。
On the other hand, an example of the liquid piping system and pure water production unit of the wet cleaning equipment is shown in the 81st page! Shown in I. As a pure water production unit,
Raw water enters from the inlet 19, passes through the pump 20a, is pressure regulated by the pressure regulating valve 26, passes through the solenoid valve 27a, precision needle valve 28a or 28b, and is filtered into the pre-filter 2.
9a, the water is filtered by activated carbon filters 29b and 29a, deionized by an ion exchange resin cartridge 30, purified by a fine final filter 29d, and temporarily stored in a water storage tank 32 preferably made of a material such as fluororesin.

ここで貯蔵された純水を一次純水とし使用する。The purified water stored here is used as primary purified water.

また本方式は特許請求の範囲を拘束するものではなく、
−次純水として、イオン交換水や逆浸透装置によるRO
水を用いてもさしつかえない6さらに清浄度の低いレベ
ルでの洗浄には市水を通すことも可能である。各フィル
タの異物捕捉等によるフィルタ管理は、圧力計31にて
行なう。
Furthermore, this method does not restrict the scope of the claims;
- As next-purified water, RO using ion exchange water or reverse osmosis equipment
Water can also be used.6 For cleaning at a lower level of cleanliness, it is also possible to use city water. Filter management by trapping foreign matter in each filter is performed by a pressure gauge 31.

さらに−次純水のオーバーフロー分は流路42を通り何
回も前記濾過系にて濾過される。流路44を通った一次
純水は、ポンプ20bにて湿式洗浄部39、ブラシ3b
のセルフクリーニングノズル38へ送られるが、途中、
電気信号により電磁バルブ27c、27eを作動させ必
要な場合に供給される。流路45を通過する場合は、流
路42の一次純水と同様原水入口まで運ばれ再が過され
る。電磁バルブ27eを通過する一次純水は、最終フィ
ルター、望ましくはメンブレンフィルター34b、34
cにて濾過され、各洗浄機構部へ供給される。また流路
43を通過した一次純水は1、さらに超純水製造ユニッ
ト、例えば1日本ミリポー′アリミテツド社製のMil
li−Qシステム33等を通し超純水化する。ここで得
られる超純水は電磁弁27bにより必要な場合流路47
ヘポンプ20dにて送られる。さらにメンブレンフィル
タ34aにて最終濾過されリンス用ノズル3cへ、また
高圧ポンプ21を通過した超純水はアキュムレータ36
にて一定量貯蔵され、高圧電磁弁27dを必要時開くこ
とによりジェットノズル3dから高圧純水として吐出さ
れる。これらのリンス及びジェットの液は吐出後湿式洗
浄部39へ戻り、電磁バルブ25を開くことによりポン
プ20cにて流路46を通り電磁弁27fを経て、原水
入口上9へ戻される。これは、洗浄後の超純水及び純水
は原水より清浄である場合が多くフィルタの寿命等を考
慮し入口へ戻すものである。
Furthermore, the overflow of sub-purified water passes through the channel 42 and is filtered many times in the filtration system. The primary pure water that has passed through the channel 44 is sent to the wet cleaning section 39 and the brush 3b by the pump 20b.
is sent to the self-cleaning nozzle 38, but on the way,
The electromagnetic valves 27c and 27e are actuated by the electric signal, and the electric signal is supplied when necessary. When passing through the flow path 45, the water is transported to the raw water inlet and subjected to re-purification, similar to the primary pure water in the flow path 42. The primary pure water passing through the electromagnetic valve 27e is passed through a final filter, preferably membrane filters 34b, 34.
The water is filtered at c and supplied to each cleaning mechanism. In addition, the primary pure water that has passed through the flow path 43 is sent to the ultrapure water production unit 1, for example, 1 manufactured by Nippon Millipore Limited.
The water is made ultrapure through a li-Q system 33 or the like. The ultrapure water obtained here is supplied to the flow path 47 when necessary by the solenoid valve 27b.
It is sent by the hepump 20d. Furthermore, the ultrapure water that is finally filtered by the membrane filter 34a and sent to the rinsing nozzle 3c and passed through the high pressure pump 21 is transferred to the accumulator 36.
A certain amount of water is stored in the water tank, and is discharged as high-pressure pure water from the jet nozzle 3d by opening the high-pressure solenoid valve 27d when necessary. After being discharged, these rinsing and jet liquids return to the wet cleaning section 39, and by opening the electromagnetic valve 25, they are returned to the raw water inlet 9 through the flow path 46 by the pump 20c, via the electromagnetic valve 27f. This is because ultrapure water and pure water after cleaning are often cleaner than raw water, and are returned to the inlet in consideration of the lifespan of the filter.

ここで電磁弁27aは装置停止時、例えば流量をより絞
った精密ニードルバルブ28b側へ切替わり、電磁弁2
7bも精密ニードルバルブ28c・  側に切替わる。
Here, when the solenoid valve 27a is stopped, the solenoid valve 27a is switched to the precision needle valve 28b side, which reduces the flow rate, for example.
7b is also switched to the precision needle valve 28c side.

さらに電磁弁27cも同様に手動゛コック23側へ切替
わる。これにより装置停止時も、各フィルタは微量に調
節された液量が連続して流れ、フィルタ、配管等の内部
での微生物発生を抑制できる。
Further, the solenoid valve 27c is similarly switched to the manual cock 23 side. As a result, even when the apparatus is stopped, a finely regulated amount of liquid continues to flow through each filter, and the generation of microorganisms inside the filters, piping, etc. can be suppressed.

また配管系の洗浄を行なう際も、洗浄剤を入口40から
導入し各糸路を循環させ、配管内壁や、バルブ、コック
、フィルタハウジング内等の洗浄を可能としており、洗
浄後は1手動コック24を開は洗浄水を排出し、原水を
通常のように導入させ、循環排出をくり返えしたのち、
通常の運転状態へ復帰するものである。
Also, when cleaning the piping system, the cleaning agent is introduced from the inlet 40 and circulated through each thread path, making it possible to clean the inside walls of the piping, valves, cocks, filter housing, etc. After cleaning, one manual cock is used. 24, after discharging the washing water, introducing raw water as usual, and repeating the circulation and discharge,
This is to return to normal operating condition.

上述したように、本実施例によれば、微量の液を常時流
路全系に流すことができるため、微生物の発生を抑制で
き、被洗浄物の洗浄装置による再汚染を防止できる。
As described above, according to this embodiment, a small amount of liquid can be constantly flowed through the entire channel system, so that the generation of microorganisms can be suppressed and re-contamination of the object to be cleaned by the cleaning device can be prevented.

本実施例で示した各部に使用されるフィルタ、バルブ、
コック及び弁などは、これらの数量や位置が本実施例に
制約されるものではなく、液量を微量通過させる機構も
本実施例に限定されるものではない、これらは洗浄液の
液種や必要清浄度などから選定されるものであり、材質
についても同様である。また純水装置は洗浄装置内に搭
載しても外部に別に設けてもよい。
Filters, valves, and valves used in each part shown in this example
The number and position of the cocks and valves are not limited to those in this example, and the mechanism for passing a small amount of liquid is not limited to this example. The selection is made based on cleanliness, etc., and the same applies to the material. Further, the deionized water device may be installed within the cleaning device or may be provided separately outside.

〔発明の効果〕〔Effect of the invention〕

上述した通り、本発明によれば、無機物と有機物が混在
した塵埃を被洗浄物の表面から除去する洗浄装置の湿式
洗浄装置内配管系に、装置停止時にも微量の洗浄液が通
過するように流路を設けたものであるから、装置内の微
生物の発生を防止することができ、洗浄装置による被洗
浄物の再汚染を防ぐことができる。
As described above, according to the present invention, a small amount of cleaning liquid is allowed to flow through the piping system in the wet cleaning device of a cleaning device that removes dust containing a mixture of inorganic and organic substances from the surface of the object to be cleaned, so that it passes even when the device is stopped. Since the cleaning device is provided with a channel, it is possible to prevent the generation of microorganisms within the device, and it is possible to prevent re-contamination of objects to be cleaned by the cleaning device.

【図面の簡単な説明】[Brief explanation of the drawing]

第11!Iは本発明に係る洗浄装置−の一実施例の構成
を示す概略図、第2図はトレイの一部破断斜視図、第3
図〜第7図は第1図に示す各部の断面図。 第8図は本発明に係る湿式洗浄装置の配管系の一実施例
を示す系統図である。 1・・・洗浄装置、3・・・湿式洗浄装置、4・・・乾
式洗浄装置、7・・・被洗浄物、23・・・手動コック
、28b。 28c・・・精密ニードルバルブ。
11th! I is a schematic diagram showing the configuration of an embodiment of the cleaning device according to the present invention, FIG. 2 is a partially cutaway perspective view of a tray, and FIG.
7 to 7 are cross-sectional views of each part shown in FIG. 1. FIG. 8 is a system diagram showing an embodiment of the piping system of the wet cleaning device according to the present invention. DESCRIPTION OF SYMBOLS 1...Cleaning device, 3...Wet type cleaning device, 4...Dry type cleaning device, 7...Object to be cleaned, 23...Manual cock, 28b. 28c...Precision needle valve.

Claims (1)

【特許請求の範囲】[Claims] 1、被洗浄物に付着した塵埃を液体を介して除去する湿
式洗浄装置と、被洗浄物に付着した塵埃を加熱およびオ
ゾンにて除去する乾式洗浄装置とからなる洗浄装置にお
いて、前記湿式洗浄装置内の洗浄液配管系に、前記洗浄
装置停止時に微量な洗浄液が通過する流路を設けたこと
を特徴とする洗浄装置。
1. A cleaning device consisting of a wet cleaning device that removes dust attached to an object to be cleaned using a liquid and a dry cleaning device that removes dust attached to an object to be cleaned using heating and ozone, wherein the wet cleaning device A cleaning device characterized in that a cleaning fluid piping system in the cleaning device is provided with a flow path through which a small amount of cleaning fluid passes when the cleaning device is stopped.
JP60063624A 1985-03-29 1985-03-29 Cleaning apparatus Pending JPS61224327A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60063624A JPS61224327A (en) 1985-03-29 1985-03-29 Cleaning apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60063624A JPS61224327A (en) 1985-03-29 1985-03-29 Cleaning apparatus

Publications (1)

Publication Number Publication Date
JPS61224327A true JPS61224327A (en) 1986-10-06

Family

ID=13234669

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60063624A Pending JPS61224327A (en) 1985-03-29 1985-03-29 Cleaning apparatus

Country Status (1)

Country Link
JP (1) JPS61224327A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63108724A (en) * 1986-10-27 1988-05-13 Japan Organo Co Ltd Manufacture of semiconductor cleaning superpure water
JPH01140825U (en) * 1988-03-23 1989-09-27
US5135608A (en) * 1989-07-11 1992-08-04 Hitachi, Ltd. Method of producing semiconductor devices
WO2001037326A1 (en) * 1999-11-15 2001-05-25 Fsi International, Inc. Processing apparatus for microelectronic devices in which polymeric bellows are used to help accomplish substrate transport inside of the apparatus
JP2007503114A (en) * 2003-08-19 2007-02-15 ザ・ビーオーシー・グループ・インコーポレーテッド Method and system for cleaning a semiconductor wafer surface

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63108724A (en) * 1986-10-27 1988-05-13 Japan Organo Co Ltd Manufacture of semiconductor cleaning superpure water
JPH01140825U (en) * 1988-03-23 1989-09-27
US5135608A (en) * 1989-07-11 1992-08-04 Hitachi, Ltd. Method of producing semiconductor devices
WO2001037326A1 (en) * 1999-11-15 2001-05-25 Fsi International, Inc. Processing apparatus for microelectronic devices in which polymeric bellows are used to help accomplish substrate transport inside of the apparatus
US6284006B1 (en) * 1999-11-15 2001-09-04 Fsi International, Inc. Processing apparatus for microelectronic devices in which polymeric bellows are used to help accomplish substrate transport inside of the apparatus
JP2007503114A (en) * 2003-08-19 2007-02-15 ザ・ビーオーシー・グループ・インコーポレーテッド Method and system for cleaning a semiconductor wafer surface

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