JPS61223662A - Frequency measuring system - Google Patents

Frequency measuring system

Info

Publication number
JPS61223662A
JPS61223662A JP6566585A JP6566585A JPS61223662A JP S61223662 A JPS61223662 A JP S61223662A JP 6566585 A JP6566585 A JP 6566585A JP 6566585 A JP6566585 A JP 6566585A JP S61223662 A JPS61223662 A JP S61223662A
Authority
JP
Japan
Prior art keywords
frequency
signal
time base
under test
measured
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6566585A
Other languages
Japanese (ja)
Inventor
Yuichi Sato
祐一 佐藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP6566585A priority Critical patent/JPS61223662A/en
Publication of JPS61223662A publication Critical patent/JPS61223662A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To attain a sufficiently small measurement error and a high resolution and to measure a signal frequency by generating a stable high frequency signal having the n-fold frequency for the signal to be measured and counting the high frequency signal with the time base of a prescribed time. CONSTITUTION:The output of a frequency divider 115 is so adjusted automatically that this output and the signal to be measured inputted to a phase comparator 111 have the same frequency and have phases synchronized with each other. Consequently, the high frequency signal having the n-fold frequency of the signal to be measured is outputted from the output terminal OUT of a DPLL 110 as the connection point between frequency dividers 114 and 115 phase- synchronously with input pulses. In a frequency measuring means, a counter 121 receives a time base signal of a time T from a time base generator and counts the number of pulses of the high frequency signal form the DPLL 110 on the time base T. This counted value is multiplied by 1/(nT) in a frequency discriminating circuit 122 to measure and output the frequency of input pulses.

Description

【発明の詳細な説明】 〔概 要〕 周波数計測方式において、入力信号を逓倍にして計測す
ることにより、短時間で精度のよい周波5数計測を可能
にした。
[Detailed Description of the Invention] [Summary] In the frequency measurement method, by multiplying and measuring the input signal, it is possible to measure five frequencies with high accuracy in a short time.

〔産業上の利用分野〕[Industrial application field]

本発明は、被測定信号周波数の計測方式、より詳細には
、限られた短い測定基準時間において小さい測定誤差と
高い分解能力を持った被測定信号周波数の計測が可能な
周波数計測方式に関する。
The present invention relates to a method for measuring the frequency of a signal under test, and more particularly, to a frequency measurement method capable of measuring the frequency of a signal under test with a small measurement error and high resolving power in a limited short measurement reference time.

〔従来の技術〕[Conventional technology]

被測定信号の周波数を計測する場合、一定の測定基準時
間(タイム・ベース)T内に入力された被測定信号の周
波数を計数して行っている。この場合、第4図に示す様
に、時間Tにおいて1人力数の誤差を生じる。
When measuring the frequency of a signal under test, the frequency of the signal under test that is input within a fixed measurement reference time (time base) T is counted. In this case, as shown in FIG. 4, an error of one manpower occurs at time T.

第4図は、被測定信号がパルスの場合の例を示したもの
で、図示しないカウンタにより入力パルスの立下りによ
り計数が行われる。カウンタは、時間toよりもtlま
での回定時間Tをタイム・ベースとして、入力パルス数
を非同期で計数する。
FIG. 4 shows an example in which the signal to be measured is a pulse, and a counter (not shown) performs counting according to the falling edge of the input pulse. The counter asynchronously counts the number of input pulses using the rotation time T from time to to tl as a time base.

この為、計数開始時間toと入力パルスの位相関係によ
り、図示の+al 、 (b)の様に、タイム・ベース
Tにおいて計数される入力パルス数は2個((a)の場
合)又は(P−1)個((b)の場合)となり、1ビツ
トの周波数誤差が生じる。
Therefore, depending on the phase relationship between the counting start time to and the input pulse, the number of input pulses counted at the time base T is 2 (in the case of (a)) or (P -1) (in case (b)), and a 1-bit frequency error occurs.

従って、計測される入力パルスの周波数は、それぞれP
/T又は(P−1>/Tとなり、(1/T)H2の測定
誤差が生じることになる。
Therefore, the frequency of the input pulse to be measured is P
/T or (P-1>/T, resulting in a measurement error of (1/T)H2).

この測定誤差はTに反比例することから、測定誤差を小
さくして測定の分解能力を高める為、従来は、タイム・
ベースの長さTを大きくしていた。
This measurement error is inversely proportional to T, so in order to reduce the measurement error and improve the measurement resolution, conventional methods
The base length T was increased.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

従来の周波数計測方式においては、前述の様に、タイム
・ベースの長さTを大きくすることにより測定誤差を低
減させ、分解能力を高めていた。
In the conventional frequency measurement method, as described above, the measurement error is reduced by increasing the length T of the time base, and the resolution ability is improved.

然しなから、通信機器等のシステムにおいては、その中
で入力信号周波数の計測を行う場合、タイム・ベースに
制限があるケースが多い。その場合、タイム・ベースの
長さが短かいと、従来の周波数計測方式では測定誤差が
大きくなり、満足すべき分解能力が得られないという問
題があった。例えば、タイム・ベースの長さTを200
 m5ecとすると、5H2の大きな測定誤差が生じる
ので、1000H2,1005H2,l0IOH2等、
数H2の周波数差を持った複数の入力信号があった場合
、これ等を確実に識別するに十分な分解能力を得ること
が出来なかった。
However, in systems such as communication equipment, there are often restrictions on the time base when measuring the input signal frequency therein. In this case, if the length of the time base is short, the conventional frequency measurement method has a problem in that measurement errors become large and satisfactory resolution ability cannot be obtained. For example, set the time base length T to 200
If m5ec is used, a large measurement error of 5H2 will occur, so 1000H2, 1005H2, l0IOH2, etc.
When there are a plurality of input signals having a frequency difference of several H2, it is not possible to obtain sufficient resolution ability to reliably identify these signals.

本発明は、従来の周波数計測方式における前述の問題点
を解消する為に成されたもので、限られた短いタイム・
ベースにおいて小さい測定誤差と高い分解能力を持って
被測定信号周波数の計測が可能な周波数計測方式を提供
することを目的とする。
The present invention was made in order to solve the above-mentioned problems in the conventional frequency measurement method.
It is an object of the present invention to provide a frequency measurement method that can measure the frequency of a signal to be measured with small measurement errors and high resolving power at the base.

〔問題点を解決するための手段〕[Means for solving problems]

従来の周波数計測方式における前述の問題点を解決し、
前記目的を達成する為に本発明の講じた手段を、第1図
により説明する。
Solving the aforementioned problems with conventional frequency measurement methods,
The means taken by the present invention to achieve the above object will be explained with reference to FIG.

第1図は、本発明の構成をブロック図で示したものであ
る。第1図において、110は高調波発生手段で、被測
定信号に対して十分に安定したn倍の周波数を持った高
調波信号を発生する。120は周波数計測手段で、高調
波発生信号110から出力された高調波信号の周波数を
、時間Tのタイム・ベースで計数して、被測定信号周波
数の計測を行う。
FIG. 1 is a block diagram showing the configuration of the present invention. In FIG. 1, 110 is a harmonic generation means that generates a harmonic signal having a sufficiently stable frequency n times that of the signal under test. 120 is a frequency measuring means that counts the frequency of the harmonic signal output from the harmonic generation signal 110 on a time base of time T to measure the frequency of the signal under test.

〔作 用〕[For production]

第1図に示した構成を持った本発明の作用を、第2図の
タイミング・チャートを参照して説明する。第2図には
、被測定信号がパルス信号である場合の例が示されてい
るが、以下の説明は、パルス信号や正弦波信号等、各種
の被測定信号周波数の計測に共通するものである。
The operation of the present invention having the configuration shown in FIG. 1 will be explained with reference to the timing chart of FIG. 2. Figure 2 shows an example where the signal under test is a pulse signal, but the following explanation is common to measurement of various signal frequencies under test, such as pulse signals and sine wave signals. be.

被測定信号は、高調波発生手段110によりn倍に逓倍
されて、周波数計測手段120に加えられる0周波数計
測手段120は、時間toを測定開始時間とし時間Tの
タイム・ベースで、高調波発生手段110より加えられ
た高調波信号の周波数を計測する。
The signal to be measured is multiplied by n times by the harmonic generation means 110 and applied to the frequency measurement means 120. The frequency of the harmonic signal added by means 110 is measured.

周波数計測手段120の計測は、被測定信号の位相と非
同期で行われるので、測定開始時間t。
Since the measurement by the frequency measuring means 120 is performed asynchronously with the phase of the signal under test, the measurement start time t.

と被測定信号の位相関係により、計数値が変化する。The count value changes depending on the phase relationship between the signal and the signal under test.

周波数計測手段120が入力信号の立下りで計数を行う
ものとすると、第2図(a)に示した被測定信号のタイ
ム・ベースTの計数値はPとなる。
If the frequency measuring means 120 counts at the falling edge of the input signal, the counted value of the time base T of the signal under test shown in FIG. 2(a) will be P.

この被測定信号を2逓倍した高調波信号の周波数を計数
すると、高調波信号の時間toにおける位相関係により
、計数値は(2P−2)(第2図(blの場合)又は(
2P−1)(第2図(C)の場合)となる。被測定信号
を一般にn逓倍した高調波信号の場合の計数値は、(n
P−1)又は(nP−2)となる。
When the frequency of the harmonic signal obtained by doubling this signal under test is counted, the count value is (2P-2) (Figure 2 (in the case of bl) or (
2P-1) (in the case of FIG. 2(C)). In the case of a harmonic signal obtained by multiplying the signal under test by n, the count value is (n
P-1) or (nP-2).

周波数計測手段120は、この計数値に(1/nT)を
乗算することによって被測定信号の周波数を計測するが
、計測された被測定信号周波数は、CP/T  (1/
nT)又は(P/T −(2/nT)となる。従って、
両者の測定誤差は(1/n’r)に大きく低減される。
The frequency measuring means 120 measures the frequency of the signal under test by multiplying this count value by (1/nT), and the measured signal frequency under test is CP/T (1/nT).
nT) or (P/T - (2/nT). Therefore,
Both measurement errors are greatly reduced to (1/n'r).

以上の様にして、本発明によれば、従来の周波数計測方
式と同じタイムベースで計測を行って、従来の周波数計
測方式よりも測定誤差を(1/n)に低減させることが
出来、従って分解能力もn倍に高めることが出来る。
As described above, according to the present invention, measurement can be performed using the same time base as the conventional frequency measurement method, and the measurement error can be reduced to (1/n) compared to the conventional frequency measurement method. The decomposition ability can also be increased by n times.

〔実施例〕〔Example〕

本発明の一実施例を、図面を参照して詳細に説明する。 An embodiment of the present invention will be described in detail with reference to the drawings.

第3図は、本発明の一実施例を示したものである。FIG. 3 shows an embodiment of the present invention.

第3図において、高調波発生手段110及び周波数計測
手段120については、第1図で説明した通りである。
In FIG. 3, the harmonic generation means 110 and the frequency measurement means 120 are as described in FIG. 1.

本実施例においては、被測定信号はパルス信号であり、
その高調波発生手段110として、デジタルPLL (
DPLL:デジタル・フェーズ・ロック・ループ)が用
いられている。高調波発生手段110を構成するDPL
Lにおいて、111は位相比較器、112はシーケンシ
ャル・フィルタ、113はデジタルVCO<電圧制御発
振器)、114は分周比が(n/Q:n−Qは正の整数
)の分周器、115は分周比が(1/n)の分周器であ
る。
In this example, the signal under test is a pulse signal,
As the harmonic generation means 110, a digital PLL (
DPLL (digital phase lock loop) is used. DPL constituting harmonic generation means 110
In L, 111 is a phase comparator, 112 is a sequential filter, 113 is a digital VCO (<voltage controlled oscillator), 114 is a frequency divider with a frequency division ratio (n/Q: n-Q is a positive integer), 115 is a frequency divider with a frequency division ratio of (1/n).

この構成により、位相比較器111に入力さ′れる入力
パルス(被測定信号)と分周器115の出力は、周波数
が等しく且つ位相が同期する関係に自動調整される。従
って、分周器114及び115の接続点、即ちDPLL
 (110)の出力端OUTからは、入力パルスに位相
同期しその周波数がn倍に逓倍された高調波信号か出力
される。
With this configuration, the input pulse (signal under measurement) input to the phase comparator 111 and the output of the frequency divider 115 are automatically adjusted to have equal frequencies and synchronized phases. Therefore, the connection point of frequency dividers 114 and 115, i.e., DPLL
From the output terminal OUT of (110), a harmonic signal whose frequency is multiplied by n times is output in phase synchronization with the input pulse.

なお、このDPLL (110)の構成及び動作は公知
であるので、それ等の詳細な説明は省略する。PLLや
DPLLは極めて安定に発振するので、十分に安定した
n逓倍高周波信号を発生させることが出来る。
Note that the configuration and operation of this DPLL (110) are well known, so detailed explanation thereof will be omitted. Since a PLL or a DPLL oscillates extremely stably, it is possible to generate a sufficiently stable n-multiplied high frequency signal.

周波数計測手段120において、121はカウンタで、
図示しないタイム・ベース発生器より時間Tのタイム・
ベース信号を受け、このタイム・ベースTにおいてDP
LL (110)より入力された高調波信号のパルス数
を計数する。
In the frequency measuring means 120, 121 is a counter,
A time base generator (not shown) generates a time signal at time T.
DP at this time base T.
The number of pulses of the harmonic signal input from LL (110) is counted.

122は周波数識別回路で、カウンタ121の計数値に
(1/nT)を乗算することにより入力パルスの周波数
を計測して出力する。もし、入力パルス(被測定信号)
の周波数が一定値のF+  。
122 is a frequency identification circuit that measures the frequency of the input pulse by multiplying the count value of the counter 121 by (1/nT) and outputs the frequency. If the input pulse (signal under test)
F+ with a constant frequency.

F2.F3等に規定されているものである場合は、計測
値から周波数がFl 、F2  、F3等のいずれであ
るかを識別し、その識別結果が出力される。
F2. If the frequency is specified as F3, etc., it is determined from the measured value whether the frequency is Fl, F2, F3, etc., and the identification result is output.

なお、被測定信号の逓倍数nを大きくすると、測定誤差
はnに反比例して小さくなり分解能力は向上するが、そ
の反面、カウンタ121及び周波数識別回路122の構
成が複雑になる。そこで、被測定信号を計測又は識別す
る為に必要な測定誤差、分解能力、各回路要素の構成の
難易、コスト等を考慮して、逓倍数n即ち分周器115
の分周比(1/n) 、分周器114の分周比(n/Q
)、デジタルVCO113の発振周波数が適宜選定され
る。
Incidentally, when the multiplication number n of the signal under test is increased, the measurement error becomes smaller in inverse proportion to n and the resolution ability is improved, but on the other hand, the configurations of the counter 121 and the frequency identification circuit 122 become complicated. Therefore, considering the measurement error, resolution ability, difficulty in configuring each circuit element, cost, etc. necessary for measuring or identifying the signal under test, the multiplier n, that is, the frequency divider 115
The frequency division ratio of the frequency divider 114 (1/n), the frequency division ratio of the frequency divider 114 (n/Q
), the oscillation frequency of the digital VCO 113 is selected as appropriate.

以上の構成により、前述の〔作用〕の項で説明下様に、
被測定信号の周波数を(1/nT)H2の十分に低い測
定誤差を持って計測することが出来る。
With the above configuration, as explained in the [Operation] section above,
The frequency of the signal to be measured can be measured with a sufficiently low measurement error of (1/nT)H2.

以上、本発明の一実施例について説明したが、本発明は
、この実施例に限定されるものでは無い。
Although one embodiment of the present invention has been described above, the present invention is not limited to this embodiment.

例えば、被測定信号が正弦波の場合には、高調波発生手
段110としてDPLLの代りに通常のPLLが用いら
れる。高調波発生手段110として、DPLL又はPL
Lの他、他の各種の安定な逓倍器を用いることが出来る
For example, when the signal under test is a sine wave, a normal PLL is used as the harmonic generation means 110 instead of a DPLL. As the harmonic generation means 110, DPLL or PL
In addition to L, various other stable multipliers can be used.

〔発明の効果〕〔Effect of the invention〕

以上説明した様に、本発明によれば、限られた短い測定
基準時間(タイム・ベース)において、十分に小さい測
定誤差と高い分解能力を持って、被測定信号の周波数を
計測することが出来る。
As explained above, according to the present invention, it is possible to measure the frequency of a signal under test with sufficiently small measurement error and high resolution in a limited and short measurement reference time (time base). .

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の詳細な説明図、第2図は本発明の詳細
な説明するタイム・チャート、第3図は本発明の一実施
例の説明図、第4図は従来の周波数計測方式の動作を説
明するタイム・チャート、をそれぞれ示す。 第1図において、 110・・・高調波発生手段、120・・・周波数計測
手段。 特許出願人   富 士 通 株式会社千隆v¥hy+
積へ゛ノゲu、、/71tuQ @第1図 ↑0                    ↑1千
発Illηの◆ハ工ダ4ム、イ4−ト第2■
Fig. 1 is a detailed explanatory diagram of the present invention, Fig. 2 is a time chart for detailed explanation of the present invention, Fig. 3 is an explanatory diagram of an embodiment of the present invention, and Fig. 4 is a conventional frequency measurement method. A time chart explaining the operation of each is shown. In FIG. 1, 110: harmonic generation means, 120: frequency measurement means. Patent applicant Fujitsu Chiryu Co., Ltd. v\hy+
To the product u,, /71tuQ @Figure 1 ↑0 ↑1,000 shots Illη's ◆Ha 4th m, 4th 2nd ■

Claims (2)

【特許請求の範囲】[Claims] (1)一定の測定基準時間内に入力された被測定信号の
周波数を非同期で計数して被測定信号周波数の計測を行
う周波数計測方式において、 (a)被測定信号の周波数を逓倍した高調波信号を発生
する高調波発生手段(110)と、 (b)一定の測定基準時間内における高調波発生手段(
110)の出力した高調波信号の周波数を計数して元の
被測定信号周波数の計測を行う周波数計測手段、 を備えたことを特徴とする周波数計測方式。
(1) In a frequency measurement method that measures the frequency of the signal under test by asynchronously counting the frequency of the signal under test that is input within a certain measurement reference time, (a) Harmonics obtained by multiplying the frequency of the signal under test (b) harmonic generation means (110) for generating a signal; (b) harmonic generation means (110) within a certain measurement reference time;
110) Frequency measurement means for counting the frequency of the output harmonic signal to measure the original signal frequency to be measured.
(2)高調波発生手段がPLL又はデジタルPLLであ
ることを特徴とする特許請求の範囲第1項記載の周波数
計測方式。
(2) The frequency measurement method according to claim 1, wherein the harmonic generation means is a PLL or a digital PLL.
JP6566585A 1985-03-29 1985-03-29 Frequency measuring system Pending JPS61223662A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6566585A JPS61223662A (en) 1985-03-29 1985-03-29 Frequency measuring system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6566585A JPS61223662A (en) 1985-03-29 1985-03-29 Frequency measuring system

Publications (1)

Publication Number Publication Date
JPS61223662A true JPS61223662A (en) 1986-10-04

Family

ID=13293515

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6566585A Pending JPS61223662A (en) 1985-03-29 1985-03-29 Frequency measuring system

Country Status (1)

Country Link
JP (1) JPS61223662A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010054511A (en) * 2009-10-02 2010-03-11 Fujitsu Microelectronics Ltd Detecting circuit
JP2010271091A (en) * 2009-05-20 2010-12-02 Seiko Epson Corp Frequency measuring device
CN106093567A (en) * 2016-06-01 2016-11-09 深圳先进技术研究院 A kind of high-precision wide frequency-domain frequency measures system and frequency measurement method
CN109298238A (en) * 2018-11-05 2019-02-01 西安智多晶微电子有限公司 A kind of frequency measurement method and its measuring system

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010271091A (en) * 2009-05-20 2010-12-02 Seiko Epson Corp Frequency measuring device
JP2010054511A (en) * 2009-10-02 2010-03-11 Fujitsu Microelectronics Ltd Detecting circuit
CN106093567A (en) * 2016-06-01 2016-11-09 深圳先进技术研究院 A kind of high-precision wide frequency-domain frequency measures system and frequency measurement method
CN109298238A (en) * 2018-11-05 2019-02-01 西安智多晶微电子有限公司 A kind of frequency measurement method and its measuring system

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