JPS6119774U - 走査電子顕微鏡を用いた電位測定装置 - Google Patents

走査電子顕微鏡を用いた電位測定装置

Info

Publication number
JPS6119774U
JPS6119774U JP10467084U JP10467084U JPS6119774U JP S6119774 U JPS6119774 U JP S6119774U JP 10467084 U JP10467084 U JP 10467084U JP 10467084 U JP10467084 U JP 10467084U JP S6119774 U JPS6119774 U JP S6119774U
Authority
JP
Japan
Prior art keywords
electrode
grid electrode
secondary electrons
potential
sample
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10467084U
Other languages
English (en)
Japanese (ja)
Other versions
JPH057581Y2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html
Inventor
進 高嶋
邦彦 内田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
Original Assignee
Jeol Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jeol Ltd filed Critical Jeol Ltd
Priority to JP10467084U priority Critical patent/JPS6119774U/ja
Publication of JPS6119774U publication Critical patent/JPS6119774U/ja
Application granted granted Critical
Publication of JPH057581Y2 publication Critical patent/JPH057581Y2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Measurement Of Current Or Voltage (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP10467084U 1984-07-11 1984-07-11 走査電子顕微鏡を用いた電位測定装置 Granted JPS6119774U (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10467084U JPS6119774U (ja) 1984-07-11 1984-07-11 走査電子顕微鏡を用いた電位測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10467084U JPS6119774U (ja) 1984-07-11 1984-07-11 走査電子顕微鏡を用いた電位測定装置

Publications (2)

Publication Number Publication Date
JPS6119774U true JPS6119774U (ja) 1986-02-05
JPH057581Y2 JPH057581Y2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1993-02-25

Family

ID=30664008

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10467084U Granted JPS6119774U (ja) 1984-07-11 1984-07-11 走査電子顕微鏡を用いた電位測定装置

Country Status (1)

Country Link
JP (1) JPS6119774U (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015028851A (ja) * 2013-07-30 2015-02-12 株式会社日立ハイテクノロジーズ 荷電粒子線装置

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2693950B1 (en) 2011-04-07 2020-07-29 Mobius Imaging, Llc Mobile x-ray imaging system

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015028851A (ja) * 2013-07-30 2015-02-12 株式会社日立ハイテクノロジーズ 荷電粒子線装置

Also Published As

Publication number Publication date
JPH057581Y2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1993-02-25

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