JPS61165670A - Automatic reliability testing system - Google Patents

Automatic reliability testing system

Info

Publication number
JPS61165670A
JPS61165670A JP576985A JP576985A JPS61165670A JP S61165670 A JPS61165670 A JP S61165670A JP 576985 A JP576985 A JP 576985A JP 576985 A JP576985 A JP 576985A JP S61165670 A JPS61165670 A JP S61165670A
Authority
JP
Japan
Prior art keywords
test
unit
data
fundamental
time
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP576985A
Other languages
Japanese (ja)
Other versions
JP2572958B2 (en
Inventor
Masayoshi Takahara
Tomoyuki Sato
Original Assignee
Clarion Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Clarion Co Ltd filed Critical Clarion Co Ltd
Priority to JP60005769A priority Critical patent/JP2572958B2/en
Publication of JPS61165670A publication Critical patent/JPS61165670A/en
Application granted granted Critical
Publication of JP2572958B2 publication Critical patent/JP2572958B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Abstract

PURPOSE: To perform the collection of data at an arbitrary intermediate stage without interrupting a test, by performing an automatic reliability test by using a fundamental unit coming to the center of a whole of a system, an expansion unit controlled by said fundamental unit and an environment testing unit.
CONSTITUTION: An automatic reliability testing system is constituted so as to at first set a testing condition by the computer 6 of a fundamental unit 1. Next, this set testing condition (program) is transferred to an expansion unit 2 and the start switch provided in the expansion unit 2 is subsequently closed to start a test. The expansion unit 2 is cooperated with an oven 10 corresponding to said set test program on the basis of time control by the fundamental unit 1 to perform the test of DUT. The test program, test data, time data and environmental data at this time are automatically transferred and recorded every time in the route of expansion unit 2 → fundamental unit 1 → character display 9 → data recording unit 3. By this method, the recording of data can be performed in an arbitrary intermediate stage without interrupting the test.
COPYRIGHT: (C)1986,JPO&Japio
JP60005769A 1985-01-18 1985-01-18 Automatic reliability test system Expired - Lifetime JP2572958B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60005769A JP2572958B2 (en) 1985-01-18 1985-01-18 Automatic reliability test system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60005769A JP2572958B2 (en) 1985-01-18 1985-01-18 Automatic reliability test system

Publications (2)

Publication Number Publication Date
JPS61165670A true JPS61165670A (en) 1986-07-26
JP2572958B2 JP2572958B2 (en) 1997-01-16

Family

ID=11620326

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60005769A Expired - Lifetime JP2572958B2 (en) 1985-01-18 1985-01-18 Automatic reliability test system

Country Status (1)

Country Link
JP (1) JP2572958B2 (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002132895A (en) * 2000-10-18 2002-05-10 Kusumoto Kasei Kk Measurement test system and its program
JP2008116220A (en) * 2006-11-01 2008-05-22 Syswave Corp Apparatus for testing semiconductor
JP2012013425A (en) * 2010-06-29 2012-01-19 Espec Corp Environmental test device
JP2012242341A (en) * 2011-05-24 2012-12-10 Espec Corp Hold-cold shock testing device and environment test system including the same

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53142259A (en) * 1977-05-18 1978-12-11 Toshiba Corp Threshold condition testing system
JPS5942940U (en) * 1982-09-13 1984-03-21

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53142259A (en) * 1977-05-18 1978-12-11 Toshiba Corp Threshold condition testing system
JPS5942940U (en) * 1982-09-13 1984-03-21

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002132895A (en) * 2000-10-18 2002-05-10 Kusumoto Kasei Kk Measurement test system and its program
JP2008116220A (en) * 2006-11-01 2008-05-22 Syswave Corp Apparatus for testing semiconductor
JP2012013425A (en) * 2010-06-29 2012-01-19 Espec Corp Environmental test device
JP2012242341A (en) * 2011-05-24 2012-12-10 Espec Corp Hold-cold shock testing device and environment test system including the same

Also Published As

Publication number Publication date
JP2572958B2 (en) 1997-01-16

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