JPS61155779A - Multifunctional tester - Google Patents

Multifunctional tester

Info

Publication number
JPS61155779A
JPS61155779A JP28130084A JP28130084A JPS61155779A JP S61155779 A JPS61155779 A JP S61155779A JP 28130084 A JP28130084 A JP 28130084A JP 28130084 A JP28130084 A JP 28130084A JP S61155779 A JPS61155779 A JP S61155779A
Authority
JP
Japan
Prior art keywords
circuit
test
output
electronic equipment
input
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP28130084A
Other languages
Japanese (ja)
Inventor
Akitoshi Makino
Masazumi Nakatsugawa
Original Assignee
Nec Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nec Corp filed Critical Nec Corp
Priority to JP28130084A priority Critical patent/JPS61155779A/en
Publication of JPS61155779A publication Critical patent/JPS61155779A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE: To achieve an efficiency of operation test and consolidation of the test contents, by combining replaceable adaptor section matching an input/output interface of an electronic equipment with the body.
CONSTITUTION: In the operation test of an electronic equipment, first, an adaptor section 1 matching an electronic equipment to be tested is selected and to be combined with the body 2. A microprocessor 105 operates on a program of a memory circuit 107 to perform a diagnostic processing of a circuit and when judging that the circuit is normal, it executes a test program of a memory circuit 101 to set an operation parameter for a parallel input/output circuit 103, a serial input/output circuit 104 or a timing circuit 109. When inputted, a signal is memorized into a random acceleration memory 108 and is shown on a display section 8 through a man-machine interface circuit 110. Moreover, when outputted, the signal is outputted through the man-machine interface circuit 110 with the data input from a keyboard 7. The output timing here is determined by a timing circuit 109.
COPYRIGHT: (C)1986,JPO&Japio
JP28130084A 1984-12-27 1984-12-27 Multifunctional tester Pending JPS61155779A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP28130084A JPS61155779A (en) 1984-12-27 1984-12-27 Multifunctional tester

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP28130084A JPS61155779A (en) 1984-12-27 1984-12-27 Multifunctional tester

Publications (1)

Publication Number Publication Date
JPS61155779A true JPS61155779A (en) 1986-07-15

Family

ID=17637147

Family Applications (1)

Application Number Title Priority Date Filing Date
JP28130084A Pending JPS61155779A (en) 1984-12-27 1984-12-27 Multifunctional tester

Country Status (1)

Country Link
JP (1) JPS61155779A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104345262A (en) * 2014-10-27 2015-02-11 华南农业大学 Universal circuit board test system
CN106405373A (en) * 2016-08-29 2017-02-15 北京自动测试技术研究所 Active test vector matching method

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104345262A (en) * 2014-10-27 2015-02-11 华南农业大学 Universal circuit board test system
CN104345262B (en) * 2014-10-27 2017-06-27 华南农业大学 A kind of universal circuit Board Test System
CN106405373A (en) * 2016-08-29 2017-02-15 北京自动测试技术研究所 Active test vector matching method

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