JPS61108130A - Semiconductor manufacturing equipment - Google Patents

Semiconductor manufacturing equipment

Info

Publication number
JPS61108130A
JPS61108130A JP23075184A JP23075184A JPS61108130A JP S61108130 A JPS61108130 A JP S61108130A JP 23075184 A JP23075184 A JP 23075184A JP 23075184 A JP23075184 A JP 23075184A JP S61108130 A JPS61108130 A JP S61108130A
Authority
JP
Japan
Prior art keywords
substrate
reaction
gas
reaction gas
laser beam
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP23075184A
Other languages
Japanese (ja)
Inventor
Toshiyuki Kobayashi
利行 小林
Yoshimi Otomo
大友 芳視
Yoshimi Kinoshita
儀美 木之下
Masao Oda
昌雄 織田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP23075184A priority Critical patent/JPS61108130A/en
Publication of JPS61108130A publication Critical patent/JPS61108130A/en
Pending legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/48Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating by irradiation, e.g. photolysis, radiolysis, particle radiation
    • C23C16/483Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating by irradiation, e.g. photolysis, radiolysis, particle radiation using coherent light, UV to IR, e.g. lasers
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/48Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating by irradiation, e.g. photolysis, radiolysis, particle radiation
    • C23C16/482Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating by irradiation, e.g. photolysis, radiolysis, particle radiation using incoherent light, UV to IR, e.g. lamps

Landscapes

  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • General Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)

Abstract

PURPOSE:To make it feasible to form thin films very rapidly by a method wherein a light source of ultraviolet rays to activate the surface of substrate and an oscillator of laser beams to excite reaction gas are provided. CONSTITUTION:The surface of substrate 5 heated by a heater 3 at low temperature is irradiated with ultraviolet rays from a light source 22 to activate the substrate 5. Besides, reaction gas 4 is flowed from an inlet 7 to a substrate 5 to be irradiated with laser beams 12 for photochemical reaction. Resultantly, thin films with even thickness may be formed very rapidly on the substrate 5.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 この発明は、光化学的に反応ガスを分解して薄膜を基板
上に形成させる方法(photo chemicalv
apour deposiHon  :以下光励起CV
D法と称す)を用いて薄膜を形成する半導体製造装置に
関するものである。
Detailed Description of the Invention [Industrial Field of Application] This invention relates to a method of photochemically decomposing a reactive gas to form a thin film on a substrate.
apour deposition: hereinafter referred to as photoexcitation CV
The present invention relates to a semiconductor manufacturing apparatus that forms a thin film using a method (referred to as the D method).

〔従来の技術〕[Conventional technology]

第5図に従来の光励起CVD法による装置の基本的な構
成を示す。
FIG. 5 shows the basic configuration of an apparatus using the conventional photoexcitation CVD method.

第5図中、■は反応室、2は光源、3は基板加熱用ヒー
タ、4は反応ガス、5は基板、6は光透過材からなる光
入射窓、7は反応ガス供給口、8は反応ガス排出口、9
は基板5を載せる台である。
In Fig. 5, ■ is a reaction chamber, 2 is a light source, 3 is a heater for heating the substrate, 4 is a reaction gas, 5 is a substrate, 6 is a light entrance window made of a light-transmitting material, 7 is a reaction gas supply port, and 8 is a Reaction gas outlet, 9
is a stand on which the substrate 5 is placed.

次に動作について説明する。Next, the operation will be explained.

この装置では反応ガス4は供給ロアから反応室1に導入
され、入射窓6から投射された光線により反応室1内で
光化学反応を起こし、ヒータ3によって低温加熱された
基板5上に薄膜が形成されてゆく。
In this device, a reaction gas 4 is introduced into a reaction chamber 1 from a supply lower, a photochemical reaction is caused in the reaction chamber 1 by a light beam projected from an entrance window 6, and a thin film is formed on a substrate 5 heated at a low temperature by a heater 3. It is being done.

反応ガスに光化学反応を生じさせるには、反応ガスに共
鳴的に吸収される特定波長の紫外線を該反応ガスに投射
して該反応ガスを励起し、光化学反応を生じさせるか、
又は該反応ガス中に水銀蒸気等の増感作用を有する気体
を!II量に混入させ特定波長の紫外線により該増感気
体を励起させることにより反応ガスの励起を促し、光化
学反応を生しさせる方法をとっている。
In order to cause a photochemical reaction in a reactive gas, ultraviolet rays of a specific wavelength that are resonantly absorbed by the reactive gas are projected onto the reactive gas to excite the reactive gas to cause a photochemical reaction, or
Or a gas that has a sensitizing effect, such as mercury vapor, in the reaction gas! A method is adopted in which the sensitizing gas is mixed into the amount of II and excited by ultraviolet rays of a specific wavelength, thereby promoting the excitation of the reaction gas and causing a photochemical reaction.

又、従来、光源は反応ガス又は増感気体によって定まる
特定波長の紫外線を発して反応ガスを励起するだけでは
なく、基板の表面に紫外線を照射して基板表面を活性化
することにより、基板上に形成される薄膜の品質を高め
ると共に基板上への薄膜の形成速度を高める役割をもは
たしている。
Conventionally, light sources not only emit ultraviolet rays of a specific wavelength determined by the reactive gas or sensitizing gas to excite the reactive gas, but also irradiate the surface of the substrate with ultraviolet rays to activate the substrate surface. It also plays a role in improving the quality of the thin film formed on the substrate and increasing the speed of forming the thin film on the substrate.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

従来の装置は以上のように構成されているが、基板上へ
の薄膜の形成速度を高めるためには、反応ガスに対し固
有の特定波長の紫外線を非常に強力に発する光源を設け
るか、又は増感気体を反応ガスに混入して光化学反応を
促進させる必要があった。ところが、このような出力が
大きく長寿命な実用的な光源を求めることは現在では困
難であり、また水銀蒸気等を増感気体として反応ガスに
混入し光化学反応を促進させる方法では、基板」二に形
成される薄膜へ水銀が混入するなど形成される薄膜の品
質を低下させるという問題点があった。
Conventional devices are constructed as described above, but in order to increase the speed of forming a thin film on a substrate, it is necessary to provide a light source that emits extremely strong ultraviolet rays at a specific wavelength specific to the reaction gas, or It was necessary to mix a sensitizing gas into the reaction gas to accelerate the photochemical reaction. However, it is currently difficult to find a practical light source with such a large output and long life, and the method of promoting photochemical reactions by mixing mercury vapor etc. into the reaction gas as a sensitizing gas does not allow There was a problem in that the quality of the formed thin film deteriorated, such as mercury being mixed into the thin film formed.

この発明は、このような従来の問題点を解消するために
なされたもので、反応ガスの光化学反応を促進して高品
質の薄膜を高速度に基板上に形成できる半導体製造装置
を得ることを目的とするものである。
This invention was made to solve these conventional problems, and aims to provide a semiconductor manufacturing apparatus that can form high-quality thin films on substrates at high speed by promoting photochemical reactions of reactive gases. This is the purpose.

〔問題点を解決するだめの手段〕[Failure to solve the problem]

この発明に係る半導体製造装置は、紫外線を照射して基
板表面を活性化するための紫外光源と、反応ガスを励起
するためのレーザ光を発振出力するレーザ発振装置とを
設けたものである。
A semiconductor manufacturing apparatus according to the present invention is provided with an ultraviolet light source for irradiating ultraviolet light to activate a substrate surface, and a laser oscillation device for oscillating and outputting laser light for exciting a reactive gas.

また、この発明の別の発明に係る半導体製造装置は、上
記紫外光源及び上記レーザ発振装置の他に、」−記レー
ザビームと直角な方向に基板を水平移動させるテーブル
移動機構を設けるとともに、該基板上に投射される上記
レーザビームを挟むよう反応ガス供給ノズル及び排出ノ
ズルを相互に対向して設けたものである。
In addition to the ultraviolet light source and the laser oscillation device, a semiconductor manufacturing apparatus according to another aspect of the present invention is provided with a table moving mechanism for horizontally moving the substrate in a direction perpendicular to the laser beam. A reactant gas supply nozzle and a discharge nozzle are provided facing each other so as to sandwich the laser beam projected onto the substrate.

〔作用〕[Effect]

この発明においては、基板表面が紫外線で活性化され、
基板上を流れる反応ガスがレーザ光にて励起され、該基
板表面に高速度に薄膜が形成される。
In this invention, the substrate surface is activated with ultraviolet rays,
A reactive gas flowing over the substrate is excited by laser light, and a thin film is formed on the surface of the substrate at high speed.

また、この発明の別の発明においては、レーザビームと
直角な方向に流れる反応ガスの直下の基板が該ガスの流
れと同じ方向に移動するから、該基板全面にわたり均一
な膜厚の薄膜が形成される。
Further, in another aspect of the present invention, since the substrate directly under the reactive gas flowing in a direction perpendicular to the laser beam moves in the same direction as the flow of the gas, a thin film with a uniform thickness is formed over the entire surface of the substrate. be done.

〔実施例〕〔Example〕

以下、本発明の実施例を図について説明する。 Embodiments of the present invention will be described below with reference to the drawings.

第1図は本願の第1の発明の一実施例による半導体製造
装置の断面図、第2図は第1図のn−n線断面図である
。両図中、1は反応室、5は基板、22は紫外光源であ
り、これは上記基板5表面を照射し、これを活性化する
ための紫外線を出力する。3は基板5を低温加熱するヒ
ータ、4は反応ガス、6は光透過材からなる紫外線入射
窓、7は反応ガス供給口、8は反応ガス排出口、9は基
板5が載置されるテーブル、10は光透過材から竜るレ
ーザ光入射窓、11はレーザ光発振装置、12は該レー
ザ光発振装置11により発振された反応ガス励起用のレ
ーザ光ビームである。
FIG. 1 is a sectional view of a semiconductor manufacturing apparatus according to an embodiment of the first invention of the present application, and FIG. 2 is a sectional view taken along line nn in FIG. 1. In both figures, 1 is a reaction chamber, 5 is a substrate, and 22 is an ultraviolet light source, which outputs ultraviolet light for irradiating the surface of the substrate 5 and activating it. 3 is a heater that heats the substrate 5 at a low temperature; 4 is a reactive gas; 6 is an ultraviolet incident window made of a light-transmitting material; 7 is a reactive gas supply port; 8 is a reactive gas outlet; 9 is a table on which the substrate 5 is placed. , 10 is a laser beam entrance window extending from a light-transmitting material, 11 is a laser beam oscillation device, and 12 is a laser beam for excitation of the reactant gas oscillated by the laser beam oscillation device 11.

この装置では、ヒータ3によって低温加熱された基板5
の表面に、光源22からの紫外線が照射されて該基板5
が活性化される。一方、反応ガス4は供給ロアから基板
5上に流され、該基板5上でレーザ光ビーム12により
照射され、基板5」二で均一に励起されて光化学反応を
生じ、これらの結果として基板5上に速やかに均一な膜
厚の高品質な薄膜が形成されていく。
In this device, a substrate 5 is heated at a low temperature by a heater 3.
The surface of the substrate 5 is irradiated with ultraviolet light from the light source 22, and the surface of the substrate 5 is
is activated. On the other hand, the reaction gas 4 is flowed onto the substrate 5 from the supply lower, is irradiated on the substrate 5 by the laser beam 12, and is uniformly excited on the substrate 5'2 to cause a photochemical reaction. A high-quality thin film of uniform thickness is quickly formed on top.

第3図は本願の第2の発明の一実施例による半導体製造
装置の断面図、第4図は第3図のII−IV線断面図で
ある。両図中、第1.2図と同一符号は同−又は相当部
分を示し、13.14はレーザ光ビーム12を挾むよう
対向して設けられ、該ビーム12と直角な方向に反応ガ
ス4を流すための反応ガス供給ノズル及び排出ノズル、
19はレーザ光ビーJい12と直角な方向に移動可能な
テーブル、20は該テーブル19を移動させるテーブル
移動機構であり、これは上記テーブル19に固着された
連結子19aに螺合したボールネジ23とこれを回転駆
動するモータ24とから構成されている。
3 is a sectional view of a semiconductor manufacturing apparatus according to an embodiment of the second invention of the present application, and FIG. 4 is a sectional view taken along the line II-IV in FIG. 3. In both figures, the same reference numerals as in FIG. 1.2 indicate the same or corresponding parts, and 13 and 14 are provided facing each other so as to sandwich the laser beam 12, and the reactant gas 4 is directed in a direction perpendicular to the beam 12. reaction gas supply nozzle and discharge nozzle for flowing;
19 is a table movable in a direction perpendicular to the laser beam beam 12; 20 is a table moving mechanism for moving the table 19; this is a ball screw 23 screwed into a connector 19a fixed to the table 19; and a motor 24 that rotationally drives this.

この装置では、反応ガス4は反応ガス供給ロアを通り反
応ガス供給ノズル13からレーザ光ビーム12を包み込
むように、かつ該ビーム12と直角方向に該ビーム12
の幅L1より若干広い長さL 2だけ基板5」−に流さ
れるので、該反応ガス4は基板5上のレーザ光ビーム1
2に照射される部分の短い距離■、1を効率よく流れる
こととなり、該レーザ光ビーム12によって照射され光
化学反応を生じる範囲で反応ガス4の濃度はほぼ均一な
ものとなり、これにより基板5上に均一な厚さの薄膜が
形成される。
In this device, the reaction gas 4 passes through the reaction gas supply lower and exits the reaction gas supply nozzle 13 so as to surround the laser light beam 12 and extend in a direction perpendicular to the beam 12.
Since the reactive gas 4 is caused to flow onto the substrate 5 by a length L2 which is slightly wider than the width L1 of the laser beam 1 on the substrate 5.
The concentration of the reaction gas 4 becomes almost uniform within the range irradiated by the laser beam 12 to cause a photochemical reaction, and as a result, the concentration of the reaction gas 4 becomes almost uniform within the range where the laser beam 12 is irradiated and a photochemical reaction occurs. A thin film of uniform thickness is formed.

また、この反応ガスが短い距離を効率よく流れるため、
反応室内の不必要な部分に反応ガスが拡散して光入射窓
6.10に膜が堆積し、これにより光の入射を妨げると
いう不具合も減ぜられることとなる。
In addition, because this reaction gas flows efficiently over a short distance,
This also reduces the problem that the reaction gas diffuses into unnecessary parts of the reaction chamber and a film is deposited on the light entrance window 6.10, thereby blocking the incidence of light.

また、移動テーブル19を、レーザ光ビーム1の分布が
あっても基板5上に連続して均一な薄膜を形成し続ける
ことができる。
Furthermore, the movable table 19 can continue to form a uniform thin film on the substrate 5 even if the laser beam 1 is distributed.

また移動テーブル19の移動方向は反応ガス4の流れ方
向にも沿っているので、該テーブル19を移動させるこ
とは、反応ガスの流れ方向の微妙な反応ガス濃度の変化
が、形成される薄膜の膜厚を不均一とするということを
もなくすことができるものである。
Furthermore, since the moving direction of the moving table 19 is also along the flow direction of the reaction gas 4, moving the table 19 means that subtle changes in the reaction gas concentration in the flow direction of the reaction gas can be caused by the formation of a thin film. This makes it possible to eliminate uneven film thickness.

なお上記第1.第2の両発明において、光源22は基板
5表面を活性化させ形成される薄膜の品質を高めるため
のものであり、反応ガス4に光化学反応を起こさせるも
のではないので、従来装置の光源のように個々の反応ガ
スに特有の波長のみを有するものである必要はなく、又
従来の光源のように大出力の大きな光源である必要もな
い。
Note that the above 1. In the second invention, the light source 22 is for activating the surface of the substrate 5 and improving the quality of the formed thin film, and is not for causing a photochemical reaction in the reaction gas 4, so it is different from the light source of the conventional device. The light source does not need to have only a wavelength unique to each reactant gas, nor does it need to be a large light source with a high output like conventional light sources.

〔発明の効果〕〔Effect of the invention〕

以上のように、この発明に係る半導体製造装置によれば
、基板活性化用の紫外線を発振する紫外光源の他に反応
ガス励起用のレーザ光発振装置を設けたので、高品質な
薄膜を高速度に基板上に形成できる効果があり、さらに
上記レーザ光ビームと直角な方向に反応ガスを流すため
の供給・排気ノズル及び該方向に移動する移動テーブル
を設けだので、基板全面にわたり均一な膜厚の薄膜を形
成でき、より高い精度の半導体を効率よく製造できる効
果がある。
As described above, according to the semiconductor manufacturing apparatus according to the present invention, in addition to the ultraviolet light source that oscillates ultraviolet rays for activating the substrate, a laser beam oscillation device for excitation of the reactive gas is provided, so that high-quality thin films can be manufactured with high quality. In addition, supply and exhaust nozzles for flowing the reaction gas in a direction perpendicular to the laser beam and a moving table that moves in that direction are provided, so that a uniform film can be formed over the entire surface of the substrate. It is possible to form thick thin films, and has the effect of efficiently manufacturing semiconductors with higher precision.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本願の第1の発明の一実施例による半導体製造
装置の断面正面図、第2図は第1図の■−■線断面図、
第3図は本願の第2の発明の一実施例による半導体製造
装置の断面正面図、第4図は第3図のIV−IV線断面
図、第5図は従来の半導体製造装置の断面側面図である
。 図において、1は反応室、22は紫外光源、4は反応ガ
ス、5は基板、11はレーザ光発振装置、12はレーザ
光ビーム、13は反応ガス供給ノズル、14は反応ガス
排出ノズル、2oはテーブル移動機構である。 なお図中同一符号は同−又は相当部分を示す。
FIG. 1 is a cross-sectional front view of a semiconductor manufacturing apparatus according to an embodiment of the first invention of the present application, and FIG. 2 is a cross-sectional view taken along the line ■-■ in FIG.
FIG. 3 is a cross-sectional front view of a semiconductor manufacturing apparatus according to an embodiment of the second invention of the present application, FIG. 4 is a cross-sectional view taken along the line IV-IV in FIG. 3, and FIG. 5 is a cross-sectional side view of a conventional semiconductor manufacturing apparatus. It is a diagram. In the figure, 1 is a reaction chamber, 22 is an ultraviolet light source, 4 is a reaction gas, 5 is a substrate, 11 is a laser beam oscillation device, 12 is a laser beam beam, 13 is a reaction gas supply nozzle, 14 is a reaction gas discharge nozzle, 2o is the table moving mechanism. Note that the same reference numerals in the figures indicate the same or equivalent parts.

Claims (2)

【特許請求の範囲】[Claims] (1)反応室内の反応ガス中に置かれた基板上に光化学
的に該反応ガスを分解して薄膜を形成させる半導体製造
装置において、上記基板に該基板表面を活性化するため
の紫外線を出力照射する紫外光源と、上記反応ガスにこ
れに光化学反応を生じさせるためのレーザ光を出力照射
するレーザ発振装置とを備えたことを特徴とする半導体
製造装置。
(1) In semiconductor manufacturing equipment that photochemically decomposes the reactive gas to form a thin film on a substrate placed in a reactive gas in a reaction chamber, ultraviolet rays are output to the substrate to activate the substrate surface. 1. A semiconductor manufacturing apparatus comprising: an ultraviolet light source for irradiating the reaction gas; and a laser oscillation device for outputting laser light for causing a photochemical reaction in the reaction gas.
(2)反応室内の反応ガス中に置かれた基板上に光化学
的に該反応ガスを分解して薄膜を形成させる半導体製造
装置において、上記基板に該基板表面を活性化するため
の紫外線を出力照射する紫外光源と、上記反応ガスにこ
れに光化学反応を生じさせるためのレーザ光を出力照射
するレーザ発振装置と、上記レーザビームの方向と直角
方向に上記基板を水平移動させるテーブル移動機構と、
上記基板上に投射される上記レーザビームを挟むよう対
向して設けられ該レーザビームと直角な方向に上記反応
ガスを流すための反応ガス供給ノズル及び排出ノズルと
を備えたことを特徴とする半導体製造装置。
(2) In semiconductor manufacturing equipment that photochemically decomposes the reactive gas to form a thin film on a substrate placed in a reactive gas in a reaction chamber, ultraviolet rays are output to the substrate to activate the substrate surface. an ultraviolet light source for irradiation, a laser oscillation device for outputting irradiation with a laser beam for causing a photochemical reaction in the reaction gas, and a table moving mechanism for horizontally moving the substrate in a direction perpendicular to the direction of the laser beam;
A semiconductor characterized by comprising a reaction gas supply nozzle and a discharge nozzle, which are provided opposite to each other so as to sandwich the laser beam projected onto the substrate, and for flowing the reaction gas in a direction perpendicular to the laser beam. Manufacturing equipment.
JP23075184A 1984-11-01 1984-11-01 Semiconductor manufacturing equipment Pending JPS61108130A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP23075184A JPS61108130A (en) 1984-11-01 1984-11-01 Semiconductor manufacturing equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP23075184A JPS61108130A (en) 1984-11-01 1984-11-01 Semiconductor manufacturing equipment

Publications (1)

Publication Number Publication Date
JPS61108130A true JPS61108130A (en) 1986-05-26

Family

ID=16912708

Family Applications (1)

Application Number Title Priority Date Filing Date
JP23075184A Pending JPS61108130A (en) 1984-11-01 1984-11-01 Semiconductor manufacturing equipment

Country Status (1)

Country Link
JP (1) JPS61108130A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62186537A (en) * 1986-02-12 1987-08-14 Tokyo Electron Ltd Optical cvd apparatus

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58204525A (en) * 1982-05-24 1983-11-29 Nippon Telegr & Teleph Corp <Ntt> Photochemical device for gaseous phase growth
JPS58212127A (en) * 1982-06-03 1983-12-09 Hitachi Ltd Manufacture of silicon thin film semiconductor device

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58204525A (en) * 1982-05-24 1983-11-29 Nippon Telegr & Teleph Corp <Ntt> Photochemical device for gaseous phase growth
JPS58212127A (en) * 1982-06-03 1983-12-09 Hitachi Ltd Manufacture of silicon thin film semiconductor device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62186537A (en) * 1986-02-12 1987-08-14 Tokyo Electron Ltd Optical cvd apparatus

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