JPS60262067A - 容量測定方法 - Google Patents
容量測定方法Info
- Publication number
- JPS60262067A JPS60262067A JP60118680A JP11868085A JPS60262067A JP S60262067 A JPS60262067 A JP S60262067A JP 60118680 A JP60118680 A JP 60118680A JP 11868085 A JP11868085 A JP 11868085A JP S60262067 A JPS60262067 A JP S60262067A
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- measurement
- measuring
- capacitance
- signal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000000034 method Methods 0.000 title claims description 26
- 238000005259 measurement Methods 0.000 claims description 34
- 239000003990 capacitor Substances 0.000 claims description 11
- 238000000691 measurement method Methods 0.000 claims description 10
- 230000000694 effects Effects 0.000 claims description 5
- 230000002452 interceptive effect Effects 0.000 claims 1
- 239000004575 stone Substances 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 3
- 230000011514 reflex Effects 0.000 description 2
- 238000013459 approach Methods 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000001276 controlling effect Effects 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000001208 nuclear magnetic resonance pulse sequence Methods 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2605—Measuring capacitance
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
- Transmission And Conversion Of Sensor Element Output (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FI842193A FI69932C (fi) | 1984-05-31 | 1984-05-31 | Maetningsfoerfarande foer kapacitanser speciellt foer smao kapacitanser vid vilker man anvaender tvao referenser |
| FI842193 | 1984-05-31 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS60262067A true JPS60262067A (ja) | 1985-12-25 |
Family
ID=8519172
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP60118680A Pending JPS60262067A (ja) | 1984-05-31 | 1985-05-31 | 容量測定方法 |
Country Status (10)
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102096057A (zh) * | 2010-11-16 | 2011-06-15 | 北京航天测控技术开发公司 | 一种电容测量电路的校准方法及装置 |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FI74549C (fi) * | 1986-02-13 | 1988-02-08 | Vaisala Oy | Maetningsfoerfarande foer impedanser, saerskilt smao kapacitanser. |
| DE19524387C1 (de) * | 1995-07-04 | 1996-11-07 | Siemens Ag | Schaltungsanordnung und Verfahren zum Messen eines Kapazitätsunterschiedes zwischen einer ersten Kapazität C1 und einer zweiten Kapazität C2 |
Family Cites Families (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE970798C (de) * | 1953-05-16 | 1958-10-30 | Rolf Scheunert Dr Ing | Anordnung zur Messung von vorzugsweise sehr kleinen Kapazitaeten bzw. Kapazitaetsaenderungen |
| DE1026860B (de) * | 1956-05-24 | 1958-03-27 | Die Bundesrepublik Deutschland | Schwebungskompensator |
| US3480857A (en) * | 1967-12-27 | 1969-11-25 | Ibm | Digital method and apparatus for measuring small inductances and capacitances |
| DE2508033A1 (de) * | 1975-02-25 | 1976-09-02 | Zinn Erich | Kapazitaets- und verlustfaktormesseinrichtung mit selbsttaetiger abgleichung |
| US4041382A (en) * | 1976-08-16 | 1977-08-09 | The Sippican Corporation | Calibrating a measurement system including bridge circuit |
| GB2006970B (en) * | 1977-09-23 | 1982-03-31 | Testut Aequitas | Capacitance measuring device |
| FI57319C (fi) * | 1977-10-14 | 1980-07-10 | Vaisala Oy | Foerfarande foer maetning av smao kapacitanser |
| FI54664C (fi) * | 1977-10-14 | 1979-01-10 | Vaisala Oy | Elektronisk omkopplingstroemstaellare i synnerhet foer telemeteranvaendning i sonder |
| US4130796A (en) * | 1977-12-07 | 1978-12-19 | Westinghouse Electric Corp. | Calibrating and measuring circuit for a capacitive probe-type instrument |
| AU530552B2 (en) * | 1978-04-07 | 1983-07-21 | Minister of Public Works of Nsw | Wave level measuring apparatus |
| JPS5528157A (en) * | 1978-08-19 | 1980-02-28 | Fuji Electric Co Ltd | Displacement converter |
| US4295091B1 (en) * | 1978-10-12 | 1995-08-15 | Vaisala Oy | Circuit for measuring low capacitances |
| FR2446037A1 (fr) * | 1979-01-03 | 1980-08-01 | Vaisala Oy | Procede d'emission de signaux pour une radiosonde |
| DE2901516C2 (de) * | 1979-01-16 | 1985-01-24 | VEGA Grieshaber GmbH & Co, 7620 Wolfach | Anordnung zur Erzeugung eines einer Kapazität proportionalen Signals |
| US4322977A (en) * | 1980-05-27 | 1982-04-06 | The Bendix Corporation | Pressure measuring system |
| SE436936B (sv) * | 1981-01-29 | 1985-01-28 | Asea Ab | Integrerad kapacitiv givare |
| US4398426A (en) * | 1981-07-02 | 1983-08-16 | Kavlico Corporation | Linear capacitive pressure transducer system |
| DE3321580A1 (de) * | 1983-06-15 | 1984-12-20 | Philips Patentverwaltung Gmbh, 2000 Hamburg | Einrichtung zur erfassung der temperatur fuer die kompensation temperaturabhaengiger fehler in einem kapazitiven differenzdrucksensor |
-
1984
- 1984-05-31 FI FI842193A patent/FI69932C/fi not_active IP Right Cessation
-
1985
- 1985-05-21 ZA ZA853855A patent/ZA853855B/xx unknown
- 1985-05-22 AU AU42749/85A patent/AU587578B2/en not_active Ceased
- 1985-05-30 BR BR8502572A patent/BR8502572A/pt not_active IP Right Cessation
- 1985-05-30 IT IT20967/85A patent/IT1200492B/it active
- 1985-05-30 DE DE19853519390 patent/DE3519390A1/de active Granted
- 1985-05-30 CA CA000482808A patent/CA1262372A/en not_active Expired
- 1985-05-31 GB GB08513830A patent/GB2159965B/en not_active Expired
- 1985-05-31 JP JP60118680A patent/JPS60262067A/ja active Pending
- 1985-05-31 FR FR8508231A patent/FR2565353B1/fr not_active Expired
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102096057A (zh) * | 2010-11-16 | 2011-06-15 | 北京航天测控技术开发公司 | 一种电容测量电路的校准方法及装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| ZA853855B (en) | 1986-03-26 |
| GB2159965B (en) | 1988-06-29 |
| DE3519390A1 (de) | 1985-12-12 |
| FI69932B (fi) | 1985-12-31 |
| FI69932C (fi) | 1986-05-26 |
| DE3519390C2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1990-10-25 |
| FR2565353A1 (fr) | 1985-12-06 |
| FR2565353B1 (fr) | 1986-12-26 |
| FI842193A0 (fi) | 1984-05-31 |
| AU587578B2 (en) | 1989-08-24 |
| GB2159965A (en) | 1985-12-11 |
| GB8513830D0 (en) | 1985-07-03 |
| CA1262372A (en) | 1989-10-17 |
| IT1200492B (it) | 1989-01-18 |
| BR8502572A (pt) | 1986-02-04 |
| AU4274985A (en) | 1985-12-05 |
| IT8520967A0 (it) | 1985-05-30 |
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