JPS60258727A - Magnetic storage medium - Google Patents

Magnetic storage medium

Info

Publication number
JPS60258727A
JPS60258727A JP11466184A JP11466184A JPS60258727A JP S60258727 A JPS60258727 A JP S60258727A JP 11466184 A JP11466184 A JP 11466184A JP 11466184 A JP11466184 A JP 11466184A JP S60258727 A JPS60258727 A JP S60258727A
Authority
JP
Japan
Prior art keywords
film
protective film
hydrocarbon
magnetic
magnetic storage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11466184A
Other languages
Japanese (ja)
Inventor
Toshihiro Ando
敏弘 安東
Toru Nagaoka
徹 長岡
Shuichi Hirai
修一 平井
Hiroshi Takeno
博 竹野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Denka Co Ltd
Original Assignee
Denki Kagaku Kogyo KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Denki Kagaku Kogyo KK filed Critical Denki Kagaku Kogyo KK
Priority to JP11466184A priority Critical patent/JPS60258727A/en
Publication of JPS60258727A publication Critical patent/JPS60258727A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To prevent wear and head stick by forming a thin plasma-polymerized film of hydrocarbon onto a thin film consisting of a non-magnetic metal, the oxide, carbide and nitride of an inorg. compd. and carbon thereby forming two- layered protective films. CONSTITUTION:The 1st protective film 3 consisting of at least one kind selected from the non-magnetic metal such as Rh, the oxide such as SiO2, the carbon such as graphite, the carbide such as SiC and the nitride such as CrN and the 2nd protective film 4 formed by the plasma polymn. of the hydrocarbon are formed on a thin ferromagnetic metallic film 2 on a non-magnetic base material. The hydrocarbon (e.g.: C2H2, C4H10, etc.) is fed as it is into a reactor 8 or is fed therein after the hydrocarbon is gasified to form the gaseous raw material. The inside of the reactor is evacuated to 0.001-10Torr and, for example, 200- 2,000V DC voltage is impressed between electrodes 6 and 7 to generate plasma. The plasma polymn. is thus effected on a magnetic storage medium 5 installed on the electrode 6.

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は磁気記憶媒体、特に録画用、録音用あるいは電
算機用磁気ドラムあるいは磁気ディスク等に好ましく用
いられる磁気記憶媒体表面に保護膜を形成させた磁気記
憶媒体に関するものである。
Detailed Description of the Invention (Field of Industrial Application) The present invention relates to the formation of a protective film on the surface of a magnetic storage medium, which is preferably used for magnetic recording, audio recording, or computer magnetic drums or magnetic disks. The invention relates to magnetic storage media.

(従来技術) 近年、記録密度の向上の目的のために鉄(Fe)、コバ
ルト(CO)、ニッケル(Ni)又はこれらの合金から
なる強磁性金属薄膜を真空蒸着、スパッタリングまたは
メッキなどの方法で基体上に形成させた磁気記憶媒体が
知られている。しかしこれらの方法で作成された薄膜型
の全縮磁気記憶媒体は高密度記録性に優れているが、記
録再生装置に使用する場合、磁気ヘラr等と物理的に接
触し高速度で走行をするので、耐摩耗性に優れているこ
とが要求され、そのために強磁性金属薄膜の表面に保護
膜を形成する方法がいろいろ提案されている。例えば、
(1)基体上の磁性層の表面にRh1Cr1Ni−Pな
どの非磁性金属、5in2、Al2O3,0r203、
TiO2、ZrO2などの酸化物、Sin、XWC,N
bO。
(Prior art) In recent years, ferromagnetic metal thin films made of iron (Fe), cobalt (CO), nickel (Ni), or alloys thereof have been developed using methods such as vacuum evaporation, sputtering, or plating to improve recording density. Magnetic storage media formed on a substrate are known. However, although the thin-film fully-shrinkable magnetic storage media created by these methods have excellent high-density recording properties, when used in recording and reproducing devices, they must physically come into contact with magnetic spatulas, etc., and run at high speeds. Therefore, it is required to have excellent wear resistance, and for this purpose various methods have been proposed for forming a protective film on the surface of a ferromagnetic metal thin film. for example,
(1) Non-magnetic metal such as Rh1Cr1Ni-P, 5in2, Al2O3, 0r203,
Oxides such as TiO2, ZrO2, Sin, XWC, N
bO.

B4Cなどの炭化物及びOrN 、、 TiN 、 N
bN XZrNなどの窒化物から選ばれた少くとも1種
をメッキ法、スパッタリング法、CVD法などによって
薄膜を形成させる方法、 (特開昭50−104602号公報、特開昭50−16
7701号公報、特開昭56−146206号公報)、 (2)前記保護膜上にワックスなどの潤滑剤を塗布する
方法があげられる。
Carbides such as B4C and OrN, TiN, N
bN A method of forming a thin film of at least one selected from nitrides such as XZrN by a plating method, a sputtering method, a CVD method, etc. (JP-A-50-104602, JP-A-50-16
(2) A method of applying a lubricant such as wax on the protective film is mentioned.

(本発明が解決しようとする問題点) (1)の方法による保護膜はいずれも硬質であるが、摩
擦係数が大きく、保護膜又は磁気ヘッドのいずれかが損
耗しやすく、(2)の方法は潤滑剤と磁気ヘッドとが固
着するいわゆる、ヘラげステイクなどの問題が生じやす
い欠点がある。
(Problems to be Solved by the Present Invention) Although the protective films obtained by the method (1) are all hard, they have a large coefficient of friction and either the protective film or the magnetic head is easily worn out, and the method (2) This method has the drawback that problems such as so-called "slip staking" in which the lubricant and the magnetic head stick together tend to occur.

(問題点を解決するための手段) 本発明は非磁性基体上の強磁性金属薄膜に保護膜を形成
させた磁気記憶媒体において、その保護膜が非磁性金属
、無機化合物の酸化物、炭化物、及び窒化物、炭素類か
らなる薄膜とその上に炭化水素のプラズマ重合薄膜とを
形成させ二層のものとすることにより、従来の問題点を
解決したものである。
(Means for Solving the Problems) The present invention provides a magnetic storage medium in which a protective film is formed on a ferromagnetic metal thin film on a non-magnetic substrate, in which the protective film is made of a non-magnetic metal, an oxide or carbide of an inorganic compound, The conventional problems have been solved by forming a thin film of nitrides and carbons and a plasma-polymerized thin film of hydrocarbon thereon to form a two-layer structure.

すなわ鳥、本発明は、非磁性基体上の強磁性金属薄膜に
保護膜を形成させた磁気記憶媒体において、その保護膜
がRk、、0rXNi−Pなどの非磁性金属、5in2
、A1□Or5、Cr2o5、T10□、ZrO2など
の酸化、物、グラファイト、タイヤモンげ状炭素などの
炭素類、810 XWe 、 TiC,NbO、B、O
などの炭化物及びOrN XTiN 、 NbN XZ
rNなどの窒化物から選ばれた少くとも1種の薄膜(以
下第1保護膜という)とその上に炭化水素のデラアマ重
合薄膜(以下第2保護膜という)を形成させたものから
なることを特徴とする磁気記憶媒体である。
In other words, the present invention provides a magnetic storage medium in which a protective film is formed on a ferromagnetic metal thin film on a nonmagnetic substrate, in which the protective film is made of a nonmagnetic metal such as Rk, 0rXNi-P, 5in2
, A1□Or5, Cr2o5, T10□, ZrO2 and other oxidations, substances, graphite, carbons such as tire-like carbon, 810 XWe, TiC, NbO, B, O
Carbides such as OrN XTiN, NbN XZ
It consists of at least one kind of thin film selected from nitrides such as rN (hereinafter referred to as the first protective film) and a delaminate polymeric thin film of hydrocarbon (hereinafter referred to as the second protective film) formed thereon. This is a magnetic storage medium with special characteristics.

次に本発明の磁気記憶媒体の製法について説明する。本
発明の磁気記憶媒体は第1図に示すように基体1、磁性
@2、第1保護膜3、および第2保護膜4からなってい
る。
Next, a method for manufacturing the magnetic storage medium of the present invention will be explained. As shown in FIG. 1, the magnetic storage medium of the present invention comprises a base 1, a magnetic field 2, a first protective film 3, and a second protective film 4.

本発明に用いられる基体としては無機物質及び有機物質
いずれのものであってもよいが非磁性のものであること
が必要である。
The substrate used in the present invention may be either inorganic or organic, but must be non-magnetic.

無機物質の具体例としてはアルミニウム、アルミニウム
合金、銅、シリコンなどの非磁性金属又は合金、ガラス
、Al2O3,5102などのセラミックス、ABS樹
脂、ポリカーざネート樹脂、ポリイミケ樹脂、?リエス
テル樹脂などの合成樹脂があげられる。
Specific examples of inorganic substances include aluminum, aluminum alloys, copper, non-magnetic metals or alloys such as silicon, glass, ceramics such as Al2O3, 5102, ABS resin, polycarbonate resin, polyimike resin, etc. Examples include synthetic resins such as lyester resins.

これらの基体の形状、大きさ等は目的とするものによっ
て異なるが、面精度のすぐれたものが好ましい。
The shape, size, etc. of these substrates vary depending on the intended purpose, but those with excellent surface precision are preferred.

次に、強磁性金属薄膜を基材上に常法により被覆するが
、その強磁性金属の具体例としNi−Co −P。
Next, a ferromagnetic metal thin film is coated on the base material by a conventional method, and a specific example of the ferromagnetic metal is Ni-Co-P.

Co−P 、Co−Wなどがあげられる。その被覆方法
としては電解メッキ法又は無電解メッキ法等が用いられ
る。これらの条件は特に制限はなく、その厚さを0.1
μm程度とする。
Examples include Co-P and Co-W. As a coating method, an electrolytic plating method, an electroless plating method, or the like is used. These conditions are not particularly limited, and the thickness is 0.1
It is about μm.

次に、強磁性金属薄膜の表面に直接、あるいはエツチン
グ処理等を行った後、前記した第1保護膜を形成する無
機物質をメッキ法、スパッタリング法、真空蒸着(含C
VD )法等の適当な手段を用いて均一に被覆すれば第
1保護膜が形成される。
Next, after directly or etching the surface of the ferromagnetic metal thin film, the inorganic material forming the first protective film described above is applied by plating, sputtering, or vacuum deposition (including carbon dioxide).
A first protective film is formed by uniformly coating the film using an appropriate method such as VD) method.

これらの第1保獲膜の形成方法の中でスパッタリング法
により形成された膜は密着性、安定性、均一性、および
作業性などの点で他の方法よりすぐれているので好まし
い。しかし、これらに限られるものではなく、メッキ法
、真空蒸着法等によっても本発明の目的が達成すること
ができる。
Among these methods for forming the first retention film, a film formed by sputtering is preferred because it is superior to other methods in terms of adhesion, stability, uniformity, and workability. However, the present invention is not limited to these methods, and the object of the present invention can also be achieved by a plating method, a vacuum evaporation method, or the like.

次いでその第1保護膜の表面に炭化水素の重合膜をゾラ
デマ重合装置により形成させて第2保護膜とする。本発
明に用いられる炭化水素の具体例としてはC2H2、C
2H,、C2H6、CH4、C4H0゜などがあげられ
る。これらをそのまま又はガス化して原料ガスとするが
、さらにこれらにArXWe、Ne、H2などの炭化水
素ガス以外のガスを併用することができる。
Next, a hydrocarbon polymerized film is formed on the surface of the first protective film using a Zoladema polymerization apparatus to form a second protective film. Specific examples of hydrocarbons used in the present invention include C2H2, C2H2,
Examples include 2H,, C2H6, CH4, and C4H0°. These are used as raw material gases as they are or by gasification, but gases other than hydrocarbon gases such as ArXWe, Ne, and H2 can be used in combination with these gases.

12171合装置の操作条件は、反応器内の圧力を[)
、001〜10トールとし電極間に200〜2000V
の直流あるいは交流の電圧、又は200〜2000vの
1Q Q KHz 〜20 MHzの高周波電圧を印加
すればよい。第2保護膜の炭化水素のプラズマ重合膜は
従来の炭素膜とは構造が異なり0/Hのモル比で水素が
10〜50モル係程度存在し、かつC=C結合はほとん
ど存在しないものである。この炭化水素のプラズマ重合
膜はその構造中に存在するO−H結合により摩擦係数が
極めて小さく、−・、ットステイク現象を全く生ずるこ
とはない。又これは、第1保護膜に完全に密着している
The operating conditions for the 12171 reactor are as follows:
, 001 to 10 torr and 200 to 2000 V between the electrodes.
A DC or AC voltage of 200 to 2000 V and a high frequency voltage of 1Q KHz to 20 MHz may be applied. The hydrocarbon plasma polymerized film, which is the second protective film, has a different structure from the conventional carbon film, in that hydrogen exists in a 0/H molar ratio of about 10 to 50 moles, and there are almost no C=C bonds. be. This plasma-polymerized hydrocarbon film has an extremely small coefficient of friction due to O--H bonds existing in its structure, and does not cause any stick-stake phenomenon. Moreover, it is in complete contact with the first protective film.

このようにして磁気記憶媒体上に破着された二層の保護
膜は強磁性金属薄膜に密着しており、又これらの保護膜
は非常に硬く、かつ非常に小さな摩擦係数を持つもので
あるので、磁気記憶媒体の保護膜として特に優れている
The two-layer protective film that has been broken onto the magnetic storage medium in this way is in close contact with the ferromagnetic metal thin film, and these protective films are extremely hard and have a very small coefficient of friction. Therefore, it is particularly excellent as a protective film for magnetic storage media.

/I(発明の二層からなる保護膜合計の厚みとしては、
2000X以下、好ましくは1000A以下である。こ
れ以上の厚みになるとスペーシングロスが太き(なるの
で好ましくない。
/I (The total thickness of the protective film consisting of two layers of the invention is:
It is 2000X or less, preferably 1000A or less. If it becomes thicker than this, the spacing loss will increase (which is not preferable).

また、本発明において第2保護膜の炭化水素のプラズマ
重合膜は市販のプラズマ重合装置を用いて作製すること
ができる。しかしスパッタリングまたは蒸着などと同一
容器内で順次処理することも可能である。
Further, in the present invention, the hydrocarbon plasma polymerized film of the second protective film can be produced using a commercially available plasma polymerization apparatus. However, it is also possible to carry out sequential processing in the same container as sputtering or vapor deposition.

l 第2図はプラズマ重合装置の説明図である。反′)
 応答器8は反応容器台9の上に気密が保持されるよう
に構成したもので、反応容器台9にはガス供給口10及
び排気ポンプに接続された排気管11が設けられている
。本装置にを用いて磁気記憶媒体を作製するには反応容
器8内には電極6.7によってプラズマを発生させ、一
方前記電極6上に設置した第2薄膜が被着される磁気記
憶媒体5には電極6と同じ電位を印加して、この磁気記
憶媒体上でプラズマ重合すればよい。
l Figure 2 is an explanatory diagram of a plasma polymerization apparatus. anti′)
The responder 8 is constructed so as to be kept airtight on a reaction container stand 9, and the reaction container stand 9 is provided with a gas supply port 10 and an exhaust pipe 11 connected to an exhaust pump. To produce a magnetic storage medium using this apparatus, a plasma is generated in the reaction vessel 8 by an electrode 6, and a second thin film placed on the electrode 6 is deposited on the magnetic storage medium 5. The same potential as that of the electrode 6 may be applied to perform plasma polymerization on this magnetic storage medium.

実施例1 メッキディスクの製造 直径9cm、厚み2mmの鏡面研摩したアルミ板上に非
磁性N1−Pを50μm厚に無電解メッキした後、30
μm厚まで鏡面研摩し、更にその上に第1表に示すメッ
キ液を用い、メッキ条件pF(7,5、dtliN75
°CでCo−Ni −P (Co : 8Q係、Ni 
: 15係、P:5%)の磁性膜を0.1μm厚となる
ように無電解メッキ(以下メッキディスクAという)し
た。 ゛無電解メッキの前処理としては日本カニゼン(
株)のシューマセンシタイザー及びシューマアクチベー
ターを使用した。
Example 1 Production of a plated disk After electroless plating of non-magnetic N1-P to a thickness of 50 μm on a mirror-polished aluminum plate with a diameter of 9 cm and a thickness of 2 mm,
Mirror-polished to a thickness of μm, and then using the plating solution shown in Table 1, plating conditions pF (7,5, dtliN75
Co-Ni-P (Co: 8Q, Ni
: 15, P: 5%) was electrolessly plated (hereinafter referred to as plated disk A) to a thickness of 0.1 μm.゛Nippon Kanigen (
Schumer sensitizer and Schumer activator manufactured by Co., Ltd. were used.

第 1 表 単位9/l (株)徳田製作所製のスパッタリング装置(商品名「C
FS−8F8S」)を用い、まりl−”z”/)とし、
では日立化成@)の高密度カー♂゛/(商品名「Hap
 −18J )を用い、Arがス雰囲気下でスパッタリ
ングを行ない、メッキディスクA上に炭素膜の厚さを2
00X、400X、5OoXのものを作製した。
Table 1 Unit: 9/l Sputtering equipment manufactured by Tokuda Seisakusho Co., Ltd. (product name "C")
FS-8F8S"), and Mari l-"z"/),
Now, Hitachi Chemical @)'s high-density car♂゛/(product name:
-18J), sputtering was performed in an Ar gas atmosphere to form a carbon film with a thickness of 2 on the plating disk A.
00X, 400X, and 500X were produced.

第2図に示すプラズマ重合装置を用いて、炭素膜の厚み
を変えたディスクA上に、第2表に示す条件でプラズマ
重合膜を形成した。
Using the plasma polymerization apparatus shown in FIG. 2, plasma polymerized films were formed on disks A with different thicknesses of carbon films under the conditions shown in Table 2.

第6表にその評価結果を示す。なお比較のために炭素膜
のみ形成させたものの結果も実験/169 。
Table 6 shows the evaluation results. For comparison, the results of forming only a carbon film are also shown in Experiment/169.

10.11に示した。10.11.

第 6 表 実施例2 (株)徳田製作所製スパッタリング装置商品名[OFS
 −3KSJを用い、ターデッドとしてはそれぞれOr
 、5in2、TiN 、 SiCを用いガス圧7×1
0−3トールアルゴンがス豚囲気下、1KWの高周波電
力を供給しスパッタリングを行い実施例1で作製したメ
ッキディスクへの上に、それぞれOr 、 5i02、
TiN 、 SiOを厚さ400Aのものを形成させ第
1保護膜とした。
Table 6 Example 2 Sputtering equipment manufactured by Tokuda Seisakusho Co., Ltd. Product name [OFS
-3KSJ is used, and as tarded, Or
, 5in2, TiN, SiC gas pressure 7×1
Sputtering was performed by supplying high-frequency power of 1 KW under an atmosphere of 0-3 tall argon, and on top of the plated disk prepared in Example 1, Or, 5i02,
A first protective film was formed from TiN and SiO to a thickness of 400 Å.

次いで、これらに第2図に示すプラズマ重合装置を用い
て炭化水素のプラズマ重合膜を形成させ第2保護膜とし
た。
Next, a hydrocarbon plasma polymerized film was formed on these using the plasma polymerization apparatus shown in FIG. 2 to form a second protective film.

これらの条件及び物性等の測定結果を第4表及び第5表
に示す。
Tables 4 and 5 show these conditions and measurement results of physical properties, etc.

なお実験/1616.17.18,19.及び20は比
較例を示すもので、実験AI6は第1保護膜を被覆せず
第2保護膜を形成した場合、実験應17〜20は第1保
護膜のみを形成した場合のものである。
Experiment/1616.17.18, 19. and 20 show comparative examples, in which experiment AI6 was the case where the second protective film was formed without covering the first protective film, and experiments 17 to 20 were the cases where only the first protective film was formed.

実施例の物性測定は次の方法によった。The physical properties of the examples were measured by the following method.

(1)ass(コンタクト・スタート・ストップ)テス
ト 固定ディスクドライブ装置を用いて、ヘッドクラッシュ
が発生するまでのサイクル数を測定した。
(1) ASS (Contact Start Stop) Test Using a fixed disk drive device, the number of cycles until a head crash occurred was measured.

ヘッド : IBM−3350タイプ (Mn −Zn製) ヘッド荷重: 9.5.9 回転速度: 3600r、p、m ON −OFF 3 Q秒すイクル (2)動摩擦係数測定 第6図に示す回転装置を用いて測定した。Head: IBM-3350 type (Made of Mn-Zn) Head load: 9.5.9 Rotation speed: 3600r, p, m ON - OFF 3 Q seconds cycle (2) Dynamic friction coefficient measurement The measurement was performed using a rotating device shown in FIG.

ヘッド 二 よりM−3350タイプ (Mn −Zn製) ヘッド荷重: 9.5 g 相対速度:43cfn/5ec (発明の効果) 本発明品の効果を要約すると次のとおりである。Head 2 M-3350 type (Made of Mn-Zn) Head load: 9.5g Relative speed: 43cfn/5ec (Effect of the invention) The effects of the product of the present invention are summarized as follows.

(1)摩擦係数が極めて小さいこと。(1) The coefficient of friction is extremely small.

(2)へツースティック現象が生じないこと。(2) No two-stick phenomenon occurs.

(3)保hFI膜の密着性がよく、繰り返し使用が可能
である。
(3) The hFI membrane has good adhesion and can be used repeatedly.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の実施例の断面図、第2図は本発明の実
施例に用いるプラズマ重合装置の説明図、第3図は本発
明品の評価に用いられる動摩擦係数測定装置の説明図で
ある。 符号 1・・・基体 2・・・磁性層 3・・第1保護膜 4・・・第2保膿膜5・・・メッキ
ディスクA 6・・電極7・・・電極 8・・・反応容
器 9・・・反応容器台 10・・・ガス供給口11・・排
気管 12・・・磁気記憶媒体13・・ホールダ−14
・・・ヘッド 15・・・板バネ 16・・・歪デージ17・・・XY
ステージ 18・・・モーター19・・・架台 20・
・・アンプ及びレコーダー 特許出願人 電気化学工業株式会社
Figure 1 is a cross-sectional view of an example of the present invention, Figure 2 is an explanatory diagram of a plasma polymerization apparatus used in an example of the present invention, and Figure 3 is an explanatory diagram of a dynamic friction coefficient measuring apparatus used for evaluation of products of the present invention. It is. Reference numeral 1...Substrate 2...Magnetic layer 3...First protective film 4...Second retentive film 5...Plating disk A 6...Electrode 7...Electrode 8...Reaction vessel 9... Reaction container stand 10... Gas supply port 11... Exhaust pipe 12... Magnetic storage medium 13... Holder 14
... Head 15 ... Leaf spring 16 ... Distortion degree 17 ... XY
Stage 18... Motor 19... Frame 20.
...Amplifier and recorder patent applicant Denki Kagaku Kogyo Co., Ltd.

Claims (1)

【特許請求の範囲】 非磁性基体上の強磁性金属薄膜に保護膜を形成させた磁
気記憶媒体において、その保護膜がRh。 Or、N1−Pなどの非磁性金属、S10□、Al2O
,,0r203、TlO2、ZrO2などの酸化物、グ
ラファイト、ダイヤモンド状炭素などの炭素類、SiC
!。 WC! 、 Tie、 N1)OXB、C!などの炭化
物及びCrN 。 TiN 、 NbN XZrNなどの窒化物から選ばれ
た少くとも1種の薄膜とその上に炭化水素のプラズマ重
合薄膜を形成させたものからなることを特徴とする磁気
記憶媒体。
[Claims] In a magnetic storage medium in which a protective film is formed on a ferromagnetic metal thin film on a nonmagnetic substrate, the protective film is Rh. Non-magnetic metals such as Or, N1-P, S10□, Al2O
,,0r203, oxides such as TlO2, ZrO2, graphite, carbons such as diamond-like carbon, SiC
! . WC! , Tie, N1) OXB, C! Carbides such as and CrN. A magnetic storage medium comprising at least one thin film selected from nitrides such as TiN, NbN, XZrN, etc., and a plasma polymerized thin film of hydrocarbon formed thereon.
JP11466184A 1984-06-06 1984-06-06 Magnetic storage medium Pending JPS60258727A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11466184A JPS60258727A (en) 1984-06-06 1984-06-06 Magnetic storage medium

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11466184A JPS60258727A (en) 1984-06-06 1984-06-06 Magnetic storage medium

Publications (1)

Publication Number Publication Date
JPS60258727A true JPS60258727A (en) 1985-12-20

Family

ID=14643401

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11466184A Pending JPS60258727A (en) 1984-06-06 1984-06-06 Magnetic storage medium

Country Status (1)

Country Link
JP (1) JPS60258727A (en)

Cited By (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6326817A (en) * 1986-07-18 1988-02-04 Matsushita Electric Ind Co Ltd Magnetic recording medium
US4748073A (en) * 1985-06-29 1988-05-31 Kabushiki Kaisha Toshiba Perpendicular magnetic recording medium with multilayered protective layer
JPS647317A (en) * 1986-05-09 1989-01-11 Tdk Corp Magnetic recording medium
US4816334A (en) * 1986-04-04 1989-03-28 Tdk Corporation Magnetic recording medium
US4820584A (en) * 1986-06-12 1989-04-11 Kabushiki Kaisha Toshiba Magnetic recording medium and method of manufacturing the same
US4833031A (en) * 1986-03-20 1989-05-23 Matsushita Electric Industrial Co., Ltd. Magnetic recording medium
US4839244A (en) * 1987-04-24 1989-06-13 Nec Corporation Magnetic recording medium with protective layer using graphite fluoride and method of producing same
US4840843A (en) * 1986-10-17 1989-06-20 Fuji Photo Film Co., Ltd. Magnetic recording medium
JPH01211221A (en) * 1988-02-18 1989-08-24 Hitachi Ltd Magnetic recording medium
US4880687A (en) * 1986-05-09 1989-11-14 Tdk Corporation Magnetic recording medium
US4889767A (en) * 1986-04-23 1989-12-26 Tdk Corporation Magnetic recording medium
US4898774A (en) * 1986-04-03 1990-02-06 Komag, Inc. Corrosion and wear resistant magnetic disk
US4929500A (en) * 1986-04-03 1990-05-29 Komag, Inc. Corrosion resistant magnetic disk
US4994321A (en) * 1986-01-24 1991-02-19 Fuji Photo Film Co., Ltd. Perpendicular magnetic recording medium and the method for preparing the same

Cited By (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4748073A (en) * 1985-06-29 1988-05-31 Kabushiki Kaisha Toshiba Perpendicular magnetic recording medium with multilayered protective layer
US4994321A (en) * 1986-01-24 1991-02-19 Fuji Photo Film Co., Ltd. Perpendicular magnetic recording medium and the method for preparing the same
US4833031A (en) * 1986-03-20 1989-05-23 Matsushita Electric Industrial Co., Ltd. Magnetic recording medium
US4929500A (en) * 1986-04-03 1990-05-29 Komag, Inc. Corrosion resistant magnetic disk
US4898774A (en) * 1986-04-03 1990-02-06 Komag, Inc. Corrosion and wear resistant magnetic disk
US4816334A (en) * 1986-04-04 1989-03-28 Tdk Corporation Magnetic recording medium
US4889767A (en) * 1986-04-23 1989-12-26 Tdk Corporation Magnetic recording medium
US4880687A (en) * 1986-05-09 1989-11-14 Tdk Corporation Magnetic recording medium
JPS647317A (en) * 1986-05-09 1989-01-11 Tdk Corp Magnetic recording medium
US5069967A (en) * 1986-05-09 1991-12-03 Tdk Corporation Magnetic recording medium
US4820584A (en) * 1986-06-12 1989-04-11 Kabushiki Kaisha Toshiba Magnetic recording medium and method of manufacturing the same
JPS6326817A (en) * 1986-07-18 1988-02-04 Matsushita Electric Ind Co Ltd Magnetic recording medium
US4840843A (en) * 1986-10-17 1989-06-20 Fuji Photo Film Co., Ltd. Magnetic recording medium
US4839244A (en) * 1987-04-24 1989-06-13 Nec Corporation Magnetic recording medium with protective layer using graphite fluoride and method of producing same
JPH01211221A (en) * 1988-02-18 1989-08-24 Hitachi Ltd Magnetic recording medium

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