JPS60198475A - Test system - Google Patents

Test system

Info

Publication number
JPS60198475A
JPS60198475A JP5421284A JP5421284A JPS60198475A JP S60198475 A JPS60198475 A JP S60198475A JP 5421284 A JP5421284 A JP 5421284A JP 5421284 A JP5421284 A JP 5421284A JP S60198475 A JPS60198475 A JP S60198475A
Authority
JP
Japan
Prior art keywords
data
circuit
test
error
test pattern
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5421284A
Other languages
Japanese (ja)
Inventor
Ryuichi Takagi
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP5421284A priority Critical patent/JPS60198475A/en
Publication of JPS60198475A publication Critical patent/JPS60198475A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317Testing of digital circuits
    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/07Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08Error detection or correction by redundancy in data representation, e.g. by using checking codes

Abstract

PURPOSE:To improve the reliability of a test by allowing test pattern data to contain check data, and discriminating immediately whether an error detected by a test originates from a circuit or system. CONSTITUTION:Test pattern memory 2 is stored with test data D1 for testing the function of an objective circuit 6. This data D1 contains test pattern data Di to be inputted to the circuit 6 for simulation and estimation output data Do from the circuit 6 which is put in simulating operation. Further, the memory 2 is stored with check data D2 for discriminating whether the data Di has an error or not as well as the date D1. Then, a driver/comparator 3 receives the data D1 and inputs the data Di in it to the circuit 6 for sumulation. Further, data Di outputted from the circuit 6 corresponding to the data Di is compared with the estimation data in the data D1 to detect an error which is caused by either the circuit 6 or system 1.
JP5421284A 1984-03-23 1984-03-23 Test system Pending JPS60198475A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5421284A JPS60198475A (en) 1984-03-23 1984-03-23 Test system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5421284A JPS60198475A (en) 1984-03-23 1984-03-23 Test system

Publications (1)

Publication Number Publication Date
JPS60198475A true JPS60198475A (en) 1985-10-07

Family

ID=12964239

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5421284A Pending JPS60198475A (en) 1984-03-23 1984-03-23 Test system

Country Status (1)

Country Link
JP (1) JPS60198475A (en)

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