JPS60183507A - 光学式外形寸法測定器 - Google Patents

光学式外形寸法測定器

Info

Publication number
JPS60183507A
JPS60183507A JP3907684A JP3907684A JPS60183507A JP S60183507 A JPS60183507 A JP S60183507A JP 3907684 A JP3907684 A JP 3907684A JP 3907684 A JP3907684 A JP 3907684A JP S60183507 A JPS60183507 A JP S60183507A
Authority
JP
Japan
Prior art keywords
image sensor
light
shadow
pulse
output
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP3907684A
Other languages
English (en)
Japanese (ja)
Other versions
JPH041845B2 (enrdf_load_stackoverflow
Inventor
Toshihiro Mori
利宏 森
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hokuyo Automatic Co Ltd
Original Assignee
Hokuyo Automatic Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hokuyo Automatic Co Ltd filed Critical Hokuyo Automatic Co Ltd
Priority to JP3907684A priority Critical patent/JPS60183507A/ja
Publication of JPS60183507A publication Critical patent/JPS60183507A/ja
Publication of JPH041845B2 publication Critical patent/JPH041845B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP3907684A 1984-02-29 1984-02-29 光学式外形寸法測定器 Granted JPS60183507A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3907684A JPS60183507A (ja) 1984-02-29 1984-02-29 光学式外形寸法測定器

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3907684A JPS60183507A (ja) 1984-02-29 1984-02-29 光学式外形寸法測定器

Publications (2)

Publication Number Publication Date
JPS60183507A true JPS60183507A (ja) 1985-09-19
JPH041845B2 JPH041845B2 (enrdf_load_stackoverflow) 1992-01-14

Family

ID=12543020

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3907684A Granted JPS60183507A (ja) 1984-02-29 1984-02-29 光学式外形寸法測定器

Country Status (1)

Country Link
JP (1) JPS60183507A (enrdf_load_stackoverflow)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62168410U (enrdf_load_stackoverflow) * 1986-03-26 1987-10-26
JPH01213504A (ja) * 1988-02-22 1989-08-28 Tadao Totsuka 光学的寸法測定装置
USRE38025E1 (en) * 1991-02-22 2003-03-11 Cyberoptics Corporation High precision component alignment sensor system
US7456978B2 (en) 2004-11-24 2008-11-25 Kabushiki Kaisha Kobe Seiko Sho Shape measuring apparatus
US7746481B2 (en) 2007-03-20 2010-06-29 Cyberoptics Corporation Method for measuring center of rotation of a nozzle of a pick and place machine using a collimated laser beam
US8068664B2 (en) 2007-06-05 2011-11-29 Cyberoptics Corporation Component sensor for pick and place machine using improved shadow imaging
CN106092015A (zh) * 2016-05-27 2016-11-09 南京理工大学 一种轨道表面凹陷长度检测方法

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54102146U (enrdf_load_stackoverflow) * 1977-12-28 1979-07-18
JPS5852508A (ja) * 1981-09-22 1983-03-28 Yokogawa Hokushin Electric Corp 形状測定装置
JPS5853704A (ja) * 1981-09-26 1983-03-30 Nippon Kogaku Kk <Nikon> 位置検出装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54102146U (enrdf_load_stackoverflow) * 1977-12-28 1979-07-18
JPS5852508A (ja) * 1981-09-22 1983-03-28 Yokogawa Hokushin Electric Corp 形状測定装置
JPS5853704A (ja) * 1981-09-26 1983-03-30 Nippon Kogaku Kk <Nikon> 位置検出装置

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62168410U (enrdf_load_stackoverflow) * 1986-03-26 1987-10-26
JPH01213504A (ja) * 1988-02-22 1989-08-28 Tadao Totsuka 光学的寸法測定装置
USRE38025E1 (en) * 1991-02-22 2003-03-11 Cyberoptics Corporation High precision component alignment sensor system
US7456978B2 (en) 2004-11-24 2008-11-25 Kabushiki Kaisha Kobe Seiko Sho Shape measuring apparatus
US7746481B2 (en) 2007-03-20 2010-06-29 Cyberoptics Corporation Method for measuring center of rotation of a nozzle of a pick and place machine using a collimated laser beam
US8068664B2 (en) 2007-06-05 2011-11-29 Cyberoptics Corporation Component sensor for pick and place machine using improved shadow imaging
CN106092015A (zh) * 2016-05-27 2016-11-09 南京理工大学 一种轨道表面凹陷长度检测方法

Also Published As

Publication number Publication date
JPH041845B2 (enrdf_load_stackoverflow) 1992-01-14

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Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term