JPS60160137A - リ−ド曲り検出方法 - Google Patents
リ−ド曲り検出方法Info
- Publication number
- JPS60160137A JPS60160137A JP1487084A JP1487084A JPS60160137A JP S60160137 A JPS60160137 A JP S60160137A JP 1487084 A JP1487084 A JP 1487084A JP 1487084 A JP1487084 A JP 1487084A JP S60160137 A JPS60160137 A JP S60160137A
- Authority
- JP
- Japan
- Prior art keywords
- lead
- fiber sensor
- bent
- detecting
- shoulder
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000034 method Methods 0.000 title claims abstract description 6
- 238000001514 detection method Methods 0.000 title claims description 4
- 239000000835 fiber Substances 0.000 claims abstract description 20
- 238000005452 bending Methods 0.000 claims description 4
- 238000007689 inspection Methods 0.000 abstract description 3
- 230000000007 visual effect Effects 0.000 abstract 1
- 238000011179 visual inspection Methods 0.000 abstract 1
- 238000009825 accumulation Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1487084A JPS60160137A (ja) | 1984-01-30 | 1984-01-30 | リ−ド曲り検出方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1487084A JPS60160137A (ja) | 1984-01-30 | 1984-01-30 | リ−ド曲り検出方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS60160137A true JPS60160137A (ja) | 1985-08-21 |
| JPH0340944B2 JPH0340944B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1991-06-20 |
Family
ID=11873050
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1487084A Granted JPS60160137A (ja) | 1984-01-30 | 1984-01-30 | リ−ド曲り検出方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS60160137A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6214449A (ja) * | 1985-07-11 | 1987-01-23 | Nec Kyushu Ltd | 半導体素子のリ−ド曲り検出方法 |
| CN109073567A (zh) * | 2016-04-28 | 2018-12-21 | 川崎重工业株式会社 | 零件检查装置及方法 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5663275A (en) * | 1979-10-30 | 1981-05-29 | Nec Kyushu Ltd | Lead testing device for semiconductor device |
-
1984
- 1984-01-30 JP JP1487084A patent/JPS60160137A/ja active Granted
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5663275A (en) * | 1979-10-30 | 1981-05-29 | Nec Kyushu Ltd | Lead testing device for semiconductor device |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6214449A (ja) * | 1985-07-11 | 1987-01-23 | Nec Kyushu Ltd | 半導体素子のリ−ド曲り検出方法 |
| CN109073567A (zh) * | 2016-04-28 | 2018-12-21 | 川崎重工业株式会社 | 零件检查装置及方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0340944B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1991-06-20 |
Similar Documents
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| LAPS | Cancellation because of no payment of annual fees |