JPS5946561A - Inspector for electronic appliance - Google Patents

Abstract

PURPOSE:To enable decision on an display of propriety by providing a comparison/collation circuit for collating an inspection number in an inspection executing number memory circuit and transmitting an inspection signal to an object equipment based on the output thereof to receive a response signal thereto. CONSTITUTION:An inspection signal is transmitted to an electronic equipment 11 from an inspection 10 to prestore an inspection signal 12, an inspection signal 13 and a reference response signal 14 into a memory circuit 15 corresponding to inspection items as one number unit set. An inspection number specification circuit 16 and a execution number memory circuit 17 are provided and a specified number memorized is supplied to a comparison/collation circuit 18 to be collated with an inspection number 12 read out of the memory circuit 15 and fed to a judging circuit 19 to which a signal is fed from an operation circuit 20 for directing the start and end of inspection. An inspection signal 13 is transmitted to the electronic equipment 11 through an output circuit 21 to perform an inspection, stored into an inspection result memory circuit 23 and finally indicated on a display unit 24. This can eliminates unnecessary inspection to reduce the inspection time.

Description

DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an electronic device testing device that sequentially tests a plurality of circuits constituting an electronic device and retests identified circuits after repair or the like.

When inspecting a plurality of circuits constituting an electronic device, it is usually performed as follows. Namely.

In order to confirm whether an electronic circuit incorporated in an electronic device to be tested operates normally, a testing device first outputs a test signal to each circuit in the electronic device according to a specified order. Each circuit within the electronic device then generates a response signal in response to this test signal. Here, the inspection device stores in advance a reference response signal that can be estimated when a test signal is sent to a circuit in a normally operating electronic device, and therefore the response signal from the circuit section and the reference signal By comparing the values, it is possible to check whether the circuit is functioning properly. Then, this inspection device sends various inspection signals corresponding to the inspection items to the electronic device in the order of inspection numbers, repeats the comparison operation as described above, and stores and sets each inspection result. When all tests are completed, the stored results are displayed on a display device.

Here, for n inspection items, inspection numbers Nl, N2.
N3...If Nn is added, the test will always start from the specific test number N1 at the beginning.

Tests were performed in the order of consecutive test numbers, such as N3... That is, the test starts from the first test number N1 identified, ends at the last test number Nn, and the test result is displayed on the display device. However, in the inspection of electronic devices, since one test item series overlaps with another test item series, it is sufficient to use one test item series to selectively test the other test item series. In some cases, items with similar functions may be selected to shorten the inspection time, and in some cases, defective items may be repaired and re-inspected after inspection. In this case, the process starts from the first inspection item.

Therefore, for example, if you try to execute tests from arbitrary test numbers Ni to Nj, the test will start from the first test number N1, and will therefore increase from N+ to Ni-1 and N,
Unnecessary tests will be performed from +1 to Nn.

This invention was made in order to solve the above-mentioned problems, and in the case of inspection of arbitrarily selected inspection items, unnecessary inspection items are reduced as much as possible to improve inspection efficiency. The purpose is to provide electronic equipment testing equipment.

That is, the electronic device testing apparatus according to the present invention includes a test number storage circuit that stores test signals and reference response signals that are combined based on test numbers corresponding to each of a plurality of test items.

An inspection number designation circuit for specifying an arbitrary inspection number for which an inspection is desired to be carried out; an inspection number storage circuit for storing the inspection number specified by the inspection number specification circuit; and an inspection number stored in the inspection number storage circuit. and a comparison/verification circuit that collates the inspection number in the inspection number storage circuit; and a comparison/verification circuit that sends an inspection signal to the electronic device to be inspected based on the matched inspection number that is compared by the comparison/verification circuit, and a response signal to the circuit. It is characterized by comprising a judgment circuit for determining whether the operation is good or bad, and means for displaying the test results from the judgment circuit.

An embodiment of the present invention will be described below with reference to the drawings. FIG. 1 shows the configuration, and an electronic device 11 is connected to the inspection device 10 by a signal line. Then, a test signal is sent from the test device 10 to the electronic device 11, and a response signal from the electronic device 11 is transmitted to the test device 10. Here, the inspection device 10 has an inspection number 12. corresponding to each inspection item. The test signal 13 and the reference response signal 14 are arranged in groups of two numbers and stored in advance in the storage circuit 15 in the order of the number of test items. Also, an inspection number designation circuit 16 for specifying the inspection number for which inspection is to be performed. and an inspection number storage path 17 for storing the inspection number specified by the same circuit, and the specified and stored number is further supplied to a comparison and verification circuit 18, and the inspection number 12 read out from the storage circuit 15 is provided.
The result is supplied to a judgment circuit of 1.9K. This judgment circuit 19 is supplied with a signal from an operation circuit 20 that instructs the start and end of the test. That is, when the operation circuit 20 issues a start instruction, the test signal 13 corresponding to the test number 12, which is the test number stored in the test number storage circuit 17, is transferred to the judgment circuit 19. .

The test signal 13 sent from the judgment circuit 19 is transmitted to the electronic device 11 via the output circuit 21.

Further, a response signal sent from the electronic device 11 is input to the judgment circuit 19 via the input circuit 22.

The output circuit 21 and the input circuit 22 perform signal adjustment so that different input/output signal processing systems can be coupled to the judgment circuit 19, and the judgment circuit 19 performs central processing control of each transmitted signal. Let's do it. The test results are stored in the test result storage circuit 23 until all items have been tested.

Finally, the results are displayed on the display device 24.

That is, when the apparatus configured as described above is used in a normal inspection process, the inspection number designation circuit 16
Specify the first inspection number N, and select from inspection number N to the last N. Continuously perform each inspection process up to. and,
The results are displayed on the display device 24.

Therefore, when one inspection item series is used to selectively inspect another inspection item series, when items with similar functions are selectively inspected to shorten inspection time, or when defective items are repaired. In case of subsequent re-examination, etc.

As shown in (2) to (6) in Figure 2, inspection numbers N, ~N,
When selectively inspecting only a specific number in , proceed as follows.

For example, let us explain the case of FIG. 2 (2).

When the item requiring inspection is inspection number N112, first, inspection number N1 specified by inspection number designation circuit 16 is stored in inspection execution number storage circuit 17. When the operation circuit 20 instructs to start the test.

The stored inspection number Ni and the inspection number N in the memory circuit 15
i12 is collated by the comparison and collation circuit 18, and this inspection number N
The test signal 13 corresponding to i12 is transferred to the judgment circuit 19. Here, the judgment circuit 19 transmits this test signal 13 to the electronic device 11 via the output circuit 21 to prompt the operation of the circuit to be tested. In response to the test signal 13 thus supplied, this circuit generates a response signal, and this response signal is sent to the judgment circuit 1 through an input circuit 22 provided in the test device 10.
9. The 1 judgment circuit 19 is the memory circuit 1.
The reference response signal 14 corresponding to the above-mentioned test signal 131C, which is stored in the test signal 5, is extracted, and the test result determined by comparison with this response signal is transferred to the test result storage circuit 22.

The above is the processing for inspection number N112.

Following number Ni + 11 Ni +2+...I
Thereafter, the Nn inspection items are sequentially processed in the same manner as above.

When the inspection of all items is completed, the 1 judgment circuit 19 causes the display device 24 to display the inspection results.

As described above, the electronic device testing apparatus according to the present invention includes a test number storage circuit that stores test signals and reference response signals that are combined based on test numbers corresponding to each of a plurality of test items.

An inspection number designation circuit for specifying an arbitrary inspection number for which an inspection is desired to be carried out; an inspection number storage circuit for storing the inspection number specified by the inspection number specification circuit; and an inspection number stored in the inspection number storage circuit. and a comparison/verification circuit that collates the inspection number in the inspection number storage circuit; and a comparison/verification circuit that sends an inspection signal to the electronic device to be inspected based on the matched inspection number that is compared by the comparison/verification circuit, and a response signal to the circuit. It is characterized by comprising a judgment circuit that determines whether the operation is good or bad, and a means for displaying the test results from the judgment circuit.As in the past, the test number N+ is always
From N.

There is no need to execute all the tests up to this point, and any desired test number N1 can be selectively designated and tested. Therefore, unnecessary tests can be omitted and the test time can be shortened.

[Brief explanation of the drawing]

FIG. 1 is a block diagram of an embodiment of the electronic equipment testing apparatus of the present invention, and FIG. 2 is an explanatory diagram of its testing items. 10...Electronic device inspection device, 11...Electronic device. 12...Inspection number, 13...Inspection signal, 14...
Reference response signal, 15... Inspection number storage circuit, 16...
- Inspection number designation circuit, 17... Inspection execution number storage circuit. 18... Comparison verification circuit, 19... Judgment circuit, 20.
...Operation circuit, 21...Output circuit, 22...Input circuit. 23...Test result storage circuit, 24...Display device. Agent Akira Sakama 1 country

Claims (1)

[Claims] An inspection number storage circuit that stores test signals and reference response signals that are combined based on test numbers corresponding to each of a plurality of test items, an test number designation circuit that specifies an arbitrary test number for which a test is to be performed, and the test number. an inspection execution number storage circuit that stores the inspection number designated by the designated circuit; a comparison verification circuit that collates the inspection number stored in the inspection execution number storage circuit with the inspection number in the inspection number storage circuit; A judgment circuit that sends a test signal to the electronic device to be tested based on the matching test number that is verified by the matching circuit, and determines whether the circuit is operating properly based on a response signal, and a judgment circuit that displays the test results from the judgment circuit. An electronic device inspection device characterized by comprising: means.