JPS59230120A - 光センサ - Google Patents

光センサ

Info

Publication number
JPS59230120A
JPS59230120A JP58104812A JP10481283A JPS59230120A JP S59230120 A JPS59230120 A JP S59230120A JP 58104812 A JP58104812 A JP 58104812A JP 10481283 A JP10481283 A JP 10481283A JP S59230120 A JPS59230120 A JP S59230120A
Authority
JP
Japan
Prior art keywords
filter
optical sensor
film interference
interference filter
sharp cut
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP58104812A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0311654B2 (enrdf_load_stackoverflow
Inventor
Shizuko Katsube
勝部　倭子
Tokuo Inoue
井上　十九男
Kensuke Funabiki
船引　健介
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Omron Corp
National Institute of Advanced Industrial Science and Technology AIST
Original Assignee
Agency of Industrial Science and Technology
Tateisi Electronics Co
Omron Tateisi Electronics Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agency of Industrial Science and Technology, Tateisi Electronics Co, Omron Tateisi Electronics Co filed Critical Agency of Industrial Science and Technology
Priority to JP58104812A priority Critical patent/JPS59230120A/ja
Publication of JPS59230120A publication Critical patent/JPS59230120A/ja
Publication of JPH0311654B2 publication Critical patent/JPH0311654B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00—Constructional details of devices covered by this subclass
    • H10F77/30—Coatings
    • H10F77/306—Coatings for devices having potential barriers
    • H10F77/331—Coatings for devices having potential barriers for filtering or shielding light, e.g. multicolour filters for photodetectors
    • H10F77/337—Coatings for devices having potential barriers for filtering or shielding light, e.g. multicolour filters for photodetectors using interference filters, e.g. multilayer dielectric filters

Landscapes

  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
JP58104812A 1983-06-10 1983-06-10 光センサ Granted JPS59230120A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58104812A JPS59230120A (ja) 1983-06-10 1983-06-10 光センサ

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58104812A JPS59230120A (ja) 1983-06-10 1983-06-10 光センサ

Publications (2)

Publication Number Publication Date
JPS59230120A true JPS59230120A (ja) 1984-12-24
JPH0311654B2 JPH0311654B2 (enrdf_load_stackoverflow) 1991-02-18

Family

ID=14390823

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58104812A Granted JPS59230120A (ja) 1983-06-10 1983-06-10 光センサ

Country Status (1)

Country Link
JP (1) JPS59230120A (enrdf_load_stackoverflow)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0253002A1 (de) * 1986-07-12 1988-01-20 Günter Dr.-Ing. Pusch Vorrichtung zur Erkennung thermischer Kontraste
JP2010101627A (ja) * 2008-10-21 2010-05-06 Murata Mfg Co Ltd 紫外線測定装置、コンパクトケースおよび電子機器
JP2018141766A (ja) * 2017-02-27 2018-09-13 采▲ぎょく▼科技股▲ふん▼有限公司ＶｉｓＥｒａ Ｔｅｃｈｎｏｌｏｇｉｅｓ Ｃｏｍｐａｎｙ Ｌｉｍｉｔｅｄ スペクトル検査装置

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0253002A1 (de) * 1986-07-12 1988-01-20 Günter Dr.-Ing. Pusch Vorrichtung zur Erkennung thermischer Kontraste
JP2010101627A (ja) * 2008-10-21 2010-05-06 Murata Mfg Co Ltd 紫外線測定装置、コンパクトケースおよび電子機器
JP2018141766A (ja) * 2017-02-27 2018-09-13 采▲ぎょく▼科技股▲ふん▼有限公司ＶｉｓＥｒａ Ｔｅｃｈｎｏｌｏｇｉｅｓ Ｃｏｍｐａｎｙ Ｌｉｍｉｔｅｄ スペクトル検査装置
US10145740B2 (en) 2017-02-27 2018-12-04 Visera Technologies Company Limited Sensing multiple peak wavelengths using combination of dual-band filters

Also Published As

Publication number Publication date
JPH0311654B2 (enrdf_load_stackoverflow) 1991-02-18

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