JPS59179781A - Sputtering device - Google Patents

Sputtering device

Info

Publication number
JPS59179781A
JPS59179781A JP5541883A JP5541883A JPS59179781A JP S59179781 A JPS59179781 A JP S59179781A JP 5541883 A JP5541883 A JP 5541883A JP 5541883 A JP5541883 A JP 5541883A JP S59179781 A JPS59179781 A JP S59179781A
Authority
JP
Japan
Prior art keywords
target
target group
furnace body
sputtering device
workpiece
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5541883A
Other languages
Japanese (ja)
Inventor
Mizuo Edamura
枝村 瑞郎
Kyoji Kajikawa
梶川 享志
Koji Okamoto
康治 岡本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kawasaki Heavy Industries Ltd
Kawasaki Motors Ltd
Original Assignee
Kawasaki Heavy Industries Ltd
Kawasaki Jukogyo KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kawasaki Heavy Industries Ltd, Kawasaki Jukogyo KK filed Critical Kawasaki Heavy Industries Ltd
Priority to JP5541883A priority Critical patent/JPS59179781A/en
Priority to US06/594,577 priority patent/US4478703A/en
Publication of JPS59179781A publication Critical patent/JPS59179781A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/34Gas-filled discharge tubes operating with cathodic sputtering
    • H01J37/3402Gas-filled discharge tubes operating with cathodic sputtering using supplementary magnetic fields
    • H01J37/3405Magnetron sputtering

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
  • Physical Vapour Deposition (AREA)
  • Electrodes Of Semiconductors (AREA)

Abstract

PURPOSE:To provide a titled device which enables efficient formation of a surface having good throwing power on an object to be treated by disposing annularly a target group on the outside of said object, and linking the object or the target group to a rotating mechanism. CONSTITUTION:An object 3 to be treated is disposed in a furnace body 2 of a sputtering device 1 and a target group consisting of plural targets 4 composed of materials different from each other is disposed at a specified spacing on the outside of the material 3. The object 3 is placed on a stage 6 connected to a revolving shaft 5 and the object 3 is rotated with respect to each target 4. An alloy-like surface layer having good throwing power is efficiently and uniformly formed on the surface of the object 3. This sputtering device may also be so constructed as to rotate the target group around the object 3.

Description

【発明の詳細な説明】 本発明は、被処理物の表面に同材質あるいは合金状の薄
層を均一に、生産性よく形成することができるスパッタ
リング装置に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a sputtering apparatus that can uniformly and efficiently form a thin layer of the same material or alloy on the surface of a workpiece.

一般lこ、グロー放電で陰極側の金属が陽イオンの衝撃
によりたたき出されて、陽極の近傍にある物体の表面に
付着するというスパッタリングを利用したスパッタリン
グ装置は知られている(例えば、特公昭6乙−,5り3
フッ号)Q イ5z+ノ良v’、、htpMAnu+yシ市Jytr
uL、+++、。
Generally speaking, there are known sputtering devices that utilize sputtering in which the metal on the cathode side is knocked out by the impact of cations during glow discharge and adheres to the surface of an object near the anode (for example, 6 ot-, 5 ri 3
Fu No.)Q I5z+Nora v',,htpMAnu+yshi city Jytr
uL,+++,.

地物表面の付着量が多く、反対向は付着量が少な処理物
を回転すればこれらの問題は解決するが、この場合には
スパッタされる原子の飛散が一方向で被膜形成速度は遅
くなり、スパッタ効率が悪い欠点があった。
These problems can be solved by rotating the object with a large amount of adhesion on the feature surface and a small amount of adhesion in the opposite direction, but in this case, the sputtered atoms scatter in one direction and the film formation rate slows down. However, it had the disadvantage of poor sputtering efficiency.

また、チタンTi、クロムCr、ケイ素si、ホウ素B
、タンタルTa、ジルコニウムZrなどの金属才複合タ
ーゲットを用いることにより可能であるが、そのような
複合ターゲットは製作コストが高くつぐし、また上記し
た均一性、つきまわり性t・よびスパッタ効率の点でも
問題があった。
Also, titanium Ti, chromium Cr, silicon si, boron B
This is possible by using a composite target made of metals such as tantalum, Ta, and zirconium Zr, but such a composite target is expensive to manufacture and also suffers from the above-mentioned problems in terms of uniformity, throwing power, and sputtering efficiency. But there was a problem.

本発明はかかる点に鑑みてなされたもので、/バッタさ
れた原子を付着せしめるスノ(ツタリング装置の提供に
あり、他の目的は複合ターゲットを用いることなく、被
処理物表、面全体に異種金属およびそれらの窒化物、炭
化物あるいは酸化物などによる均一でしかもつきまわり
性のよい合金状の表面層を容易に、効率的にかつ安価に
被覆コーティングすることかできるスノくツタリング装
置を提供することである。
The present invention has been made in view of the above-mentioned problems, and the purpose of the present invention is to provide a dusting device for adhering the battered atoms.Another purpose of the present invention is to provide a dusting device for attaching the battered atoms. To provide a snow tutting device capable of easily, efficiently and inexpensively coating a surface layer of a uniform alloy with good throwing power made of metals and their nitrides, carbides, oxides, etc. It is.

以下、本発明の構成を、実施例について、図面に沿って
説明する。
DESCRIPTION OF THE PREFERRED EMBODIMENTS The configuration of the present invention will be described below with reference to embodiments with reference to the drawings.

第1図および第2図において、1はマダイ・トロンをの
スパンタリング装置で、その炉体2の内部のほぼ中央部
には被処理物6が配置され、該被処理物乙の外側に、−
走間1鵠を存して、材質の相互に異なる複数のターゲッ
ト4(本例ではグつで、材質は例えはTi、Cr、B、
Si)からなるターゲツト群か環状に配置されている。
In FIGS. 1 and 2, reference numeral 1 denotes a sputtering device for Madai Tron, in which a workpiece 6 is disposed approximately in the center of the furnace body 2, and on the outside of the workpiece B, −
A plurality of targets 4 made of mutually different materials (in this example, the materials are Ti, Cr, B,
A target group consisting of Si) is arranged in a ring.

前記被処理物6は、回転軸5に連結された載1台6上に
載置され、回転軸5か、絶縁体7および磁気シール8を
介して、炉体2外部のモータ9と連係されている。それ
によって、被処理物6は各ターゲット4に対して回転す
ることになる0前記各ターゲツト4は、被処理物6より
等距離に位置しており、しかしてその内部には、後述す
るように磁界形成体か配設されている。一方、炉体2の
周囲には電接コイル10が配設され、これとターゲット
内部の磁界形成体によってターゲット4と被処理物3と
の間における電界に直交して磁界を与えるようになって
いる。
The workpiece 6 is placed on a mount 6 connected to a rotating shaft 5, and linked to a motor 9 outside the furnace body 2 via the rotating shaft 5, an insulator 7, and a magnetic seal 8. ing. As a result, the object 6 to be processed rotates relative to each target 4. Each target 4 is located at an equal distance from the object 6 to be processed, and inside thereof, as will be described later, A magnetic field forming body is provided. On the other hand, an electric coil 10 is disposed around the furnace body 2, and this and a magnetic field forming body inside the target apply a magnetic field orthogonal to the electric field between the target 4 and the workpiece 3. There is.

前記被処理物乙の回転構造の詳細を示す第3図において
、回転、実動源であるモータ9のモータ軸9aは、フラ
ンジ8aか取付ボルト11によって炉体2(第1図)の
下部炉壁2aに取付けられてなる磁気シール8を貫通し
て、該下部炉壁2aにおける開孔2bに挿通され、しか
して炉体2の内部て絶縁体7の下端部に螺着されている
。前記絶侍縁体7の上端部には、モータ軸9 aと同軸
状に下側回転軸12の下端部か螺着され、該下1111
1回転軸12の周囲に筒状の絶縁ガイシ16か配置され
ている。
In FIG. 3 showing the details of the rotating structure of the object to be processed A, the motor shaft 9a of the motor 9, which is the source of rotation and actual operation, is connected to the lower furnace of the furnace body 2 (FIG. 1) by means of a flange 8a or a mounting bolt 11. It passes through the magnetic seal 8 attached to the wall 2a, is inserted into the opening 2b in the lower furnace wall 2a, and is screwed onto the lower end of the insulator 7 inside the furnace body 2. A lower end of a lower rotating shaft 12 is screwed onto the upper end of the insulator 7 coaxially with the motor shaft 9a.
A cylindrical insulating insulator 16 is arranged around the single rotation shaft 12.

前記下側回転軸12の上端部は、上側回転軸14の下端
部14aに同軸状に螺着され、しかして該」−側口転軸
14の」二端部が、処理物6の載置台乙に固着螺着され
ている0 また、l IU11回転11!Ill 14の下端部1
4a上面に接触する電極端子15が取伺具16を介して
ベースプレート17に取付固定されている。上側回転軸
14の下端部14aと電極端子15との接触によって、
電流か上側回転!1ill+ 14 L、たかって載置
台6に導入されることに1よる。
The upper end of the lower rotating shaft 12 is coaxially screwed onto the lower end 14a of the upper rotating shaft 14, and the two ends of the side rotating shaft 14 are connected to the mounting table for the workpiece 6. 0 is firmly screwed to O. Also, l IU11 rotation 11! Lower end 1 of Ill 14
An electrode terminal 15 in contact with the upper surface of 4a is fixedly attached to a base plate 17 via a mounting tool 16. Due to the contact between the lower end 14a of the upper rotating shaft 14 and the electrode terminal 15,
Current or upper rotation! 1 ill + 14 L, which is due to the fact that it is introduced into the mounting table 6.

また、前記ターゲット4の取付構造の詳細を示す第7図
に訃いて、炉体2(第1図)の下部炉壁2aに対し、取
付フランジ18aを有する筒状σ〕収納管18が外部下
方から貫通して配設され、しかして取付7ランジ18a
が支持プレート19とともに締付ポル)2[]によって
下部炉壁2aの下向に固設されている。前記取付フラン
ジ18aと下部炉壁2dとの間にはOIJング21が介
設され、それによって真空シールが行われている。
Further, as shown in FIG. 7 showing the details of the mounting structure of the target 4, a cylindrical storage pipe 18 having a mounting flange 18a is located at the bottom of the lower furnace wall 2a of the furnace body 2 (FIG. 1). The mounting 7 flange 18a is
is fixed downwardly on the lower furnace wall 2a together with the support plate 19 by a tightening bolt 2 []. An OIJ ring 21 is interposed between the mounting flange 18a and the lower furnace wall 2d, thereby providing a vacuum seal.

前記収納管18の外周下部には下部炉壁2a上にアルミ
ナ製絶縁材からなる支持台22が配設され、該支持台2
2」二にはアルミナ製絶縁材からfSる筒体26か収納
管18を囲んで配設されている。
A support stand 22 made of alumina insulating material is disposed on the lower furnace wall 2a at the lower part of the outer periphery of the storage pipe 18.
2. A cylinder 26 made of an insulating material made of alumina is disposed surrounding the storage pipe 18.

前記筒体23の外周で、かつ支持台22上に筒状のター
ゲット4が装設されている。
A cylindrical target 4 is installed on the support base 22 at the outer periphery of the cylinder 23 .

さらに、収納管18の内部には、下端か支持プレート1
9に固着された中空筒状の冷却4(管24の細径部24
aに外嵌された磁界形成体25か位置している。冷却水
管24の下端開口は支持プレート19の開孔19aを通
じて、支持プレート19に固着された冷却水供給管26
に連通されている0それによって、冷却水供給管26よ
り供給された冷却水(↓、冷却水管24内を通って、該
冷却水管24上端の開口24bから該冷却水管24の外
部へ流出し、それで収納管18内を経て、支持ブ1/−
ト19の排出口19bを通じて流出するように構成され
ている。この冷却水の循環によって、ターゲット4を冷
却し、かつ磁界Jlt成体25を冷却して放電に伴う熱
によって消磁することか防止される。なお、取付フラン
ジ18aと支持ブレーt・19との間は、シール材27
によって水シールされている。また、磁界形成体25は
永久磁石などからなる周知のものである。才だ、ターゲ
ット4には電極端子34が取付りられている。
Furthermore, inside the storage tube 18, there is a support plate 1 at the lower end.
A hollow cylindrical cooling 4 fixed to the tube 9 (the narrow diameter part 24 of the tube 24
A magnetic field forming body 25 fitted onto the outside is located. The lower end opening of the cooling water pipe 24 is connected to the cooling water supply pipe 26 fixed to the support plate 19 through the opening 19a of the support plate 19.
As a result, the cooling water (↓) supplied from the cooling water supply pipe 26 passes through the cooling water pipe 24 and flows out from the opening 24b at the upper end of the cooling water pipe 24 to the outside of the cooling water pipe 24, Then, through the storage pipe 18, the support plate 1/-
It is configured to flow out through the outlet 19b of the port 19. This circulation of cooling water cools the target 4 and the magnetic field Jlt body 25, thereby preventing it from being demagnetized by heat accompanying discharge. Note that a sealing material 27 is provided between the mounting flange 18a and the support plate 19.
The water is sealed by the water. Further, the magnetic field forming body 25 is a well-known type made of a permanent magnet or the like. The electrode terminal 34 is attached to the target 4.

第/は1の28は直流電源、29は真空ポンプ、30は
雰囲気ガス供給手段で、N2ガス、不活性ガス等の雰囲
気ガスを炉体2内に供給するものである。
No. 1, 28, is a DC power supply, 29 is a vacuum pump, and 30 is an atmospheric gas supply means, which supplies atmospheric gas such as N2 gas or inert gas into the furnace body 2.

上記のように構成すれは、AIなど不活性ガスやN2な
ど反応ガス雰囲気中で、モータ9を駆動させて被処理物
3を2θ〜3Qrpm程度で回転させ、各ターゲット4
を陰極、被処理物3を陽極として直流電圧を印加してス
パッタリンク装置を行うと、異種金属(例えは、Ti、
Si、B、Cr )からなる各ターゲット4よりたたき
出された金属原子が、相溶した状態で被処理物30表面
に付着することになる。
In the above configuration, each target 4 is rotated by driving the motor 9 to rotate the workpiece 3 at about 2θ to 3Q rpm in an atmosphere of an inert gas such as AI or a reactive gas such as N2.
When a sputter link device is operated by applying a DC voltage with the object 3 as a cathode and the object 3 as an anode, dissimilar metals (for example, Ti,
The metal atoms ejected from each target 4 made of (Si, B, Cr) adhere to the surface of the workpiece 30 in a compatible state.

したがって、被処理物6の表面には、合金状の表面層か
形成されることになる。なお、この場合、被処理物6は
回転しているので、該被処理物3の表面に効率的に一嘩
につきまわり性よく表面層が形成される。
Therefore, an alloy-like surface layer is formed on the surface of the object 6 to be processed. In this case, since the object to be processed 6 is rotating, a surface layer is formed on the surface of the object to be processed 3 by efficiently covering the surface of the object.

上記実施例では、ターゲット4が円筒状である場合につ
いて説明したか、第5図に示すように、ターゲット61
は板状であっても差支えはない。
In the above embodiment, the case where the target 4 is cylindrical is explained, or as shown in FIG.
There is no problem even if it is plate-shaped.

その場合、収納管18と被処理物6との間に該収納管1
8に沿って、炉体2の下部炉壁2a上にアルミナ製絶縁
材からなる取伺台62か立設され、該取付台62にクー
ゲット61が取付ヒス66にて取付固定されている。な
お、その他の構成は、第7図に示すものと同様である。
In that case, between the storage pipe 18 and the object 6, the storage pipe 1
8, a mounting stand 62 made of an alumina insulating material is erected on the lower furnace wall 2a of the furnace body 2, and a cuget 61 is mounted and fixed to the mounting stand 62 with a mounting hitch 66. Note that the other configurations are similar to those shown in FIG. 7.

また、上記実施例では、被処!11物3が回転するよう
にしているが、ターゲット群に回転機構を連係し、それ
によって、被処理物6を中ノし・とじてターゲツト群を
回転させるようにしてもよい。
In addition, in the above embodiment, the subject! Although the object 3 is rotated in this embodiment, a rotation mechanism may be linked to the target group, and the target group may be rotated by cutting and closing the object 6 to be processed.

さらに上記実施例ではターゲツト群を異種材質にして合
金状の表面層を被処lit物に形成する場合であるか、
ターゲツト群を同相質にしてスパッタリングを行っても
被処理物またはターゲツト群の何れか一方を回転させる
ので、均一な表面層かつきまわり性よく得られ、また被
処理物全体が常にスパッタ原子の飛散方向に対向してい
るので、スパッタ効率が向上することはもちろんのこと
である。また、さらに、上記実施例では、直流マグネト
ロシ型のスパッタリング装置に適用した例であるが、そ
のほか、高周波型、イオンビーム型のスパッタリンク装
置などに対しても適用可能である。
Furthermore, in the above embodiment, the target group is made of different materials and an alloy-like surface layer is formed on the lit object.
Even if sputtering is performed with the target group in the same phase, either the workpiece or the target group is rotated, so a uniform surface layer and good coverage can be obtained, and the entire workpiece is always exposed to the scattering of sputtered atoms. Since they are oriented in opposite directions, it goes without saying that the sputtering efficiency is improved. Further, in the above embodiment, the present invention is applied to a DC magnetoresistive type sputtering apparatus, but it is also applicable to a high frequency type, an ion beam type sputtering apparatus, and the like.

不発l:!IJは上記のように構成したから、被処理物
の表面に、生産性よくかつ容易に、同材質あるいは合金
状の表面層を均一に、つきまわり性よくかつ効率的に形
成することができるという実用上優れた効果を有する。
Misfire:! Since the IJ is configured as described above, it is possible to easily form a surface layer of the same material or alloy on the surface of the workpiece with high productivity and efficiency. It has excellent practical effects.

【図面の簡単な説明】[Brief explanation of the drawing]

図面は本発明の実施態様を例示するもので、第7図はス
パッタリング装置の全体構成図、第2図は被処理物とタ
ーゲットとの位置関係を示す説明図、第3図は被処理物
を回転させる機構を示す詳細断面図、第7図はターゲッ
トの冷却構造を示す詳細断面図、第5図は変形例につい
ての、第7図と同様の図である。 1・・・・・・スパッタリンク装置、2・・・炉体、6
・・・・・被処理物、4・・・・・・クーゲット、9・
・・・モータ、61・・・・・・ターゲノト 第1図4 第2図 第3図 第5図
The drawings illustrate embodiments of the present invention, and FIG. 7 is an overall configuration diagram of the sputtering apparatus, FIG. 2 is an explanatory diagram showing the positional relationship between the object to be processed and the target, and FIG. FIG. 7 is a detailed sectional view showing a rotating mechanism, FIG. 7 is a detailed sectional view showing a target cooling structure, and FIG. 5 is a similar view to FIG. 7 of a modified example. 1... Sputter link device, 2... Furnace body, 6
...Processed object, 4...Couget, 9.
...Motor, 61...Target note Fig. 1 Fig. 4 Fig. 2 Fig. 3 Fig. 5

Claims (1)

【特許請求の範囲】[Claims] (1)炉体内部のほぼ中央部に被処理物が配置される一
方、該被処理物の外側に、一定間隔を存して、複数のタ
ーゲットからなるターゲツト群が環状に配置され、前記
被処理物またはターゲツト群の何れか一方が回転機構に
連係されていることを特徴とするスパッタリング装置。
(1) The object to be treated is arranged approximately at the center inside the furnace body, while a target group consisting of a plurality of targets is arranged in a ring shape at regular intervals outside the object. 1. A sputtering apparatus characterized in that either a processing object or a group of targets is linked to a rotation mechanism.
JP5541883A 1983-03-31 1983-03-31 Sputtering device Pending JPS59179781A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP5541883A JPS59179781A (en) 1983-03-31 1983-03-31 Sputtering device
US06/594,577 US4478703A (en) 1983-03-31 1984-03-29 Sputtering system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5541883A JPS59179781A (en) 1983-03-31 1983-03-31 Sputtering device

Publications (1)

Publication Number Publication Date
JPS59179781A true JPS59179781A (en) 1984-10-12

Family

ID=12998024

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5541883A Pending JPS59179781A (en) 1983-03-31 1983-03-31 Sputtering device

Country Status (1)

Country Link
JP (1) JPS59179781A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01298156A (en) * 1988-05-27 1989-12-01 Matsushita Electric Ind Co Ltd Sputtering device

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55100980A (en) * 1979-01-23 1980-08-01 Coulter Systems Corp Sputtering device

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55100980A (en) * 1979-01-23 1980-08-01 Coulter Systems Corp Sputtering device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01298156A (en) * 1988-05-27 1989-12-01 Matsushita Electric Ind Co Ltd Sputtering device

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