JPS5876773A - 布線試験機のアドレス制御方式 - Google Patents

布線試験機のアドレス制御方式

Info

Publication number
JPS5876773A
JPS5876773A JP56173697A JP17369781A JPS5876773A JP S5876773 A JPS5876773 A JP S5876773A JP 56173697 A JP56173697 A JP 56173697A JP 17369781 A JP17369781 A JP 17369781A JP S5876773 A JPS5876773 A JP S5876773A
Authority
JP
Japan
Prior art keywords
flip
test
flop
package
switching
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56173697A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0123070B2 (cs
Inventor
Taiichi Miho
美保　泰一
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP56173697A priority Critical patent/JPS5876773A/ja
Publication of JPS5876773A publication Critical patent/JPS5876773A/ja
Publication of JPH0123070B2 publication Critical patent/JPH0123070B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
    • G01R31/67—Testing the correctness of wire connections in electric apparatus or circuits

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
JP56173697A 1981-10-31 1981-10-31 布線試験機のアドレス制御方式 Granted JPS5876773A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56173697A JPS5876773A (ja) 1981-10-31 1981-10-31 布線試験機のアドレス制御方式

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56173697A JPS5876773A (ja) 1981-10-31 1981-10-31 布線試験機のアドレス制御方式

Publications (2)

Publication Number Publication Date
JPS5876773A true JPS5876773A (ja) 1983-05-09
JPH0123070B2 JPH0123070B2 (cs) 1989-04-28

Family

ID=15965433

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56173697A Granted JPS5876773A (ja) 1981-10-31 1981-10-31 布線試験機のアドレス制御方式

Country Status (1)

Country Link
JP (1) JPS5876773A (cs)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6042662A (ja) * 1983-08-17 1985-03-06 Ibiden Co Ltd プリント配線板の検査方法とその検査装置
JPS61117473A (ja) * 1984-11-13 1986-06-04 Ibiden Co Ltd プリント配線板の検査方法とその検査装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6042662A (ja) * 1983-08-17 1985-03-06 Ibiden Co Ltd プリント配線板の検査方法とその検査装置
JPS61117473A (ja) * 1984-11-13 1986-06-04 Ibiden Co Ltd プリント配線板の検査方法とその検査装置

Also Published As

Publication number Publication date
JPH0123070B2 (cs) 1989-04-28

Similar Documents

Publication Publication Date Title
US4879717A (en) Testable carriers for integrated circuits
US3573751A (en) Fault isolation system for modularized electronic equipment
US3927371A (en) Test system for large scale integrated circuits
JPS62503188A (ja) 構成可能なゲ−トアレイ用オンチツプテストシステム
JPS6232511B2 (cs)
GB2070779A (en) Apparatus for testing digital electronic circuits
JPH03256297A (ja) 線形フイードバツクシフトレジスタをクロスチエツク格子構造を伴なつて直列シフトレジスタとして動作させる方法および装置
KR900019188A (ko) 시험 방법, 시험회로 및 시험회로를 갖는 반도체 집적회로
US6073260A (en) Integrated circuit
US4847838A (en) Circuit for testing the bus structure of a printed wiring card
US5166937A (en) Arrangement for testing digital circuit devices having tri-state outputs
JPS5876773A (ja) 布線試験機のアドレス制御方式
US5918198A (en) Generating pulses in analog channel of ATE tester
EP0151694A2 (en) Logic circuit with built-in self-test function
JPH08507610A (ja) プリング抵抗を備える接続部をテストする装置
US5426649A (en) Test interface for a digital circuit
JPS637630B2 (cs)
JPS61262856A (ja) 試験回路
SU1432528A2 (ru) Устройство дл контрол функционировани логических блоков
JP2864880B2 (ja) 半導体メモリｉｃ試験装置
GB2164474A (en) Circuit testing
JP2000338188A (ja) 半導体集積回路の試験回路
JPH0257988A (ja) 試験パターン発生器
SU1608672A1 (ru) Устройство дл контрол логических блоков
JPH0429991B2 (cs)