JPS5848222U - Sector electronic scanning ultrasound diagnostic equipment - Google Patents
Sector electronic scanning ultrasound diagnostic equipmentInfo
- Publication number
- JPS5848222U JPS5848222U JP14583681U JP14583681U JPS5848222U JP S5848222 U JPS5848222 U JP S5848222U JP 14583681 U JP14583681 U JP 14583681U JP 14583681 U JP14583681 U JP 14583681U JP S5848222 U JPS5848222 U JP S5848222U
- Authority
- JP
- Japan
- Prior art keywords
- element group
- diagnostic equipment
- ultrasound diagnostic
- electronic scanning
- scanning ultrasound
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Measurement Of Velocity Or Position Using Acoustic Or Ultrasonic Waves (AREA)
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
- Ultra Sonic Daignosis Equipment (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
図は本考案の一実施例のブロック図である。
= 1.2.3・・・エレメント群、10〜19
.20〜29.30〜39・・・エレメント、4・・・
支持体1.。
50〜59・・・遅延回路、6・・・切替回路。
゛しThe figure is a block diagram of an embodiment of the present invention. = 1.2.3...Element group, 10 to 19
.. 20-29.30-39...element, 4...
Support 1. . 50-59...Delay circuit, 6...Switching circuit.
゛shi
Claims (1)
群に分割し、各エレメント群を複数エレメントの平面状
配列により構成するとともにこれら複数エレメント群を
突状に配列し、各エレメント群のエレメント数と同数の
遅延回路を各エレメント群に共通に用いることとし、こ
れら遅延回路と各エレメント群の各エレメントとを切替
回路によりエレメント群毎に選択的に接続し、各エレメ
ント群が向いている方向での小さな角度内での超音波ビ
ームのセクタ走査を各エレメント群により行なうことに
よって全体で必要な大きな角度内の超音波ビームのセク
タ走査を行なうようにしたセ、 ツタ電子走査型超音
波診断装置。A large number of ultrasonic transducer elements constituting the probe are divided into multiple groups, each element group is configured by a planar arrangement of multiple elements, and these multiple element groups are arranged in a convex shape, and the elements of each element group are The same number of delay circuits are used in common for each element group, and these delay circuits and each element of each element group are selectively connected to each element group by a switching circuit, and the direction in which each element group faces By performing sector scanning of the ultrasound beam within a small angle by using each element group, the sector scanning of the ultrasound beam within a large angle required as a whole is performed. .
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14583681U JPS5848222U (en) | 1981-09-30 | 1981-09-30 | Sector electronic scanning ultrasound diagnostic equipment |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14583681U JPS5848222U (en) | 1981-09-30 | 1981-09-30 | Sector electronic scanning ultrasound diagnostic equipment |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5848222U true JPS5848222U (en) | 1983-04-01 |
Family
ID=29938754
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP14583681U Pending JPS5848222U (en) | 1981-09-30 | 1981-09-30 | Sector electronic scanning ultrasound diagnostic equipment |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5848222U (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2020153770A (en) * | 2019-03-19 | 2020-09-24 | 株式会社東芝 | Ultrasonic inspection device |
-
1981
- 1981-09-30 JP JP14583681U patent/JPS5848222U/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2020153770A (en) * | 2019-03-19 | 2020-09-24 | 株式会社東芝 | Ultrasonic inspection device |
US11318497B2 (en) | 2019-03-19 | 2022-05-03 | Kabushiki Kaisha Toshiba | Ultrasonic inspection device |
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