JPS58176962A - Preparation of bidirectional semiconductor varister - Google Patents

Preparation of bidirectional semiconductor varister

Info

Publication number
JPS58176962A
JPS58176962A JP6068682A JP6068682A JPS58176962A JP S58176962 A JPS58176962 A JP S58176962A JP 6068682 A JP6068682 A JP 6068682A JP 6068682 A JP6068682 A JP 6068682A JP S58176962 A JPS58176962 A JP S58176962A
Authority
JP
Japan
Prior art keywords
varister
laminated
rectangular
semiconductor
varistor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP6068682A
Other languages
Japanese (ja)
Other versions
JPS6320021B2 (en
Inventor
Hidenobu Abe
秀延 阿部
Yasuo Hasegawa
長谷川 泰男
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Origin Electric Co Ltd
Original Assignee
Origin Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Origin Electric Co Ltd filed Critical Origin Electric Co Ltd
Priority to JP6068682A priority Critical patent/JPS58176962A/en
Publication of JPS58176962A publication Critical patent/JPS58176962A/en
Publication of JPS6320021B2 publication Critical patent/JPS6320021B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/77Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
    • H01L21/78Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/0002Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Abstract

PURPOSE:To simplify assembling and eliminate miswiring for polarity and removing positional deviation in soldering by obtaining a plurality of multi-layered rectangular segments through cutting of laminated and bonded PN semiconductor wafer block in the specified width and a direction, placing a pair of such multi-layered wafer segments in parallel between electrode plates in the opposite directions and bonding them and individually cutting them for each specified width. CONSTITUTION:A laminated PN semiconductor wafer block 2 is obtained by laminating wafers in the same direction using brazing material and then heating them. Such laminated wafer block is plated for the entire part and it is then cut in the same direction with the specified width with a cutting machine. Thereby, a narrow rectangular shape laminated wafer segment 3 can be obtained. These laminated wafer segments are placed reversely in parallel with each other between rectangular laminated segments 3, 3 and metal plates 4, 4' are brazed, forming a rectangular varister 5. Such rectangular varister is divided into individual varister elements 6 by cutting a rectangular varister 5 in the specified size in the direction at a right angle to the longitudinal direction of electrode 4 and each varister element is given the lead wires 7, 7' at both ends with soldering. Thereafter, it is molded by resin and a bidirectional semiconductor varister 8 can be obtained.

Description

【発明の詳細な説明】 本発明はPN接合を有する複数のペレットを積層接着し
九PNペレット積層体を逆並列接続してなる双方向性半
導体バリスタの製造方法に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for manufacturing a bidirectional semiconductor varistor in which a plurality of pellets having a PN junction are laminated and bonded and nine PN pellet stacks are connected in antiparallel.

一般に電気囲路に入来するサージ讐抑制したプ、或いは
その電気囲路が発生するサージ電圧を吸収するのくバリ
スタが用いられる。斯かるバリスタとしてダイオードの
順方向特性を利用して双方向のサージ電圧を吸収すべく
、PNi1合を有する複数のペレットを積層したものを
逆並列に接続してなる双方向性半導体バリスタがある。
Generally, a varistor is used to suppress the surge voltage entering the electric fence or to absorb the surge voltage generated by the electric fence. As such a varistor, there is a bidirectional semiconductor varistor made by stacking a plurality of pellets having PNi1 and connecting them in antiparallel in order to absorb bidirectional surge voltage by utilizing the forward characteristics of a diode.

従来の斯かる)Z 9スタの製造方法は、PNg合を有
する大面積の半導体ウェハを鑞材を介して所望枚数積層
して接着させた後、X、Y方向に所定の寸法で切断して
多数のPNベレット積層体に分割し、第1図に示す様に
これらPNベレット積層体Pの211I t−互一に逆
方向になる様に電極E、B’間に鑞材Sと一緒に配置す
ると共に加熱して前記PNペレット積層体P((電ff
1E、E’に鑞付けしてい友。この様に従来の製造方法
は個々に切断されたPN半導体ペレット積層体2Wk逆
並列にして組立てているので、工数が非常にかかり、且
つPN半導体ベレット積層体が非常に小さいために組立
て時に互いに逆方向にするところを互いに同方向に組立
ててしまう間違いが生じ易く、歩留りを著しく低下させ
るという欠点があった。
The conventional manufacturing method for Z 9 stars is to stack and bond a desired number of large-area semiconductor wafers with PNg bonding via a soldering material, and then cut them into predetermined dimensions in the X and Y directions. The PN pellet laminates P are divided into a number of laminates, and as shown in FIG. At the same time, the PN pellet laminate P ((electronic ff
My friend is brazing 1E and E'. As described above, the conventional manufacturing method involves assembling 2Wk of individually cut PN semiconductor pellet stacks in antiparallel, which requires a large number of man-hours, and since the PN semiconductor pellet stacks are very small, they are assembled in opposite directions when assembled. It is easy to make a mistake in assembling the parts in the same direction, which has the drawback of significantly lowering the yield.

本発明は斯かる従来方法による欠点を除去することを目
的とし、PN接合を有する大面積の半導体ウェハを複数
枚積層接着してなるPN半導体ウニ八へ層体を所定幅に
て一方向に切断して複数の短冊状積層体を得、これら短
冊状積層体の少くとも2個を逆方向にして電#j、板関
に並置して鑞付けし、しかる後に所定幅毎に個々に切断
することを特徴としている。
The present invention aims to eliminate the drawbacks of the conventional method, and involves cutting the layered body in a predetermined width in one direction into a PN semiconductor wafer made by laminating and bonding a plurality of large-area semiconductor wafers having PN junctions. to obtain a plurality of strip-shaped laminates, at least two of these strip-shaped laminates are placed side by side on the board #j and board in opposite directions and brazed, and then cut individually into predetermined widths. It is characterized by

第1図及び第2図(A)〜(G) Kよシ本発明に係る
双方向性半導体バリスタの製造方法の一笑施ガを説明す
る。
1 and 2 (A) to (G) K. A brief explanation of the method for manufacturing a bidirectional semiconductor varistor according to the present invention will now be described.

先ず牙2図人)に示す様なPN接合を有する大面積の半
導体9エバ1【所望枚数、ここでは4枚用意し、これら
半導体ウェハを鑞材(図示せず)を介して同方向に積層
した後に加熱して互い専接着させることにより、同図B
)K示す様なPN半導体9工八積層体2を得ている。次
に後の工程において電極板を鑞接するために、半導体9
工バ積層体2の全面に通常のメッキ方法によりメッキを
施す。
First, prepare a large-area semiconductor wafer 1 (desired number of wafers, here 4 wafers) having a PN junction as shown in Figure 2, and stack these semiconductor wafers in the same direction via a solder material (not shown). By heating and adhering them to each other,
) A 9-8 PN semiconductor stack 2 as shown in FIG. Next, in order to solder the electrode plate in a later process, the semiconductor 9
Plating is applied to the entire surface of the workpiece laminate 2 using a conventional plating method.

しかる後同図C)に示すIIKカッティングマシーンに
よシ半導体ウェハ積層体2を所定の幅にて同一方向に切
断する。この結果、同図D) K示す様な一方に細長い
短冊状積層体3が多゛数個得られる。
Thereafter, the semiconductor wafer stack 2 is cut into a predetermined width in the same direction using the IIK cutting machine shown in FIG. As a result, a large number of elongated strip-shaped laminates 3 are obtained on one side as shown in FIG.

次に同図D)K示す様にほぼ同じ長さの短冊状積層体3
t2個ニッケル板或いはコバール板の様々細長い金属板
4.4′間に、互いに逆方向、っま夛逆並列になる様に
並置する。この半導体バイリスタにあってはダイオード
の順方向を利用しているので、2mの短冊状積層体3.
3を接触させて並置しても、或いは若干間隔を設けて並
置しても電圧−電流特性に悪影響を及ぼすことはない。
Next, as shown in Figure D)K, a strip-shaped laminate 3 with approximately the same length
T2 various elongated metal plates 4.4' made of nickel plates or Kovar plates are arranged side by side in opposite directions to each other so as to be inversely parallel to each other. Since this semiconductor biristor utilizes the forward direction of the diode, the 2m long strip-shaped laminate 3.
Even if 3 are placed side by side in contact with each other, or even if they are placed side by side with some spacing between them, the voltage-current characteristics will not be adversely affected.

なおこの際、短冊状積層体6.6と電極板4.4′間に
は半田の様な細長い鑞材が介在されておシ(図示せず)
、従ってこれらを所定温度で加熱することによシ短冊状
積層体3.6と金属板4.4′とが鑞付けされ、短冊状
バリスタ5となる。
At this time, a long thin solder material such as solder is interposed between the strip-shaped laminate 6.6 and the electrode plate 4.4' (not shown).
Therefore, by heating these at a predetermined temperature, the strip-shaped laminate 3.6 and the metal plate 4.4' are brazed to form the strip-shaped varistor 5.

斯かる状態で短冊状バリスタ5はバリスタとしての電圧
−電流特性t″有するが、更に一々のバリスタ素子とし
て分割される。つまり第2図E)K示す様に細長い電極
板4の長手、方向に対し直角に所定寸法にて短冊状バリ
スタ5を切断することによシ、個々のバリスタ素子6に
分割する。
In this state, the strip-shaped varistor 5 has voltage-current characteristics t'' as a varistor, but is further divided into individual varistor elements.In other words, as shown in FIG. The strip-shaped varistor 5 is cut into individual varistor elements 6 by cutting the strip-shaped varistor 5 with a predetermined dimension at right angles to the varistor element.

しかる後、同図G)に示す様に−々のバリスタ素子6の
両端K 17−ド線7.7’t−半田付けするが、斯か
る工種については鰯々のバリスタ素子に切断する前に予
め各バリスタ素子に適した形状のり一ド纏アレイを短冊
状バリスタ5のIE電極板、4′に鑞付けしておき、し
かる後に個々のバリスタ素子に切断するものであっても
良φ。
After that, as shown in Figure G), both ends of each varistor element 6 are soldered to each other. It is also possible to braze a glue-wrapped array in a shape suitable for each varistor element to the IE electrode plate 4' of the strip-shaped varistor 5 in advance, and then cut it into individual varistor elements.

次に同図G)に示す様に、通常のトランスファーモール
ド法によシ樹脂モールドし、完成した双方向性半導体バ
リスタ8を得る。
Next, as shown in FIG. G), resin molding is performed by a normal transfer molding method to obtain a completed bidirectional semiconductor varistor 8.

以上述べた様に本発明の実施的によれば、PN接合を有
する大面積の半導体9エバ【所望枚数だけ積層接着して
な名PN半導体つェへ積層体を所定幅にて一方向に切断
して複数の短冊状積層体を作り、この短冊状積層体を少
くとも211互いに逆方向にして細長−電極板間に並置
して加熱接着し、しかる後Kll々のバリスタ素子に切
断しているので1組立てが極めて簡略化され、しかも個
々の半導体ベレット積層体に分割した後に逆並列接続し
ていないので、極性を誤っ九り、半田付けに際して位置
ずれを生ずることがなく、従って不良品の発生が極めて
少なくなる。
As described above, according to the embodiment of the present invention, a large-area semiconductor wafer having a PN junction is laminated and bonded in a desired number of layers, and the laminate is cut in one direction at a predetermined width into a PN semiconductor. A plurality of strip-shaped laminates are made, and these strip-shaped laminates are placed in parallel between the elongated and electrode plates in at least 211 directions in opposite directions and are heat-bonded, and then cut into KII varistor elements. Therefore, one assembly is extremely simplified, and since there is no anti-parallel connection after dividing into individual semiconductor pellet stacks, there is no possibility of incorrect polarity or misalignment during soldering, and therefore there is no possibility of defective products. becomes extremely small.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は従来の双方向性半導体バリスタの製造方法を説
明するための図、第2図ム)乃至G)は本発明に係る双
方向性半導体バリスタの製造方法の一実施P1を説明す
るための図である。 1・・・半導体ウェハ 2・−・PNN半導体ウニへ層体 5・−・Mi冊状積層体 4.4′・・・電極板 5・・・短冊状バリスタ 6・・・バリスタ素子 7、7′・・・リード線 8・・・双方向性半導体バリスタ 特許出願人  オリジン電気株式会社
FIG. 1 is a diagram for explaining a conventional method for manufacturing a bidirectional semiconductor varistor, and FIG. This is a diagram. 1...Semiconductor wafer 2...PNN semiconductor layer 5...Mi strip-shaped laminate 4.4'...Electrode plate 5...Strip-shaped varistor 6...Varistor elements 7, 7 '... Lead wire 8... Bidirectional semiconductor varistor patent applicant Origin Electric Co., Ltd.

Claims (1)

【特許請求の範囲】 PN接合を有する複数の半導体ベレツ)1積層接着した
PN半導体ベレット槓積層体逆並列接続してなる双方向
性半導体バリスタの製造方法において、 PN接合を有する大面積の半導体ウェハを鑞材を介して
所望枚数積層した後にこれを加熱して接着する工程と、 このPN半導体ウェハ積層体を所定幅にて一方向に切断
して複数の短冊状積層体を形成する工程と、 該短冊状積層体の少くとも2個゛を逆方向にして電極間
に並置すると共に加熱して、これら短冊状積層体を前記
電極に鑞付けして短冊状バリスタを得る工程と、 骸短冊状バリスタを所望寸法毎に切断して被数のバリス
タに分割する工程と、 全備え九〇とt−特徴とする双方向性半導体バリスタの
製造方法。
[Scope of Claims] A method for manufacturing a bidirectional semiconductor varistor formed by connecting a plurality of semiconductor pellets having a PN junction in antiparallel and bonding a single layer of PN semiconductor pellets, comprising: a large-area semiconductor wafer having a PN junction; a step of laminating a desired number of PN semiconductor wafers via a soldering material and then heating and bonding them; a step of cutting this PN semiconductor wafer stack in one direction at a predetermined width to form a plurality of strip-shaped stacks; arranging at least two of the strip-shaped laminates in opposite directions between electrodes and heating them, and brazing these strip-shaped laminates to the electrodes to obtain a strip-shaped varistor; A method for manufacturing a bidirectional semiconductor varistor, comprising: a step of cutting a varistor into desired dimensions and dividing the varistor into a number of varistors;
JP6068682A 1982-04-12 1982-04-12 Preparation of bidirectional semiconductor varister Granted JPS58176962A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6068682A JPS58176962A (en) 1982-04-12 1982-04-12 Preparation of bidirectional semiconductor varister

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6068682A JPS58176962A (en) 1982-04-12 1982-04-12 Preparation of bidirectional semiconductor varister

Publications (2)

Publication Number Publication Date
JPS58176962A true JPS58176962A (en) 1983-10-17
JPS6320021B2 JPS6320021B2 (en) 1988-04-26

Family

ID=13149429

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6068682A Granted JPS58176962A (en) 1982-04-12 1982-04-12 Preparation of bidirectional semiconductor varister

Country Status (1)

Country Link
JP (1) JPS58176962A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60140851A (en) * 1983-12-28 1985-07-25 Origin Electric Co Ltd Manufacture of semiconductor device
US5661087A (en) * 1994-06-23 1997-08-26 Cubic Memory, Inc. Vertical interconnect process for silicon segments

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60140851A (en) * 1983-12-28 1985-07-25 Origin Electric Co Ltd Manufacture of semiconductor device
US5661087A (en) * 1994-06-23 1997-08-26 Cubic Memory, Inc. Vertical interconnect process for silicon segments

Also Published As

Publication number Publication date
JPS6320021B2 (en) 1988-04-26

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