JPS5766354A - Eddy current flaw detector - Google Patents
Eddy current flaw detectorInfo
- Publication number
- JPS5766354A JPS5766354A JP55141755A JP14175580A JPS5766354A JP S5766354 A JPS5766354 A JP S5766354A JP 55141755 A JP55141755 A JP 55141755A JP 14175580 A JP14175580 A JP 14175580A JP S5766354 A JPS5766354 A JP S5766354A
- Authority
- JP
- Japan
- Prior art keywords
- detecting
- coil
- absolute
- coils
- differential
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000011000 absolute method Methods 0.000 abstract 3
- 238000000034 method Methods 0.000 abstract 3
- 239000002184 metal Substances 0.000 abstract 2
- 239000000523 sample Substances 0.000 abstract 2
- 238000001514 detection method Methods 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
- G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
- G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
- G01N27/904—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents with two or more sensors
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55141755A JPS5766354A (en) | 1980-10-09 | 1980-10-09 | Eddy current flaw detector |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55141755A JPS5766354A (en) | 1980-10-09 | 1980-10-09 | Eddy current flaw detector |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5766354A true JPS5766354A (en) | 1982-04-22 |
JPS6259776B2 JPS6259776B2 (enrdf_load_stackoverflow) | 1987-12-12 |
Family
ID=15299432
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP55141755A Granted JPS5766354A (en) | 1980-10-09 | 1980-10-09 | Eddy current flaw detector |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5766354A (enrdf_load_stackoverflow) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003522937A (ja) * | 1999-12-23 | 2003-07-29 | ケーエルエー−テンカー テクノロジィース コーポレイション | 渦電流測定あるいは光学測定を利用して、メタライゼーション処理を実状態で監視する方法 |
-
1980
- 1980-10-09 JP JP55141755A patent/JPS5766354A/ja active Granted
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003522937A (ja) * | 1999-12-23 | 2003-07-29 | ケーエルエー−テンカー テクノロジィース コーポレイション | 渦電流測定あるいは光学測定を利用して、メタライゼーション処理を実状態で監視する方法 |
Also Published As
Publication number | Publication date |
---|---|
JPS6259776B2 (enrdf_load_stackoverflow) | 1987-12-12 |
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