JPS5728105B2 - - Google Patents
Info
- Publication number
- JPS5728105B2 JPS5728105B2 JP4152176A JP4152176A JPS5728105B2 JP S5728105 B2 JPS5728105 B2 JP S5728105B2 JP 4152176 A JP4152176 A JP 4152176A JP 4152176 A JP4152176 A JP 4152176A JP S5728105 B2 JPS5728105 B2 JP S5728105B2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
Landscapes
- Engineering & Computer Science (AREA)
- Textile Engineering (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Arrangements For Transmission Of Measured Signals (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4152176A JPS52125389A (en) | 1976-04-13 | 1976-04-13 | Defect inspection apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4152176A JPS52125389A (en) | 1976-04-13 | 1976-04-13 | Defect inspection apparatus |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS52125389A JPS52125389A (en) | 1977-10-21 |
| JPS5728105B2 true JPS5728105B2 (US07368563-20080506-C00056.png) | 1982-06-15 |
Family
ID=12610675
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP4152176A Granted JPS52125389A (en) | 1976-04-13 | 1976-04-13 | Defect inspection apparatus |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS52125389A (US07368563-20080506-C00056.png) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5679848U (US07368563-20080506-C00056.png) * | 1979-11-27 | 1981-06-29 | ||
| JPH0642199Y2 (ja) * | 1986-09-10 | 1994-11-02 | 株式会社東芝 | 欠陥弁別回路 |
| JPS63118641A (ja) * | 1986-11-07 | 1988-05-23 | Yasunaga Tekkosho:Kk | 光学式傷判別装置 |
-
1976
- 1976-04-13 JP JP4152176A patent/JPS52125389A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS52125389A (en) | 1977-10-21 |
