JPS57196599A - Device for inspecting unsintered ceramic - Google Patents

Device for inspecting unsintered ceramic

Info

Publication number
JPS57196599A
JPS57196599A JP57032529A JP3252982A JPS57196599A JP S57196599 A JPS57196599 A JP S57196599A JP 57032529 A JP57032529 A JP 57032529A JP 3252982 A JP3252982 A JP 3252982A JP S57196599 A JPS57196599 A JP S57196599A
Authority
JP
Japan
Prior art keywords
inspecting
unsintered ceramic
unsintered
ceramic
inspecting unsintered
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57032529A
Other languages
English (en)
Other versions
JPS5933996B2 (ja
Inventor
Fuiritsupu Chiyangu Taiihon
Jieemuzu Koon Fuiritsupu
Yurugen Hoon Furitsutsu
Uiriamu Moruzen Jiyuni Uorutaa
Richiyaado Jingaa Aasaa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of JPS57196599A publication Critical patent/JPS57196599A/ja
Publication of JPS5933996B2 publication Critical patent/JPS5933996B2/ja
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2644—Adaptations of individual semiconductor devices to facilitate the testing thereof
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/305—Contactless testing using electron beams
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01B—CABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
    • H01B1/00—Conductors or conductive bodies characterised by the conductive materials; Selection of materials as conductors
    • H01B1/20—Conductive material dispersed in non-conductive organic material
    • H01B1/24—Conductive material dispersed in non-conductive organic material the conductive material comprising carbon-silicon compounds, carbon or silicon

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Dispersion Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Production Of Multi-Layered Print Wiring Board (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP57032529A 1981-05-26 1982-03-03 未焼結セラミツクの検査装置 Expired JPS5933996B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US26732181A 1981-05-26 1981-05-26
US267321 1981-05-26

Publications (2)

Publication Number Publication Date
JPS57196599A true JPS57196599A (en) 1982-12-02
JPS5933996B2 JPS5933996B2 (ja) 1984-08-20

Family

ID=23018291

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57032529A Expired JPS5933996B2 (ja) 1981-05-26 1982-03-03 未焼結セラミツクの検査装置

Country Status (3)

Country Link
EP (1) EP0066087B1 (ja)
JP (1) JPS5933996B2 (ja)
DE (1) DE3265985D1 (ja)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2729532A1 (fr) * 1995-01-17 1996-07-19 Thomson Csf Procede et systeme de controle de cartes de circuits imprimes avant le report de composants sur les cartes
CN101194122B (zh) 2005-04-07 2010-05-12 丘伯国际控股有限公司 用于灭火过压力预防的气动式流量控制阀
CN103454794B (zh) * 2013-09-06 2016-06-08 深圳市华星光电技术有限公司 点灯测试治具以及液晶面板测试方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3016486A (en) * 1957-08-05 1962-01-09 Gen Electric Magnetic amplifier having non-linear response characteristic
US4169816A (en) * 1978-03-06 1979-10-02 Exxon Research & Engineering Co. Electrically conductive polyolefin compositions
FR2477758A1 (fr) * 1980-03-06 1981-09-11 Sanders Conducteur electrique
US4443278A (en) * 1981-05-26 1984-04-17 International Business Machines Corporation Inspection of multilayer ceramic circuit modules by electrical inspection of green specimens
US4415851A (en) * 1981-05-26 1983-11-15 International Business Machines Corporation System for contactless testing of multi-layer ceramics
US4417203A (en) * 1981-05-26 1983-11-22 International Business Machines Corporation System for contactless electrical property testing of multi-layer ceramics

Also Published As

Publication number Publication date
EP0066087B1 (en) 1985-09-04
JPS5933996B2 (ja) 1984-08-20
DE3265985D1 (en) 1985-10-10
EP0066087A1 (en) 1982-12-08

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