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Priority to JP4512876ApriorityCriticalpatent/JPS52128196A/ja
Publication of JPS52128196ApublicationCriticalpatent/JPS52128196A/ja
Publication of JPS5718571B2publicationCriticalpatent/JPS5718571B2/ja
Investigating Or Analysing Materials By Optical Means
(AREA)
JP4512876A1976-04-201976-04-20Method of measuring water content of thin material free from increment of thickness due to water contained
GrantedJPS52128196A
(en)