JPS5717804A - Dimension measuring method - Google Patents

Dimension measuring method

Info

Publication number
JPS5717804A
JPS5717804A JP9255380A JP9255380A JPS5717804A JP S5717804 A JPS5717804 A JP S5717804A JP 9255380 A JP9255380 A JP 9255380A JP 9255380 A JP9255380 A JP 9255380A JP S5717804 A JPS5717804 A JP S5717804A
Authority
JP
Grant status
Application
Patent type
Prior art keywords
circuit
obtained
material
measured
data
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9255380A
Inventor
Shigeo Oota
Original Assignee
Seiko Seiki Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical means
    • G01B11/02Measuring arrangements characterised by the use of optical means for measuring length, width or thickness
    • G01B11/022Measuring arrangements characterised by the use of optical means for measuring length, width or thickness by means of tv-camera scanning

Abstract

PURPOSE:To correctly measure the dimensions of materials to be measured by obtaining the starting and finishing signals of measurement as compared with the previously obtained data and the data of dimensions of diameter obtained from sensor digitally by shifting the material to be measured. CONSTITUTION:The material is taken a photograph by an image sensor by shifting the material to be measured in the direction of the shaft. Waveform shaped output in a threshold level setting circuit 12 is fed to a counting circuit 13, and output of the counting circuit 13 is stored in a memory circuit 14. Memory circuit 14 is connected to a large/small comparison circuit 15 and the large/small comparison circuit 15 compares the data obtained in this time and the data obtained in the previous scanning. Starting signal 16 and finishing signal 17 of measurement can be obtained by this large/small comparison circuit 15 and dimensions of the material to be measured can be measured by using the shifted distance of the material while obtaining the signals.
JP9255380A 1980-07-07 1980-07-07 Dimension measuring method Pending JPS5717804A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9255380A JPS5717804A (en) 1980-07-07 1980-07-07 Dimension measuring method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9255380A JPS5717804A (en) 1980-07-07 1980-07-07 Dimension measuring method

Publications (1)

Publication Number Publication Date
JPS5717804A true true JPS5717804A (en) 1982-01-29

Family

ID=14057586

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9255380A Pending JPS5717804A (en) 1980-07-07 1980-07-07 Dimension measuring method

Country Status (1)

Country Link
JP (1) JPS5717804A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6362647A (en) * 1986-08-29 1988-03-18 Mitsubishi Electric Corp Numeric controller
USRE38025E1 (en) * 1991-02-22 2003-03-11 Cyberoptics Corporation High precision component alignment sensor system
US7746481B2 (en) 2007-03-20 2010-06-29 Cyberoptics Corporation Method for measuring center of rotation of a nozzle of a pick and place machine using a collimated laser beam
US8068664B2 (en) 2007-06-05 2011-11-29 Cyberoptics Corporation Component sensor for pick and place machine using improved shadow imaging

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6362647A (en) * 1986-08-29 1988-03-18 Mitsubishi Electric Corp Numeric controller
USRE38025E1 (en) * 1991-02-22 2003-03-11 Cyberoptics Corporation High precision component alignment sensor system
US7746481B2 (en) 2007-03-20 2010-06-29 Cyberoptics Corporation Method for measuring center of rotation of a nozzle of a pick and place machine using a collimated laser beam
US8068664B2 (en) 2007-06-05 2011-11-29 Cyberoptics Corporation Component sensor for pick and place machine using improved shadow imaging

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