JPS57172587A - Voltage boosting circuit of memory circuit - Google Patents
Voltage boosting circuit of memory circuitInfo
- Publication number
- JPS57172587A JPS57172587A JP56057142A JP5714281A JPS57172587A JP S57172587 A JPS57172587 A JP S57172587A JP 56057142 A JP56057142 A JP 56057142A JP 5714281 A JP5714281 A JP 5714281A JP S57172587 A JPS57172587 A JP S57172587A
- Authority
- JP
- Japan
- Prior art keywords
- vcc
- voltage
- word line
- signal
- phia
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/409—Read-write [R-W] circuits
- G11C11/4096—Input/output [I/O] data management or control circuits, e.g. reading or writing circuits, I/O drivers or bit-line switches
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/408—Address circuits
- G11C11/4085—Word line control circuits, e.g. word line drivers, - boosters, - pull-up, - pull-down, - precharge
Abstract
PURPOSE:To achieve sufficient writing operation by boosting the voltage of a word line by capacitances >=2 times. CONSTITUTION:Switches SW1, SW2, and SW3 are all in on states initially, and switches SW1 and SW3 are turned off; and then a signal phiA generated by a generating circuit 40 goes up to a level Vcc, and consequently the potential of a word line W is raised to the Vcc. A signal phiB goes up to a high level (Vcc) and is passed through a capacitance CB to boost the voltage of the word line W above the Vcc. At this time, the voltage phiA at the output terminal of the phiA generating circuit is also boosted. Then, the switch SW2 is turned off and a signal phiC goes up to the high level (Vcc). The signal phiC further boosts the voltage of the word line W through a capacitance Cc.
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56057142A JPS57172587A (en) | 1981-04-17 | 1981-04-17 | Voltage boosting circuit of memory circuit |
US06/358,678 US4503522A (en) | 1981-03-17 | 1982-03-16 | Dynamic type semiconductor monolithic memory |
EP82301347A EP0061289B1 (en) | 1981-03-17 | 1982-03-16 | Dynamic type semiconductor monolithic memory |
DE8282301347T DE3278833D1 (en) | 1981-03-17 | 1982-03-16 | Dynamic type semiconductor monolithic memory |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56057142A JPS57172587A (en) | 1981-04-17 | 1981-04-17 | Voltage boosting circuit of memory circuit |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS57172587A true JPS57172587A (en) | 1982-10-23 |
Family
ID=13047317
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP56057142A Pending JPS57172587A (en) | 1981-03-17 | 1981-04-17 | Voltage boosting circuit of memory circuit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57172587A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5377138A (en) * | 1990-01-24 | 1994-12-27 | Seiko Epson Corporation | Semiconductor memory and data processing device |
US5526319A (en) * | 1995-01-31 | 1996-06-11 | International Business Machines Corporation | Memory with adiabatically switched bit lines |
US6125075A (en) * | 1985-07-22 | 2000-09-26 | Hitachi, Ltd. | Semiconductor device incorporating internal power supply for compensating for deviation in operating condition and fabrication process conditions |
-
1981
- 1981-04-17 JP JP56057142A patent/JPS57172587A/en active Pending
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6125075A (en) * | 1985-07-22 | 2000-09-26 | Hitachi, Ltd. | Semiconductor device incorporating internal power supply for compensating for deviation in operating condition and fabrication process conditions |
US6363029B1 (en) | 1985-07-22 | 2002-03-26 | Hitachi, Ltd. | Semiconductor device incorporating internal power supply for compensating for deviation in operating condition and fabrication process conditions |
US6970391B2 (en) | 1985-07-22 | 2005-11-29 | Renesas Technology Corporation | Semiconductor device incorporating internal power supply for compensating for deviation in operating condition and fabrication process conditions |
US7002856B2 (en) | 1986-07-18 | 2006-02-21 | Renesas Technology Corporation | Semiconductor device incorporating internal power supply for compensating for deviation in operating condition and fabrication process conditions |
US5377138A (en) * | 1990-01-24 | 1994-12-27 | Seiko Epson Corporation | Semiconductor memory and data processing device |
US5526319A (en) * | 1995-01-31 | 1996-06-11 | International Business Machines Corporation | Memory with adiabatically switched bit lines |
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