JPS57144406A - Inspecting device for product shape - Google Patents

Inspecting device for product shape

Info

Publication number
JPS57144406A
JPS57144406A JP3015581A JP3015581A JPS57144406A JP S57144406 A JPS57144406 A JP S57144406A JP 3015581 A JP3015581 A JP 3015581A JP 3015581 A JP3015581 A JP 3015581A JP S57144406 A JPS57144406 A JP S57144406A
Authority
JP
Japan
Prior art keywords
inspecting
barycenter
nondefective
defective
inputted
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP3015581A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6342721B2 (enrdf_load_stackoverflow
Inventor
Yoshimasa Fujiwara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Electric Works Co Ltd
Original Assignee
Matsushita Electric Works Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Works Ltd filed Critical Matsushita Electric Works Ltd
Priority to JP3015581A priority Critical patent/JPS57144406A/ja
Publication of JPS57144406A publication Critical patent/JPS57144406A/ja
Publication of JPS6342721B2 publication Critical patent/JPS6342721B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/024—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of diode-array scanning

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP3015581A 1981-02-28 1981-02-28 Inspecting device for product shape Granted JPS57144406A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3015581A JPS57144406A (en) 1981-02-28 1981-02-28 Inspecting device for product shape

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3015581A JPS57144406A (en) 1981-02-28 1981-02-28 Inspecting device for product shape

Publications (2)

Publication Number Publication Date
JPS57144406A true JPS57144406A (en) 1982-09-07
JPS6342721B2 JPS6342721B2 (enrdf_load_stackoverflow) 1988-08-25

Family

ID=12295856

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3015581A Granted JPS57144406A (en) 1981-02-28 1981-02-28 Inspecting device for product shape

Country Status (1)

Country Link
JP (1) JPS57144406A (enrdf_load_stackoverflow)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100424699B1 (ko) * 2002-05-01 2004-03-27 삼성테크윈 주식회사 라인 스캔 카메라의 자동 캘리브레이션 시스템
JP2012093118A (ja) * 2010-10-25 2012-05-17 Yamatake Corp 画像処理装置及び画像処理方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4940763A (enrdf_load_stackoverflow) * 1972-08-23 1974-04-16
JPS50124671A (enrdf_load_stackoverflow) * 1974-03-06 1975-09-30

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4940763A (enrdf_load_stackoverflow) * 1972-08-23 1974-04-16
JPS50124671A (enrdf_load_stackoverflow) * 1974-03-06 1975-09-30

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100424699B1 (ko) * 2002-05-01 2004-03-27 삼성테크윈 주식회사 라인 스캔 카메라의 자동 캘리브레이션 시스템
JP2012093118A (ja) * 2010-10-25 2012-05-17 Yamatake Corp 画像処理装置及び画像処理方法

Also Published As

Publication number Publication date
JPS6342721B2 (enrdf_load_stackoverflow) 1988-08-25

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