JPS5670547A - Minute pattern forming method - Google Patents
Minute pattern forming methodInfo
- Publication number
- JPS5670547A JPS5670547A JP14823179A JP14823179A JPS5670547A JP S5670547 A JPS5670547 A JP S5670547A JP 14823179 A JP14823179 A JP 14823179A JP 14823179 A JP14823179 A JP 14823179A JP S5670547 A JPS5670547 A JP S5670547A
- Authority
- JP
- Japan
- Prior art keywords
- solvent
- egmae
- rays
- monomer units
- mixture containing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
- G03F7/30—Imagewise removal using liquid means
- G03F7/32—Liquid compositions therefor, e.g. developers
- G03F7/325—Non-aqueous compositions
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Photosensitive Polymer And Photoresist Processing (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Abstract
PURPOSE:To enhance resolution, by using a negative resist made of a polymer containing monomer units having 2 or more allkyl groups, and as its developing fluid, a solvent mixture containing ethyleneglycol monoalkyl ether (EGMAE) as a poor solvent. CONSTITUTION:In forming a micropattern with electron beams, X-rays, ultraviolet, rays, etc., a negative resist layer is formed on a substrate using a copolymer having monomer units each having 2 or more allyl groups, such as diallyl phthalate or triallyl cyanurate, and the resist layer is imagewise exposed, and developed with a solvent mixture containing EGMAE as a poor solvent and a good solvent such as dioxane or chlorobenzol, thus permitting cross-linking reaction on the exposed regions to be sufficiently accomplished, swelling, peeling, or the like to be prevented, therefore, deformation of the resist pattern not to occur, and a superior pattern of high resolution to be obtained.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP54148231A JPS6058465B2 (en) | 1979-11-15 | 1979-11-15 | Fine pattern formation method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP54148231A JPS6058465B2 (en) | 1979-11-15 | 1979-11-15 | Fine pattern formation method |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5670547A true JPS5670547A (en) | 1981-06-12 |
JPS6058465B2 JPS6058465B2 (en) | 1985-12-20 |
Family
ID=15448194
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP54148231A Expired JPS6058465B2 (en) | 1979-11-15 | 1979-11-15 | Fine pattern formation method |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6058465B2 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS56101148A (en) * | 1980-01-16 | 1981-08-13 | Toshiba Corp | Photoresist developing method |
JPS58187926A (en) * | 1982-04-28 | 1983-11-02 | Toyo Soda Mfg Co Ltd | Method for developing radiation sensitive negative type resist |
-
1979
- 1979-11-15 JP JP54148231A patent/JPS6058465B2/en not_active Expired
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS56101148A (en) * | 1980-01-16 | 1981-08-13 | Toshiba Corp | Photoresist developing method |
JPH0145055B2 (en) * | 1980-01-16 | 1989-10-02 | Tokyo Shibaura Electric Co | |
JPS58187926A (en) * | 1982-04-28 | 1983-11-02 | Toyo Soda Mfg Co Ltd | Method for developing radiation sensitive negative type resist |
JPH0546535B2 (en) * | 1982-04-28 | 1993-07-14 | Tosoh Corp |
Also Published As
Publication number | Publication date |
---|---|
JPS6058465B2 (en) | 1985-12-20 |
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