JPS5646096B2 - - Google Patents
Info
- Publication number
- JPS5646096B2 JPS5646096B2 JP15595976A JP15595976A JPS5646096B2 JP S5646096 B2 JPS5646096 B2 JP S5646096B2 JP 15595976 A JP15595976 A JP 15595976A JP 15595976 A JP15595976 A JP 15595976A JP S5646096 B2 JPS5646096 B2 JP S5646096B2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/952—Inspecting the exterior surface of cylindrical bodies or wires
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15595976A JPS5388782A (en) | 1976-12-24 | 1976-12-24 | Method of inspecting abnormality of surface of long material |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15595976A JPS5388782A (en) | 1976-12-24 | 1976-12-24 | Method of inspecting abnormality of surface of long material |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP12547782A Division JPS58135441A (ja) | 1982-07-19 | 1982-07-19 | 長尺体表面異常検査方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5388782A JPS5388782A (en) | 1978-08-04 |
JPS5646096B2 true JPS5646096B2 (US07223432-20070529-C00017.png) | 1981-10-30 |
Family
ID=15617264
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP15595976A Granted JPS5388782A (en) | 1976-12-24 | 1976-12-24 | Method of inspecting abnormality of surface of long material |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5388782A (US07223432-20070529-C00017.png) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6247370U (US07223432-20070529-C00017.png) * | 1985-05-09 | 1987-03-24 |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5594554U (US07223432-20070529-C00017.png) * | 1978-12-11 | 1980-06-30 | ||
JPS5594553U (US07223432-20070529-C00017.png) * | 1978-12-18 | 1980-06-30 | ||
KR20010102703A (ko) * | 2000-05-04 | 2001-11-16 | 심윤희 | 비접촉식 선피막 검사장치 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS491281A (US07223432-20070529-C00017.png) * | 1972-04-17 | 1974-01-08 |
-
1976
- 1976-12-24 JP JP15595976A patent/JPS5388782A/ja active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS491281A (US07223432-20070529-C00017.png) * | 1972-04-17 | 1974-01-08 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6247370U (US07223432-20070529-C00017.png) * | 1985-05-09 | 1987-03-24 |
Also Published As
Publication number | Publication date |
---|---|
JPS5388782A (en) | 1978-08-04 |