JPS5633517A - Infrared ray detector - Google Patents

Infrared ray detector

Info

Publication number
JPS5633517A
JPS5633517A JP10998079A JP10998079A JPS5633517A JP S5633517 A JPS5633517 A JP S5633517A JP 10998079 A JP10998079 A JP 10998079A JP 10998079 A JP10998079 A JP 10998079A JP S5633517 A JPS5633517 A JP S5633517A
Authority
JP
Japan
Prior art keywords
reflexibility
reflection
infrared ray
polished
lens
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10998079A
Other languages
Japanese (ja)
Inventor
Makoto Ito
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP10998079A priority Critical patent/JPS5633517A/en
Publication of JPS5633517A publication Critical patent/JPS5633517A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02—Constructional details
    • G01J5/06—Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity
    • G01J5/061—Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity by controlling the temperature of the apparatus or parts thereof, e.g. using cooling means or thermostats

Abstract

PURPOSE:To eliminate a measurement error or the like due to reflection on the surface of a lens, by making high the reflexibility of the surface of one side of a low- temperature member which is cooled. CONSTITUTION:The inside and outside surfaces of a cold shield 9 made of a metal are so finished that the surfaces are very different in reflexibility from each other. The outside surface 9a is polished as a lustrous surface to heighten its reflexibility as to infrared rays. Mat black painting for prevention of reflection is effected on the inside surface 9b so that the surface is made almost as a black body. The part of the surface of a cooling block 3 near an infrared ray detection element 4 is polished and then plated with silver 10 so that the part is finished as a highly reflecting surface. Said procedure results in greatly reducing defects due to the reflection on the surface of a lens L of radiation from the cold shield 9.
JP10998079A 1979-08-28 1979-08-28 Infrared ray detector Pending JPS5633517A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10998079A JPS5633517A (en) 1979-08-28 1979-08-28 Infrared ray detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10998079A JPS5633517A (en) 1979-08-28 1979-08-28 Infrared ray detector

Publications (1)

Publication Number Publication Date
JPS5633517A true JPS5633517A (en) 1981-04-04

Family

ID=14524020

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10998079A Pending JPS5633517A (en) 1979-08-28 1979-08-28 Infrared ray detector

Country Status (1)

Country Link
JP (1) JPS5633517A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01110225A (en) * 1987-10-23 1989-04-26 Agency Of Ind Science & Technol Infrared radiation meter
US5434413A (en) * 1993-10-01 1995-07-18 Texas Instruments Incorporated Virtual cold shield and cold filter for infrared detector arrays
US5561296A (en) * 1991-08-01 1996-10-01 Fujitsu Limited Infrared detector having multiple element type infrared sensor and wiring pattern for signal fetching
WO1999005489A1 (en) * 1997-07-28 1999-02-04 Matsushita Electric Industrial Co., Ltd. Radiation clinical thermometer
JP4607300B2 (en) * 2000-08-30 2011-01-05 日置電機株式会社 Cooling device and light detection device
JP2015190912A (en) * 2014-03-28 2015-11-02 旭化成エレクトロニクス株式会社 Infrared detection device, visual field limiting unit, and manufacturing method thereof

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01110225A (en) * 1987-10-23 1989-04-26 Agency Of Ind Science & Technol Infrared radiation meter
US5561296A (en) * 1991-08-01 1996-10-01 Fujitsu Limited Infrared detector having multiple element type infrared sensor and wiring pattern for signal fetching
US5434413A (en) * 1993-10-01 1995-07-18 Texas Instruments Incorporated Virtual cold shield and cold filter for infrared detector arrays
WO1999005489A1 (en) * 1997-07-28 1999-02-04 Matsushita Electric Industrial Co., Ltd. Radiation clinical thermometer
US6371925B1 (en) 1997-07-28 2002-04-16 Matsushita Electric Industrial Co., Ltd. Radiation clinical thermometer
JP4607300B2 (en) * 2000-08-30 2011-01-05 日置電機株式会社 Cooling device and light detection device
JP2015190912A (en) * 2014-03-28 2015-11-02 旭化成エレクトロニクス株式会社 Infrared detection device, visual field limiting unit, and manufacturing method thereof

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