JPS5583233A - Electron beam scanning method for mark detection - Google Patents
Electron beam scanning method for mark detectionInfo
- Publication number
- JPS5583233A JPS5583233A JP15891378A JP15891378A JPS5583233A JP S5583233 A JPS5583233 A JP S5583233A JP 15891378 A JP15891378 A JP 15891378A JP 15891378 A JP15891378 A JP 15891378A JP S5583233 A JPS5583233 A JP S5583233A
- Authority
- JP
- Japan
- Prior art keywords
- mark
- scanning
- constant
- increased
- detection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
- H01J37/304—Controlling tubes by information coming from the objects or from the beam, e.g. correction signals
- H01J37/3045—Object or beam position registration
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Electron Beam Exposure (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15891378A JPS5583233A (en) | 1978-12-20 | 1978-12-20 | Electron beam scanning method for mark detection |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15891378A JPS5583233A (en) | 1978-12-20 | 1978-12-20 | Electron beam scanning method for mark detection |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5583233A true JPS5583233A (en) | 1980-06-23 |
JPS6258140B2 JPS6258140B2 (zh) | 1987-12-04 |
Family
ID=15682076
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP15891378A Granted JPS5583233A (en) | 1978-12-20 | 1978-12-20 | Electron beam scanning method for mark detection |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5583233A (zh) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5870554U (ja) * | 1981-11-09 | 1983-05-13 | トヨタ自動車株式会社 | ダンパプ−リ |
JPS58102524A (ja) * | 1981-12-14 | 1983-06-18 | Fujitsu Ltd | 電子ビ−ム露光装置の位置合せ方法 |
JPS58151041A (ja) * | 1982-03-03 | 1983-09-08 | Toshiba Corp | リダンダンシ−装置 |
JPS61210625A (ja) * | 1985-03-15 | 1986-09-18 | Toshiba Corp | 電子ビ−ム描画方法 |
-
1978
- 1978-12-20 JP JP15891378A patent/JPS5583233A/ja active Granted
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5870554U (ja) * | 1981-11-09 | 1983-05-13 | トヨタ自動車株式会社 | ダンパプ−リ |
JPS58102524A (ja) * | 1981-12-14 | 1983-06-18 | Fujitsu Ltd | 電子ビ−ム露光装置の位置合せ方法 |
JPS58151041A (ja) * | 1982-03-03 | 1983-09-08 | Toshiba Corp | リダンダンシ−装置 |
JPS61210625A (ja) * | 1985-03-15 | 1986-09-18 | Toshiba Corp | 電子ビ−ム描画方法 |
Also Published As
Publication number | Publication date |
---|---|
JPS6258140B2 (zh) | 1987-12-04 |
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